CS196800B1 - Connection for measuring the quality of elements of the oscillation circuit - Google Patents
Connection for measuring the quality of elements of the oscillation circuit Download PDFInfo
- Publication number
- CS196800B1 CS196800B1 CS776329A CS632977A CS196800B1 CS 196800 B1 CS196800 B1 CS 196800B1 CS 776329 A CS776329 A CS 776329A CS 632977 A CS632977 A CS 632977A CS 196800 B1 CS196800 B1 CS 196800B1
- Authority
- CS
- Czechoslovakia
- Prior art keywords
- frequency
- generator
- block
- oscillating circuit
- measuring
- Prior art date
Links
- 230000010355 oscillation Effects 0.000 title 1
- 230000004044 response Effects 0.000 claims description 9
- 230000007935 neutral effect Effects 0.000 claims description 5
- 238000005259 measurement Methods 0.000 description 16
- 230000008878 coupling Effects 0.000 description 8
- 238000010168 coupling process Methods 0.000 description 8
- 238000005859 coupling reaction Methods 0.000 description 8
- 238000000926 separation method Methods 0.000 description 6
- 239000003990 capacitor Substances 0.000 description 5
- 238000010586 diagram Methods 0.000 description 2
- 238000011835 investigation Methods 0.000 description 2
- 238000005452 bending Methods 0.000 description 1
- 230000001143 conditioned effect Effects 0.000 description 1
- 230000005672 electromagnetic field Effects 0.000 description 1
- 230000008030 elimination Effects 0.000 description 1
- 238000003379 elimination reaction Methods 0.000 description 1
- 230000006698 induction Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2688—Measuring quality factor or dielectric loss, e.g. loss angle, or power factor
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Measuring Frequencies, Analyzing Spectra (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| SU762408263A SU750389A1 (ru) | 1976-10-01 | 1976-10-01 | Устройство дл измерени добротности колебательных контуров |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CS196800B1 true CS196800B1 (en) | 1980-04-30 |
Family
ID=20678390
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CS776329A CS196800B1 (en) | 1976-10-01 | 1977-09-29 | Connection for measuring the quality of elements of the oscillation circuit |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US4136313A (enExample) |
| JP (1) | JPS5388769A (enExample) |
| CS (1) | CS196800B1 (enExample) |
| DE (1) | DE2744122C3 (enExample) |
| FR (1) | FR2366575A1 (enExample) |
| GB (1) | GB1550062A (enExample) |
| SU (1) | SU750389A1 (enExample) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0325341B1 (en) * | 1988-01-22 | 1992-05-13 | United Kingdom Atomic Energy Authority | Material characterisation |
| US6975665B1 (en) * | 2000-05-26 | 2005-12-13 | Freescale Semiconductor, Inc. | Low power, high resolution timing generator for ultra-wide bandwidth communication systems |
| WO2001093443A2 (en) * | 2000-05-26 | 2001-12-06 | Xtremespectrum, Inc. | A low power, high resolution timing generator for ultrawide bandwidth communication systems |
| US8311074B2 (en) * | 2000-10-10 | 2012-11-13 | Freescale Semiconductor, Inc. | Low power, high resolution timing generator for ultra-wide bandwidth communication systems |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2671198A (en) * | 1951-04-12 | 1954-03-02 | Sperry Corp | Method and apparatus for measuring the frequency response of translating devices |
| US2692947A (en) * | 1951-05-11 | 1954-10-26 | Sperry Corp | Locator of inflection points of a response curve |
| US3824458A (en) * | 1973-01-22 | 1974-07-16 | A Martyashin | Device for measuring parameters of elements of parallel lc-circuit |
| US3843925A (en) * | 1973-06-11 | 1974-10-22 | V Shlyandin | Method for measuring parameters of complex electric circuit components and device for effecting same |
| US3846699A (en) * | 1973-07-16 | 1974-11-05 | A Morozov | Method and device for measuring parameters of resonant lc circuit elements |
| US3848186A (en) * | 1973-08-24 | 1974-11-12 | A Martyashin | Method of measuring parameters of complex electric circuit and device for effecting same |
-
1976
- 1976-10-01 SU SU762408263A patent/SU750389A1/ru active
-
1977
- 1977-09-29 CS CS776329A patent/CS196800B1/cs unknown
- 1977-09-29 US US05/837,849 patent/US4136313A/en not_active Expired - Lifetime
- 1977-09-30 FR FR7729529A patent/FR2366575A1/fr active Granted
- 1977-09-30 DE DE2744122A patent/DE2744122C3/de not_active Expired
- 1977-10-01 JP JP11852877A patent/JPS5388769A/ja active Pending
- 1977-10-03 GB GB41032/77A patent/GB1550062A/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| SU750389A1 (ru) | 1980-07-23 |
| FR2366575B1 (enExample) | 1981-01-16 |
| US4136313A (en) | 1979-01-23 |
| GB1550062A (en) | 1979-08-08 |
| DE2744122C3 (de) | 1980-09-04 |
| DE2744122B2 (de) | 1980-01-10 |
| JPS5388769A (en) | 1978-08-04 |
| DE2744122A1 (de) | 1978-04-06 |
| FR2366575A1 (fr) | 1978-04-28 |
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