DE102019115573B4 - Power electronic switching device and method of manufacture - Google Patents
Power electronic switching device and method of manufacture Download PDFInfo
- Publication number
- DE102019115573B4 DE102019115573B4 DE102019115573.8A DE102019115573A DE102019115573B4 DE 102019115573 B4 DE102019115573 B4 DE 102019115573B4 DE 102019115573 A DE102019115573 A DE 102019115573A DE 102019115573 B4 DE102019115573 B4 DE 102019115573B4
- Authority
- DE
- Germany
- Prior art keywords
- electrically conductive
- thickness
- conductive film
- contact surface
- switching device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
- H01L23/4985—Flexible insulating substrates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/36—Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
- H01L23/373—Cooling facilitated by selection of materials for the device or materials for thermal expansion adaptation, e.g. carbon
- H01L23/3735—Laminates or multilayers, e.g. direct bond copper ceramic substrates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/48—Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
- H01L21/4814—Conductive parts
- H01L21/4871—Bases, plates or heatsinks
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/40—Mountings or securing means for detachable cooling or heating arrangements ; fixed by friction, plugs or springs
- H01L23/4093—Snap-on arrangements, e.g. clips
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/42—Fillings or auxiliary members in containers or encapsulations selected or arranged to facilitate heating or cooling
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/02—Bonding areas ; Manufacturing methods related thereto
- H01L24/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L24/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/50—Tape automated bonding [TAB] connectors, i.e. film carriers; Manufacturing methods related thereto
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/71—Means for bonding not being attached to, or not being formed on, the surface to be connected
- H01L24/72—Detachable connecting means consisting of mechanical auxiliary parts connecting the device, e.g. pressure contacts using springs or clips
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L24/86—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using tape automated bonding [TAB]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/90—Methods for connecting semiconductor or solid state bodies using means for bonding not being attached to, or not being formed on, the body surface to be connected, e.g. pressure contacts using springs or clips
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/03—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
- H01L25/04—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L25/07—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L29/00
- H01L25/072—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L29/00 the devices being arranged next to each other
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/03—Manufacturing methods
- H01L2224/033—Manufacturing methods by local deposition of the material of the bonding area
- H01L2224/0333—Manufacturing methods by local deposition of the material of the bonding area in solid form
- H01L2224/03334—Manufacturing methods by local deposition of the material of the bonding area in solid form using a preform
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/03—Manufacturing methods
- H01L2224/035—Manufacturing methods by chemical or physical modification of a pre-existing or pre-deposited material
- H01L2224/03505—Sintering
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/04026—Bonding areas specifically adapted for layer connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/0405—Bonding areas specifically adapted for tape automated bonding [TAB] connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/05001—Internal layers
- H01L2224/05075—Plural internal layers
- H01L2224/0508—Plural internal layers being stacked
- H01L2224/05082—Two-layer arrangements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/0554—External layer
- H01L2224/05599—Material
- H01L2224/056—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
- H01L2224/05638—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
- H01L2224/05647—Copper [Cu] as principal constituent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/06—Structure, shape, material or disposition of the bonding areas prior to the connecting process of a plurality of bonding areas
- H01L2224/0601—Structure
- H01L2224/0603—Bonding areas having different sizes, e.g. different heights or widths
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/06—Structure, shape, material or disposition of the bonding areas prior to the connecting process of a plurality of bonding areas
- H01L2224/061—Disposition
- H01L2224/0618—Disposition being disposed on at least two different sides of the body, e.g. dual array
- H01L2224/06181—On opposite sides of the body
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32225—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
- H01L2224/32227—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation the layer connector connecting to a bond pad of the item
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/33—Structure, shape, material or disposition of the layer connectors after the connecting process of a plurality of layer connectors
- H01L2224/331—Disposition
- H01L2224/3318—Disposition being disposed on at least two different sides of the body, e.g. dual array
- H01L2224/33181—On opposite sides of the body
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/50—Tape automated bonding [TAB] connectors, i.e. film carriers; Manufacturing methods related thereto
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/71—Means for bonding not being attached to, or not being formed on, the surface to be connected
- H01L2224/72—Detachable connecting means consisting of mechanical auxiliary parts connecting the device, e.g. pressure contacts using springs or clips
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73251—Location after the connecting process on different surfaces
- H01L2224/73269—Layer and TAB connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/832—Applying energy for connecting
- H01L2224/83201—Compression bonding
- H01L2224/83203—Thermocompression bonding, e.g. diffusion bonding, pressure joining, thermocompression welding or solid-state welding
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/838—Bonding techniques
- H01L2224/8384—Sintering
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/86—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using tape automated bonding [TAB]
- H01L2224/862—Applying energy for connecting
- H01L2224/8621—Applying energy for connecting with energy being in the form of electromagnetic radiation
- H01L2224/86214—Applying energy for connecting with energy being in the form of electromagnetic radiation using a laser
