DE1548593C

DE1548593C - Optical micrometer for interpolation of a circle division

Info

Publication number: DE1548593C
Application number: DE19641548593
Authority: DE
Inventors: Georg 7080 Aalen Wehhng
Original assignee: Franke & Co Optik GmbH, 6300 Gießen
Priority date: 1964-08-12
Filing date: 1964-08-12
Publication date: 1973-02-15

Description

die vom Abbildungsstrahlengang zweier um 180° versetzter Teilkreisstellen herkommen, bezeichnet.which come from the imaging beam path of two pitch circle points offset by 180 ° are designated.

In Fig. 2 ist das Mikrometer unter Verwendung der gleichen Bezugszeichen um 90° gedreht dargestellt. Mit 2 ist der Teilkreis eines Winkelmeßinstrumentes angedeutet, auf dem zwei um 180° versetzte Teilkreisstellen mit 22 und 23 bezeichnet sind. 24 bezeichnet eine Abbildungsoptik, mit der die Teilkreisstelle 22 über ein Prisma 17 und ein Dachkantenprisma 18 neben die Teilkreisstelle 23 und parallel zu ihr liegend abgebildet ist.In Fig. 2, the micrometer is shown rotated by 90 ° using the same reference numerals. With 2 the pitch circle of an angle measuring instrument is indicated, on which two offset by 180 ° Partial circle points with 22 and 23 are designated. 24 denotes imaging optics with which the pitch circle point 22 via a prism 17 and a roof prism 18 next to the pitch circle point 23 and parallel to it you are shown lying down.

Die gegenläufige mikrometrische Verstellung der dem Mikrometer gegenläufig zugeführten Abbildungsstrahlengänge I und II ergibt sich bei dieser Anordnung in folgender Weise: Beim Drehen des Triebknopfes 7 werden die Planplatten 8 und 9 gemeinsam in gleicher Richtung um die Achse 4 verschwenkt und nehmen die in der F i g. 2 gestrichelt angedeutete Lage ein. Beim Durchgang durch die Planplatte 8 werden dabei beide Strahlengänge um einen bestimmten Betrag, der in der F i g. 2 mit α bezeichnet ist, versetzt. Beide Strahlengänge durchlaufen nun das seitenvertauschende Abbe-Prisma 15. Der Abbildungsstrahlengang I durchläuft nun, wie aus Fig. 1 zu ersehen ist, eine dem optischen Wegausgleich dienende feststehende Planplatte und gelangt ohne weitere Strahlversetzung zum Punkt 19 der Bildebene 20. Der Abbildungsstrahlengang II wird durch die verschwenkte Planplatte 9, die die doppelte Stärke der Planplatte 8 hat, um den Betrag .2 α versetzt und trifft im Punkt 21 auf die BildebeneThe opposite micrometric adjustment of the imaging beam paths I and II fed in opposite directions to the micrometer results in the following way with this arrangement: When the drive knob 7 is turned, the plane plates 8 and 9 are pivoted together in the same direction about the axis 4 and take the positions shown in FIG . 2 position indicated by dashed lines. When passing through the plane plate 8, both beam paths are thereby reduced by a certain amount, which is shown in FIG. 2 is denoted by α , offset. Both beam paths now pass through the laterally reversing Abbe prism 15. The imaging beam path I now, as can be seen from FIG the pivoted plane plate 9, which has twice the thickness of the plane plate 8, offset by the amount .2 α and hits the image plane at point 21

20. Damit ist durch die Verschwenkung des Teiles 3 der Abbildungsstrahlengang I um den gleichen Betrag nach links versetzt worden wie der Abbildungsstrahlengang II nach rechts. Es ist also eine zur Mitte symmetrische gegenläufige Bewegung der Bilder der beiden Teilkreisstellen erreicht. Die Größe der zur Koinzidenzbildung erforderlichen Verschiebung der Planplatten ist auf der mitverschwenkten Skalenplatte 10 ablesbar. Die Wirkungsweise der Bildtrennvorrichtung 11 und 12 wurde, da sie einer für diesen Zweck üblichen Anordnung entspricht, nicht näher erläutert. Ebenso erübrigt es sich, auf das Aussehen der Maskenplatte, die der Abgrenzung des Gesichtsfeldes dient, näher einzugehen.20. As a result of the pivoting of the part 3, the imaging beam path I is by the same amount has been shifted to the left like the imaging beam path II to the right. So it's one to the middle symmetrical opposite movement of the images of the two partial circle points achieved. The size of the Coincidence formation required shift of the plane plates is on the also pivoted scale plate 10 readable. How the image separator works 11 and 12, since they correspond to an arrangement customary for this purpose, have not been specified explained. There is also no need to look at the appearance of the mask plate or the delimitation of the field of view serves to go into more detail.

