DE202009000615U1 - Molding compound power semiconductor element - Google Patents
Molding compound power semiconductor element Download PDFInfo
- Publication number
- DE202009000615U1 DE202009000615U1 DE202009000615U DE202009000615U DE202009000615U1 DE 202009000615 U1 DE202009000615 U1 DE 202009000615U1 DE 202009000615 U DE202009000615 U DE 202009000615U DE 202009000615 U DE202009000615 U DE 202009000615U DE 202009000615 U1 DE202009000615 U1 DE 202009000615U1
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- Prior art keywords
- power semiconductor
- heat
- molding compound
- semiconductor element
- element according
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Abstract
Formmassenvergossenes Leistungshalbleiterelement, bei dem ein Leistungshalbeiter mit metallischen, an die Außenseite eines Moldmoduls geführten Kontakten in Umhüllungsspritzen mit Duroplasten umgeben ist, und wobei zur Wärmeableitung einer Bodenseite eine Wärmeleitungsstrecke wenigstens durch den Halbleiter und einen Substratträger vorhanden ist, dadurch gekennzeichnet, daß
wenigstens eine wenigstens im Bereich eines der Kontakte des Halbleiters auf seiner Oberseite einen der Kontakte flächig bedeckend ausgebildete Kontaktlasche angesetzt ist,
auf dem wenigstens einen flächigen Abschnitt der Kontaktlasche wärmeleitend zur Oberseite des Moldmoduls wenigstens ein wärmeleitendes Element zur Ausbildung einer zweiten wärmeableitenden Brücke an die Außenseite des Moduls vorgesehen ist.A molding compound encapsulated power semiconductor element in which a Leistungshalbeiter with metallic, guided to the outside of a Moldmoduls contacts in cladding syringes with thermosets is surrounded, and wherein for heat dissipation of a bottom side a heat conduction path at least through the semiconductor and a substrate carrier is present, characterized in that
at least one contact lug formed covering at least in the region of one of the contacts of the semiconductor on its upper side one of the contacts,
on the at least one flat portion of the contact tab heat-conducting to the top of the mold module at least one heat-conducting element for forming a second heat-dissipating bridge is provided to the outside of the module.
Description
Die Erfindung betrifft ein formmassenvergossenes Leistungshalbleiterelement.The The invention relates to a molding compound power semiconductor element.
Bei Leistungshalbleiterelementen, insbesondere bei solchen mit Formverguss werden die Bauelemente üblicherweise nur einseitig durch das Substrat oder das Stanzgitter einen Kühlungspfad zum äußeren Kühlkörper aufweisen. Diese Ableitung der gesamten erzeugten Verlustleistung über nur einen definierten Kühlpfad ist mit Problemen behaftet. Zum einen führt dieser Kühlpfad von der Unterseite des Halbleiterelementes durch das Substrat der Baugruppe beziehungsweise durch ein Stanzgitter an eine äußere Fläche des formvergossenen Leistungshalbleitermoduls (des s. g. mold packages). Von dort wird die Verlustleistung üblicherweise über Wärmeleitpasten an Luft oder Wasserkühler abgegeben.at Power semiconductor elements, in particular in those with mold casting The components are usually only one side through the substrate or the lead frame a cooling path to the outer heat sink. This derivation of the total generated power loss over only a defined cooling path is fraught with problems. First, this cooling path leads from the underside of the semiconductor element through the substrate of the assembly or by a stamped grid to an outer surface of the molded power semiconductor module (of the so-called mold package). From there, the power loss is usually over thermal grease in air or water cooler issued.
Andererseits ist schon bekannt, dass die Verlustleistung in einem Halbleiter insbesondere bei einem MOSFET und IGBE-Bauelementen einige 10 μm bis 100 μm unterhalb der Kontaktoberfläche des Halbleiters entsteht. Dies entspricht also den oberen 20% der üblichen Gesamtdicke eines Halbleiters.on the other hand It is already known that the power loss in a semiconductor especially in a MOSFET and IGBE devices some 10 microns to 100 microns below the contact surface of the semiconductor arises. This corresponds to the upper 20% of the usual Total thickness of a semiconductor.