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/86—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using tape automated bonding [TAB]
- H01L2224/8634—Bonding interfaces of the connector
- H01L2224/86345—Shape, e.g. interlocking features
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/90—Methods for connecting semiconductor or solid state bodies using means for bonding not being attached to, or not being formed on, the body surface to be connected, e.g. pressure contacts using springs or clips
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/91—Methods for connecting semiconductor or solid state bodies including different methods provided for in two or more of groups H01L2224/80 - H01L2224/90
- H01L2224/92—Specific sequence of method steps
- H01L2224/922—Connecting different surfaces of the semiconductor or solid-state body with connectors of different types
- H01L2224/9222—Sequential connecting processes
- H01L2224/92242—Sequential connecting processes the first connecting process involving a layer connector
- H01L2224/92248—Sequential connecting processes the first connecting process involving a layer connector the second connecting process involving a TAB connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/42—Fillings or auxiliary members in containers or encapsulations selected or arranged to facilitate heating or cooling
- H01L23/433—Auxiliary members in containers characterised by their shape, e.g. pistons
- H01L23/4338—Pistons, e.g. spring-loaded members
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/46—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements involving the transfer of heat by flowing fluids
- H01L23/473—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements involving the transfer of heat by flowing fluids by flowing liquids
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
- H01L23/49811—Additional leads joined to the metallisation on the insulating substrate, e.g. pins, bumps, wires, flat leads
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
- H01L23/538—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames the interconnection structure between a plurality of semiconductor chips being formed on, or in, insulating substrates
- H01L23/5387—Flexible insulating substrates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/02—Bonding areas ; Manufacturing methods related thereto
- H01L24/03—Manufacturing methods
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/02—Bonding areas ; Manufacturing methods related thereto
- H01L24/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L24/06—Structure, shape, material or disposition of the bonding areas prior to the connecting process of a plurality of bonding areas
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L24/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L24/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L24/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
Abstract
Leistungselektronische Schalteinrichtung (1) mit einem Substrat (2), mit einer Verbindungseinrichtung (3) und mit einem Leistungshalbleiterbauelement (5), wobei das Substrat (2) eine Normalenrichtung (N) und gegeneinander elektrisch isoliert eine erste und eine zweite Leiterbahn (22, 24) aufweist und auf einer ersten Leiterbahn (22) das Leistungshalbleiterbauelement (5) mit seiner ersten Kontaktfläche (500) seiner ersten Metallisierung (50) angeordnet und elektrisch leitend damit verbunden ist,wobei die Verbindungseinrichtung (3) als Folienverbund mit einer ersten elektrisch leitenden Folie (30) und einer elektrisch isolierenden Folie (32) ausgebildet ist und die erste elektrisch leitende Folie eine erste, dem Substrat (2) zugewandte Hauptfläche (300) aufweist, wobei die Schalteinrichtung mittels der Verbindungseinrichtung (3) intern schaltungsgerecht verbunden ist und hierbei eine zweite Kontaktfläche (520) einer zweiten Metallisierung (52) des Leistungshalbleiterbauelements (5) mit einer ersten Kontaktfläche der ersten Hauptfläche (300) der Verbindungseinrichtung (3) elektrisch leitend verbunden ist undeine Kontaktfläche der zweiten Leiterbahn (24), die somit einen Verbindungspartner ausbildet, mit einer zweiten Kontaktfläche der ersten Hauptfläche (300) der ersten elektrisch leitenden Folie (30) der Verbindungseinrichtung (3) mittels einer Laserschweißverbindung (60) elektrisch leitend verbunden ist, wobeidie elektrisch isolierende Folie (32) im Bereich der Laserschweißverbindung (60) eine erste Ausnehmung (310) mit einer Mindestbreite (930) aufweist und somit eine zweite Hauptfläche (302) der ersten elektrisch leitenden Folie (30) aus negativer Normalenrichtung (N) betrachtet im Bereich dieser Ausnehmung (310) für einen Laserstrahl (8) frei zugänglich ist undwobei die zweite Leiterbahn eine erste Dicke (902), die zweite Metallisierung (52) des Leistungshalbleiterbauelements (5) eine zweite Dicke und die erste elektrisch leitende Folie eine dritte Dicke (900) aufweisen.Power electronic switching device (1) with a substrate (2), with a connecting device (3) and with a power semiconductor component (5), the substrate (2) having a normal direction (N) and a first and a second conductor track (22, electrically insulated from one another) 24) and the power semiconductor component (5) with its first contact surface (500) of its first metallization (50) is arranged and electrically conductively connected to it on a first conductor track (22), the connecting device (3) being a film composite with a first electrically conductive one Foil (30) and an electrically insulating foil (32) is formed and the first electrically conductive foil has a first main surface (300) facing the substrate (2), the switching device being internally connected by means of the connecting device (3) in accordance with the circuitry a second contact surface (520) of a second metallization (52) of the power semiconductor component (5) with e A first contact surface of the first main surface (300) of the connecting device (3) is electrically conductively connected and a contact surface of the second conductor track (24), which thus forms a connection partner, is connected to a second contact surface of the first main surface (300) of the first electrically conductive film (30) ) the connecting device (3) is connected in an electrically conductive manner by means of a laser welded connection (60), the electrically insulating film (32) having a first recess (310) with a minimum width (930) in the area of the laser welded connection (60) and thus a second main surface ( 302) of the first electrically conductive film (30) viewed from the negative normal direction (N) is freely accessible to a laser beam (8) in the area of this recess (310) and the second conductor track has a first thickness (902), the second metallization (52) of the power semiconductor component (5) has a second thickness and the first electrically conductive film has a third thickness (900) point.
