CS240596B1 - Electrotechnic components state evaluation circuit connection - Google Patents

Abstract

The wiring is designed to evaluate the condition electrical components, for example columns of thyristors where the optical signals for indicating the correct operation of the components of the boot it into evaluation circuits. These inputs The evaluation circuits are connected to output pulse generator a the outputs are connected to the corresponding inputs electrical engineering evaluation block components. The diagnostic signal can be removed either directly from the evaluation outputs block, or after passing through a matching block. The most suitable area of application is the area of application semiconductor converters, in particular high voltage inverters. Wiring can be used further to evaluate a plurality of states elements of any system.

Description

The wiring is designed to evaluate the condition of electrical components, such as a thyristor column, where optical signals to indicate the correct operation of the components are fed to the evaluation circuits. The inputs of these evaluation circuits are connected to the output of the switching pulse generator and the outputs are connected to the corresponding inputs of the evaluation block of the electrical components. The diagnostic signal can be taken either directly from the outputs of the evaluation block or after passing through the adaptation block.

The most suitable field of application is the field of power semiconductor converters, especially high voltage converters. The wiring can also be used to evaluate the state of a larger number of elements of any system.

The invention relates to a circuit for evaluating the condition of electrical components, for example a series of thyristors connected in series. In particular, the invention relates to the field of power semiconductor converters.

. Existing known circuits solve this problem either by means of counters with gradual checking of the state of individual components or by simultaneous checking by means of triangular matrix of logic circuits. In both cases, the wiring for a large number of components is quite complex. Another disadvantage of these circuits is the impossibility of changing the evaluation algorithm and coding the output signals.

The above drawbacks eliminate the circuitry for evaluating the condition of the electrical components of the invention. Its essence is that the inputs of the evaluation circuits are connected to the output of the ON pulse generator, while the outputs of the evaluation circuits are connected to the corresponding inputs of an evaluation block of electrical components, for example a thyristor column. This evaluation block has outputs for taking a diagnostic signal. These outputs can be coupled to the corresponding inputs of an adaptation block that has outputs for taking a diagnostic signal. The evaluation block of the stack of electrical components is preferably formed by a programmed memory circuit. Its address inputs form the inputs of the evaluation block of the column of electrical components and the data outputs form the outputs of this evaluation block. Unused address inputs are handled appropriately. The memory block is provided with a selection input to permanently activate the memory block.

The basic advantage of the circuitry according to the invention is that the method of evaluating the condition of electrical components is programmable and allows to adapt the failure evaluation algorithm to the demands placed on the inverter. Another advantage is that healing is simple even for a large number of controllable components. In addition, the wiring can be used both to diagnose a column of serially aligned components and to check components in any arrangement.

The circuit according to the invention is explained in more detail by way of example with reference to the accompanying drawings, in which: FIG. 1 is a block diagram of an electrical component evaluation circuit, in this case a thyristor column, and FIG.

Fig. 1 shows a block diagram of a thyristor column evaluation circuit consisting of thyristor evaluation circuits 11 to ln, a thyristor column evaluation block 2, and an adaptation block 3. The thyristor evaluation blocks 11 to ln receive optical signals 01 to On and further on inputs 111 to lln output signal from output 1 of the ON pulse generator. The outputs 121 to 12n of the evaluation circuits of the thyristors 11 to ln are connected to the corresponding inputs 211 to 21n of the evaluation block 2 of the column, whose outputs 221 to 22m are connected to the corresponding input terminals of the adaptation block 3. control system, or for indication.

The circuitry operates in such a way that an optical signal carrying information on the state of the component is sent to the evaluation circuits 11 to 11n from the individual electrical components, in this case thyristors. These signals are compared in the evaluation circuits 11 to 11n with the control pulse from the output 1 of the trigger pulse generator. During the duration of the control signal, the optical signal is conicidated and the state of the monitored component in the evaluation block is evaluated

1. The thyristor status diagnostic signals for the master control system or for the Indication can be taken directly from outputs 221 to 22m of evaluation block 2 or from outputs 321 to 32m of adaptation block 3.

Fig. 2 shows a diagram of an electrical component evaluation block 2, for example a thyristor column formed by a memory circuit 4. The input terminals 211 to 21n of the thyristor column evaluation block 2 are connected to the address inputs A1 to An of the memory circuit 4. Unused address inputs are suitably treated. The data outputs D1 to Dm of the memory circuit 4 are coupled to the output terminals 221 to 22m of the electrical component evaluation block 2. The CS memory input selection input 4 is wired so that the memory circuit 4 is permanently activated. Algorithm of component state evaluation is given by memory content.

According to the programmed algorithm, evaluation block 2 evaluates the corresponding fault signals. These signals are routed to the computer after appropriate adjustment. At the same time, the status of evaluated components is also indicated optically.

Claims (3)

An electrical circuit condition evaluation circuit, characterized in that the inputs (111) to (lln) of the evaluation circuits (11) to (ln) are connected to the output (1) of the start pulse generator; whereas the outputs (121) to (12n) of the evaluation circuits (11) to (11n) are coupled to the corresponding inputs (211) to (21n) of the evaluation block (2) of the electrical components, formed for example by a thyristor column having outputs (221) to ( 22m) for diagnostic signal collection. 2. A circuit for evaluating the condition of electrical components according to claim 1, characterized in that the evaluation block (2) of the stack of electrical components is formed by a programmed memory circuit (4) with unused addressing, but address inputs (AI) to (An). forming the inputs (211) to (21n) of the electrical component stack evaluation block (2), the data outputs (D1) to (Dn) forming the outputs (221) to (22m) of the electrical component stack evaluation block (2), the memory block (4); is provided with a selection input (CS) for permanently activating the memory block (4). 3. The electrical condition evaluation circuit according to claim 1 or 2, characterized in that the outputs (221) to (22m) of the evaluation block (2) of the electrical component stack are connected to corresponding inputs (311) to (31m) of the adjustment block (2). 3), which is provided with an output (321) to (32m) for taking a diagnostic signal.