DE102009035421A1 - Method for measuring near-field dispersion of electromagnetic transient emissions of measuring object, involves forming correlation functions from measuring signals detected by near-field sensors that are movable along surface within object - Google Patents

Abstract

The method involves moving two near-field sensors (4, 5) along a surface (3) within a measuring object (2) that is arranged on a base plate (1), where the base plate is designed in a metallically conducting manner. Tangential electrical and/or magnetic field components at measuring points in the surrounding of the object are measured by the sensors, and correlation functions are formed from measuring signals detected by the sensors. The sensors are position-controlled by a central computing and controlling unit (10). An independent claim is also included for an arrangement for measuring near-field dispersion of electromagnetic transient emissions of a measuring object.

Description

The The invention relates to a method for near field measurement of electromagnetic Emissions in the time domain and an order to carry them out of the procedure. To assess the electromagnetic compatibility of circuits and systems is the measurement of the radiated emissions of great importance. Under electromagnetic compatibility becomes the property of components, circuits and systems understood not to disturb other facilities or of other facilities are not disturbed. The property, Not disturbing other facilities is called active electromagnetic Compatibility called.

to Determination of active electromagnetic compatibility the emissions are measured. These measurements take place usually spectrally resolved, so that the spectral Distribution of the emissions can be found.

Across from The traditional spectral measuring methods are the last ones Decade developed time domain methods for measuring electromagnetic Noise emissions the benefits of order of magnitude reduced measurement time and improved parameter acquisition.

• • DE 103 15 372 B4 2006.02.09 2005.03.31 ”Verfahren und Vorrichtung zur Bereitstellung eines Messsignals und Vorrichtung zur Erfassung einer elektromagnetischen Störung”

und in den Druckschriften

• • F. Krug, P. Russer, ”The time-domain electromagnetic interference measurement system”, IEEE Transactions an Electromagnetic Compatibility, Vol. 45, No. 2, Mai 2003 S. 330–338 ,
• • F. Krug, D. Müller, P. Russer, Signal processing strategies with the TDEMI measurement system IEEE Transactions an Instrumentation and Measurement, Vol. 53, No. 5, Oktober 2004 S. 1402–1408
• • S. Braun, F. Krug, und P. Russer, ”A novel automatic digital quasi-peak detector for a time domain measurement system,” 2004 InternationalSymposium an Electromagnetic Compatibility, EMC 2004, S. 919–924, 2004 ,

beschrieben. Verfahren zur Zeitbereichsmessung strahlungsgebundener und leitungsgebundener elektromagnetischer Störemissionen weisen gegenüber den Frequenzbereichsverfahren eine Reihe wesentlicher Vorteile auf:

• • Die Zeitbereichsmessung kann wesentlich schneller erfolgen als eine Messung im Frequenzbereich.
• • Darüber hinaus liefert eine Zeitbereichsmessung auch die Phaseninformation sowie Impulsfominformation über die Störungen, die bei der Frequenzbereichsmessung in der Regel verloren gehen.

Methods and arrangements for time domain measurement of electromagnetic emissions have been described in the patent

• • DE 103 15 372 B4 2006.02.09 2005.03.31 "Method and device for providing a measurement signal and device for detecting an electromagnetic interference"

and in the pamphlets

• • F. Krug, P. Russer, "The time-domain electromagnetic interference measurement system", IEEE Transactions on Electromagnetic Compatibility, Vol. 2, May 2003 pp. 330-338 .
• • F. Krug, D. Müller, P. Russer, Signal Processing Strategies with the TDEMI Measurement System IEEE Transactions on Instrumentation and Measurement, Vol. 5, October 2004 p. 1402-1408
• • S. Braun, F. Krug, and P. Russer, "A novel automatic digital quasi-peak detector for a time domain measurement system," 2004 International Symposium on Electromagnetic Compatibility, EMC 2004, pp. 919-924, 2004 .

described. Methods for time domain measurement of radiated and conducted EMI have a number of significant advantages over frequency domain techniques:

• • The time domain measurement can be much faster than a measurement in the frequency domain.
• • In addition, a time domain measurement also provides the phase information as well as pulse information about the disturbances that are usually lost in the frequency domain measurement.