Description
Die Erfindung beschreibt eine leistungselektronische Schalteinrichtung mit einem Substrat, mit einer Verbindungseinrichtung und mit einem Leistungshalbleiterbauelement, wobei die Verbindungseinrichtung als Folienverbund mit einer ersten elektrisch leitenden Folie und einer elektrisch isolierenden Folie ausgebildet ist, wobei die Schalteinrichtung mittels der Verbindungseinrichtung intern schaltungsgerecht elektrisch leitend verbunden ist. Die Erfindung beschreibt weiterhin ein Verfahren zur Herstellung einer derartigen leistungselektronischen Schalteinrichtung.The invention describes a power electronic switching device with a substrate, with a connecting device and with a power semiconductor component, the connecting device being designed as a film composite with a first electrically conductive film and an electrically insulating film, the switching device being internally connected in an electrically conductive manner by means of the connecting device. The invention also describes a method for producing such a power electronic switching device.
Die
Aus der
Die
Aus der
In Kenntnis des genannten Standes der Technik, liegt der Erfindung die Aufgabe zugrunde, die Verbindung zwischen einer Folie des Folienverbunds und einem Verbindungspartner zu verbessern.Knowing the cited prior art, the invention is based on the object of improving the connection between a film of the film composite and a connection partner.
Diese Aufgabe wird erfindungsgemäß gelöst durch eine leistungselektronische Schalteinrichtung mit einem Substrat, mit einer Verbindungseinrichtung und mit einem Leistungshalbleiterbauelement, wobei das Substrat eine Normalenrichtung und gegeneinander elektrisch isoliert eine erste und eine zweite Leiterbahnen aufweist und auf einer ersten Leiterbahn das Leistungshalbleiterbauelement mit einer ersten Kontaktfläche einer ersten Metallisierung angeordnet und elektrisch leitend damit verbunden ist, wobei die Verbindungseinrichtung als Folienverbund mit einer ersten elektrisch leitenden Folie und einer elektrisch isolierenden Folie ausgebildet ist und die erste elektrisch leitende Folie eine erste, dem Substrat zugewandte Hauptfläche aufweist, wobei die Schalteinrichtung mittels der Verbindungseinrichtung intern schaltungsgerecht verbunden ist und hierbei eine zweite Kontaktfläche einer zweiten Metallisierung des Leistungshalbleiterbauelements mit einer ersten Kontaktfläche der ersten Hauptfläche der Verbindungseinrichtung elektrisch leitend verbunden ist und eine Kontaktfläche der zweiten Leiterbahn, die somit einen Verbindungspartner ausbildet, mit einer zweiten Kontaktfläche der ersten Hauptfläche der ersten elektrisch leitenden Folie der Verbindungseinrichtung mittels einer Laserschweißverbindung elektrisch leitend verbunden ist, wobei die elektrisch isolierende Folie im Bereich der Laserschweißverbindung eine erste Ausnehmung mit einer Mindestbreite aufweist und somit eine zweite Hauptfläche der ersten elektrisch leitenden Folie aus negativer Normalenrichtung betrachtet im Bereich dieser Ausnehmung für einen Laserstrahl frei zugänglich ist und wobei die zweite Leiterbahn eine erste Dicke, die zweite Metallisierung des Leistungshalbleiterbauelements eine zweite Dicke und die erste elektrisch leitende Folie eine dritte Dicke aufweisen.This object is achieved according to the invention by a power electronic switching device with a substrate, with a connecting device and with a power semiconductor component, the substrate having a normal direction and electrically insulated from one another a first and a second conductor track and on a first conductor track the power semiconductor component with a first contact surface of a first Metallization is arranged and electrically conductively connected to it, the connecting device being designed as a film composite with a first electrically conductive film and an electrically insulating film and the first electrically conductive film having a first main surface facing the substrate, the switching device being internally circuit-compatible by means of the connecting device is connected and here a second contact surface of a second metallization of the power semiconductor component a first contact surface of the first main surface of the connecting device is electrically conductively connected and a contact surface of the second conductor track, which thus forms a connection partner, is electrically conductively connected to a second contact surface of the first main surface of the first electrically conductive film of the connecting device by means of a laser welded connection, the electrically insulating film has a first recess with a minimum width in the area of the laser weld connection and thus a second main surface of the first electrically conductive film viewed from the negative normal direction is freely accessible in the area of this recess for a laser beam and wherein the second conductor track has a first thickness, the second metallization of the Power semiconductor component have a second thickness and the first electrically conductive film have a third thickness.
