DE112005003818A5 - Korrektiv zur Beseitigung des Öffnungsfehlers 3. Ordnung und des axialen Farbfehlers 1. Ordnung 1. Grades - Google Patents

Korrektiv zur Beseitigung des Öffnungsfehlers 3. Ordnung und des axialen Farbfehlers 1. Ordnung 1. Grades Download PDF

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Publication number
DE112005003818A5
DE112005003818A5 DE112005003818T DE112005003818T DE112005003818A5 DE 112005003818 A5 DE112005003818 A5 DE 112005003818A5 DE 112005003818 T DE112005003818 T DE 112005003818T DE 112005003818 T DE112005003818 T DE 112005003818T DE 112005003818 A5 DE112005003818 A5 DE 112005003818A5
Authority
DE
Germany
Prior art keywords
order
aberration
corrective
elimination
axial chromatic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
DE112005003818T
Other languages
German (de)
English (en)
Inventor
Heiko Müller
Harald Rose
Stephan Uhlemann
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CEOS GmbH
CEOS Corrected Electron Optical Systems GmbH
Original Assignee
CEOS GmbH
CEOS Corrected Electron Optical Systems GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by CEOS GmbH, CEOS Corrected Electron Optical Systems GmbH filed Critical CEOS GmbH
Publication of DE112005003818A5 publication Critical patent/DE112005003818A5/de
Withdrawn legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
    • H01J37/153—Electron-optical or ion-optical arrangements for the correction of image defects, e.g. stigmators
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/153—Correcting image defects, e.g. stigmators
    • H01J2237/1534—Aberrations

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Beam Exposure (AREA)
DE112005003818T 2005-12-06 2005-12-06 Korrektiv zur Beseitigung des Öffnungsfehlers 3. Ordnung und des axialen Farbfehlers 1. Ordnung 1. Grades Withdrawn DE112005003818A5 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/DE2005/002210 WO2007065382A1 (de) 2005-12-06 2005-12-06 Korrektiv zur beseitigung des öffnungsfehlers 3. ordnung und des axialen farbfehlers 1. ordnung 1. grades

Publications (1)

Publication Number Publication Date
DE112005003818A5 true DE112005003818A5 (de) 2008-11-13

Family

ID=36729287

Family Applications (1)

Application Number Title Priority Date Filing Date
DE112005003818T Withdrawn DE112005003818A5 (de) 2005-12-06 2005-12-06 Korrektiv zur Beseitigung des Öffnungsfehlers 3. Ordnung und des axialen Farbfehlers 1. Ordnung 1. Grades

Country Status (5)

Country Link
US (1) US7989776B2 (https=)
EP (1) EP1958231B1 (https=)
JP (1) JP4848017B2 (https=)
DE (1) DE112005003818A5 (https=)
WO (1) WO2007065382A1 (https=)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4851268B2 (ja) * 2006-08-31 2012-01-11 日本電子株式会社 収差補正方法および電子線装置
DE102007007923A1 (de) * 2007-02-14 2008-08-21 Carl Zeiss Nts Gmbh Phasenschiebendes Element und Teilchenstrahlgerät mit phasenschiebenden Element
DE102007045874A1 (de) 2007-09-25 2009-04-02 Ceos Corrected Electron Optical Systems Gmbh Multipolspulen
DE102007049816B3 (de) * 2007-10-20 2009-04-16 Ceos Corrected Electron Optical Systems Gmbh Korrektor
DE102007058443B4 (de) * 2007-12-05 2010-05-06 Ceos Corrected Electron Optical Systems Gmbh Korrektor für axialen und außeraxialen Strahlengang und TEM damit
DE102009010774A1 (de) * 2009-02-26 2010-11-11 Ceos Corrected Electron Optical Systems Gmbh Verfahren und Vorrichtung zur Bildkontrasterzeugung durch Phasenschiebung
US8373136B2 (en) * 2009-10-15 2013-02-12 Ict Integrated Circuit Testing Gesellschaft Fur Halbleiterpruftechnik Mbh Achromatic beam deflector, achromatic beam separator, charged particle device, method of operating an achromatic beam deflector, and method of operating an achromatic beam separator
DE102010054541A1 (de) * 2010-12-15 2012-06-21 Ceos Corrected Electron Optical Systems Gmbh Korrektor
DE102011009954A1 (de) * 2011-02-01 2012-08-02 Ceos Corrected Electron Optical Systems Gmbh Korrektor
US8536538B2 (en) * 2011-02-16 2013-09-17 Kla-Tencor Corporation Multiple-pole electrostatic deflector for improving throughput of focused electron beam instruments
JP2013030374A (ja) * 2011-07-29 2013-02-07 Jeol Ltd 電子顕微鏡
JP5934517B2 (ja) * 2012-02-24 2016-06-15 日本電子株式会社 色収差補正装置及び色収差補正装置の制御方法
US9275817B2 (en) 2012-04-09 2016-03-01 Frederick Wight Martin Particle-beam column corrected for both chromatic and spherical aberration
US8541755B1 (en) * 2012-05-09 2013-09-24 Jeol Ltd. Electron microscope
US10103004B2 (en) 2015-07-02 2018-10-16 ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH System and method for imaging a secondary charged particle beam with adaptive secondary charged particle optics
JP6647854B2 (ja) * 2015-12-22 2020-02-14 日本電子株式会社 収差補正方法および荷電粒子線装置
US20240006148A1 (en) * 2021-01-12 2024-01-04 Hitachi High-Tech Corporation Aberration corrector and electron microscope

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10001277A1 (de) 2000-01-14 2001-07-19 Harald Rose Elektronenoptischer Korrektor zur Beseitigung der Bildfehler dritter Ordnung
DE10159308A1 (de) 2001-12-04 2003-06-12 Ceos Gmbh Teilchenoptischer Korrektor
DE10159454B4 (de) * 2001-12-04 2012-08-02 Carl Zeiss Nts Gmbh Korrektor zur Korrektion von Farbfehlern erster Ordnung, ersten Grades
JP4204902B2 (ja) * 2002-06-28 2009-01-07 日本電子株式会社 収差補正装置を備えた荷電粒子ビーム装置
US6770887B2 (en) 2002-07-08 2004-08-03 Ondrej L. Krivanek Aberration-corrected charged-particle optical apparatus

Also Published As

Publication number Publication date
WO2007065382A1 (de) 2007-06-14
EP1958231B1 (de) 2018-05-23
US7989776B2 (en) 2011-08-02
EP1958231A1 (de) 2008-08-20
JP2009518784A (ja) 2009-05-07
US20080283749A1 (en) 2008-11-20
JP4848017B2 (ja) 2011-12-28

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