CN1657957A - Testing regulating device and method of quartz crystal osciuator - Google Patents

Testing regulating device and method of quartz crystal osciuator Download PDF

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Publication number
CN1657957A
CN1657957A CN 200510033353 CN200510033353A CN1657957A CN 1657957 A CN1657957 A CN 1657957A CN 200510033353 CN200510033353 CN 200510033353 CN 200510033353 A CN200510033353 A CN 200510033353A CN 1657957 A CN1657957 A CN 1657957A
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CN
China
Prior art keywords
quartz oscillator
test
circuit
test adjusting
module
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CN 200510033353
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Chinese (zh)
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CN100473995C (en
Inventor
欧阳晟
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欧阳槐清
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Priority to CNB2005100333532A priority Critical patent/CN100473995C/en
Publication of CN1657957A publication Critical patent/CN1657957A/en
Application granted granted Critical
Publication of CN100473995C publication Critical patent/CN100473995C/en

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Abstract

This invention discloses a test adjuster and the method for quartz crystal oscillator, including the processing center, the transmission module and the test adjustment module, the processing center and the test adjustment module connects mutually exterior, the test adjustment module including the power source, the frequency meter and the adjustment electric circuit, the power source gives the test adjustment module separately other part 'or' circuit power supplies, the frequency meter and the adjustment electric circuit also may connect the quartz crystal oscillator. The frequency meter tests performance parameter quartz crystal oscillator, transfering the performance parameter to the processing centre, the adjusting the quartz crystal oscillator.