Alternativ oder bevorzugt sogar gleichzeitig wird die Aufgabe gelöst durch eine leistungselektronische Schalteinrichtung mit einem Substrat, mit einer Verbindungseinrichtung und mit einem Leistungshalbleiterbauelement, wobei das Substrat eine Normalenrichtung und gegeneinander elektrisch isoliert eine erste und eine zweite Leiterbahnen aufweist und auf einer der ersten Leiterbahn das Leistungshalbleiterbauelement mit einer ersten Kontaktfläche einer ersten Metallisierung angeordnet und elektrisch leitend damit verbunden ist, wobei die Verbindungseinrichtung als Folienverbund mit einer ersten elektrisch leitenden Folie und einer elektrisch isolierenden Folie ausgebildet ist und die erste elektrisch leitende Folie eine erste, dem Substrat zugewandte Hauptfläche aufweist, wobei die Schalteinrichtung mittels der Verbindungseinrichtung intern schaltungsgerecht verbunden ist und hierbei eine zweite Kontaktfläche einer zweiten Metallisierung, die somit einen Verbindungspartner ausbildet, des Leistungshalbleiterbauelements mit einer ersten Kontaktfläche der ersten Hauptfläche der Verbindungseinrichtung mittels einer Laserschweißverbindung elektrisch leitend verbunden ist und eine Kontaktfläche der zweiten Leiterbahn mit einer zweiten Kontaktfläche der ersten Hauptfläche der ersten elektrisch leitenden Folie der Verbindungseinrichtung elektrisch leitend verbunden ist, wobei die elektrisch isolierende Folie im Bereich der Laserschweißverbindung eine erste Ausnehmung mit einer Mindestbreite aufweist und somit eine zweite Hauptfläche der ersten elektrisch leitenden Folie aus negativer Normalenrichtung betrachtet im Bereich dieser Ausnehmung für einen Laserstrahl frei zugänglich ist und wobei die zweite Leiterbahn eine erste Dicke, die zweite Metallisierung des Leistungshalbleiterbauelements eine zweite Dicke und die erste elektrisch leitende Folie eine dritte Dicke aufweisen.Alternatively or preferably even at the same time, the object is achieved by a power electronic switching device with a substrate, with a connecting device and with a power semiconductor component, the substrate having a normal direction and electrically insulated first and second conductor tracks and the power semiconductor component on one of the first conductor tracks A first contact surface of a first metallization is arranged and electrically conductively connected to it, the connecting device being designed as a film composite with a first electrically conductive film and an electrically insulating film and the first electrically conductive film having a first main surface facing the substrate, the switching device is connected internally by means of the connection device in a circuit-compatible manner and in this case a second contact surface of a second metallization, which thus forms a connection partner, of the Power semiconductor component is electrically conductively connected to a first contact surface of the first main surface of the connecting device by means of a laser welded connection and a contact surface of the second conductor track is electrically conductively connected to a second contact surface of the first main surface of the first electrically conductive film of the connecting device, the electrically insulating film in the area of the Laser weld connection has a first recess with a minimum width and thus a second main surface of the first electrically conductive film viewed from the negative normal direction is freely accessible for a laser beam in the area of this recess and wherein the second conductor track has a first thickness, the second metallization of the power semiconductor component has a second thickness and the first electrically conductive film have a third thickness.
Hierbei kann es bevorzugt sein, wenn in Normalenrichtung der Folienverbund eine weitere elektrisch leitende Folie oder eine Mehrzahl von Folien aufweist, die abwechselnd elektrisch leitend und elektrisch isolierend ausgebildet sind. Insbesondere kann es noch bevorzugt sein, wenn die eine weitere elektrisch leitende Folie oder die Mehrzahl von Folien in Normalenrichtung mit der ersten Ausnehmung weitere fluchtende Ausnehmungen aufweisen. Auch kann es hierbei bevorzugt sein, wenn die Mindestbreite mindestens 3mm beträgt oder im Bereich zwischen 200µm und 800µm liegt. Ebenfalls kann es bevorzugt sein, wenn im Randbereich der ersten Ausnehmung eine metallische Kontaktverbindung zwischen der ersten elektrisch leitenden Folie und einer weiteren elektrisch leitenden Folie angeordnet ist.In this case, it can be preferred if the film composite has a further electrically conductive film or a plurality of films in the normal direction which are alternately designed to be electrically conductive and electrically insulating. In particular, it can also be preferred if the one further electrically conductive film or the plurality of films have further recesses that are aligned with the first recess in the normal direction. It can also be preferred here if the minimum width is at least 3 mm or is in the range between 200 μm and 800 μm. It can also be preferred if a metallic contact connection is arranged between the first electrically conductive film and a further electrically conductive film in the edge region of the first recess.