• • DE 10 2005 026 928 A1 2006.02.09, ”Verfahren und Vorrichtung zur Analog-Digitalwandlung eines Eingangssignals mit hoher Dynamik”,
• • DE 10 2005 032 982 A1 2006.02.16, ”Verfahren und Vorrichtung zur Analog-Digital-Wandlung eines Eingangssignals”,

sowie in den Druckschriften

• • S. Braun und P. Russer, ”A low-noise multiresolution high-dynamic Ultra-broad-band time-domain EMI measurement system,” IEEE Transactions an Microwave Theory and Techniques, vol. 53, 2005, S. 3354–3363 .
• • S. Braun, T. Donauer, und P. Russer, 'A Real-Time Time-Domain EMI Measurement System for Full-Compliance Measurements According to CISPR 16-1-1,” IEEE Transactions an Electromagnetic Compatibility, vol. 50, S. 259–267, 2008 .

beschrieben. Bei dem in diesen Offenlegungsschriften und in dieser Veröffentlichung beschriebenen Verfahren wird der Amplitudenbereich des zu digitalisierenden Verfahrens in mehrere Bereiche unterteilt und das Signal auf mehrere Analog-Digital-Wandler aufgeteilt, welche unterschiedliche Amplitudenbereiche digitalisieren.In the time domain methods for measuring electromagnetic interference emissions, the problem of limiting dynamics occurs due to the limited amplitude resolution of broadband analog-to-digital converters with sampling rates in the GHz range. Methods and arrangements for increasing the dynamics were disclosed in the published patent applications

• • DE 10 2005 026 928 A1 2006.02.09, "Method and Apparatus for Analog to Digital Conversion of a High Dynamic Input Signal",
• • DE 10 2005 032 982 A1 2006.02.16, "Method and Apparatus for Analog-to-Digital Conversion of an Input Signal",

as well as in the publications

• • S. Braun and P. Russer, "A low-noise multiresolution high-dynamic ultra-broadband time domain EMI measurement system," IEEE Transactions to Microwave Theory and Techniques, vol. 53, 2005, pp. 3354-3363 ,
• • S. Braun, T. Donauer, and P. Russer, "Real Time Time-Domain EMI Measurement System for Full-Compliance Measurements According to CISPR 16-1-1," IEEE Transactions to Electromagnetic Compatibility, vol. 50, pp. 259-267, 2008 ,

described. In the method described in these publications and in this publication, the amplitude range of the method to be digitized is subdivided into a plurality of areas and the signal is divided among a plurality of analog-to-digital converters which digitize different amplitude ranges.

Across from previous systems for the measurement of emissions, where emissions with the help of a tunable Receivers were measured, have modern time domain measuring systems the advantage of much shorter measurement times, since at These systems, the interference signal with high sampling rate in a wide frequency band is digitized and the emission spectrum then by digital signal processing from the sampled signal is calculated.

The Measurement of radiation-bound emissions often in a screened and broadband reflection-free interior lined measuring booth carried out. Such measuring booths are very expensive.

• • X. Dong, S. Deng, T. Hubing, und D. Beetner, ”Analysis of chip-level EMI using near-field magnetic scanning,” Electromagnetic Compatibility, 2004. EMC 2004. 2004 InternationalSymposium on, vol. 1, 2004 .
• • A. Tankielun, U. Keller, E. Sicard, P. Kralicek, und B. Vrignon, ”Electromagnetic Near-Field Scanning for Microelectronic Test Chip Investigation,” IEEE EMC Society Newsletter (October 2006) .
• • A. Tankielun, ”Data Post-Processing and Hardware Architecture of Electromagnetic Near-Field Scanner,” Dissertation, Fakultät für Elektrotechnik und Informatik der Gottfried Wilhelm Leibniz Universität Hannover, (2007) .

beschrieben. Elektrische und magnetische Nahfeldsonden werden in den Druckschriften

• • D. Baudry, A. Louis, und B. Mazari, ”Characterization of the open-ended coaxial probe used for near-field measurements in EMC applications,” Progress In Electromagnetics Research, vol. 60, 2006, S. 311–333 .
• • A. Tankielun, U. Keller, E. Sicard, P. Kralicek, und B. Vrignon, ”Electromagnetic Near-Field Scanning for Microelectronic Test Chip Investigation,” IEEE EMC Society Newsletter (October 2006) .
• • T. Ordas, M. Lisart, E. Sicard, P. Maurine, und L. Torres, ”Near-Field Mapping System to Scan in Time Domain the Magnetic Emissions of Integrated Circuits,” Proceedings of the 18th International Workshop an Power and Timing Modeling Optimization and Simulation, 2008 .

beschrieben.An alternative to measurements of emissions in large measuring cabins is in the near Field measurement of the emissions. In this case, the spatial distribution of the electric or magnetic field or both of the electric and the magnetic field in an area above the object to be measured is measured with near field probes. Such arrangements are z. B. in the publications

