DE19900833B4 - Testhalterung - Google Patents

Testhalterung Download PDF

Info

Publication number
DE19900833B4
DE19900833B4 DE19900833A DE19900833A DE19900833B4 DE 19900833 B4 DE19900833 B4 DE 19900833B4 DE 19900833 A DE19900833 A DE 19900833A DE 19900833 A DE19900833 A DE 19900833A DE 19900833 B4 DE19900833 B4 DE 19900833B4
Authority
DE
Germany
Prior art keywords
test fixture
fixture
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE19900833A
Other languages
English (en)
Other versions
DE19900833A1 (de
Inventor
David R Van Loan
Markt A Swart
Onge Gary F St
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Delaware Capital Formation Inc
Capital Formation Inc
Original Assignee
Delaware Capital Formation Inc
Capital Formation Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Delaware Capital Formation Inc, Capital Formation Inc filed Critical Delaware Capital Formation Inc
Publication of DE19900833A1 publication Critical patent/DE19900833A1/de
Application granted granted Critical
Publication of DE19900833B4 publication Critical patent/DE19900833B4/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07357—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with flexible bodies, e.g. buckling beams
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Input Circuits Of Receivers And Coupling Of Receivers And Audio Equipment (AREA)
DE19900833A 1998-03-20 1999-01-12 Testhalterung Expired - Fee Related DE19900833B4 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/045,232 US6066957A (en) 1997-09-11 1998-03-20 Floating spring probe wireless test fixture

Publications (2)

Publication Number Publication Date
DE19900833A1 DE19900833A1 (de) 1999-10-07
DE19900833B4 true DE19900833B4 (de) 2007-05-16

Family

ID=21936732

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19900833A Expired - Fee Related DE19900833B4 (de) 1998-03-20 1999-01-12 Testhalterung

Country Status (5)

Country Link
US (1) US6066957A (de)
DE (1) DE19900833B4 (de)
FR (1) FR2776390B1 (de)
GB (1) GB2335548B (de)
IT (1) IT1305735B1 (de)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102007047269A1 (de) * 2007-10-02 2009-04-09 Atg Luther & Maelzer Gmbh Vollrasterkassette für einen Paralleltester zum Testen einer unbestückten Leiterplatte, Federkontaktstift für eine solche Vollrasterkassette sowie Adapter für einen Paralleltester zum Testen einer unbestückten Leiterplatte
DE102009016181A1 (de) 2009-04-03 2010-10-14 Atg Luther & Maelzer Gmbh Kontaktierungseinheit für eine Testvorrichtung zum Testen von Leiterplatten