Es kann im Grund auch vorteilhaft sein, wenn die zweite Metallisierung ausgebildet ist aus einer ersten dünnen Teilmetallisierung und einer stoffschlüssig, insbesondere mittels eines Sinterverfahrens verbundenen, zweiten dicken Teilmetallisierung, die vorzugsweise als flächiger Metallformkörper ausgebildet ist.Basically, it can also be advantageous if the second metallization is formed from a first thin partial metallization and a second thick partial metallization which is cohesively connected, in particular by means of a sintering process, and which is preferably designed as a flat metal molding.
Es ist weiterhin vorteilhaft, wenn die erste Dicke zwischen 200µm und 1000µm beträgt, die zweite Dicke bei Vorhandensein einer Laserschweißverbindung mit der zweiten Metallisierung zwischen 80µm und 500µm, sonst zwischen 5µm und 50µm beträgt und die dritte Dicke zwischen 50µm und 800µm beträgt.It is also advantageous if the first thickness is between 200 .mu.m and 1000 .mu.m, the second thickness is between 80 .mu.m and 500 .mu.m if there is a laser welded connection with the second metallization, otherwise between 5 .mu.m and 50 .mu.m and the third thickness is between 50 .mu.m and 800 .mu.m.
Allgemein ist es bevorzugt, wenn die dritte Dicke gleich der ersten Dicke ist oder maximal 90% der ersten Dicke, insbesondere maximal 80% der ersten Dicke beträgt.In general, it is preferred if the third thickness is equal to the first thickness or is a maximum of 90% of the first thickness, in particular a maximum of 80% of the first thickness.
Ebenfalls ist es bevorzugt, wenn die dritte Dicke gleich der zweiten Dicke ist oder maximal 90% der zweiten Dicke, insbesondere maximal 80% der zweiten Dicke beträgt.It is also preferred if the third thickness is equal to the second thickness or is a maximum of 90% of the second thickness, in particular a maximum of 80% of the second thickness.
Die Aufgabe wird weiterhin gelöst durch ein Verfahren zur Herstellung einer oben genannten Schalteinrichtung mit den Verfahrensschritten:
- a. Bereitstellen eines Substrats mit hierauf angeordnetem Leistungshalbleiterbauelement;
- b. Anordnen der Verbindungseinrichtung derart zum Substrat, dass die Kontaktfläche der zweiten Metallisierung des Leistungshalbleiterbauelements mit einer ersten Kontaktfläche der ersten Hauptfläche der Verbindungseinrichtung und die Kontaktfläche der zweiten Leiterbahn mit einer zweiten Kontaktfläche der ersten Hauptfläche der Verbindungseinrichtung in Normalenrichtung fluchtet;
- c. Direktes Beaufschlagen eines zugänglichen Bereichs der zweiten Hauptfläche der ersten elektrisch leitenden Folie über dem darunter befindlichen Verbindungspartner mittels eines Laserstrahls unter Ausbildung einer Schweißverbindung zwischen der ersten leitenden Folie mit diesem Verbindungspartner, wobei dieser bis zu einer Tiefe von maximal 90% seiner Dicke lokal aufgeschmolzen wird.
- a. Providing a substrate with a power semiconductor component arranged thereon;
- b. Arranging the connecting device to the substrate in such a way that the contact surface of the second metallization of the power semiconductor component is aligned with a first contact surface of the first main surface of the connecting device and the contact surface of the second conductor track is aligned with a second contact surface of the first main surface of the connecting device in the normal direction;
- c. Direct exposure of an accessible area of the second main surface of the first electrically conductive film above the connection partner located below by means of a Laser beam with the formation of a welded connection between the first conductive film and this connection partner, this being locally melted to a depth of a maximum of 90% of its thickness.
Hierbei ist es vorteilhaft, wenn ein Abstand zwischen der ersten Hauptfläche der ersten elektrisch leitenden Folie und dem Verbindungspartner beim Verfahrensschritt c) zwischen 5µm und 300µm, bevorzugt zwischen 10µm und 150µm und besonders bevorzugt zwischen 15µm und 75µm beträgt.It is advantageous here if a distance between the first main surface of the first electrically conductive film and the connection partner in process step c) is between 5 μm and 300 μm, preferably between 10 μm and 150 μm and particularly preferably between 15 μm and 75 μm.
Es kann auch bevorzugt sein, wenn unmittelbar vor und während des Verfahrensschritts c) die elektrisch leitende Folie, vorzugsweise direkt im Umfeld des zugänglichen Bereichs der zweiten Hauptfläche, gegenüber diesem mittels einer Halteeinrichtung fixiert wird.It can also be preferred if immediately before and during method step c) the electrically conductive film, preferably directly in the vicinity of the accessible area of the second main surface, is fixed in relation to the latter by means of a holding device.