• • X. Dong, S. Deng, T. Hubing, and D. Beetner, "Analysis of chip-level EMI using near-field magnetic scanning," Electromagnetic Compatibility, 2004. EMC 2004. 2004 International Symposium on, vol. 1, 2004 ,
• • A. Tankielun, U. Keller, E. Sicard, P. Kralicek, and B. Vrignon, "Electromagnetic Near-Field Scanning for Microelectronic Test Chip Investigation," IEEE EMC Society Newsletter (October 2006) ,
• • A. Tankielun, "Data Post-Processing and Hardware Architecture of Electromagnetic Near-Field Scanners," Dissertation, Faculty of Electrical Engineering and Computer Science, Gottfried Wilhelm Leibniz Universität Hannover, (2007) ,

described. Electrical and magnetic near field probes are in the publications

• • D. Baudry, A. Louis, and B. Mazari, "Characterization of the open-ended coaxial probe used for near-field measurements in EMC applications," Progress In Electromagnetics Research, vol. 60, 2006, pp. 311-333 ,
• • A. Tankielun, U. Keller, E. Sicard, P. Kralicek, and B. Vrignon, "Electromagnetic Near-Field Scanning for Microelectronic Test Chip Investigation," IEEE EMC Society Newsletter (October 2006) ,
• • T. Ordas, M. Lisart, E. Sicard, P. Maurine, and L. Torres, "Near-Field Mapping System to Scan in Time Domain of the Magnetic Emissions of Integrated Circuits," Proceedings of the 18th International Workshop on Power and Timing Modeling Optimization and Simulation, 2008 ,

described.

• • O. M. Bucci, C. Gennarelli, G. Riccio, V. Speranza, und C. Savarese, ”Nonredundant representation of the electromagnetic fields over a cylinder with application to the near-field far-field transformation,” Electromagnetics, vol. 16, 1996, S. 273–290 .
• • F. D'Agostino, F. Ferrara, C. Gennarelli, G. Riccio, und C. Savarese, ”NF-FF transformation with cylindrical scanning from a minimum number of data,” Microwave and Optical Technology Letters, vol. 35, 2002 .

behandelt. Nahfeldmessungen entlang von das Objekt umschließenden sphär Flächen sind in den Druckschriften

• • Y. Rahmat-Samii und J. Lemanczyk, ”Application of spherical near-field measurements to microwave holographic diagnosis of antennas,” Antennas and Propagation, IEEE Transactions on, vol. 36, 1988, S. 869–878 .
• • H. Thal und J. Manges, ”Theory and practice for a spherical-scan near-field antenna range”, IEEE Transactions on Antennas and Propagation, vol. 36, 1988, S. 815–821 .

behandelt. Für beliebige Abtastgemetrien im Nahfeld wird die Bestimmung des Fernfeldes auf Basis der gemessenen Nahfeldverteilung in der Druckschrift

• • T. K. Sarkar und A. Taaghol, ”Near-field to near/far-field transformation for arbitrary near-field geometry utilizing an equivalent electric current andMoM,” IEEE Transactions on Antennas and Propagation, vol. 47, 1999, S. 566–573 .

beschrieben. Die Messung des Nahfeldes kann entlang unterschiedlicher Flächen erfolgen. Im folgenden wird bei der beschriebenen Erfindung die Abtastung des Nahfeldes exemplarisch entlang einer ebenen Fläche behandelt. In Abhängigkeit von der Geometrie des zu untersuchenden Messobjektes können sich jedoch auch andere Geometrien als vorteilhaft erweisen. Die Verwendung anderer Abtastgeometrien, ändert nichts an dem Prinzip und der Funktionsweise der hier vorgestellten Erfindung. Die für die Nahfeld-Fernfeld-Transformation verwendeten Algorithmen sind der gewählten Abtastgeometrie entsprechen der zitierten Literatur anzupassen.For a full characterization of the near field, it is sufficient to measure the emitting object on a surface completely enclosing the object, requiring a complete description by measuring either the tangential electric field or the tangential magnetic field along the surface. Near field measurements along cylindrical surfaces surrounding the object are in the references

• • OM Bucci, C. Gennarelli, G. Riccio, V. Speranza, and C. Savarese, "Nonredundant representation of the electromagnetic fields of a cylinder with application to the near-field far-field transformation," Electromagnetics, vol. 16, 1996, pp. 273-290 ,
• • F. D'Agostino, F. Ferrara, C. Gennarelli, G. Riccio, and C. Savarese, "NF-FF Transformation with Cylindrical Scanning from a Minimum Number of Data," Microwave and Optical Technology Letters, vol. 35, 2002 ,

treated. Near field measurements along spherical surfaces surrounding the object are in the documents

