DE2046960C3 - Circuit arrangement for telecommunications systems, in particular telephone exchanges, with a self-locking test multiple - Google Patents

Description

40 simultaneous test processes a double occupancy (in the form of a branch) prevents confused * by giving preference to one of two test circuits by means of mutual, circuitry

The invention relates to a circuit-induced influencing of the test processes. From the Rules for telecommunication systems, in particular telecommunications 45 German Auslegeschrift 1 030 886 is used for two-way exchanges, For which switching elements pel test two test relays (preparation relays) centrally for several connection devices, double occupancy of an occupancy circuit are seen and the test to a central one provided in the occupancy circuit Switching element prevents the connecting devices capacitor by this for the mutually assigned self-locking test multiplicity 50 testing and allocation process available times limited by the connecting devices individually electrical energy, so that at the same time assigned Fast-switching test switching means (test of two test processes, none or at most one relay) and for which the test circuit can come into play. The two above on the part of each of the connecting devices are respectively mentioned known circuit arrangements for a test process for the duration of a pulse 55 neither intended nor usable for with (Test pulse duration) is switched through and, in the event of differing urgency, to a central one unsuccessful examination of the test process as long as switching element-testing connection devices until, according to the temporal spread of these, a corresponding mutual priority is given to checking processes to grant binding devices in the case of several simultaneously checking the test success one of the test relays 60 involved is silent because this test process on circuit claims. technically as simple as possible to implement.

Such circuit arrangements are already from the German Auslegeschrift 1 033 265 is

known from German patents 934 956 and a circuit arrangement in which at meh-035 703 each known. In the case of the parallel described there, success type due to double checking the examination with the help of a so-called selfless 65 and therefore to be repeated several times Blocking test multiples are not duplicated of a central switching element on the part of several of the processes vary »(temporal spread of the above test Connection devices possible because corridors), and in this way ultimately one of these

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Let Piüfvorgäiage come into play. The program level branched circuit and the analog problem eiaer different urgency different circuit for the individual device W8 of the simultaneous test processes is also closed. These two circuits are not touched; This means that a time test multiple based on the resistances Wl and Wl and the object of the invention can also be used to solve the problem on conductors 1 and 2 of the self-locking problem of different urgencies. In a known way, savings in chips cannot be achieved. voltage division with the help of the resistors Wl, Tl and

A further development of the invention provides that T 8 generates a partial voltage at the connection point between the resistors with a maximum urgency on the central connection device testing the Wl and Wl, ie also on the conductor 1, switching element. This partial voltage is the duration of the respective The test process on the part of this is so small that none of the connection devices is not limited at all via the resistor W1, both test relays P1 and P8 can respond. In this highest level of urgency, the short-circuited relays Xl fall to one of the connecting devices mentioned and S 8 fall off. This means that 2 * 1 will be shared on the contacts. This makes it possible overall 15 2 8 at the same time provide * the two test circuits again that the testing procedure one of the connects be separated Further, by opening the Kondungseinrichtungen towards the testing Orgängen contacts 1 * 1 and 1 * 8, the relay Al and AS again thrown out of all other connections that were checking at the same time. If these relays have dropped out again, directions prevail. is the short circuit for relay X 1 at contact 1 α 1

In the drawing, an embodiment of the ao and on contact 1α8 is the short circuit for the relay

Invention in the essential to understanding the er- XS again separated These two relays speak

finding contributing components shown, whereupon now again. They close except their contacts

however, it is by no means limited. 2 * 1 and 2 * 8 their contacts 1 * 1 and 1 * 8. There-

In the lower part of the drawing, relays A 1 and A 8 respond again below.

horizontally drawn dot-dash line »5 The morning processes begin again,

a self-locking test multiple is shown. The relays, e.g. Xl and Al, are an individual

stands from the two series-connected resistance device, z. B. Wl, so represent a self-subordinate

the Wl and Wl and the two conductors 1 and ? .. breaker (relay breaker). This self-sub

The self-locking test multiple belongs to a breaker switches during the fall time of the waste expiry

continued as Zentralsteuerv / ork TO designated central 30 delayed relay X ... in each case the P call circuit

len switching element. The two ladders 1 and 2 of the self-through. During the release time of the relay / 1 ... and

