CN1657957A - Testing regulating device and method of quartz crystal osciuator - Google Patents
Testing regulating device and method of quartz crystal osciuator Download PDFInfo
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- CN1657957A CN1657957A CN 200510033353 CN200510033353A CN1657957A CN 1657957 A CN1657957 A CN 1657957A CN 200510033353 CN200510033353 CN 200510033353 CN 200510033353 A CN200510033353 A CN 200510033353A CN 1657957 A CN1657957 A CN 1657957A
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- quartz oscillator
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- test adjusting
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- 238000012360 testing method Methods 0.000 title claims abstract description 74
- 239000010453 quartz Substances 0.000 title claims abstract description 61
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 title claims abstract description 61
- 238000000034 method Methods 0.000 title claims abstract description 23
- 239000013078 crystal Substances 0.000 title abstract description 7
- 230000001105 regulatory effect Effects 0.000 title 1
- 238000012545 processing Methods 0.000 claims abstract description 24
- 230000005540 biological transmission Effects 0.000 claims abstract description 6
- 230000003534 oscillatory effect Effects 0.000 claims description 6
- 230000032683 aging Effects 0.000 claims description 2
- 238000004519 manufacturing process Methods 0.000 description 6
- 230000007812 deficiency Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000012216 screening Methods 0.000 description 2
- 238000004891 communication Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000009776 industrial production Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000011056 performance test Methods 0.000 description 1
- 238000012827 research and development Methods 0.000 description 1
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Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CNB2005100333532A CN100473995C (en) | 2005-03-02 | 2005-03-02 | Testing regulating device and method of quartz crystal osciuator |
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CNB2005100333532A CN100473995C (en) | 2005-03-02 | 2005-03-02 | Testing regulating device and method of quartz crystal osciuator |
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CN1657957A true CN1657957A (en) | 2005-08-24 |
CN100473995C CN100473995C (en) | 2009-04-01 |
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CNB2005100333532A Active CN100473995C (en) | 2005-03-02 | 2005-03-02 | Testing regulating device and method of quartz crystal osciuator |
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Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101713811B (en) * | 2009-10-29 | 2011-09-28 | 天津必利优科技发展有限公司 | System for automatically testing parameters of quartz crystal oscillator |
CN102565676A (en) * | 2012-01-13 | 2012-07-11 | 平湖市电子有限公司 | Automation measuring apparatus for crystal oscillator parameters |
CN102914711A (en) * | 2012-10-12 | 2013-02-06 | 中国电子科技集团公司第二十研究所 | Method for simultaneously measuring measured pieces in different types in quartz crystal oscillator testing system |
CN102928692A (en) * | 2012-10-12 | 2013-02-13 | 中国电子科技集团公司第二十研究所 | Method for measuring newly-added tested pieces in operation process of quartz crystal automatic testing system |
CN102981138A (en) * | 2012-11-14 | 2013-03-20 | 中国电力科学研究院 | Electric-energy-meter-use clock chip full performance test system and method thereof |
CN105301415A (en) * | 2015-11-27 | 2016-02-03 | 廊坊中电熊猫晶体科技有限公司 | Method for improving test of SMD quartz crystal resonator by employing network analyzer |
CN107765164A (en) * | 2017-09-28 | 2018-03-06 | 国营芜湖机械厂 | A kind of circuit board high-frequency signal method of adjustment |
CN107991600A (en) * | 2017-11-29 | 2018-05-04 | 成都锐成芯微科技股份有限公司 | Automatic test approach and its test system |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101609126B (en) * | 2009-07-16 | 2013-04-24 | 广东大普通信技术有限公司 | Automatic testing system of temperature compensating crystal oscillator |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH08288741A (en) * | 1995-04-14 | 1996-11-01 | Matsushita Electric Ind Co Ltd | Crystal oscillator and adjusting method therefor |