Da die Montage des Halleiters auf dem Substrat/Stanzgitter üblicherweise auf seiner Unterseite (der von Source-Kontakt bzw. Emitter und Gate abgewandten Seite) erfolgt, ist lediglich der Drain- bzw. Kollektoranschluss an der Unterseite. Die Verlustleistung muss daher im wesentlichen durch die Trägerschichten des Siliziums bis zum Substrat, also durch ca. 80% der Gesamtdicke des Halbleiters geführt werden. Dieser lange Entwärmungspfad führt bei möglichst effektivem Betrieb (hohe Stromlast pro Halbleiterfläche) zu einer starken Erwärmung der Sperrschicht des Halbleiters und dies hat weitere ungünstige Folgen.There the mounting of the semiconductors on the substrate / stamped grid usually on its bottom (that of source contact or emitter and gate opposite side), is only the drain or collector terminal on the bottom. The power loss must therefore be substantially through the carrier layers of the silicon to the substrate, ie by about 80% of the total thickness of the semiconductor. This long heat removal path leads as possible effective operation (high current load per semiconductor area) too a strong warming the junction of the semiconductor and this has further unfavorable consequences.
Im Stand der Technik werden diese Module auch als Halbleiter-Moldpackages (also als mit Duroplast umspritzte Umhüllungskörper einer elektronischen Baugruppe mit mindestens einen Halbleiterelement) bezeichnet und sind als robuste, umhüllungsgespritzte Baugruppen bekannt, in denen für bestimmte Anwendungen (z. B. Motorsteuerungen) vorzugweise Leistungsbauelemente mit besonders hoher Verlustleistung zugefasst werden.in the State of the art, these modules are also called semiconductor mold packages (ie as encapsulated with thermoset enclosing body of an electronic module with at least one semiconductor element) and are as robust, sheath-sprayed Assemblies are known in which for certain Applications (eg motor controllers) preferably power components be covered with a particularly high power loss.
Die Oberseite solcher Halbleiterbauelemente ist üblicherweise durch bogenförmig aufgesetzte Kontaktdrähte (Bonddrähte) mit anderen Leiterbahnen des Substrates oder des Stanzgitters verbunden und von isolierender Duroplastmasse umhüllt. Die sehr geringe Wärmeleitung der Duroplastmassen (< 1 W/mK) führt nur zu einer sehr geringen Leitung von Verlustwärme durch den Umhüllungskörper an die Umgebung.The Top of such semiconductor devices is usually by arcuate patch contact wires (bonding wires) with connected to other tracks of the substrate or the lead frame and surrounded by insulating Duroplastmasse. The very low heat conduction of thermoset compounds (<1 W / mK) only to a very small line of heat loss through the enclosure body the environment.
Die oben erwähnten ungünstigen Folgen bestehen daher in:
- • geringere Lebensdauer durch höhere Sperrschichttemperatur
- • früheres Ablösen der Bonddrähte (Wirebond lift off) bei hoher mittlerer Betriebstemperatur bei wechselnden Lasten
- • Suboptimaler Maximalstrom (uneffektive Ausnutzung der Siliziumfläche)
- • Größeres Volumen durch unsymmetrische, äußere Kühlkörper der gesamten Baugruppe
- • reduced service life due to higher junction temperature
- • earlier detachment of the bonding wires (Wirebond lift off) at high mean operating temperature with changing loads
- • Suboptimal maximum current (inefficient utilization of silicon area)
- • Larger volume due to asymmetrical, outer heat sinks of the entire assembly
Bei der Fertigung des Moldpackage nach dem Stand der Technik sind durch den unsymmetrischen Aufbau (Bauteileträger unten und großes Moldvolumen oben) starke Verformungen durch unsymmetrisches Schrumpfen zu beobachten. Nur durch langwierige Temperung kann diese Verwerfung vermindert werden.at the production of Moldpackage according to the prior art are by the asymmetrical structure (component carrier below and large mold volume above) strong deformations due to asymmetrical shrinkage. Only by prolonged tempering can this fault be reduced become.