Es kann weiterhin bevorzugt sein, wenn die elektrisch isolierende Folie im Bereich der Laserschweißverbindung eine erste Ausnehmung mit einer Mindestbreite von mindestens 3mm aufweist und während des Verfahrensschritts c) die Laserbeaufschlagung mäanderförmig erfolgt.It can furthermore be preferred if the electrically insulating film has a first recess with a minimum width of at least 3 mm in the area of the laser welded connection and the laser is applied in a meandering manner during method step c).
Andererseits kann es bevorzugt sein, wenn die elektrisch isolierende Folie im Bereich der Laserschweißverbindung eine erste Ausnehmung mit einer Mindestbreite zwischen 200µm und 800µm aufweist und während des Verfahrensschritts c) die Laserbeaufschlagung punktförmig oder quasipunktförmig erfolgt. Unter einer Mindestbreite soll hier und im Folgenden verstanden werden, dass die laterale, also die seitliche, Ausdehnung nicht die Tiefenausdehnung einer Ausnehmung in jeglicher Richtung diesen Mindestwert nicht unterschreitet. Bei einer kreisrunden Ausnehmung entspricht der Durchmesser diesem Mindestwert, bei einer elliptischen Ausnehmung entspricht die Nebenachse diesem Mindestwert, bei einer rechteckigen Ausnehmung entspricht die kürzere Seite diesem Mindestwert.On the other hand, it can be preferred if the electrically insulating film in the area of the laser welded connection has a first recess with a minimum width between 200 μm and 800 μm and the laser application is point-shaped or quasi-point-shaped during method step c). Here and in the following, a minimum width is to be understood as meaning that the lateral, that is to say the lateral, extension does not fall below the depth extension of a recess in any direction this minimum value. In the case of a circular recess, the diameter corresponds to this minimum value; in the case of an elliptical recess, the minor axis corresponds to this minimum value; in the case of a rectangular recess, the shorter side corresponds to this minimum value.
Es können innerhalb einer Schalteinrichtung natürlich verschiedene Ausgestaltungen der ersten Ausnehmung gleichzeitig vorhanden sein.Different configurations of the first recess can of course be present at the same time within a switching device.
Das erfindungsgemäße Verfahren und somit auch die entsprechend damit hergestellten Schalteinrichtungen weisen gegenüber dem Stand der Technik verschiedene Vorteile auf. Durch das Schweißverfahren sind keine Verbindungsmittel, wie Lote oder Sinterpasten notwendig. Bei dem erfindungsgemäßen Verfahren werden die Leistungshalbleiterbauelemente vor Partikeln, die beim Schweißen auftreten können, durch den Folienverbund flächig, und damit schützend, überdeckt.The method according to the invention and thus also the switching devices produced accordingly have various advantages over the prior art. The welding process means that no connecting materials such as solders or sintering pastes are required. In the method according to the invention, the power semiconductor components are covered over a large area by the film composite, and thus protectively, from particles that can occur during welding.
Das explizit eingesetzte Laserschweißverfahren weist gegenüber anderen Schweißverfahren die entscheidenden Vorteile auf, dass einerseits das Substrat mechanisch nicht belastet wird und dass andererseits die beiden Verbindungspartner der Schweißverbindung nicht zwangsläufig während der Schweißverbindung einen mechanischen Kontakt aufweisen müssen, sondern zumindest geringfügig voneinander beabstandet sein können. Auch können mit diesem Verfahren vergleichsweise dünne Verbindungspartner flächig verbunden werden, ohne diese oder darunter liegende Schichten zu beschädigen.The explicitly used laser welding process has the decisive advantages over other welding processes that, on the one hand, the substrate is not mechanically stressed and, on the other hand, the two connection partners of the welded connection do not necessarily have to be in mechanical contact during the welded connection, but can be at least slightly spaced from one another. With this method, comparatively thin connection partners can also be connected over a large area without damaging them or the layers underneath.
Selbstverständlich können, sofern dies nicht per se oder explizit ausgeschlossen ist, die im Singular genannten Merkmale, insbesondere die Leistungshalbleiterbauelemente, die erste und zweite Leiterbahn, wie auch die jeweiligen Kontaktflächen, auch mehrfach in der erfindungsgemäßen Schalteinrichtung hiermit vorhanden sein.Of course, unless this is per se or explicitly excluded, the features mentioned in the singular, in particular the power semiconductor components, the first and second conductor tracks, as well as the respective contact surfaces, can also be present several times in the switching device according to the invention.