• • Y. Rahmat-Samii and J. Lemanczyk, "Application of spherical near-field measurements to microwave holographic diagnosis of antennas," Antennas and Propagation, IEEE Transactions on, vol. 36, 1988, pp. 869-878 ,
• • H. Thal and J. Manges, "Theory and practice for a spherical-scan near-field antenna range", IEEE Transactions on Antennas and Propagation, vol. 36, 1988, p. 815-821 ,

treated. For arbitrary scanning mimics in the near field, the determination of the far field is based on the measured near field distribution in the document

• • TK Sarkar and A. Taaghol, "Near-field to near / far-field transformation for arbitrary near-field, using an equivalent electric current and MO," IEEE Transactions on Antennas and Propagation, vol. 47, 1999, pp. 566-573 ,

described. The measurement of the near field can take place along different surfaces. In the following, the scanning of the near field is treated as an example along a flat surface in the described invention. Depending on the geometry of the test object to be examined, however, other geometries may prove advantageous. The use of other scanning geometries does not alter the principle and operation of the invention presented herein. The algorithms used for the near-field far-field transformation must be adapted to the selected sample geometry according to the cited literature.

in the Case of a deterministic electromagnetic field the knowledge of the tangential electrical or magnetic field distributions on a surface enclosing the object Calculation of the angular distribution of radiated electromagnetic Energy. Similarly, in this case, when embedding the object be calculated in any environment.

at mentioned methods for measuring the near field distribution is only the spatial distribution of amplitudes or energy density measured. There will be no correlation between the amplitudes at two formed arbitrary sampling points of the near field. A mathematical one Determination of the far field distribution from these measured near field values or a simulation of the object being measured in a complex environment caused spatial field distribution is here only for deterministic near fields, d. H. for near fields with a known spatial-temporal course, but not possible for stochastic near fields.

• • H. Bittel und L. Storm, Rauschen, Springer, Berlin, (1998) .
• • P. Russer, ”Noise Analysis of Linear Microwave Circuits with General TopolÂogy”, in: ”Review of Radio Sience 1993–1996”, Hrsg.: W. Ross Stone, Oxford University Press, S. 361–393, (1996) .
• • P. Russer, S. Müller, ”Noise analysis of linear microwave circuits”, International Journal of, Numerical Modelling, Electronic Networks, Devices and Fields, No. 3, S. 287–316, 1990 ,

bekannt ist, können stochastische Signale und Feldgrößen nicht numerisch durch Amplitudenwerte charakterisiert werden. Stochastische Größe sind vielmehr im Zeitbereich durch Korrelationsfunktionen bzw. im Frequenzbereich durch Korrelationsspektren zu charakterisieren. In der gennanten Literatur wird auch ausführlich beschrieben, wie die Transformationsbeziehungen für Korrelationsspektren aus den linearen Transformationsbeziehungen für die komplexen Amplituden harmonischer Signale folgen. Ist z. B. die Transformationsbeziehung für die Nahfeld-Fernfeld-Transformation harmonischer Signale für eine bestimmte Abtastgeometrie bekannt, so kann daraus direkt eine Transformationsbeziehung für die Nahfeld-Fernfeld-Transformation der Korrelationsspektren der stochastischen Feldgrößen abgeleitet werden.Electromagnetic emissions are stochastic electromagnetic fields. As from the literature, see, for. B.

• • H. Bittel and L. Storm, Rauschen, Springer, Berlin, (1998) ,
• • P. Russer, "Noise Analysis of Linear Microwave Circuits with General Topology", in: "Review of Radio Science 1993-1996", ed.: W. Ross Stone, Oxford University Press, pp. 361-393, (1996) ,
• • P. Russer, S. Müller, "Noise Analysis of Linear Microwave Circuits", International Journal of Numerical Modeling, Electronic Networks, Devices and Fields, no. 3, pp. 287-316, 1990 .

Stochastic signals and field quantities can not be numerically characterized by amplitude values. Rather, stochastic quantities are characterized in the time domain by correlation functions or in the frequency domain by correlation spectra. The literature also describes in detail how the correlation relations for correlation spectra follow from the linear transformation relationships for the complex amplitudes of harmonic signals. Is z. For example, if the transformation relationship for the near-field far-field transform of harmonic signals for a particular sampling geometry is known, then a transformation relationship for the near-field far field transformation of the stochastic field variable correlation spectra can be directly derived therefrom.