The response times of relays X ... and A ... are blocking test multiples

Connections designated as individual devices - the test circuit is interrupted in each case. As »An

management facilities, extracts of which are used for speaking time "(or as" fall time ") of a relay

those marked with Wl and ί / 8 in dash-dotted lines are the period from when the power was switched on (or

the border are shown. switch-off) in the excitation winding of the relay to

First of all, let the testing process on the part of an in- to close (or open) the working contacts

individual facility, e.g. WI. That of the relay or until the opening (or closing) of the

The test process is designated by closing the contact el break contacts of the relay. As a common,

initiated a relay not shown. The idle 40 generic term for "response time" or

side of the contact mI and the winding I speaks »fall time«, the expression »working time« is also used

the relay X 1 on. Used with its contact 1 r I switches.

Relay Al is activated, which responds to the individual as described above

now closed contacts 2crl and 2a 1 facilities Wl and W8 started at the same time,

If the following branched circuit comes about: 45 to check the central control unit ZU speaks

initially none of the test relays of the two individual

Earth WX ^W - - ~ '~ * 2 * 1 la 1 - ^Ien bodies. The breaker game of the

'π' Relay ΑΊ and Al or XS and AS are repeated

until one of the relays Pl or P 8 triggers the test

The test relay P1 responds in this circuit. found so many times of the central control unit ZU free It leads in a manner not shown has a connection and accordingly comes to the response. Through the individual device W1 to the central a corresponding selection of the relay types for the control unit ZU . During the duration of this relay A ... X ... in the relay interrupter the relays Pl, Al and Yl are connected - it is ensured that the closing time is addressed to the cone. During the response time of the relay 55 clock 2 * ... is very short, the opening time Pl, the relay Xl is short-circuited. As a result of the test circuit, on the other hand, due to the relatively large drop-out delay caused by it, the response time and drop-out time of the relay / 4 ... relative to the actuation of the contact pt when the response is high is high. The opening pause of the test circuit beRelais Pl does not stop. After activating the contact, the sum of the fall time of the p \ gives the relay Xl its full excitation again, so relay A. .. the response time of relay X ... and so that it continues to be held. the response time of relay A ... Since the response

Consider now the case that the two times of the domestic call relay P are smaller than the fall times dividual devices K 1 and W 8 randomly inlet of the relay X ... of the two relays interrupter, initiate their gegleich test procedures, without any the natural spread of the relay times is sufficient when there is different urgency. At the same time, the relay interrupter is closed, at the latest after that, ie the contacts el and eS are closed. The second repeated test process between the, if at the same time, the retays Xl and XS and the closure of the test circuit for the relay P1, relays A 1 and A 8 respond. At the same time, the above bc- and the closure of the test circuit for the

Relay P 8 to bring about such a time difference, relay X 8 drops already 2 milliseconds after the start

around one of the two test relays with certainty for the two test processes that start at the same time.

Bringing appeal. In contrast, relay Xl only drops for 6 milliseconds

So as not to be affected by the randomness of the natural after the beginning of the two occurring simultaneously

Spread of the working time of the relay A ... of the relay 5 test processes. After the contact Ix 8

To be interrupter dependent, this relay test circuit for the relay P 8 can be separated

As is known per se - each capacitor is, there is only the test circuit for that

connected in parallel and adjustable resistors in relay Pl, which now responds.

Can be connected in series. This allows the Ar- The relay P1 is opposite to the relay ^ 8

times of these relays - and thus the impulse io preferred. For this purpose, the release time of relay X ...

frequency of the self-breakers of the various controlled with the help of the relevant contact u ...,

more individual · bodies - by setting the In addition, it is also possible to create

Specify resistances, d. H. for each of the self-subordinate several urgency levels the drop-off time of the

crusher set its own pulse frequency. Relay X ... controllable in multiple steps

Then let the 15 according to the invention be made.