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JP3104906B2 (ja) * 1997-05-13 2000-10-30 日本電産リード株式会社 基板位置ずれ検出装置および基板位置ずれ検出方法
US6359452B1 (en) * 1998-07-22 2002-03-19 Nortel Networks Limited Method and apparatus for testing an electronic assembly
KR100295228B1 (ko) * 1998-10-13 2001-07-12 윤종용 통합테스트시스템과그를이용한통합테스트공정수행방법
US6265886B1 (en) 1999-07-12 2001-07-24 Micron Technology, Inc. Conductive bump array contactors having an ejector and methods of testing using same
US6262571B1 (en) 1999-11-17 2001-07-17 Agilent Technologies, Inc. Adjustable electrical connector for test fixture nest
US6384617B1 (en) * 1999-11-17 2002-05-07 Agilent Technologies, Inc. Signal transfer device for probe test fixture
US6650134B1 (en) * 2000-02-29 2003-11-18 Charles A. Schein Adapter assembly for connecting test equipment to a wireless test fixture
US6570399B2 (en) 2000-05-18 2003-05-27 Qa Technology Company, Inc. Test probe and separable mating connector assembly
US6876530B2 (en) * 2001-01-12 2005-04-05 Qa Technology Company, Inc. Test probe and connector
US6509752B1 (en) 2001-03-05 2003-01-21 Emc Corporation Testing apparatus with mechanism for preventing damage to unit under test
US6551126B1 (en) * 2001-03-13 2003-04-22 3M Innovative Properties Company High bandwidth probe assembly
US6964828B2 (en) 2001-04-27 2005-11-15 3M Innovative Properties Company Cathode compositions for lithium-ion batteries
US6628130B2 (en) 2001-07-18 2003-09-30 Agilent Technologies, Inc. Wireless test fixture for printed circuit board test systems
US6667628B2 (en) 2002-04-02 2003-12-23 Agilent Technologies, Inc. Method and apparatus for the management of forces in a wireless fixture
US6784675B2 (en) * 2002-06-25 2004-08-31 Agilent Technologies, Inc. Wireless test fixture adapter for printed circuit assembly tester
US6636061B1 (en) * 2002-07-10 2003-10-21 Agilent Technologies, Inc. Method and apparatus for configurable hardware augmented program generation
US6824427B1 (en) * 2003-05-13 2004-11-30 3M Innovative Properties Company Coaxial probe interconnection system
CA2470986C (en) * 2003-06-19 2014-04-22 Rematek Inc. Vacuum-actuated test fixture for testing printed circuit boards
GB2405249B (en) * 2003-08-22 2007-03-07 Ipwireless Inc Holder for module and method therefor
US8988091B2 (en) 2004-05-21 2015-03-24 Microprobe, Inc. Multiple contact probes
US9476911B2 (en) 2004-05-21 2016-10-25 Microprobe, Inc. Probes with high current carrying capability and laser machining methods
US9097740B2 (en) 2004-05-21 2015-08-04 Formfactor, Inc. Layered probes with core
US7659739B2 (en) * 2006-09-14 2010-02-09 Micro Porbe, Inc. Knee probe having reduced thickness section for control of scrub motion
USRE43503E1 (en) 2006-06-29 2012-07-10 Microprobe, Inc. Probe skates for electrical testing of convex pad topologies
US7759949B2 (en) * 2004-05-21 2010-07-20 Microprobe, Inc. Probes with self-cleaning blunt skates for contacting conductive pads
US7301356B2 (en) * 2004-10-28 2007-11-27 Hewlett-Packard Development Company, L.P. Support for a receptacle block of a unit under test
US7227365B2 (en) * 2004-10-28 2007-06-05 Hewlett-Packard Development Company, L.P. Connector insertion apparatus for connecting a testing apparatus to a unit under test
CN100356184C (zh) * 2005-02-03 2007-12-19 芽庄科技股份有限公司 实装板的测试设备
US7649367B2 (en) 2005-12-07 2010-01-19 Microprobe, Inc. Low profile probe having improved mechanical scrub and reduced contact inductance
US7345492B2 (en) * 2005-12-14 2008-03-18 Microprobe, Inc. Probe cards employing probes having retaining portions for potting in a retention arrangement
US7312617B2 (en) 2006-03-20 2007-12-25 Microprobe, Inc. Space transformers employing wire bonds for interconnections with fine pitch contacts
US7616019B2 (en) * 2006-05-08 2009-11-10 Aspen Test Engineering, Inc. Low profile electronic assembly test fixtures
US8907689B2 (en) * 2006-10-11 2014-12-09 Microprobe, Inc. Probe retention arrangement
US7786740B2 (en) * 2006-10-11 2010-08-31 Astria Semiconductor Holdings, Inc. Probe cards employing probes having retaining portions for potting in a potting region
JP5190195B2 (ja) * 2006-11-29 2013-04-24 株式会社日本マイクロニクス 電気的接続装置
CN101201372B (zh) * 2006-12-13 2011-06-29 英业达股份有限公司 电路板测试工具
DE102006059429A1 (de) * 2006-12-15 2008-06-26 Atg Luther & Maelzer Gmbh Modul für eine Prüfvorrichtung zum Testen von Leiterplatten
US7514948B2 (en) 2007-04-10 2009-04-07 Microprobe, Inc. Vertical probe array arranged to provide space transformation
CN101296604A (zh) * 2007-04-24 2008-10-29 鸿富锦精密工业（深圳）有限公司 屏蔽箱体
CA2592901C (en) * 2007-07-13 2012-03-27 Martin Blouin Semi-generic in-circuit test fixture
US8723546B2 (en) 2007-10-19 2014-05-13 Microprobe, Inc. Vertical guided layered probe
US8230593B2 (en) * 2008-05-29 2012-07-31 Microprobe, Inc. Probe bonding method having improved control of bonding material
CN201348650Y (zh) * 2009-01-16 2009-11-18 鸿富锦精密工业（深圳）有限公司 电路板测试治具
US8073019B2 (en) * 2009-03-02 2011-12-06 Jian Liu 810 nm ultra-short pulsed fiber laser
US8907694B2 (en) * 2009-12-17 2014-12-09 Xcerra Corporation Wiring board for testing loaded printed circuit board
US20130014983A1 (en) * 2011-07-14 2013-01-17 Texas Instruments Incorporated Device contactor with integrated rf shield
US9274643B2 (en) 2012-03-30 2016-03-01 Synaptics Incorporated Capacitive charge measurement
CN103777129B (zh) * 2012-10-22 2016-05-25 昆山意力电路世界有限公司 无线双头探针功能测试仪
CN103837818B (zh) * 2012-11-26 2016-12-21 昆山威典电子有限公司 Pcb板测试用无间隙两段式结构
US9470715B2 (en) * 2013-01-11 2016-10-18 Mpi Corporation Probe head
CN103983815A (zh) * 2014-04-28 2014-08-13 昆山明创电子科技有限公司 一种pcb板小针测试治具
CN104007380A (zh) * 2014-05-30 2014-08-27 苏州锟恩电子科技有限公司 一种pcb板测试治具
JP6407128B2 (ja) * 2015-11-18 2018-10-17 三菱電機株式会社 半導体装置の評価装置および半導体装置の評価方法
CN206096201U (zh) * 2016-07-21 2017-04-12 梁永焯 用于半导体晶圆测试的系统、切线探针卡及其探头组件
CN106353540A (zh) * 2016-11-22 2017-01-25 贵州航天计量测试技术研究所 一种低通滤波器测试夹具
TWI663799B (zh) * 2017-10-06 2019-06-21 吳在淑 測試半導體晶片的連接器銷裝置及其製造方法
WO2019089611A1 (en) 2017-10-31 2019-05-09 Formfactor, Inc. Mems probe card assembly having decoupled electrical and mechanical probe connections
CN108225235B (zh) * 2018-04-19 2018-11-13 连晓芳 建筑监测用木板尺寸快速检测装置
CN109975585A (zh) * 2019-03-15 2019-07-05 华为技术有限公司 一种测试装置、测试针及测试针的安装结构
EP3959524A4 (de) 2019-04-26 2023-01-18 FormFactor, Inc. Sonde auf einer trägerarchitektur für vertikale sondenarrays
US20210136356A1 (en) * 2019-11-01 2021-05-06 Magna Electronics Inc. Vehicular camera testing system using spring-loaded electrical connectors
US11818842B1 (en) * 2020-03-06 2023-11-14 Amazon Technologies, Inc. Configurable circuit board for abstracting third-party controls