Es versteht sich, dass die verschiedenen Ausgestaltungen der Erfindung einzeln oder in beliebigen Kombinationen realisiert sein können, um Verbesserungen zu erreichen. Insbesondere sind die vorstehend und im Folgenden genannten und erläuterten Merkmale, gleichgültig ob sie im Rahmen der Schalteinrichtung oder dem Verfahren zur Herstellung der Schalteinrichtung beschrieben sind, nicht nur in den angegebenen Kombinationen, sondern auch in anderen Kombinationen oder in Alleinstellung einsetzbar, ohne den Rahmen der vorliegenden Erfindung zu verlassen.It goes without saying that the various embodiments of the invention can be implemented individually or in any combination in order to achieve improvements. In particular, the features mentioned and explained above and below, regardless of whether they are described in the context of the switching device or the method for producing the switching device, can be used not only in the specified combinations, but also in other combinations or alone, without the scope of to leave the present invention.
Weitere Erläuterungen der Erfindung, vorteilhafte Einzelheiten und Merkmale, ergeben sich aus der nachfolgenden Beschreibung der in den
-
1 zeigt eine Anordnung mit einer leistungselektronischen Schalteinrichtung nach dem Stand der Technik in seitlicher Schnittansicht. -
2 und3 zeigen zwei Ausgestaltungen einer ersten erfindungsgemäßen leistungselektronischen Schalteinrichtung. -
4 und5 zeigen eine zweite erfindungsgemäße leistungselektronische Schalteinrichtung. -
6 zeigt einen Ausschnitt einer Ausgestaltung einer ersten erfindungsgemäßen leistungselektronischen Schalteinrichtung. -
7 zeigt eine Draufsicht auf einen Ausschnitt einer zweiten erfindungsgemäßen leistungselektronischen Schalteinrichtung.
-
1 shows an arrangement with a power electronic switching device according to the prior art in a side sectional view. -
2 and3 show two embodiments of a first power electronic switching device according to the invention. -
4th and5 show a second power electronic switching device according to the invention. -
6th shows a section of an embodiment of a first power electronic switching device according to the invention. -
7th shows a plan view of a section of a second power electronic switching device according to the invention.
Auf einer ersten Leiterbahn
Die internen Verbindungen der Schalteinrichtung
Zur externen elektrischen Anbindung weist die leistungselektronische Schalteinrichtung
Die Druckeinrichtung
Die Anordnung weist weiterhin die Flüssigkeitskühleinrichtung
Alternativ kann der Isolierstoffkörper
Die Anordnung weist weiterhin eine Druckeinleiteinrichtung auf, die oberhalb der Verbindungseinrichtung angeordnet ist. Mittels dieser Druckeinleiteinrichtung, die sich, nicht dargestellt, gegen den Kühlkörper abstützt, wird Druck
Die erfindungsgemäßen Schalteinrichtungen der folgenden Figuren können selbstverständlich dort explizit nicht beschriebene Komponenten der oben beschriebenen Schalteinrichtung nach dem Stand der Technik zusätzlich aufweisen. The switching devices according to the invention of the following figures can of course additionally have components of the switching device according to the prior art described above that are not explicitly described there.
Auch sind diese erfindungsgemäßen, und nur in relevanten Ausschnitten dargestellten, Schalteinrichtungen geeignet und ausgebildet im Rahmen einer Anordnung auf einem Kühlkörper, insbesondere einem Flüssigkeitskühlkörper, angeordnet zu werden.These switching devices according to the invention and shown only in relevant excerpts are also suitable and designed to be arranged as part of an arrangement on a heat sink, in particular a liquid heat sink.
