DE112014002373T8 - Verfahren zum schätzen der lebensdauer eines organischen el-elements, verfahren zum produzieren einer lebensdauerschätzeinrichtung und eine lichtemittierende einrichtung - Google Patents

Verfahren zum schätzen der lebensdauer eines organischen el-elements, verfahren zum produzieren einer lebensdauerschätzeinrichtung und eine lichtemittierende einrichtung Download PDF

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Publication number
DE112014002373T8
DE112014002373T8 DE112014002373.6T DE112014002373T DE112014002373T8 DE 112014002373 T8 DE112014002373 T8 DE 112014002373T8 DE 112014002373 T DE112014002373 T DE 112014002373T DE 112014002373 T8 DE112014002373 T8 DE 112014002373T8
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DE
Germany
Prior art keywords
life
estimating
organic
producing
light emitting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
DE112014002373.6T
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English (en)
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DE112014002373T5 (de
Inventor
Kazunori Sugimoto
Toshihiro Yoshioka
Tetsuo Tsutsui
Satoshi Miyaguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CHEMICAL MATERIALS EVALUATION AND RES BASE
CHEMICAL MATERIALS EVALUATION AND RESEARCH BASE
Original Assignee
CHEMICAL MATERIALS EVALUATION AND RES BASE
CHEMICAL MATERIALS EVALUATION AND RESEARCH BASE
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Publication date
Application filed by CHEMICAL MATERIALS EVALUATION AND RES BASE, CHEMICAL MATERIALS EVALUATION AND RESEARCH BASE filed Critical CHEMICAL MATERIALS EVALUATION AND RES BASE
Publication of DE112014002373T5 publication Critical patent/DE112014002373T5/de
Application granted granted Critical
Publication of DE112014002373T8 publication Critical patent/DE112014002373T8/de
Ceased legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2642—Testing semiconductor operation lifetime or reliability, e.g. by accelerated life tests
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2632—Circuits therefor for testing diodes
    • G01R31/2635—Testing light-emitting diodes, laser diodes or photodiodes
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/22—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources
    • G09G3/30—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels
    • G09G3/32—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED]
    • G09G3/3208—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED]
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K50/00—Organic light-emitting devices
    • H10K50/80—Constructional details
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2320/00—Control of display operating conditions
    • G09G2320/04—Maintaining the quality of display appearance
    • G09G2320/041—Temperature compensation
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2320/00—Control of display operating conditions
    • G09G2320/04—Maintaining the quality of display appearance
    • G09G2320/043—Preventing or counteracting the effects of ageing
    • G09G2320/048—Preventing or counteracting the effects of ageing using evaluation of the usage time
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H10K71/70—Testing, e.g. accelerated lifetime tests

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • Optics & Photonics (AREA)
  • Manufacturing & Machinery (AREA)
  • Electroluminescent Light Sources (AREA)
DE112014002373.6T 2013-11-29 2014-11-28 Verfahren zum schätzen der lebensdauer eines organischen el-elements, verfahren zum produzieren einer lebensdauerschätzeinrichtung und eine lichtemittierende einrichtung Ceased DE112014002373T8 (de)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
JP2013-247990 2013-11-29
JP2013247990 2013-11-29
JP2014-112137 2014-05-30
JP2014112137 2014-05-30
PCT/JP2014/081580 WO2015080250A1 (ja) 2013-11-29 2014-11-28 有機ｅｌ素子の寿命推定方法、寿命推定装置及び製造方法、並びに発光装置

Publications (2)

Publication Number Publication Date
DE112014002373T5 DE112014002373T5 (de) 2016-01-21
DE112014002373T8 true DE112014002373T8 (de) 2016-03-10

Family

ID=53199185

Family Applications (1)

Application Number Title Priority Date Filing Date
DE112014002373.6T Ceased DE112014002373T8 (de) 2013-11-29 2014-11-28 Verfahren zum schätzen der lebensdauer eines organischen el-elements, verfahren zum produzieren einer lebensdauerschätzeinrichtung und eine lichtemittierende einrichtung

Country Status (5)

Country Link
US (1) US20160103171A1 (de)
JP (1) JP5870233B2 (de)
KR (1) KR101605300B1 (de)
DE (1) DE112014002373T8 (de)
WO (1) WO2015080250A1 (de)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6308777B2 (ja) * 2013-12-25 2018-04-11 Eizo株式会社 寿命予測方法、寿命予測プログラム及び寿命予測装置
US10748497B2 (en) * 2016-12-27 2020-08-18 Semiconductor Energy Laboratory Co., Ltd. Light-emitting element, light-emitting device, electronic device, and lighting device
JP2018107449A (ja) * 2016-12-27 2018-07-05 株式会社半導体エネルギー研究所 発光素子、発光装置、電子機器、および照明装置
CN107204170A (zh) * 2017-07-21 2017-09-26 京东方科技集团股份有限公司 一种色偏补偿方法、色偏补偿系统和显示面板
KR102593264B1 (ko) * 2018-08-14 2023-10-26 삼성전자주식회사 디스플레이 드라이버 및 이를 포함하는 유기발광 표시장치
US20220170883A1 (en) * 2019-05-15 2022-06-02 Lg Chem, Ltd. Method for selecting material for organic light-emitting device
JP7361624B2 (ja) * 2020-02-12 2023-10-16 東京エレクトロン株式会社 加熱源の寿命推定システム、寿命推定方法、および検査装置
US11587503B2 (en) * 2020-11-11 2023-02-21 Novatek Microelectronics Corp. Method of and display control device for emulating OLED degradation for OLED display panel
KR20230049187A (ko) * 2021-10-05 2023-04-13 삼성디스플레이 주식회사 표시 장치 및 그의 열화 보상 방법
KR20230060620A (ko) 2021-10-27 2023-05-08 삼성디스플레이 주식회사 표시 장치 및 표시 장치의 구동 방법
CN115902465B (zh) * 2022-11-10 2024-02-20 中国原子能科学研究院 辐伏转换器件的参数确定方法、装置、设备及介质

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005055909A (ja) * 2003-08-07 2005-03-03 Barco Nv Ｏｌｅｄディスプレイ素子、それを制御するための制御装置、およびその耐用年数を最適化するための方法
JP2005283608A (ja) * 2004-03-26 2005-10-13 Fuji Photo Film Co Ltd 有機ｅｌ発光素子の経時劣化予測方法、駆動方法およびプリエージング方法
JP2007012581A (ja) * 2005-05-31 2007-01-18 Kyocera Corp 有機発光装置の製造方法
JP2007258275A (ja) 2006-03-20 2007-10-04 Institute Of Physical & Chemical Research 有機エレクトロルミネッセンス素子、有機エレクトロルミネッセンス素子のエイジング方法、有機エレクトロルミネッセンス素子の評価方法およびその装置
JP2007287971A (ja) * 2006-04-18 2007-11-01 Sony Corp 焼き付き補正速度調整装置、自発光表示装置及びコンピュータプログラム
US7355574B1 (en) * 2007-01-24 2008-04-08 Eastman Kodak Company OLED display with aging and efficiency compensation
JP5246433B2 (ja) * 2009-09-18 2013-07-24 ソニー株式会社 表示装置

Also Published As

Publication number Publication date
JPWO2015080250A1 (ja) 2017-03-16
KR20150136138A (ko) 2015-12-04
KR101605300B1 (ko) 2016-03-21
JP5870233B2 (ja) 2016-02-24
DE112014002373T5 (de) 2016-01-21
US20160103171A1 (en) 2016-04-14
WO2015080250A1 (ja) 2015-06-04

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