For a complete description of the stochastic near-field distribution, a calculation of the far field angle distribution or a calculation of the Energy distribution in any environment in which the radiant Object is embedded, therefore, are the correlation functions or correlation spectra metrologically to capture, with in each Sample point the autocorrelation function or the autocorrelation spectrum of the measured field value and for each pair of sampling points, the cross-correlation function or the cross-correlation spectrum to measure. To realize this measuring method, the electrical and / or magnetic field simultaneously at two different measuring points measured with field probes and it will be from the digitized measurement signals both field probes by digital signal processing in known Form the cross-correlation function and / or the cross-correlation spectrum.

• • DE 10 2007 042 266 A1 , Verfahren und Anordnung zur Umgebungsstörkompensierten Emissionsmessung im Zeitbereich

sowie in der Druckschrift

• • Arnd Frech, Amer Zakaria, Stephan Braun und Peter Russer ”Ambient Noise Cancelation with a Time-domain EMI Measurement System using Adaptive Filtering”, Proc. 2008 Asia-Pacific Sympsoium an Electromagnetic Compatibility, 19–22 May 2008, Singapore, 2008 .

beschrieben. Bei diesem Verfahren werden von einer ersten Antenne die Störaussendungen des Messobjektes einschließlich der Umgebungsstörungen aufgenommen und von einer zweiten Antenne, welche vom Messobjekt weiter entfernt angeordnet ist in erster Linie die Umgebungsstörungen aufgenommen. Nach digitalisierung beider Messignale werden durch digitale Signalverarbeitung die Umgebungsstörungen kompensiert.A system in which the spurious emissions are detected by two independent antennas and the signals detected by the antennas are digitized and further processed in two independent channels in the published patent application

• • DE 10 2007 042 266 A1 , Method and arrangement for ambient noise-compensated emission measurement in the time domain

as well as in the publication

• • Arnd Frech, Amer Zakaria, Stephan Braun and Peter Russer "Ambient Noise Canceling with a Time Domain EMI Measurement System using Adaptive Filtering", Proc. 2008 Asia-Pacific Symposium on Electromagnetic Compatibility, 19-22 May 2008, Singapore, 2008 ,

described. In this method, the interference emissions of the measurement object, including the ambient disturbances, are recorded by a first antenna, and the ambient disturbances are primarily recorded by a second antenna, which is arranged further from the measurement object. After digitizing both measuring signals, the ambient noise is compensated by digital signal processing.

The The invention described in this patent gives a method which allows stochastic nearfields so metrologically to grasp that from the data obtained the far field distribution the spectral power density and the spectral energy density distribution can be calculated in complex environments. The inventive Solution to the problem is to be in one above the DUT or in a measuring object enclosing Area the surface tangential electromagnetic Field with two electric and / or magnetic vectorial field probes to scan while keeping the direction and magnitude of the tangential electrical and / or magnetic field components in pairs simultaneously in to measure two different sampling points and for each Pair of measurements, the correlation function and / or the correlation spectrum form the field values measured by both field probes.

are the autocorrelation spectra of the tangential electrical and / or magnetic field components in all sampling points, as well as the cross-correlation spectra the measured field values for all pairs of sample points known, can be determined from these parameters in the angular distribution of the spectral power density in the known manner Far field as well as the spatial distribution of the spectral Calculate energy density in complex environments of the DUT.

1 shows an inventive arrangement for carrying out the method. On a base plate 1 is the measuring object 2 whose emissions are to be determined. The base plate 1 is preferably formed metallically conductive. Above the measurement object 2 become two near field probes 4 and 5 along a surface 3 emotional. At the near field probes 4 and 5 it is either electrical or magnetic near field probes. Such near-field probes are described in the literature. Each of the two near field probes 4 and 5 measures the direction and amplitude or the amplitude components in two tangential directions of the electric or magnetic field. The signals picked up by the near field probes are first in analog filter and amplifier circuits 6 and 7 band-limited and linearly amplified, then in analog-to-digital converter 8th and 9 digitized and then in a central computing and control unit 10 further processed. In the central computer and control unit 10 the digitized signals are digitally superimposed in a known manner so that the cross-correlation functions of the signals are determined. By digital Fourier transformation are in 10 also determines the correlation spectra. In this case, the autocorrelation function and / or the autocorrelation spectrum are determined for a channel by digital signal processing. Furthermore, the cross-correlation functions and / or the cross-correlation spectra are determined by two independent field probes for a maximum of N (N-1) / 2 different pairs of the N selected sampling points. The result is in the memory 11 stored and provided there for further processing and / or display.

