CN2814427Y - Testing and regulating device for quartz crystal oscillator - Google Patents
Testing and regulating device for quartz crystal oscillator Download PDFInfo
- Publication number
- CN2814427Y CN2814427Y CN 200520055171 CN200520055171U CN2814427Y CN 2814427 Y CN2814427 Y CN 2814427Y CN 200520055171 CN200520055171 CN 200520055171 CN 200520055171 U CN200520055171 U CN 200520055171U CN 2814427 Y CN2814427 Y CN 2814427Y
- Authority
- CN
- China
- Prior art keywords
- quartz oscillator
- circuit
- test
- test adjusting
- module
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Abstract
The utility model provides a testing and regulating device for quartz crystal oscillators, which comprises a processing center, a transmitting module and a testing and regulating module, wherein the processing center and the testing and regulating module are mutually connected through the transmitting module; the testing and regulating module comprises a power source, a frequency meter and a regulating circuit, wherein the power source respectively supplies power to the other elements or circuits of the testing and regulating module, and the frequency meter and the regulating circuit can be connected with an external quartz crystal oscillator. The utility model overcomes the defects of the large-scale testing and regulating of the quartz crystal oscillator, and improves the production technology of the quartz crystal oscillator effectively.
Description
Technical field
The utility model belongs to industrial test, production field, is specifically related to a kind of test adjusting gear and method of quartz oscillator.
Technical background
Quartz oscillator is a kind of passive device that produces stabilized frequency, is widely used on all kinds of communication systems, the terminal, is to be put into the product type that China's Tenth Five-year plan is given priority to.Along with the widespread use of novel electron equipment such as mobile phone, GPS, the demand of quartz oscillator upwards increases with annual double-digit growth amount.In the use of quartz oscillator, because quartzy can't processing with the material of producing the large-scale circuit use now, so quartz oscillator exists as independent components and parts always.
In the production of quartz oscillator, because historical reasons, China is in backward status always in the world.Trace it to its cause, the hysteresis of the homemade production equipment research and development of quartz oscillator is comparison distinct issues, and also there is very big vacancy for the performance test aspect of quartz oscillator, these 2 relations that countless ties are arranged, so how to develop a cover have the mass production system that all kinds of quartz oscillators are adjusted with oscillatory circuit is tested, is applicable to the quartz oscillator characteristic, become the key whether China's quartz oscillator production industry can be in line with international standards.
Owing to without the frequency of the quartz oscillator of cross adjusting along with in a big way deviation appears in the variation of environment temperature, this problem is greatly limited the range of application of this series products, so must adjust the oscillatory circuit of quartz oscillator by technological means, make the frequency change of quartz oscillator reach requirement.In order to reach above purpose, must test without the rule that the frequency of quartz of crossing adjustment changes along with temperature variation each, adjust then, so be badly in need of test and the corresponding oscillatory circuit adjustment technology of development quartz oscillator.
Summary of the invention
The purpose of this utility model is to overcome the deficiencies in the prior art, provides a kind of convenient and swift and be applicable to the test adjusting gear of the quartz oscillator of large-scale industrial production.
In order to reach the utility model purpose, the technical solution adopted in the utility model is as follows:
A kind of test adjusting gear of quartz oscillator, comprise processing enter, transport module and test adjusting module, described processing enter and test adjusting module interconnect by transport module, described test adjusting module comprises power supply, frequency meter and adjustment circuit, power supply is electrically connected with other element or the circuit of test adjusting module respectively, and described frequency meter also is provided with the interface that can be connected outside quartz oscillator with the adjustment circuit.
Test adjusting module described in the utility model also comprises the selection circuit, described selection circuit also is provided with the interface that can connect outside quartz oscillator, by selecting circuit in a time period, to select different quartz oscillators, can realize large-scale test adjustment.
Test adjusting module described in the utility model also comprises temperature controller, and described temperature controller is used to control the working temperature that environment is adjusted in test.
