DE10238562A1 - Submikrometergenauigkeits-Kantendetektor - Google Patents

Submikrometergenauigkeits-Kantendetektor

Info

Publication number
DE10238562A1
DE10238562A1 DE2002138562 DE10238562A DE10238562A1 DE 10238562 A1 DE10238562 A1 DE 10238562A1 DE 2002138562 DE2002138562 DE 2002138562 DE 10238562 A DE10238562 A DE 10238562A DE 10238562 A1 DE10238562 A1 DE 10238562A1
Authority
DE
Germany
Prior art keywords
optical
optical power
light beam
optical fiber
detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
DE2002138562
Other languages
German (de)
English (en)
Inventor
John Bernard Medberry
Edward Steketee
James D Adams
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US09/935,018 external-priority patent/US6806484B2/en
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of DE10238562A1 publication Critical patent/DE10238562A1/de
Withdrawn legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/028Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring lateral position of a boundary of the object
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01VGEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V8/00Prospecting or detecting by optical means
    • G01V8/10Detecting, e.g. by using light barriers
    • G01V8/12Detecting, e.g. by using light barriers using one transmitter and one receiver
    • G01V8/16Detecting, e.g. by using light barriers using one transmitter and one receiver using optical fibres

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geophysics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
DE2002138562 2001-08-22 2002-08-22 Submikrometergenauigkeits-Kantendetektor Withdrawn DE10238562A1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/935,018 US6806484B2 (en) 2001-08-22 2001-08-22 Sub-micron accuracy edge detector
US09/967,448 US6765223B2 (en) 2001-08-22 2001-09-28 Sub-micron accuracy edge detector

Publications (1)

Publication Number Publication Date
DE10238562A1 true DE10238562A1 (de) 2003-03-27

Family

ID=27130067

Family Applications (2)

Application Number Title Priority Date Filing Date
DE2002138562 Withdrawn DE10238562A1 (de) 2001-08-22 2002-08-22 Submikrometergenauigkeits-Kantendetektor
DE2002138599 Withdrawn DE10238599A1 (de) 2001-08-22 2002-08-22 Submikrometergenauigkeits-Kantendetektor

Family Applications After (1)

Application Number Title Priority Date Filing Date
DE2002138599 Withdrawn DE10238599A1 (de) 2001-08-22 2002-08-22 Submikrometergenauigkeits-Kantendetektor

Country Status (2)

Country Link
JP (1) JP2003075111A (enExample)
DE (2) DE10238562A1 (enExample)

Also Published As

Publication number Publication date
DE10238599A1 (de) 2003-03-13
JP2003075111A (ja) 2003-03-12

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
8130 Withdrawal