In an in 2 shown advantageous development of this arrangement, the near field probes of two manipulators, consisting of levers 12 and 13 and mechanical drive units 14 and 15 moves, controlling the movement of the central signal processing unit 10 is made. About the signal processing unit 10 and the drive units 14 and 15 Both are on the levers 12 and 13 attached field probes in x- and y-direction according to a program stored in the signal processing unit in time sequence in certain sampling points and for pairs of Abtastpukten the vectorial tangential field components are measured and from the measured signals by digital signal processing, the auto and cross correlation functions are formed. Since, according to the uniqueness theorem, only the detection of the electrical or the magnetic tangential field components is required, two electrical or magnetic field components per sampling point are to be detected, 2 N signals are to be detected at N sampling points. From this, 2 N autocorrelation functions and 2 N (2 N - 1) / 2 cross-correlation functions can be determined. The number of correlation functions required for characterizing the stochastic near field thus grows quadratically with the number of sampling points provided, so that the measurement can be handled in terms of time only on the basis of the time domain measurement technique proposed here.

3 shows the schematic representation of a linear array 16 from field probes 20 , which by a switch 21 to be selected. In this case, two polarization directions can be selected from each field probe. 4 shows an advantageous development of the inventive arrangement with two linear arrays of field probes 16 and 17 , The execution of linear arrays of field probes 17 is equal to that of linear arrays of field probes 16 , The linear field probes are moved here only in the y direction. The selection of field probes 20 in the x-direction and the polarization direction takes place by control of the central computing and control unit 10 over the switches 21 in the field probes 16 and 17 , The switches 21 are realized in a known manner by controlled electromechanical or electronic switch. The signals of the switches 21 selected field probes 20 and polarization directions of the linear arrays of field probes 16 and 17 become the analog filter and amplifier circuits 6 and 7 fed and then processed as described above. The selection of the field probes in the y direction by switches can be done in a much shorter time than the selection of a sampling point by movement of the field probes in both directions, as in the arrangement according to 2 he follows. As a result, the entire measurement time can be significantly shortened.

In a further advantageous embodiment of the inventive arrangement according to 6 becomes a planar arrangement 22 from field probes 20 , as in 5 used schematically shown. The field probes 20 in the planar arrangement 22 from and the respective polarization directions are independent of each other from the central computing and control unit 10 controlled switches 24 and 25 selected. The signals of the switches 24 and 25 selected field probes 20 and polarization directions become the analog filter and amplifier circuits 6 and 7 fed and then processed as described above. As in the arrangement 6 the selection of the field probes in both directions by switches and without changing the position of the field probes, the selection of the measuring points in a much shorter time than in the arrangements according to 2 and 4 respectively. This significantly shortens the measuring time.

In the in 7 schematically illustrated advantageous development of the arrangement according to 2 is between the field sensors 4 and 5 and the analog filter and amplifier circuits 6 and 7 one from the central computing and control unit 10 controlled switching unit 26 inserted, which allows the assignment of the signal outputs of the field sensors 4 and 5 to the inputs of the analog filter and amplifier circuits 6 and 7 to change. This allows the signals for both pola risk directions of one of the two field sensors to the inputs of the analog filter and amplifier circuits 6 and 7 can be given and it can be determined in this way, the correlation function of the two signal components of different polarization in a field probe.

In the in 9 schematically illustrated advantageous development of the arrangement according to 4 be two in 8th schematically illustrated linear arrangements 28 and 29 from field probes 20 , which by two switches 21 and 27 to be selected. The linear array of field probes 29 is identical to the linear array of field probes 28 , It can by the switch 21 and 27 independently of each other, two field probes and for each of the two field probes the polarization directions are selected independently. Polarization directions are selected. The selection of field sensors and polarization directions is carried out by the central computing and control unit 10 , One from the central computing and control unit 10 controlled switching unit 26 allows the assignment of the signal outputs of the switches 21 and 27 in the linear arrays of field probes 28 and 29 selected field sensors and polarization directions the inputs of the analog filter and amplifier circuits 6 and 7 to change. It can be the inputs of 6 and 7 the output signals from field sensors from both or only one of the linear arrays of field probes 28 and 29 and it can also be connected to the inputs of 6 and 7 the two different polarization signals of a field probe are given. In this way, all cross-correlation functions of all pairs of signal components can be determined.