Die Erfindung hat sich daher zur Aufgabe gestellt, eine verbesserte Ableitung der Verlustwärme zu ermöglichen. Erfindungsgemäß wird dies durch ein formvergossenes Halbleistungshalbleitermodul mit den Merkmalen des Hauptanspruches gelöst. Die Unteransprüche geben vorteilhafte Ausführungsformen der Erfindung wieder.The Invention has therefore set itself the task of improving Derivation of the lost heat too enable. According to the invention this is by a molded semicon power semiconductor module having the features solved the main claim. The dependent claims give advantageous embodiments the invention again.
Besonders vorteilhaft ist, dass die Betriebsbedingungen der Halbleiter und die damit verbundenen Nachteile durch einen weiteren Entwärmungspfad zur Umgebung deutlich verringert werden können. Der Wärmepfad soll auf der dem vorhandenen Substrat, gegenüberliegenden Seite des Moldpackage an die Umgebung geführt werden. Dort kann dann thermischer Kontakt zu einem Luft- oder Wasserkühler hergestellt werden.Especially It is advantageous that the operating conditions of the semiconductor and the associated disadvantages by another Entwärmungspfad can be significantly reduced to the environment. The heat path should be on the existing substrate, opposite Side of Moldpackage be led to the environment. There can then thermal contact to an air or water cooler are made.
Der zusätzliche Wärmepfad steigert die Wärmeabfuhr um 20% bis 30% und um den gleichen Anteil sinkt der verlustleistungsbedingte Temperaturhub in der Sperrschicht des Halbleiters. Dieser geringere Temperaturhub kann nun für eine gesteigerte Lebensdauer oder erhöhte Stromabgabe genutzt werden.Of the additional thermal path increases the heat dissipation by 20% to 30% and by the same proportion the loss-related Temperature swing in the junction of the semiconductor. This lower temperature swing can now for an increased life or increased power output can be used.
Der zusätzliche Entwärmungspfad beginnt dabei in sehr günstiger Weise auf der heißen Oberseite des Halbleiters und wird durch folgenden Aufbau realisiert:
- 1. Anstelle der üblichen Bonddrähte werden durch Löten, Sintern oder Leitkleben überwiegend ebene Kontaktlaschen zur elektrischen Kontaktierung eingesetzt. Optionen: a. Die Kontaktlasche kann Bestandteil eines zweiten, ausgedehnten Stanzgitters sein. b. Die Kontaktlasche kann in Ihrem Verlauf eine partielle elektrische Isolierung tragen (Isolierlacke, Polyimidschlauch) zur Vermeidung möglicher, montagebedingter Berührungen von potentialtragenden Leiterbahnen oder Bauteilberandungen.
- 2. Auf diesen Kontaktlaschen kann nun durch Löten, Sintern oder Leitkleben eine thermisch und elektrisch leitende Brücke aufgesetzt werden, die den Wärmepfad bis zur Oberfläche des Moldpackages verlängert. Optionen: a. Eine weitere Funktion dieser metallischen Wärmebrücke ist die Gestaltung als nachgiebiges Element. Diese Eigenschaft ist erforderlich, um die technisch bedingten Dickentoleranzen aller gestapelten Materialien durch Nachgeben beim Schließen des Spritzwerkzeugen auszugleichen. Durch eine z. B. ballige Formgebung der Wärmebrücke wird sichergestellt, dass keine positive Dickentoleranz entsteht und so Halbleiterbauelemente durch Schließkraft des Werkzeuges zerstört werden. Nach dem Schließen des Spritzwerkzeuges folgt das Einpressen der Duroplastmasse und das vollständige Ausfüllen der verbliebenen Hohlräume innerhalb des Werkzeuges. Eine weitere Verformung der Wärmebrücke ist danach nicht mehr möglich. b. Die Balligkeit soll vorzugsweise so orientiert werden, dass die konvexe Seite dem Inneren des Moldpacke zugewandt ist. Die konkave Seite ist demnach an äußeren Fläche dem geschlossenen Werkzeug zugewandt. Damit wird erreicht, dass ein Eindringen der Duroplastmasse (das Overmold) zwischen Wärmebrücke und Werkzeugwand verhindert wird. Eine Nacharbeit zur Beseitigung von Duroplast-Flecken entfällt.