Weiterhin dargestellt ist der Folienverbund
Eine zweite Kontaktfläche der ersten Hauptseite
Zwischen der zweiten Leiterbahn
Die elektrisch isolierende Folie
Insbesondere die zweite Kontaktfläche
Die zweite Metallisierung
Die elektrisch isolierende Folie
Zur Verbindung zwischen der zweiten Kontaktfläche
Die Laserschweißverbindung
Weiterhin dargestellt ist ein Folienverbund aus einer ersten elektrisch leitenden Folie
Claims (15)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102019115573.8A DE102019115573B4 (en) | 2019-06-07 | 2019-06-07 | Power electronic switching device and method of manufacture |
CN202010504978.7A CN112054013A (en) | 2019-06-07 | 2020-06-05 | Power electronic switching device and method for the production thereof |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102019115573.8A DE102019115573B4 (en) | 2019-06-07 | 2019-06-07 | Power electronic switching device and method of manufacture |
Publications (2)
Publication Number | Publication Date |
---|---|
DE102019115573A1 DE102019115573A1 (en) | 2020-12-10 |
DE102019115573B4 true DE102019115573B4 (en) | 2021-12-09 |
Family
ID=73459653
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE102019115573.8A Active DE102019115573B4 (en) | 2019-06-07 | 2019-06-07 | Power electronic switching device and method of manufacture |
Country Status (2)
Country | Link |
---|---|
CN (1) | CN112054013A (en) |
DE (1) | DE102019115573B4 (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102022207522A1 (en) | 2022-07-22 | 2024-01-25 | Zf Friedrichshafen Ag | Power module |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102015121680A1 (en) | 2015-01-08 | 2016-07-14 | Infineon Technologies Ag | POWER SUB-MODULE MODULE THAT HAS A FLEXIBLE PCB CONNECTION WITH A LOW GATE DRIVER INDUCTIVITY |
DE102016108656A1 (en) | 2016-05-11 | 2017-11-16 | Danfoss Silicon Power Gmbh | Power electronic assembly with vibration-free contacting |
EP3273470A1 (en) | 2016-07-22 | 2018-01-24 | SEMIKRON Elektronik GmbH & Co. KG | Power electronics switching device, arrangement using the same, and method for producing the switch device |
DE102017115879A1 (en) | 2017-07-14 | 2019-01-17 | Semikron Elektronik Gmbh & Co. Kg | Method for producing a power electronic submodule by means of a welding method |
-
2019
- 2019-06-07 DE DE102019115573.8A patent/DE102019115573B4/en active Active
-
2020
- 2020-06-05 CN CN202010504978.7A patent/CN112054013A/en active Pending
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102015121680A1 (en) | 2015-01-08 | 2016-07-14 | Infineon Technologies Ag | POWER SUB-MODULE MODULE THAT HAS A FLEXIBLE PCB CONNECTION WITH A LOW GATE DRIVER INDUCTIVITY |
DE102016108656A1 (en) | 2016-05-11 | 2017-11-16 | Danfoss Silicon Power Gmbh | Power electronic assembly with vibration-free contacting |
EP3273470A1 (en) | 2016-07-22 | 2018-01-24 | SEMIKRON Elektronik GmbH & Co. KG | Power electronics switching device, arrangement using the same, and method for producing the switch device |
DE102017115879A1 (en) | 2017-07-14 | 2019-01-17 | Semikron Elektronik Gmbh & Co. Kg | Method for producing a power electronic submodule by means of a welding method |
Also Published As
Publication number | Publication date |
---|---|
DE102019115573A1 (en) | 2020-12-10 |
CN112054013A (en) | 2020-12-08 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE102017115883B4 (en) | Power electronic submodule with DC and AC voltage connection elements and arrangement herewith | |
DE102011079708B4 (en) | SUPPORT DEVICE, ELECTRICAL DEVICE WITH SUPPORT DEVICE, AND METHOD FOR MANUFACTURING SAME | |
EP3273473B1 (en) | Power electronics switching device, arrangement using the same, and method for producing the switch device | |
EP3095307B1 (en) | Printed circuit board, circuit, and method for the production of a circuit | |
DE102014213490C5 (en) | Cooling device, method for producing a cooling device and power circuit | |
EP3273474A1 (en) | Power electronics switching device, arrangement using the same, and method for producing the switch device | |
EP2757586B1 (en) | Semiconductor power module and method for manufacturing the same | |
DE102017115879B4 (en) | Process for the production of a power electronic submodule by means of a welding process | |
DE102014010373A1 (en) | Electronic module for a motor vehicle | |
EP3273470A1 (en) | Power electronics switching device, arrangement using the same, and method for producing the switch device | |
DE102016115221A1 (en) | Method for connecting at least two substrates to form a module | |
DE102016223651A1 (en) | SEMICONDUCTOR MODULE AND SEMICONDUCTOR DEVICE | |
DE102019115573B4 (en) | Power electronic switching device and method of manufacture | |
EP2271196B1 (en) | Method for producing a frequency converter with cooling device and frequency converter | |
EP3555913B1 (en) | Semiconductor module with baseplate with hollow chamber | |
DE102016105783A1 (en) | Power semiconductor device | |
DE102014203306A1 (en) | Manufacture of an electronic module | |
EP2704194B1 (en) | Semiconductor power module and method for manufacturing the same | |
EP3345217B1 (en) | Cooling device, method for producing a cooling device and power circuit | |
DE102019126311B3 (en) | Conductive cooling element, system and method for heat dissipation from power electronic components on circuit boards | |
DE102020127606B4 (en) | Power electronic switching device with a heat-conducting device and method for its production | |
DE102019126623B4 (en) | Power electronic switching device with a casting compound | |
DE102019118421B4 (en) | Power electronic switching device with a connecting means and with a power semiconductor component | |
DE102012219568B3 (en) | Power semiconductor module manufacturing method, involves connecting semiconductor components with two conductors, respectively, and breaking insulant body along recesses that extend between connection and utilizable regions | |
DE102021123636B4 (en) | Power semiconductor module with a substrate arrangement, with power semiconductor components and with a foil stack arrangement |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
R012 | Request for examination validly filed | ||
R016 | Response to examination communication | ||
R018 | Grant decision by examination section/examining division | ||
R020 | Patent grant now final |