Described peculiarities of the embodiment. Finally, the importance of the con

With the help of the contacts ul and u8, clocks vl and ν8, not shown, are indicated. It is possible to select relays, the drop-out times of the relays ATl can be set optionally for a single one of the individual devices and Jf 8. To be assigned by an ent- a highest level of urgency. Corresponding dimensioning of the windings I and II that ao is in this device a relay, not shown, the fall times of the same can be made to respond in this device, which switch the contact vl or ratio 1: 3. If the contact ν8 is activated. If for example the individual Einrich- ul its rest position, thus saith assigned this highest priority level, the relay Xl at tung St., closure of the contact el only about his Wick- the contact is opened vl. Now becomes a lung I. If the contact IaI is then closed as the test process by closing the contact el einsen, then only the winding I of the relay Xl is conducted, so speak - as described - the short-circuited. Let its fall time in this relay X1 and A 1. The test circuit for the case is two milliseconds. If, however, the relay Pl is closed. If the same-contact u 1 happens to be in its working position, the relay will also be energized in a timely manner test processes of one or more in-Xl via its two windings I and II. If the contact IaI is then closed, different levels of urgency may begin, the relay Xl can not respond until after six milliseconds from the relay P1. The audit incidents went to these other individual entities

At this point it should be added that it is time-limited for the taxes. On the other hand, the test

tion of the release time of relays is an abundance of well-known 35 processes that need to be checked with the greatest urgency

Circuits there. These can also be found in the present individual device Hl as a result of the opening of the

The case for controlling the fall time of a contact is not limited in time. Because after

Use relay X ... optionally. The relays Xl and Al will respond

It is now assumed that the individual relay is not thrown off again. The test circuit device St. with a higher severity level 40 for the relay Pl therefore remains as long begegenüber individual device H are an inlet 8 until the test circuits of other insammenschaltung with the central control unit TO Toggle dividual facilities are separated again overwhelmed. Accordingly, in the individual inputs and the relay can address P1, direction Holy contact «1 operated, however, it should be noted that for individual furnishing H8 contact uS not 45 in the event that both individual institutions in the conclusion, z. B. actuated. It is also assumed that in the Hl and H 8, as well as one of the central control unit two individual devices, the request- ZU secondary central device via contacts el and e8 are closed so that the same self-locking test multiple on the central two test circuits via the Check contacts 2a 1 and control unit, provision can be made that only 2a8 are closed at the same time. As described, the two test relays P1 can initially be assigned the highest level of urgency to this secondary, second central facility. In die- and PS as a result of the voltage divider effect of this case, this device does not respond to the absolute self-locking test multiple. The priority over all individual facilities.

1 sheet of drawings

Claims (2)

in the case of several randomly initiated test claims at the same time: processes none of them a result, d. H. leads to response of the respective test relay 1. Circuit arrangement for telecommunications systems, from the »Yearbook of electrical telecommunications in particular Fermsprechwrimtüungsanlagen / bei S wesens «, 1958,» Em contribution to the future Enfcvick- • Which switching elements are centralized for several connection of the switching technology ", p. 73 ff, it is also provided for communication devices and the test is known to carry out jointly assigned classes. The traffic classes under the self-locking test multiple through the io are differentiated by the thinness of the occupancy connecting devices individually assigned to the central switching elements. The various high-speed switching test switching means (test relays) result from the different types and in which the test circuit on the part of required connection through-connections via each of the connection devices for a common coupling field. ....
a test process for the duration of a pulse is The invention is based on the task of switching through a (test pulse duration) and, in the case of a circuit arrangement of the type mentioned, the unsuccessful test of the test process is repeated as long as the occupancy of a 2-neutral switching cycle is to which urgency levels can be implemented in one of the easiest ways with the help of a self-locking of the test processes in the case of several test viekaches testing at the same time on circuit-technically feasible connection devices,
This task is characterized according to the invention by the fact that with different solves that with different urgency on the central switching element (Zi /) the central switching element testing connection checking connection devices (Hl, .. .H 8) directions the test pulse duration according to which the test pulse duration according to the urgency level can be set to such a different size keitsstufe can be set to such a different size that the pulse duration at higher urgency (via contacts u 1, ... μ 8) that the Pulse duration is greater than with lower urgency.
if the urgency is higher than if the urgency is lower. where urgencies begin practically 2. Circuit arrangement according to claim 1, then, the test process with the higher survives, characterized in that in the case of one with the highest urgency level the one with the lower urgency on the central switching element (CLOSED) urgency level. After the (unsuccessful) termination of the testing connection device, preferably the test procedure with the lower urgency · a likewise central device, the duration level, the test procedure with the higher urgency of the respective test procedure comes into effect on the part of this reliability level; the test relay binding device in question is not limited at all. responds and carries out the connection of the relevant Device to the central switching element. From the German Auslegeschrift 1 U30 885 a circuit arrangement is known in which at