Der Erfindungsgedanke, die Gegenläufigkeit von dem Mikrometer als gegenläufige Bilder angebotenen Teilkreisstellen mit zwei die Abbildungsstrahlengänge in gleicher Richtung strahlversetzenden optischen Elemente, zwischen denen ein seitenvertausehendes optisches Element angeordnet ist, vorzunehmen, kann, wie ersichtlich, auch in anderer Weise verwirklicht werden, als es im Ausführungsbeispiel dargestellt ist und ist z. B. nicht an die Verwendung von Planplatten zur Strahlversetzung gebunden. Auch kann die Seitenvertauschung durch andere bekannte optische Elemente erfolgen. Ebenso ist es möglich, abweichend vom Ausführungsbeispiel, zuerst nur bei einem der Abbildungsstrahlengänge eine Strahlversetzung vorzunehmen und erst nach der Seitenvertau- schung beider Abbildungsstrahlengänge die Versetzung bei beiden Strahlengängen durchzuführen.The idea of the invention, the counter-rotation offered by the micrometer as counter-rotating images Partial circle points with two optical beams which offset the imaging beam paths in the same direction To make elements between which a side-facing optical element is arranged, can, as can be seen, also be implemented in a different way than shown in the exemplary embodiment is and is z. B. not tied to the use of plane plates for beam displacement. Also the sides can be swapped using other known optical elements. It is also possible deviating from the exemplary embodiment, first only carry out a beam offset in one of the imaging beam paths and only after the lateral confusion With the help of both imaging beam paths, the displacement can be carried out in both beam paths.

Hierzu 1 Blatt Zeichnungen1 sheet of drawings

Claims

1 2 from one in the imaging beam path of the system

1. Optical micrometer for interpolation separating edge and one in the imaging beam path a circular division, consisting of an optical 5 of the system arranged optical element for the Sei system for imaging the tick marks of two reversal of the imaging beam bundle Reading points offset from one another by 180 ° in which the images of both reading points are transmitted to the optical a common image plane in such a way that these are fed to the system in such a way that they are in front of the stand opposite at a separating edge, move in opposite directions from a system while rotating the circle, arranged in the imaging beam path of the system to improve such known micrometers Neten device for measurable and counter-rotating is proposed according to the invention that gene shifting of both tick marks on the device for shifting the tick mark separating edge and one in the imaging beam transmitter of two in the imaging beam path of the optigang of the system arranged optical EIe see systems arranged one behind the other optical element is formed for the lateral reversal of the imaging 15 elements, one of which is the bundle of rays, in which the images of both display beam paths of the images of both reading points One is fed to the optical system in this way and the other is only the imaging beam path are that these are in front of the system when a reading point is rotated in the sense of the image verdes in the same direction Move the circle in opposite directions, thereby influencing the shift and by the fact that the that the device (1,4,7, 20 hene side-swapping element in Figure 8, 9) to move the partial line images from the beam path of both images between the elements two is arranged in the imaging beam path of the system (16).

optical elements arranged one behind the other. This design enables the

ten (8, 9), of which one (8) to train the optic micrometer gear-free, d. H., Formation beam path of the images of both readings 25 the means for shifting the opposite direction of the set (I, II) and the other (9) the imaging optical system supplied images of the two radiation paths only one reading point (11) in the sense of reading points can be rigidly coupled to one another, the image shift in the same direction, which causes certain measurement errors caused by wear and tear in that the side-swapping egg phenomena occur are avoided. It is too ment (15) in the imaging beam path of both images 30 possible, the imaging beam path of both readings is arranged between the elements. put up relatively far in front of the common image plane

2. Optical micrometer according to claim 1, to merge and only impenetrate both beam paths characterized in that to separate the beam displacement indirectly in front of this image plane. These too two jointly pivoted, measure in the beam path increases the measurement reliability, plane-parallel plates arranged one behind the other (8 35 A particularly simple arrangement is obtained and 9) are provided, between which a three- if the beam displacement is through in the beam path fold reflective Abbe prism (15) is arranged, pivotable optical elements, such as plane-parallel the flat plate facing the circular graduation, 'which is rigidly distributed with a micrometer graduation (8) and the Abbe prism (15) can be of both images.

tion beam paths, which the image separating device 40 It is also advantageous, the coincidence formation of the device facing plane plate (9) only from one of the graduation lines in the middle of their original distance imaging beam paths is interspersed. to bring about. This can be done in that

3. Optical micrometer according to claim 2, that only from one of the imaging beam paths characterized in that the optical element which precedes the image separation is doubled direction facing plane plate (9) has the double 45 large beam-displacing effect, like the other Thickness of the plan optical element facing the circle division. When using verplatte (8) has. swiveling plane-parallel plates for beam displacement

4. Optical micrometer according to claim 2 tongue can be achieved in that the one plate or 3, characterized in that it has twice the strength of the other. pivotable plane plates (8, 9) rigid with a 5 ° The invention is based on the F i g. 1 and 2, the Micrometer graduation (10) are connected. show an embodiment will be explained.

5. Optical micrometer according to one of the preceding. 1 shows a micrometer for an angle measuring device 2 to 4, characterized in that in instrument; in

only one swiveling plane plate through- F i g. 2 is a schematic of the beam path of this mini

A fixed imaging beam path is indicated.

outgoing plane plate (14) to the optical path out- In F i g. 1 is the same as 1 with a not shown is arranged. ten angle measuring instrument firmly connected frame

a micrometer, on which a part 3 pivoted about the axis 4 is arranged

60 is. This is via a ring gear 5 and a pinion 6 can be rotated against the frame 1 by turning the drive knob 7. There is a lens on the frame 1

The invention relates to an optical Mi- 16, a triple reflecting Abbe prism 15, a Krometer for the interpolation of a circle division, best flat plate 14, one of the prisms 11 and 12 consisting consisting of an optical system for imaging the image separating device and a mask plate Tick marks of two 13 offset from one another by 180 ° are attached. The pivotable part 3 carries Reading points in a common image plane such, 2 flat plates 8 and 9 and one with a Verdaß scale these face each other at a separating edge, see plate 10. With I and II are the main rays,