DE102004030592A1 - Magnetischer Speicher - Google Patents

Magnetischer Speicher Download PDF

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Publication number
DE102004030592A1
DE102004030592A1 DE102004030592A DE102004030592A DE102004030592A1 DE 102004030592 A1 DE102004030592 A1 DE 102004030592A1 DE 102004030592 A DE102004030592 A DE 102004030592A DE 102004030592 A DE102004030592 A DE 102004030592A DE 102004030592 A1 DE102004030592 A1 DE 102004030592A1
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DE
Germany
Prior art keywords
trench
magnetic storage
conductor
magnetic
magnetic layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
DE102004030592A
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English (en)
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DE102004030592B4 (de
Inventor
Thomas C Anthony
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Samsung Electronics Co Ltd
Original Assignee
Hewlett Packard Development Co LP
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Development Co LP filed Critical Hewlett Packard Development Co LP
Publication of DE102004030592A1 publication Critical patent/DE102004030592A1/de
Application granted granted Critical
Publication of DE102004030592B4 publication Critical patent/DE102004030592B4/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B61/00—Magnetic memory devices, e.g. magnetoresistive RAM [MRAM] devices
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N50/00—Galvanomagnetic devices
    • H10N50/10—Magnetoresistive devices

Landscapes

  • Mram Or Spin Memory Techniques (AREA)
  • Hall/Mr Elements (AREA)
  • Semiconductor Memories (AREA)

Abstract

Ausführungsbeispiele der vorliegenden Erfindung stellen einen magnetischen Speicher bereit. Bei einem Ausführungdsbeispiel weist der magnetische Speicher einen Isolator, der einen Graben aufweist, einen ersten Leiter in dem Graben, eine erste magnetische Schicht in dem Graben und benachbart zu dem ersten Leiter und eine zweite magnetische Schicht außerhalb des Grabens auf.
DE102004030592A 2003-10-06 2004-06-24 Magnetischer Speicher Active DE102004030592B4 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/679,564 US6900491B2 (en) 2003-10-06 2003-10-06 Magnetic memory
US10/679,564 2003-10-06

Publications (2)

Publication Number Publication Date
DE102004030592A1 true DE102004030592A1 (de) 2005-05-12
DE102004030592B4 DE102004030592B4 (de) 2009-04-09

Family

ID=34394180

Family Applications (1)

Application Number Title Priority Date Filing Date
DE102004030592A Active DE102004030592B4 (de) 2003-10-06 2004-06-24 Magnetischer Speicher

Country Status (2)

Country Link
US (1) US6900491B2 (de)
DE (1) DE102004030592B4 (de)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050271811A1 (en) * 2004-02-25 2005-12-08 The Queen's University Of Belfast Method of manufacturing nanostructure arrays
US8324660B2 (en) 2005-05-17 2012-12-04 Taiwan Semiconductor Manufacturing Company, Ltd. Lattice-mismatched semiconductor structures with reduced dislocation defect densities and related methods for device fabrication
US9153645B2 (en) 2005-05-17 2015-10-06 Taiwan Semiconductor Manufacturing Company, Ltd. Lattice-mismatched semiconductor structures with reduced dislocation defect densities and related methods for device fabrication
US20070267722A1 (en) * 2006-05-17 2007-11-22 Amberwave Systems Corporation Lattice-mismatched semiconductor structures with reduced dislocation defect densities and related methods for device fabrication
WO2007112066A2 (en) 2006-03-24 2007-10-04 Amberwave Systems Corporation Lattice-mismatched semiconductor structures and related methods for device fabrication
US8173551B2 (en) 2006-09-07 2012-05-08 Taiwan Semiconductor Manufacturing Co., Ltd. Defect reduction using aspect ratio trapping
WO2008039534A2 (en) 2006-09-27 2008-04-03 Amberwave Systems Corporation Quantum tunneling devices and circuits with lattice- mismatched semiconductor structures
US8502263B2 (en) 2006-10-19 2013-08-06 Taiwan Semiconductor Manufacturing Company, Ltd. Light-emitter-based devices with lattice-mismatched semiconductor structures
US8304805B2 (en) 2009-01-09 2012-11-06 Taiwan Semiconductor Manufacturing Company, Ltd. Semiconductor diodes fabricated by aspect ratio trapping with coalesced films
US8237151B2 (en) 2009-01-09 2012-08-07 Taiwan Semiconductor Manufacturing Company, Ltd. Diode-based devices and methods for making the same
US9508890B2 (en) 2007-04-09 2016-11-29 Taiwan Semiconductor Manufacturing Company, Ltd. Photovoltaics on silicon
US7825328B2 (en) 2007-04-09 2010-11-02 Taiwan Semiconductor Manufacturing Company, Ltd. Nitride-based multi-junction solar cell modules and methods for making the same
US8329541B2 (en) 2007-06-15 2012-12-11 Taiwan Semiconductor Manufacturing Company, Ltd. InP-based transistor fabrication
CN101884117B (zh) 2007-09-07 2013-10-02 台湾积体电路制造股份有限公司 多结太阳能电池
US8183667B2 (en) 2008-06-03 2012-05-22 Taiwan Semiconductor Manufacturing Co., Ltd. Epitaxial growth of crystalline material
US8274097B2 (en) 2008-07-01 2012-09-25 Taiwan Semiconductor Manufacturing Company, Ltd. Reduction of edge effects from aspect ratio trapping
US8981427B2 (en) 2008-07-15 2015-03-17 Taiwan Semiconductor Manufacturing Company, Ltd. Polishing of small composite semiconductor materials
US20100072515A1 (en) 2008-09-19 2010-03-25 Amberwave Systems Corporation Fabrication and structures of crystalline material
CN102160145B (zh) 2008-09-19 2013-08-21 台湾积体电路制造股份有限公司 通过外延层过成长的元件形成
US8253211B2 (en) 2008-09-24 2012-08-28 Taiwan Semiconductor Manufacturing Company, Ltd. Semiconductor sensor structures with reduced dislocation defect densities
JP5705207B2 (ja) 2009-04-02 2015-04-22 台湾積體電路製造股▲ふん▼有限公司Ｔａｉｗａｎ Ｓｅｍｉｃｏｎｄｕｃｔｏｒ Ｍａｎｕｆａｃｔｕｒｉｎｇ Ｃｏｍｐａｎｙ，Ｌｔｄ． 結晶物質の非極性面から形成される装置とその製作方法
US9146287B2 (en) * 2010-11-15 2015-09-29 Infineon Technologies Ag XMR sensors with high shape anisotropy