Test adjusting module of the present utility model is provided with expansion interface, can insert other element or circuit by described expansion interface, as digital multimeter, multimeter and phase noise tester etc.
Processing enter of the present utility model can adopt common computer, or adopts single-chip microcomputer, or adopts process chip or circuit based on the robot calculator framework.Accordingly, the bus controller that described transport module can adopt common computer to be suitable for, or special in being used for the control device or the circuit of electronic information transmission usefulness.
Principle of work of the present utility model is:
Performance parameter by frequency meter test quartz oscillator, and this performance parameter is sent to processing enter through transport module, processing enter is simultaneously by the work of transport module controlled frequency meter, and handle the performance parameter that is received, according to result control adjustment circuit the oscillatory circuit of quartz oscillator is adjusted again.
In order to realize large scale test and adjustment, processing enter described in the utility model also can select circuit to select different quartz oscillators by transport module control.So can test and adjust a large amount of quartz oscillators simultaneously, by selecting circuit concrete quartz oscillator is made a choice, can in a period of time, test and adjust on the macroscopic view a large amount of quartz oscillators.
Because the frequency of quartz oscillator can change with the difference of environment temperature, so temperature that the utility model is also tested the working environment of adjusting by temperature controller control, thereby frequency meter can go out the frequency departure of quartz oscillator according to the varying environment temperature test, and by adjusting circuit oscillatory circuit is adjusted accordingly, make the frequency of quartz oscillator comparatively stable.
The performance parameter that the utility model is tested quartz oscillator mainly comprises frequency, frequency tolerance, temperature characterisitic, ageing rate, voltage characteristic, load characteristic, voltage controlled frequency scope; Or increase test response curve and linear rate; Described performance parameter also can comprise start-up time and current characteristics, perhaps comprises by digital multimeter test output voltage, or the phase noise by the test of phase noise tester etc.
The utility model can be tested on a large scale and adjust and simple in structure the quartz oscillator characteristic, only need common computer or single-chip microcomputer in conjunction with common element, and the utility model is compatible strong, can be by compatible at any time other element of expansion interface or circuit, well solved prior art to the deficiency of quartz oscillator in large scale test and adjustment, be fit to promote the use of.
Description of drawings
Fig. 1 is a structured flowchart of the present utility model;
Fig. 2 is a workflow diagram of the present utility model.
Embodiment
Below in conjunction with accompanying drawing the utility model is described further.
Structured flowchart of the present utility model as shown in Figure 1, comprise processing enter 1, transport module 2 and test adjusting module 3, wherein, processing enter 1 comprises data processing centre (DPC) and data storage center, data processing centre (DPC) adopts the CPU element of ordinary individual's computing machine, data storage center adopts and the supporting big capacity hard disk of personal computer, transport module 2 is a Data Transmission Control Unit, the bus controller that present embodiment adopts ordinary individual's computing machine to be suitable for, test adjusting module 3 comprises power supply, frequency meter, select circuit, temperature controller, other tester and adjustment circuit, other tester mainly is can expand element or the circuit that connects according to actual needs by expansion interface, as digital multimeter etc.
Data processing centre (DPC) and data storage center interconnect, and data processing centre (DPC) also is connected by all elements or the circuit of Data Transmission Control Unit with the test adjusting module, and the selection circuit of test adjusting module 3 is connected with outside components and parts 4 (being quartz oscillator) to be measured.
Present embodiment is earlier gone up the IC chip of adjustment to be tested with the quartz-crystal resonator binding, becomes a unadjusted quartz oscillator, and this IC chip is mainly realized according to the content that writes of adjusting circuit the performance of quartz oscillator being adjusted.