GB2349995A (en) * | 1999-05-14 | 2000-11-15 | Ericsson Telefon Ab L M | An oscillator in which when the frequency is adjusted the level is also adjusted |
CN2449236Y (en) * | 2000-10-27 | 2001-09-19 | 南京熊猫仪器仪表有限公司 | Autoamtic positioning frequency-testing classifier for quartz chip |
CN1371170A (en) * | 2001-02-27 | 2002-09-25 | 谭洪斌 | Frequency trimmer |
CN2814427Y (en) * | 2005-03-02 | 2006-09-06 | 欧阳槐清 | Testing and regulating device for quartz crystal oscillator |
-
2005
- 2005-03-02 CN CNB2005100333532A patent/CN100473995C/en active Active
Cited By (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101713811B (en) * | 2009-10-29 | 2011-09-28 | 天津必利优科技发展有限公司 | System for automatically testing parameters of quartz crystal oscillator |
CN102565676A (en) * | 2012-01-13 | 2012-07-11 | 平湖市电子有限公司 | Automation measuring apparatus for crystal oscillator parameters |
CN102565676B (en) * | 2012-01-13 | 2014-01-01 | 平湖市电子有限公司 | Automation measuring apparatus for crystal oscillator parameters |
CN102914711A (en) * | 2012-10-12 | 2013-02-06 | 中国电子科技集团公司第二十研究所 | Method for simultaneously measuring measured pieces in different types in quartz crystal oscillator testing system |
CN102928692A (en) * | 2012-10-12 | 2013-02-13 | 中国电子科技集团公司第二十研究所 | Method for measuring newly-added tested pieces in operation process of quartz crystal automatic testing system |
CN102928692B (en) * | 2012-10-12 | 2014-10-29 | 中国电子科技集团公司第二十研究所 | Method for measuring newly-added tested pieces in operation process of quartz crystal automatic testing system |
CN102914711B (en) * | 2012-10-12 | 2015-06-17 | 中国电子科技集团公司第二十研究所 | Method for simultaneously measuring measured pieces in different types in quartz crystal oscillator testing system |
CN102981138A (en) * | 2012-11-14 | 2013-03-20 | 中国电力科学研究院 | Electric-energy-meter-use clock chip full performance test system and method thereof |
CN105301415A (en) * | 2015-11-27 | 2016-02-03 | 廊坊中电熊猫晶体科技有限公司 | Method for improving test of SMD quartz crystal resonator by employing network analyzer |
CN105301415B (en) * | 2015-11-27 | 2018-06-22 | 廊坊中电熊猫晶体科技有限公司 | Improve the method using Network Analyzer test patch quartz-crystal resonator |
CN107765164A (en) * | 2017-09-28 | 2018-03-06 | 国营芜湖机械厂 | A kind of circuit board high-frequency signal method of adjustment |
CN107991600A (en) * | 2017-11-29 | 2018-05-04 | 成都锐成芯微科技股份有限公司 | Automatic test approach and its test system |
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Publication number | Publication date |
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CN100473995C (en) | 2009-04-01 |
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Effective date of registration: 20130716 Address after: 510635, Guangdong province Guangzhou Guangzhou hi tech Industrial Development Zone Science City cliff Eagle Road No. 27, building four, building 401, room C Patentee after: GUANGZHOU JINGYOU ELECTRONIC TECHNOLOGY CO., LTD. Address before: Post 139 dormitory No. 510630 Guangdong city of Guangzhou province Zhongshan Road 35 building 508 room Patentee before: Ouyang Huaiqing |
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Denomination of invention: Testing regulating device and method of quartz crystal osciuator Effective date of registration: 20180322 Granted publication date: 20090401 Pledgee: Bank of Guangzhou branch of the Bank of Guangzhou Science City Branch Pledgor: GUANGZHOU JINGYOU ELECTRONIC TECHNOLOGY CO., LTD. Registration number: 2018440000065 |
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Date of cancellation: 20190522 Granted publication date: 20090401 Pledgee: Bank of Guangzhou branch of the Bank of Guangzhou Science City Branch Pledgor: GUANGZHOU JINGYOU ELECTRONIC TECHNOLOGY CO., LTD. Registration number: 2018440000065 |
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PC01 | Cancellation of the registration of the contract for pledge of patent right |