Description of the pictures

1 Schematic representation of the arrangement according to the invention.

2 Schematic representation of a development of the arrangement according to the invention with controlled positioning modules.

3 Schematic representation of a linear field probe arrangement.

4 Schematic representation of a development of the arrangement according to the invention with controlled positioning modules and two linear field probe arrangements.

5 Schematic representation of a planar field probe arrangement.

6 Schematic representation of a development of the arrangement according to the invention with a planar field probe arrangement.

7 Schematic representation of a development of the arrangement according to the invention with a polarization selection unit.

3 Schematic representation of a development of the linear field probe arrangement.

9 Schematic representation of a development of the arrangement according to the invention with a polarization selection unit.

QUOTES INCLUDE IN THE DESCRIPTION

This list The documents listed by the applicant have been automated generated and is solely for better information recorded by the reader. The list is not part of the German Patent or utility model application. The DPMA takes over no liability for any errors or omissions.

Cited patent literature

• - DE 10315372 B4 [0004]
• DE 102005026928 A1 [0005]
• - DE 102005032982 A1 [0005]
• DE 102007042266 A1 [0014]

Cited non-patent literature

• F. Krug, P. Russer, "The time-domain electromagnetic interference measurement system", IEEE Transactions on Electromagnetic Compatibility, Vol. 2, May 2003 pp. 330-338 [0004]
• F. Krug, D. Müller, P. Russer, Signal Processing Strategies with the TDEMI Measurement System IEEE Transactions on Instrumentation and Measurement, Vol. 5, October 2004 p. 1402-1408 [0004]
• - S. Braun, F. Krug, and P. Russer, "A novel automatic digital quasi-peak detector for a time domain measurement system," 2004 International Symposium on Electromagnetic Compatibility, EMC 2004, pp. 919-924, 2004 [0004]
• S. Braun and P. Russer, "A low-noise multiresolution high-dynamic ultra-broad band time domain EMI measurement system," IEEE Transactions to Microwave Theory and Techniques, vol. 53, 2005, pp. 3354-3363 [0005]
• - S. Braun, T. Donauer, and P. Russer, "A Real-Time Time-Domain EMI Measurement System for Full-Compliance Measurements According to CISPR 16-1-1," IEEE Transactions to Electromagnetic Compatibility, vol. 50, pp. 259-267, 2008 [0005]
• X. Dong, S. Deng, T. Hubing, and D. Beetner, "Analysis of chip-level EMI using near-field magnetic scanning," Electromagnetic Compatibility, 2004. EMC 2004. 2004 International Symposium on, vol. 1, 2004 [0008]
• A. Tankielun, U. Keller, E. Sicard, P. Kralicek, and B. Vrignon, "Electromagnetic Near-Field Scanning for Microelectronic Test Chip Investigation," IEEE EMC Society Newsletter (October 2006) [0008]
• - A. Tankielun, "Data Post-Processing and Hardware Architecture of Electromagnetic Near-Field Scanners," Dissertation, Faculty of Electrical Engineering and Computer Science, Gottfried Wilhelm Leibniz Universität Hannover, (2007) [0008]
• D. Baudry, A. Louis, and B. Mazari, "Characterization of the open-ended coaxial probe used for near-field measurements in EMC applications," Progress In Electromagnetics Research, vol. 60, 2006, pp. 311-333 [0008]
• A. Tankielun, U. Keller, E. Sicard, P. Kralicek, and B. Vrignon, "Electromagnetic Near-Field Scanning for Microelectronic Test Chip Investigation," IEEE EMC Society Newsletter (October 2006) [0008]
• - T. Ordas, M. Lisart, E. Sicard, P. Maurine, and L. Torres, "Near-Field Mapping System to Scan in Time Domain of the Magnetic Emissions of Integrated Circuits," Proceedings of the 18th International Workshop on Power and Technology Timing Modeling Optimization and Simulation, 2008 [0008]
• - OM Bucci, C. Gennarelli, G. Riccio, V. Speranza, and C. Savarese, "Nonredundant representation of the electromagnetic fields over a cylinder with application to the near-field far-field transformation," Electromagnetics, vol. 16, 1996, pp. 273-290 [0009]
• F. D'Agostino, F. Ferrara, C. Gennarelli, G. Riccio, and C. Savarese, "NF-FF transformation with cylindrical scanning from a minimum number of data", Microwave and Optical Technology Letters, vol. 35, 2002 [0009]
• Y. Rahmat-Samii and J. Lemanczyk, "Application of spherical near-field measurements to microwave holographic diagnosis of antennas," Antennas and Propagation, IEEE Transactions on, vol. 36, 1988, pp. 869-878 [0009]
• H. Thal and J. Manges, "Theory and practice for a spherical scan near-field antenna range", IEEE Transactions on Antennas and Propagation, vol. 36, 1988, pp. 815-821 [0009]
• TK Sarkar and A. Taaghol, "Near-field to near-far-field transformation for arbitrary near-field, using an equivalent electric current and MO," IEEE Transactions on Antennas and Propagation, vol. 47, 1999, pp. 566-573 [0009]
• - H. Bittel and L. Storm, Rauschen, Springer, Berlin, (1998) [0012]
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Claims (12)