- 3. Für viele Anwendungen ist zusätzlich eine potentialfreie Entwärmung erforderlich. Dann wird eine möglichst gut Wärme leitende Keramik (z. B. Aln, Al2O3) unterhalb oder oberhalb der metallischen Wärmebrücke in den Wärmepfad durch Löten, Sintern oder Leitkleben zur elektrischen Isolation eingesetzt. Das Nachgeben der Wärmebrücke ist auch bei Einsatz einer elektrischen Isolation vorteilhaft.
- 4. Optionen: a. Der elektrische Isolator kann ein Wärme leitender Keramikkörper (AlN oder Al2O3) auf der Kontaktlasche des Halbeiters sein. b. Der elektrische Isolator kann eine Wärme leitende Schicht sein, die beispielsweise auf der Wärmebrücke (unten oder oben) durch (kaltgas- oder plasmagespritztes AlN oder Al2O3) aufgebracht ist und dann durch Löten, Sintern oder Kleben stoffschlüssig verbunden wird. c. Der elektrische Isolator kann ein Wärme leitender Keramikkörper (AlN oder Al2O3) oder eine keramische Schicht auf der Außenseite des Moldpackage auf den Flächen der Stanzgitter und der Wärmebrücke
- 1. Instead of the usual bonding wires mainly flat contact tabs are used for electrical contacting by soldering, sintering or conductive bonding. Options: a. The contact tab may be part of a second, extended punched grid. b. The contact tab can carry in its course a partial electrical insulation (insulating coatings, polyimide hose) to avoid mögli holes caused by mounting of potential-carrying conductor tracks or component boundaries.
- 2. On these contact tabs can now be placed by soldering, sintering or conductive bonding a thermally and electrically conductive bridge, which extends the heat path to the surface of Moldpackages. Options: a. Another function of this metallic thermal bridge is the design as a resilient element. This property is necessary to compensate for the technical thickness tolerances of all stacked materials by yielding when closing the injection molds. By a z. B. spherical shaping of the thermal bridge ensures that no positive thickness tolerance arises and so semiconductor devices are destroyed by closing force of the tool. After closing the injection molding tool, pressing in of the thermoset compound and complete filling of the remaining cavities within the tool are followed. Further deformation of the thermal bridge is then no longer possible. b. The crowning should preferably be oriented so that the convex side faces the interior of the moldpack. The concave side is accordingly facing the closed tool on the outer surface. This ensures that penetration of the thermoset compound (the overmold) between the thermal bridge and the tool wall is prevented. There is no need for reworking to remove thermoset stains.
- 3. For many applications additional potential-free cooling is required. Then, as good as possible a heat-conducting ceramic (eg Aln, Al2O3) is used below or above the metallic thermal bridge in the heat path by soldering, sintering or Leitkleben for electrical insulation. The yielding of the thermal bridge is also advantageous when using electrical insulation.
- 4. Options: a. The electrical insulator may be a heat-conducting ceramic body (AlN or Al2O3) on the contact tab of the semiconductor worker. b. The electrical insulator may be a heat-conducting layer, which is applied for example on the thermal bridge (bottom or top) by (cold gas or plasma sprayed AlN or Al2O3) and then bonded by soldering, sintering or gluing. c. The electrical insulator can be a heat-conducting ceramic body (AlN or Al 2 O 3 ) or a ceramic layer on the outside of the mold package on the surfaces of the stamped grid and the thermal bridge
Die unsymmetrische Schrumpfung mit den ungünstigen Formverwerfungen entfält vorteilhafterweise duch die Füllung des Moldkörpers mit dem zusätzlichem Material der Wärmebrücke. Der energieaufwendige Temperprozess entfällt.The asymmetrical shrinkage with the unfavorable shape distortions entfält advantageously through the filling of the mold body with the additional Material of the thermal bridge. Of the energy-intensive annealing process is eliminated.
Weitere Merkmale der Erfindung ergeben sich aus der nachfolgenden Beschreibung anhand eines bevorzugten Ausführungsbeispiels. Dabei zeigt:Further Features of the invention will become apparent from the following description based on a preferred embodiment. Showing:
In
der
Oberhalb
dieser Lasche ist ein wärmeleitender
Körper,
beispielsweise ein keramischer Isolierkörper
Oberhalb dieses wiederum ist (zur Verdeutlichung mit einem tatsächlich so nicht vorhandenen weis belassenen Freiraum) eine metallische Wärmebrücke, z. B. eine balliggeprägte Aluminium- oder Kupferscheibe dargestellt.Above this in turn is (for clarification with one actually so absence of existing white space left) a metallic thermal bridge, z. B. a crowned Aluminum or copper disc shown.
Es kann jedoch auch nur ein wärmeleitender Körper vorgesehen werden, also lediglich eine dünne, isolierende Schicht auf die Leiterlasche aufgelegt werden und dann direkt der thermische Kontakt zu einer Metallscheibe oder auch nur einem keramischen Leitelement gesucht werden.It However, only a thermally conductive body can be provided be just a thin, insulating layer to be placed on the conductor strap and then directly the thermal contact with a metal disc or even only a ceramic guide element to be sought.
In
Wie zuvor ist eine den Kontakte flächig bedeckend ausgebildete Kontaktlasche realisiert, die Balligkeit legt sich ohne Lunker im wesentlichen vollflächig an (d. h. die Balligkeit der Darstellung ist überdeutlich vorgesehen).As previously one of the contacts is flat Covering trained contact lug realized, the crown settles without cavities essentially over the entire surface (that is, the crown the presentation is clear intended).
Das auf dem wenigstens einen flächigen Abschnitt der Kontaktlasche wärmeleitend zur Oberseite des Moldmoduls vorgesehene wenigstens eine wärmeleitende Element zur Ausbildung einer zweiten wärmeableitenden Brücke an die Außenseite des Moduls ist hier ein DCB.The on the at least one flat Section of the contact tab thermally conductive provided at the top of the mold module at least one heat-conducting Element for forming a second heat-dissipating bridge to the outside of the module here is a DCB.
Dass
das wenigstens eine wärmeleitenden Element
zur Oberseite des Umhüllungskörpers eine keramische
Schicht sein kann, ist durch die Schicht
Die
wärmeleitende
metallische Platte kann auch allein eingesetzt werden, sie ist dann
aber bevorzugt durch eine dünne
Isolierschicht – wie
ebenfalls der
Die in einer bevorzugten Ausführungsform vorgeschlagene Balligkeit der metallischen Platte ist mit einer leicht konkaven Wölbung auf den Leistungshalbleiter hin vorgesehen.The proposed in a preferred embodiment The crown of the metallic plate is slightly concave bulge provided on the power semiconductor down.
Naben
der Isolierung oberhalb der Kontaktlasche ist auch der freigeführte Teil
der Lasche (der schmaler sein kann) elektrisch zu isolieren, z.