Workflow diagram of the present utility model at first can carry out initialization to system on computers, as running parameter is set as shown in Figure 2, is arranged on different time and selects different components and parts to be measured, or change the temperature etc. of test environment at different time; Data processing centre (DPC) selects circuit to select concrete components and parts to be measured according to the content control that is provided with then, and the controlled frequency meter is tested, frequency meter is transferred to processing enter with the performance parameter of test by Data Transmission Control Unit, and be kept at data storage center, data processing centre (DPC) adjusts components and parts according to test result control adjustment circuit again, and the adjustment circuit will be adjusted instruction and write in the IC chip that bundlees with quartz-crystal resonator in the quartz oscillator.The utility model can by data processing centre (DPC) automatically the whole test of control adjust flow process, but also manual control can withdraw from entire work process as required in test process.
Particularly, mainly comprise:
1, test process begins, and comprises putting components and parts to be measured well, starts power supply, and all parts are in starting state;
2, start setting program, enter user setup interface; 3, the user is provided with the adjustment initial environment, promptly is provided for judging which product through can be considered to after the above-mentioned test might be through adjusting the condition that become specification product, and is general all according to the products standards of national appointment;
4, the user is provided with the adjustment desired value, and the final goal value through each characteristic behind the production debugging of adjusting after the screening promptly is set;
5, the user sets process and each status of processes that test need be passed through;
6, enter test
7, loop test is finished up to process
8, enter the product screening process, judge according to before record and setting value;
9, entering adjustment, carry out according to before record, mainly is to adjust circuit to adjust;
10, circulation adjustment is finished up to process;
11, enter the test that is used to verify, promptly adjusted components and parts are tested again;
12, loop test is finished up to process;
13, which is specification product in all products, which is substandard product to notify the user;
14, process finishes.
Claims (6)
1, a kind of test adjusting gear of quartz oscillator, it is characterized in that comprising processing enter, transport module and test adjusting module, described processing enter and test adjusting module interconnect by transport module, described test adjusting module comprises power supply, frequency meter and adjustment circuit, described power supply is electrically connected with other element or the circuit of test adjusting module respectively, and described frequency meter also is provided with the interface that can be connected outside quartz oscillator with the adjustment circuit.
2, the test adjusting gear of quartz oscillator according to claim 1 is characterized in that described test adjusting module also comprises the selection circuit, and described selection circuit also is provided with the interface that can connect outside quartz oscillator.
3, the test adjusting gear of quartz oscillator according to claim 1 and 2 is characterized in that described test adjusting module also comprises temperature controller.
4, the test adjusting gear of quartz oscillator according to claim 3 is characterized in that described test adjusting module is provided with can insert other element or circuit expansion interface.
5, the test adjusting gear of quartz oscillator according to claim 4 is characterized in that described processing enter can adopt common computer, or adopts single-chip microcomputer, or adopts process chip or circuit based on the robot calculator framework.
6, the test adjusting gear of quartz oscillator according to claim 5 is characterized in that the bus controller that described transport module adopts common computer to be suitable for, or special in being used for the control device or the circuit of electronic information transmission usefulness.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200520055171 CN2814427Y (en) | 2005-03-02 | 2005-03-02 | Testing and regulating device for quartz crystal oscillator |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200520055171 CN2814427Y (en) | 2005-03-02 | 2005-03-02 | Testing and regulating device for quartz crystal oscillator |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN2814427Y true CN2814427Y (en) | 2006-09-06 |
Family
ID=36949514