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5039655A (en) 1989-07-28 1991-08-13 Ampex Corporation Thin film memory device having superconductor keeper for eliminating magnetic domain creep
US5861328A (en) 1996-10-07 1999-01-19 Motorola, Inc. Method of fabricating GMR devices
US6169686B1 (en) 1997-11-20 2001-01-02 Hewlett-Packard Company Solid-state memory with magnetic storage cells
US5956267A (en) 1997-12-18 1999-09-21 Honeywell Inc Self-aligned wordline keeper and method of manufacture therefor
US6153443A (en) 1998-12-21 2000-11-28 Motorola, Inc. Method of fabricating a magnetic random access memory
TW459374B (en) 2000-08-30 2001-10-11 Mosel Vitelic Inc Method for forming magnetic layer of magnetic random access memory
US6555858B1 (en) 2000-11-15 2003-04-29 Motorola, Inc. Self-aligned magnetic clad write line and its method of formation
US6358756B1 (en) * 2001-02-07 2002-03-19 Micron Technology, Inc. Self-aligned, magnetoresistive random-access memory (MRAM) structure utilizing a spacer containment scheme
US6413788B1 (en) 2001-02-28 2002-07-02 Micron Technology, Inc. Keepers for MRAM electrodes
US6551852B2 (en) 2001-06-11 2003-04-22 Micron Technology Inc. Method of forming a recessed magnetic storage element
US6661688B2 (en) * 2001-12-05 2003-12-09 Hewlett-Packard Development Company, L.P. Method and article for concentrating fields at sense layers
US6750491B2 (en) * 2001-12-20 2004-06-15 Hewlett-Packard Development Company, L.P. Magnetic memory device having soft reference layer
US6548849B1 (en) * 2002-01-31 2003-04-15 Sharp Laboratories Of America, Inc. Magnetic yoke structures in MRAM devices to reduce programming power consumption and a method to make the same
US6716644B2 (en) * 2002-05-17 2004-04-06 Micron Technology, Inc. Method for forming MRAM bit having a bottom sense layer utilizing electroless plating
US20040087163A1 (en) * 2002-10-30 2004-05-06 Robert Steimle Method for forming magnetic clad bit line

Also Published As

Publication number Publication date
DE102004030592B4 (de) 2009-04-09
US6900491B2 (en) 2005-05-31
US20050072995A1 (en) 2005-04-07

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
8127 New person/name/address of the applicant

Owner name: SAMSUNG ELECTRONICS CO., LTD., SUWON, KYONGGI, KR

8128 New person/name/address of the agent

Representative=s name: KUHNEN & WACKER PATENT- UND RECHTSANWALTSBUERO, 85

8364 No opposition during term of opposition