DE112022006203T5 - Vorrichtung für maschinelles Lernen, Abgasanalysevorrichtung, Verfahren für maschinelles Lernen, Abgasanalyseverfahren, Programm für maschinelles Lernen und Abgasanalyseprogramm - Google Patents

Vorrichtung für maschinelles Lernen, Abgasanalysevorrichtung, Verfahren für maschinelles Lernen, Abgasanalyseverfahren, Programm für maschinelles Lernen und Abgasanalyseprogramm Download PDF

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Publication number
DE112022006203T5
DE112022006203T5 DE112022006203.7T DE112022006203T DE112022006203T5 DE 112022006203 T5 DE112022006203 T5 DE 112022006203T5 DE 112022006203 T DE112022006203 T DE 112022006203T DE 112022006203 T5 DE112022006203 T5 DE 112022006203T5
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concentration
exhaust gas
machine learning
specific component
data
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DE112022006203.7T
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German (de)
English (en)
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Makoto Nagaoka
Takashi Saito
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Horiba Ltd
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Horiba Ltd
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N20/00—Machine learning
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N20/00—Machine learning
    • G06N20/10—Machine learning using kernel methods, e.g. support vector machines [SVM]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00—Computing arrangements based on biological models
    • G06N3/02—Neural networks
    • G06N3/04—Architecture, e.g. interconnection topology
    • G06N3/045—Combinations of networks
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00—Computing arrangements based on biological models
    • G06N3/02—Neural networks
    • G06N3/08—Learning methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N2021/3595—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using FTIR
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/02—Mechanical
    • G01N2201/021—Special mounting in general
    • G01N2201/0216—Vehicle borne

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Software Systems (AREA)
  • General Physics & Mathematics (AREA)
  • Computing Systems (AREA)
  • Artificial Intelligence (AREA)
  • Mathematical Physics (AREA)
  • Data Mining & Analysis (AREA)
  • Evolutionary Computation (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Medical Informatics (AREA)
  • Health & Medical Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Biophysics (AREA)
  • Biomedical Technology (AREA)
  • Molecular Biology (AREA)
  • Computational Linguistics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
DE112022006203.7T 2021-12-28 2022-10-26 Vorrichtung für maschinelles Lernen, Abgasanalysevorrichtung, Verfahren für maschinelles Lernen, Abgasanalyseverfahren, Programm für maschinelles Lernen und Abgasanalyseprogramm Pending DE112022006203T5 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2021213871 2021-12-28
JP2021-213871 2021-12-28
PCT/JP2022/039964 WO2023127262A1 (ja) 2021-12-28 2022-10-26 機械学習装置、排ガス分析装置、機械学習方法、排ガス分析方法、機械学習プログラム、及び、排ガス分析プログラム

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DE112022006203T5 true DE112022006203T5 (de) 2024-10-31

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DE112022006203.7T Pending DE112022006203T5 (de) 2021-12-28 2022-10-26 Vorrichtung für maschinelles Lernen, Abgasanalysevorrichtung, Verfahren für maschinelles Lernen, Abgasanalyseverfahren, Programm für maschinelles Lernen und Abgasanalyseprogramm

Country Status (4)

Country Link
US (1) US20240418638A1 (https=)
JP (1) JPWO2023127262A1 (https=)
DE (1) DE112022006203T5 (https=)
WO (1) WO2023127262A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117233120B (zh) * 2023-11-14 2024-02-09 山东大学 基于机器学习和高光谱图像的污染气体检测方法及系统

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000346801A (ja) 1999-06-04 2000-12-15 Horiba Ltd Ｆｔｉｒ法による多成分ガス分析方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11248963B2 (en) * 2017-01-23 2022-02-15 Honeywell International, Inc. Equipment and method for three-dimensional radiance and gas species field estimation in an open combustion environment
WO2018165029A1 (en) * 2017-03-06 2018-09-13 Ion Engineering, Llc Carbon dioxide capture system and spectroscopic evaluation thereof
EP3667295B1 (en) * 2017-08-07 2025-04-30 Horiba, Ltd. ANALYSIS DEVICE, ANALYSIS METHOD AND ANALYSIS PROGRAM
JP7014701B2 (ja) * 2018-12-14 2022-02-01 株式会社堀場製作所 光学分析装置、並びに光学分析装置に用いられる機械学習装置及びその方法
JP7335727B2 (ja) * 2019-06-07 2023-08-30 株式会社堀場製作所 排ガス分析装置、排ガス分析方法、排ガス分析用プログラム及び機械学習装置
JP6964114B2 (ja) * 2019-06-25 2021-11-10 株式会社堀場製作所 分析装置、分析方法及び分析装置用プログラム

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000346801A (ja) 1999-06-04 2000-12-15 Horiba Ltd Ｆｔｉｒ法による多成分ガス分析方法

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US20240418638A1 (en) 2024-12-19
WO2023127262A1 (ja) 2023-07-06
JPWO2023127262A1 (https=) 2023-07-06

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