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4352061A (en) * 1979-05-24 1982-09-28 Fairchild Camera & Instrument Corp. Universal test fixture employing interchangeable wired personalizers
WO1990006518A1 (en) * 1988-11-28 1990-06-14 Cimm, Inc. Wireless test fixture
US5422575A (en) * 1992-06-09 1995-06-06 Everett Charles Technologies, Inc. Test fixture with adjustable bearings and optical alignment system

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US4866375A (en) * 1984-06-22 1989-09-12 Malloy James T Universal test fixture
US4700132A (en) * 1985-05-06 1987-10-13 Motorola, Inc. Integrated circuit test site
US4783624A (en) * 1986-04-14 1988-11-08 Interconnect Devices, Inc. Contact probe devices and method
US4841240A (en) * 1988-01-29 1989-06-20 American Telephone And Telegraph Company, At&T Bell Laboratories Method and apparatus for verifying the continuity between a circuit board and a test fixture
US4977370A (en) * 1988-12-06 1990-12-11 Genrad, Inc. Apparatus and method for circuit board testing
US5157325A (en) * 1991-02-15 1992-10-20 Compaq Computer Corporation Compact, wireless apparatus for electrically testing printed circuit boards
US5510722A (en) * 1992-12-18 1996-04-23 Tti Testron, Inc. Test fixture for printed circuit boards
EP0615131A1 (de) * 1993-03-10 1994-09-14 Co-Operative Facility For Aging Tester Development Sonde für Halbleiterscheiben mit integrierten Schaltelementen
US5493230A (en) * 1994-02-25 1996-02-20 Everett Charles Technologies, Inc. Retention of test probes in translator fixtures
US5485096A (en) * 1994-04-05 1996-01-16 Aksu; Allen Printed circuit board tester having a test bed with spring probes and easily replaceable switch cards
US5543718A (en) * 1994-04-08 1996-08-06 Dcm Industries, Inc. Cable testing device
US5945836A (en) * 1996-10-29 1999-08-31 Hewlett-Packard Company Loaded-board, guided-probe test fixture
JPH10282172A (ja) * 1997-04-07 1998-10-23 Alps Electric Co Ltd 電子機器、並びにその電子機器の測定方法
US5945838A (en) * 1997-06-26 1999-08-31 Star Technology Group, Inc. Apparatus for testing circuit boards

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4352061A (en) * 1979-05-24 1982-09-28 Fairchild Camera & Instrument Corp. Universal test fixture employing interchangeable wired personalizers
WO1990006518A1 (en) * 1988-11-28 1990-06-14 Cimm, Inc. Wireless test fixture
US5422575A (en) * 1992-06-09 1995-06-06 Everett Charles Technologies, Inc. Test fixture with adjustable bearings and optical alignment system

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102007047269A1 (de) * 2007-10-02 2009-04-09 Atg Luther & Maelzer Gmbh Vollrasterkassette für einen Paralleltester zum Testen einer unbestückten Leiterplatte, Federkontaktstift für eine solche Vollrasterkassette sowie Adapter für einen Paralleltester zum Testen einer unbestückten Leiterplatte
US8749259B2 (en) 2007-10-02 2014-06-10 Dtg International Gmbh Full grid cassette for a parallel tester for testing a non-componented printed circuit board, spring contact pin for such a full grid cassette and adapter for a parallel tester for testing a non-componented printed circuit board
DE102009016181A1 (de) 2009-04-03 2010-10-14 Atg Luther & Maelzer Gmbh Kontaktierungseinheit für eine Testvorrichtung zum Testen von Leiterplatten

Also Published As

Publication number Publication date
GB2335548B (en) 2000-01-26
IT1305735B1 (it) 2001-05-15
FR2776390B1 (fr) 2001-12-14
US6066957A (en) 2000-05-23
ITTO981117A0 (it) 1998-12-31
FR2776390A1 (fr) 1999-09-24
DE19900833A1 (de) 1999-10-07
GB2335548A (en) 1999-09-22
GB9827487D0 (en) 1999-02-10
ITTO981117A1 (it) 2000-07-01

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee