DE19982734T1 - EEPROM-Zelle mit Tunnelung quer über gesamte separate Kanäle - Google Patents
EEPROM-Zelle mit Tunnelung quer über gesamte separate KanäleInfo
- Publication number
- DE19982734T1 DE19982734T1 DE19982734T DE19982734T DE19982734T1 DE 19982734 T1 DE19982734 T1 DE 19982734T1 DE 19982734 T DE19982734 T DE 19982734T DE 19982734 T DE19982734 T DE 19982734T DE 19982734 T1 DE19982734 T1 DE 19982734T1
- Authority
- DE
- Germany
- Prior art keywords
- tunneling
- separate channels
- eeprom cell
- entire separate
- entire
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
- G11C16/0408—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors
- G11C16/0441—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors comprising cells containing multiple floating gate devices, e.g. separate read-and-write FAMOS transistors with connected floating gates
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B41/00—Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates
- H10B41/30—Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates characterised by the memory core region
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B41/00—Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates
- H10B41/60—Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates the control gate being a doped region, e.g. single-poly memory cell
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B69/00—Erasable-and-programmable ROM [EPROM] devices not provided for in groups H10B41/00 - H10B63/00, e.g. ultraviolet erasable-and-programmable ROM [UVEPROM] devices
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Non-Volatile Memory (AREA)
- Semiconductor Memories (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/203,149 US6404006B2 (en) | 1998-12-01 | 1998-12-01 | EEPROM cell with tunneling across entire separated channels |
PCT/US1999/028344 WO2000033384A1 (en) | 1998-12-01 | 1999-11-30 | Eeprom cell with tunneling across entire separated channels |
Publications (1)
Publication Number | Publication Date |
---|---|
DE19982734T1 true DE19982734T1 (de) | 2001-04-26 |
Family
ID=22752718
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE19982734T Withdrawn DE19982734T1 (de) | 1998-12-01 | 1999-11-30 | EEPROM-Zelle mit Tunnelung quer über gesamte separate Kanäle |
Country Status (5)
Country | Link |
---|---|
US (1) | US6404006B2 (de) |
AU (1) | AU1837300A (de) |
DE (1) | DE19982734T1 (de) |
GB (1) | GB2349275A (de) |
WO (1) | WO2000033384A1 (de) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005353984A (ja) * | 2004-06-14 | 2005-12-22 | Seiko Epson Corp | 不揮発性記憶装置 |
TWI266417B (en) * | 2004-11-09 | 2006-11-11 | Powerchip Semiconductor Corp | One-time programmable read only memory and operating method thereof |
US8207580B2 (en) * | 2009-05-29 | 2012-06-26 | Power Integrations, Inc. | Power integrated circuit device with incorporated sense FET |
KR101585970B1 (ko) * | 2009-06-26 | 2016-01-18 | 주식회사 동부하이텍 | 비휘발성 메모리 소자의 제조 방법 |
US8947938B2 (en) * | 2012-09-21 | 2015-02-03 | Taiwan Semiconductor Manufacturing Company, Ltd. | Two-transistor non-volatile memory cell and related program and read methods |
US9450052B1 (en) * | 2015-07-01 | 2016-09-20 | Chengdu Monolithic Power Systems Co., Ltd. | EEPROM memory cell with a coupler region and method of making the same |
Family Cites Families (30)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4037242A (en) | 1975-12-29 | 1977-07-19 | Texas Instruments Incorporated | Dual injector, floating gate MOS electrically alterable, non-volatile semiconductor memory device |