Method and device for measuring the near field distribution of the electromagnetic emission of test objects with two or more electric and / or magnetic field probes, which sample the electrical and / or magnetic field values at several measuring points in the surroundings of the test object, characterized in that the tangential electrical and / or or magnetic field components are measured simultaneously by two field probes and the correlation functions are formed by the measurement signals detected by both field probes. Method and device for measuring the near field distribution the electromagnetic emission of measuring objects according to claim 1, characterized in that the field probes the tangential electric field components along a surface (hereinafter referred to as measuring area) in the near field area of the Measure the object to be measured, taking into the selected measuring points the two vectorial components of the measuring surface capture tangential electric field. Method and device for measuring the near field distribution the electromagnetic emission of measuring objects according to claim 1, characterized in that the field probes the tangential magnetic field components along a surface (hereinafter referred to as measuring area) in the near field area of the Measure the object to be measured, taking into the selected measuring points the two vectorial components of the measuring surface capture tangential magnetic field. Method and device for measuring the near field distribution the electromagnetic emission of measuring objects according to claim 1, characterized in that the field probes the along tangential electric and magnetic field components a surface (called measuring surface in the following) Measure in the near field area of the measurement object, where in the selected Measuring points the two vectorial components of the measuring surface capture tangential electric and magnetic field. Method and device for measuring the near field distribution the electromagnetic interference emission according to claim 2, 3 or 4, characterized in that detected by the two field probes Measurement signals, the correlation functions and / or correlation spectra be formed. Method and device for measuring the near field distribution the electromagnetic interference emission according to claim 2 or claim 3 and claim 5, characterized in that at a total number of N points selected on the measuring surface and 2N signals detected by the near field probes Number of 2 N autocorrelation spectra and 2 N (2 N - 1) Cross-correlation spectra are formed. Method and device for measuring the near field distribution the electromagnetic interference emission according to claim 4 and claim 5, characterized in that in a total number of N points selected on the measuring surface and 4N signals detected by the near field probes Number of 4 N autocorrelation spectra and 4 N (4 N - 1) Cross-correlation spectra are formed. Method and arrangement for measuring the near field distribution of the electromagnetic interference emission according to one or more of the preceding claims, characterized in that two field probes 4 and 5 as in 2 represented on a measuring surface by means of mechanical drive units 14 and 15 moved and from a central computing and control unit 10 be positioned controlled. Method and arrangement for measuring the near field distribution of the electromagnetic interference emission according to one or more of claims 1 to 7, characterized in that two two linear arrays of field probes 16 and 17 as in 4 represented on a measuring surface by means of mechanical drive units 18 and 19 moving in one direction and a central computing and control unit 10 be positioned under control and the field probes in the linear arrays of field probes 16 and 17 from the central computing and control unit 10 to be selected. Method and arrangement for measuring the near-field distribution of the electromagnetic interference emission according to one or more of claims 1 to 7, characterized in that as in 5 and 6 represented, the field probes 20 in a planar arrangement 22 are positioned and the field probes 20 as well as the respective polarization directions of the central computing and control unit 10 to be selected. Method and arrangement for measuring the near field distribution of the electromagnetic interference emission according to one or more of claims 1 to 7, characterized in that as in 7 represented between the field sensors 4 and 5 and the analog filter and amplifier circuits 6 and 7 one from the central computing and control unit 10 controlled switching unit 26 is inserted, which allows the assignment of the signal outputs of the field sensors 4 and 5 to the inputs of the analog filter and amplifier circuits 6 and 7 to change. Method and arrangement for measuring the near field distribution of the electromagnetic interference emission according to one or more of claims 1 to 7, characterized in that as in I 9 shown schematically, linear arrangements 28 and 29 from field probes 20 , which by two switches 21 and 27 be selected, being used by the switches 21 and 27 the central computing and control unit 10 two field probes and for each of the two field probes, the polarization directions can be selected independently.

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