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 200520055171 Expired - Lifetime CN2814427Y (en) | 2005-03-02 | 2005-03-02 | Testing and regulating device for quartz crystal oscillator |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN2814427Y (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100473995C (en) * | 2005-03-02 | 2009-04-01 | 欧阳槐清 | Testing regulating device and method of quartz crystal osciuator |
| CN101419262B (en) * | 2008-10-10 | 2011-06-15 | 南京信息工程大学 | On-line detecting system for quartz crystal oscillator |
| CN102565676A (en) * | 2012-01-13 | 2012-07-11 | 平湖市电子有限公司 | Automation measuring apparatus for crystal oscillator parameters |
| CN103905000A (en) * | 2012-12-28 | 2014-07-02 | 联芯科技有限公司 | Method for adjusting frequency and terminal device |
| CN107543960A (en) * | 2017-06-19 | 2018-01-05 | 江汉大学 | A kind of high stability crystal oscillator measurement apparatus |
| CN109828151A (en) * | 2019-03-07 | 2019-05-31 | 李德成 | A kind of quartz clock twin crystal vibration temperature compensation calibration method |
-
2005
- 2005-03-02 CN CN 200520055171 patent/CN2814427Y/en not_active Expired - Lifetime
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100473995C (en) * | 2005-03-02 | 2009-04-01 | 欧阳槐清 | Testing regulating device and method of quartz crystal osciuator |
| CN101419262B (en) * | 2008-10-10 | 2011-06-15 | 南京信息工程大学 | On-line detecting system for quartz crystal oscillator |
| CN102565676A (en) * | 2012-01-13 | 2012-07-11 | 平湖市电子有限公司 | Automation measuring apparatus for crystal oscillator parameters |
| CN102565676B (en) * | 2012-01-13 | 2014-01-01 | 平湖市电子有限公司 | Automation measuring apparatus for crystal oscillator parameters |
| CN103905000A (en) * | 2012-12-28 | 2014-07-02 | 联芯科技有限公司 | Method for adjusting frequency and terminal device |
| CN103905000B (en) * | 2012-12-28 | 2017-07-11 | 联芯科技有限公司 | The method and terminal device of frequency adjustment |
| CN107543960A (en) * | 2017-06-19 | 2018-01-05 | 江汉大学 | A kind of high stability crystal oscillator measurement apparatus |
| CN107543960B (en) * | 2017-06-19 | 2022-06-17 | 江汉大学 | High-stability crystal oscillator measuring device |
| CN109828151A (en) * | 2019-03-07 | 2019-05-31 | 李德成 | A kind of quartz clock twin crystal vibration temperature compensation calibration method |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN1657957A (en) | Testing regulating device and method of quartz crystal osciuator | |
| CN2814427Y (en) | Testing and regulating device for quartz crystal oscillator | |
| US8102720B2 (en) | System and method of pulse generation | |
| US20130246829A1 (en) | Generating a power model for an electronic device | |
| US9660649B2 (en) | Voltage scaling for holistic energy management | |
| CN103163940A (en) | Method of clock control of system on chip including functional block, system on chip of the same and semicondutor system including the same | |
| CN103683292A (en) | Parallel type quasi-proportional resonance active power filter and control method thereof | |
| CN103226382B (en) | Application operation method and electronic equipment | |
| CN104699214A (en) | Dynamic voltage and frequency scaling device and method | |
| US9671847B2 (en) | Semiconductor device employing closed loop and open loop DVFS control and semiconductor system including the same | |
| CN106557152A (en) | A kind of control device and method of mainboard | |
| CN103513698B (en) | A kind of clock signal calibration, device and electronic equipment | |
| CN1456723A (en) | Electronic let-off controlling system and method | |
| CN1605972A (en) | Supply voltage control circuit of central processing unit | |
| WO2005052771A1 (en) | Calibrating an integrated circuit to an electronic device | |
| CN103873056A (en) | Automatic oscillator calibration device and calibration method thereof | |
| CN105137222A (en) | Product delivery technical parameter test method and device | |
| CN203313413U (en) | Sensor reliability detection system for Internet of things | |
| CN112737574A (en) | Timing calibration method of chip internal clock source and related device | |
| CN105302678A (en) | Adjusting and optimizing method utilizing PID to achieve fluctuations of CPU and internal storage VR output voltage | |
| CN101561691B (en) | Method and device for regulating system frequency of storage device | |
| CN110045951A (en) | A kind of developing instrument that neural network hardware low-power consumption customizes | |
| CN104168015A (en) | Oscillation device and clock pulse signal generation method | |
| CN202218192U (en) | Programmable oscillator | |
| CN217133313U (en) | Test system of crystal oscillator chip |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| AV01 | Patent right actively abandoned |
Effective date of abandoning: 20090401 |
|
| C25 | Abandonment of patent right or utility model to avoid double patenting |