US4715014A (en) | 1985-10-29 | 1987-12-22 | Texas Instruments Incorporated | Modified three transistor EEPROM cell |
US4924278A (en) | 1987-06-19 | 1990-05-08 | Advanced Micro Devices, Inc. | EEPROM using a merged source and control gate |
JP2688492B2 (ja) | 1987-06-19 | 1997-12-10 | アドバンスト・マイクロ・デバイシズ・インコーポレイテッド | 電気的消去可能プログラマブルリードオンリメモリ |
EP0493640B1 (de) | 1990-12-31 | 1995-04-19 | STMicroelectronics S.r.l. | EEPROM-Zelle mit einschichtigem Metallgate und mit einem Lese-Interface des externen Schaltkreises, welches isoliert ist vom Schreib/Lösch-Interface des Programmierungsschaltkreises |
US5640346A (en) | 1992-03-03 | 1997-06-17 | Harris Corporation | Electrically programmable memory cell |
JPH08506693A (ja) | 1992-06-19 | 1996-07-16 | ラティス・セミコンダクター・コーポレイション | 単層の多結晶シリコン層を有するフラッシュe▲上2▼promセル |
WO1994014196A1 (en) | 1992-12-08 | 1994-06-23 | National Semiconductor Corporation | High density contactless flash eprom array using channel erase |
US5440159A (en) | 1993-09-20 | 1995-08-08 | Atmel Corporation | Single layer polysilicon EEPROM having uniform thickness gate oxide/capacitor dielectric layer |
US5504706A (en) | 1993-10-12 | 1996-04-02 | Texas Instruments Incorporated | Low voltage Fowler-Nordheim flash EEPROM memory array utilizing single level poly cells |
US5457652A (en) | 1994-04-01 | 1995-10-10 | National Semiconductor Corporation | Low voltage EEPROM |
US5487033A (en) | 1994-06-28 | 1996-01-23 | Intel Corporation | Structure and method for low current programming of flash EEPROMS |
US5587603A (en) | 1995-01-06 | 1996-12-24 | Actel Corporation | Two-transistor zero-power electrically-alterable non-volatile latch |
US5491657A (en) | 1995-02-24 | 1996-02-13 | Advanced Micro Devices, Inc. | Method for bulk (or byte) charging and discharging an array of flash EEPROM memory cells |
US5596524A (en) | 1995-04-21 | 1997-01-21 | Advanced Micro Devices, Inc. | CMOS memory cell with gate oxide of both NMOS and PMOS transistors as tunneling window for program and erase |
US5742542A (en) | 1995-07-03 | 1998-04-21 | Advanced Micro Devices, Inc. | Non-volatile memory cells using only positive charge to store data |
US5615150A (en) | 1995-11-02 | 1997-03-25 | Advanced Micro Devices, Inc. | Control gate-addressed CMOS non-volatile cell that programs through gates of CMOS transistors |
US5587945A (en) * | 1995-11-06 | 1996-12-24 | Advanced Micro Devices, Inc. | CMOS EEPROM cell with tunneling window in the read path |
DE69610062T2 (de) | 1995-11-21 | 2001-05-03 | Programmable Microelectronics | Nichtflüchtige PMOS-Speicheranordnung mit einer einzigen Polysiliziumschicht |
US5646901A (en) | 1996-03-26 | 1997-07-08 | Advanced Micro Devices, Inc. | CMOS memory cell with tunneling during program and erase through the NMOS and PMOS transistors and a pass gate separating the NMOS and PMOS transistors |
US5942780A (en) | 1996-08-09 | 1999-08-24 | Advanced Micro Devices, Inc. | Integrated circuit having, and process providing, different oxide layer thicknesses on a substrate |
US5761116A (en) * | 1996-10-07 | 1998-06-02 | Advanced Micro Devices, Inc. | Vpp only scalable EEPROM memory cell having transistors with thin tunnel gate oxide |
WO1998019343A1 (en) | 1996-10-28 | 1998-05-07 | Macronix International Co., Ltd. | Memory redundancy circuit using single polysilicon floating gate transistors as redundancy elements |