B. durch einen Schlauch
Das wärmeleitende Element kann ein fester Keramikkörper oder auch eine kompressible, elektrisch und thermisch leitfähige Schicht aus sinterfähigem Metallpartikeln sein.The thermally conductive Element can be a solid ceramic body or else a compressible, electrically and thermally conductive layer made of sinterable Be metal particles.
Claims (8)
Priority Applications (2)
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DE202009000615U DE202009000615U1 (en) | 2009-01-15 | 2009-01-15 | Molding compound power semiconductor element |
PCT/DE2010/000019 WO2010081465A2 (en) | 2009-01-15 | 2010-01-13 | Molding compound-enclosed power semiconductor element |
Applications Claiming Priority (1)
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DE202009000615U DE202009000615U1 (en) | 2009-01-15 | 2009-01-15 | Molding compound power semiconductor element |
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DE202009000615U1 true DE202009000615U1 (en) | 2010-05-27 |
Family
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DE202009000615U Expired - Lifetime DE202009000615U1 (en) | 2009-01-15 | 2009-01-15 | Molding compound power semiconductor element |
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DE (1) | DE202009000615U1 (en) |
WO (1) | WO2010081465A2 (en) |
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DE102012201889A1 (en) * | 2012-02-09 | 2012-10-04 | Conti Temic Microelectronic Gmbh | Electrical power module has electronic components for electrically coupling contact elements, and punched grid that is arranged for coupling contact elements and one side of electronic component |
DE102012204159A1 (en) * | 2012-03-16 | 2013-03-14 | Continental Automotive Gmbh | Power semiconductor module for controlling electric machine in e.g. motor mode, has punching lattice provided with metal strips, where covers of lattice comprise connection between surfaces of electrode with terminal surfaces |
DE102014211524A1 (en) | 2014-06-17 | 2015-12-17 | Robert Bosch Gmbh | Electronic module with a device for heat dissipation of heat generated by a semiconductor device arranged in a plastic housing and method for producing an electronic module |
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US7757392B2 (en) * | 2006-05-17 | 2010-07-20 | Infineon Technologies Ag | Method of producing an electronic component |
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- 2009-01-15 DE DE202009000615U patent/DE202009000615U1/en not_active Expired - Lifetime
-
2010
- 2010-01-13 WO PCT/DE2010/000019 patent/WO2010081465A2/en active Application Filing
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DE102012201889A1 (en) * | 2012-02-09 | 2012-10-04 | Conti Temic Microelectronic Gmbh | Electrical power module has electronic components for electrically coupling contact elements, and punched grid that is arranged for coupling contact elements and one side of electronic component |
DE102012204159A1 (en) * | 2012-03-16 | 2013-03-14 | Continental Automotive Gmbh | Power semiconductor module for controlling electric machine in e.g. motor mode, has punching lattice provided with metal strips, where covers of lattice comprise connection between surfaces of electrode with terminal surfaces |
US9275926B2 (en) | 2013-05-03 | 2016-03-01 | Infineon Technologies Ag | Power module with cooling structure on bonding substrate for cooling an attached semiconductor chip |
DE102014211524A1 (en) | 2014-06-17 | 2015-12-17 | Robert Bosch Gmbh | Electronic module with a device for heat dissipation of heat generated by a semiconductor device arranged in a plastic housing and method for producing an electronic module |
DE102014211524B4 (en) | 2014-06-17 | 2022-10-20 | Robert Bosch Gmbh | Electronic module with a device for dissipating heat generated by a semiconductor device arranged in a plastic housing and method for producing an electronic module |
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DE102014014473C5 (en) | 2014-09-27 | 2022-10-27 | Audi Ag | Process for producing a semiconductor device and corresponding semiconductor device |
US10002821B1 (en) | 2017-09-29 | 2018-06-19 | Infineon Technologies Ag | Semiconductor chip package comprising semiconductor chip and leadframe disposed between two substrates |
Also Published As
Publication number | Publication date |
---|---|
WO2010081465A2 (en) | 2010-07-22 |
WO2010081465A3 (en) | 2010-12-02 |
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