JPH10223782A (ja) | 1997-02-06 | 1998-08-21 | Toshiba Corp | 不揮発性半導体記憶装置およびその製造方法 |
US5896315A (en) | 1997-04-11 | 1999-04-20 | Programmable Silicon Solutions | Nonvolatile memory |
US5854114A (en) * | 1997-10-09 | 1998-12-29 | Advanced Micro Devices, Inc. | Data retention of EEPROM cell with shallow trench isolation using thicker liner oxide |
US5969992A (en) * | 1998-12-21 | 1999-10-19 | Vantis Corporation | EEPROM cell using P-well for tunneling across a channel |
US6294810B1 (en) * | 1998-12-22 | 2001-09-25 | Vantis Corporation | EEPROM cell with tunneling at separate edge and channel regions |
US5999449A (en) | 1999-01-27 | 1999-12-07 | Vantis Corporation | Two transistor EEPROM cell using P-well for tunneling across a channel |
US6274898B1 (en) * | 1999-05-21 | 2001-08-14 | Vantis Corporation | Triple-well EEPROM cell using P-well for tunneling across a channel |
-
1998
- 1998-12-01 US US09/203,149 patent/US6404006B2/en not_active Expired - Fee Related
-
1999
- 1999-11-30 GB GB0018144A patent/GB2349275A/en not_active Withdrawn
- 1999-11-30 DE DE19982734T patent/DE19982734T1/de not_active Withdrawn
- 1999-11-30 AU AU18373/00A patent/AU1837300A/en not_active Abandoned
- 1999-11-30 WO PCT/US1999/028344 patent/WO2000033384A1/en active Application Filing
Also Published As
Publication number | Publication date |
---|---|
US6404006B2 (en) | 2002-06-11 |
AU1837300A (en) | 2000-06-19 |
GB0018144D0 (en) | 2000-09-13 |
GB2349275A (en) | 2000-10-25 |
WO2000033384A1 (en) | 2000-06-08 |
US20010030343A1 (en) | 2001-10-18 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
ID28990A (id) | Herbisida-herbisida dengan urea aminofenilsulfonil asilasi | |
DE60044477D1 (de) | Brennstoffzelle mit Kühlkanälen enthaltende Separator | |
DE59804824D1 (de) | Speicherzellenanordnung | |
DE60044535D1 (de) | Brennstoffzelle mit dichtungsanordnung | |
DE69908770D1 (de) | Nichtflüchtiges flip flop | |
DE69528329D1 (de) | EEPROM-Speicherzelle | |
ATE290149T1 (de) | Isolier-schiebefenster mit separaten einzelscheiben | |
DE69820910D1 (de) | Verklebungsgegenstand mit verbesserter reversibilität | |
DE69824784D1 (de) | Brennstoffzelle | |
DE69838710D1 (de) | Einziehbare trommel mit kanälen versehenem sperrklinkenmechanismus | |
DE19882486T1 (de) | Synchroner, nicht-flüchtiger Seitenmodus-Speicher | |
DE59912807D1 (de) | Brennstoffzellen-modul | |
DE69706550T2 (de) | Zwei-transistor-flash-speicherzelle | |
DE69907918T2 (de) | Solarzellen-BAUELEMENT | |
DE69812168T2 (de) | Integriertes materialverwaltungsmodul | |
IT1296601B1 (it) | Cellula fotoelettrica ad amplificazione stabilizzata. | |
DE69936199D1 (de) | Sensorpackung mit einer integrierten pfropfenelektrode | |
DE59902207D1 (de) | Monolithischer metallischer wabenkörper mit variierender kanalzahl | |
DE69800462D1 (de) | Brennstoffzelle mit plattenförmigen Reaktantverteilerelementen | |
DE69931695D1 (de) | Geldautomat mit front- und heck-beschickbaren Konfigurationen | |
DE60032851D1 (de) | Kettensägeschwert mit flüssigkeitkanälen | |
DE69929409D1 (de) | Speicherzelle mit kapazitiver Ladung | |
DE69802759T2 (de) | Langfaserverstärkte, thermoplastische Formmasse | |
DE19982734T1 (de) | EEPROM-Zelle mit Tunnelung quer über gesamte separate Kanäle | |
TR199900345A3 (tr) | Kusak yapisi gelistirilmis lastik |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
8139 | Disposal/non-payment of the annual fee |