Description

A kind of test adjusting gear and method of quartz oscillator
Technical field
The invention belongs to industrial test, production field, be specifically related to a kind of test adjusting gear and method of quartz oscillator.
Technical background
Quartz oscillator is a kind of passive device that produces stabilized frequency, is widely used on all kinds of communication systems, the terminal, is to be put into the product type that China's Tenth Five-year plan is given priority to.Along with the widespread use of novel electron equipment such as mobile phone, GPS, the demand of quartz oscillator upwards increases with annual double-digit growth amount.In the use of quartz oscillator, because quartzy can't processing with the material of producing the large-scale circuit use now, so quartz oscillator exists as independent components and parts always.
In the production of quartz oscillator, because historical reasons, China is in backward status always in the world.Trace it to its cause, the hysteresis of the homemade production equipment research and development of quartz oscillator is comparison distinct issues, and also there is very big vacancy for the performance test aspect of quartz oscillator, these 2 relations that countless ties are arranged, so how to develop a cover have the mass production system that all kinds of quartz oscillators are adjusted with oscillatory circuit is tested, is applicable to the quartz oscillator characteristic, become the key whether China's quartz oscillator production industry can be in line with international standards.
Owing to without the frequency of the quartz oscillator of cross adjusting along with in a big way deviation appears in the variation of environment temperature, this problem is greatly limited the range of application of this series products, so must adjust the oscillatory circuit of quartz oscillator by technological means, make the frequency change of quartz oscillator reach requirement.In order to reach above purpose, must test without the rule that the frequency of quartz of crossing adjustment changes along with temperature variation each, adjust then, so be badly in need of test and the corresponding oscillatory circuit adjustment technology of development quartz oscillator.
Summary of the invention
The objective of the invention is to overcome the deficiencies in the prior art, provide a kind of convenient and swift and be applicable to the test adjusting gear of the quartz oscillator of large-scale industrial production.
Another object of the present invention is to provide a kind of method for test adjusting of the quartz oscillator of implementing according to last destination device.
In order to reach last goal of the invention, the technical solution used in the present invention is as follows:
A kind of test adjusting gear of quartz oscillator, comprise processing enter, transport module and test adjusting module, described processing enter and test adjusting module interconnect by transport module, described test adjusting module comprises power supply, frequency meter and adjustment circuit, power supply is electrically connected with other element or the circuit of test adjusting module respectively, and described frequency meter also is provided with the interface that can be connected outside quartz oscillator with the adjustment circuit.
Test adjusting module of the present invention also comprises the selection circuit, described selection circuit also is provided with the interface that can connect outside quartz oscillator, by selecting circuit in a time period, to select different quartz oscillators, can realize large-scale test adjustment.
Test adjusting module of the present invention also comprises temperature controller, and described temperature controller is used to control the working temperature that environment is adjusted in test.
Test adjusting module of the present invention is provided with expansion interface, can insert other element or circuit by described expansion interface, as digital multimeter, multimeter and phase noise tester etc.
Processing enter of the present invention can adopt common computer, or adopts single-chip microcomputer, or adopts process chip or circuit based on the robot calculator framework.Accordingly, the bus controller that described transport module can adopt common computer to be suitable for, or special in being used for the control device or the circuit of electronic information transmission usefulness.
In order to realize back one goal of the invention, the technical solution used in the present invention is:
A kind of method for test adjusting of quartz oscillator, performance parameter by frequency meter test quartz oscillator, and this performance parameter is sent to processing enter through transport module, processing enter is simultaneously by the work of transport module controlled frequency meter, and handle the performance parameter that is received, according to result control adjustment circuit the oscillatory circuit of quartz oscillator is adjusted again.
In order to realize large scale test and adjustment, processing enter of the present invention also can select circuit to select different quartz oscillators by transport module control.So can test and adjust a large amount of quartz oscillators simultaneously, by selecting circuit concrete quartz oscillator is made a choice, can in a period of time, test and adjust on the macroscopic view a large amount of quartz oscillators.
Because the frequency of quartz oscillator can change with the difference of environment temperature, so temperature that the present invention also tests the working environment of adjusting by temperature controller control, thereby frequency meter can go out the frequency departure of quartz oscillator according to the varying environment temperature test, and by adjusting circuit oscillatory circuit is adjusted accordingly, make the frequency of quartz oscillator comparatively stable.
The performance parameter that the present invention tests quartz oscillator mainly comprises frequency, frequency tolerance, temperature characterisitic, ageing rate, voltage characteristic, load characteristic, voltage controlled frequency scope; Or increase test response curve and linear rate; Described performance parameter also can comprise start-up time and current characteristics, perhaps comprises by digital multimeter test output voltage, or the phase noise by the test of phase noise tester etc.
The present invention can test on a large scale and adjust and simple in structure the quartz oscillator characteristic, only need common computer or single-chip microcomputer in conjunction with common element, and the present invention is compatible strong, can be by compatible at any time other element of expansion interface or circuit, well solved prior art to the deficiency of quartz oscillator in large scale test and adjustment, be fit to promote the use of.
Description of drawings
Fig. 1 is a structured flowchart of the present invention;
Fig. 2 is a workflow diagram of the present invention.
Embodiment
The present invention is described further below in conjunction with accompanying drawing.
Structured flowchart of the present invention as shown in Figure 1, comprise processing enter 1, transport module 2 and test adjusting module 3, wherein, processing enter 1 comprises data processing centre (DPC) and data storage center, data processing centre (DPC) adopts the CPU element of ordinary individual's computing machine, data storage center adopts and the supporting big capacity hard disk of personal computer, transport module 2 is a Data Transmission Control Unit, the bus controller that present embodiment adopts ordinary individual's computing machine to be suitable for, test adjusting module 3 comprises power supply, frequency meter, select circuit, temperature controller, other tester and adjustment circuit, other tester mainly is can expand element or the circuit that connects according to actual needs by expansion interface, as digital multimeter etc.
Data processing centre (DPC) and data storage center interconnect, and data processing centre (DPC) also is connected by all elements or the circuit of Data Transmission Control Unit with the test adjusting module, and the selection circuit of test adjusting module 3 is connected with outside components and parts 4 (being quartz oscillator) to be measured.
Present embodiment is earlier gone up the IC chip of adjustment to be tested with the quartz-crystal resonator binding, becomes a unadjusted quartz oscillator, and this IC chip is mainly realized according to the content that writes of adjusting circuit the performance of quartz oscillator being adjusted.
Workflow diagram of the present invention at first can carry out initialization to system on computers, as running parameter is set as shown in Figure 2, is arranged on different time and selects different components and parts to be measured, or change the temperature etc. of test environment at different time; Data processing centre (DPC) selects circuit to select concrete components and parts to be measured according to the content control that is provided with then, and the controlled frequency meter is tested, frequency meter is transferred to processing enter with the performance parameter of test by Data Transmission Control Unit, and be kept at data storage center, data processing centre (DPC) adjusts components and parts according to test result control adjustment circuit again, and the adjustment circuit will be adjusted instruction and write in the IC chip that bundlees with quartz-crystal resonator in the quartz oscillator.The present invention can by data processing centre (DPC) automatically the whole test of control adjust flow process, but also manual control can withdraw from entire work process as required in test process.
Particularly, mainly comprise:
1, test process begins, and comprises putting components and parts to be measured well, starts power supply, and all parts are in starting state;
2, start setting program, enter user setup interface; 3, the user is provided with the adjustment initial environment, promptly is provided for judging which product through can be considered to after the above-mentioned test might be through adjusting the condition that become specification product, and is general all according to the products standards of national appointment;
4, the user is provided with the adjustment desired value, and the final goal value through each characteristic behind the production debugging of adjusting after the screening promptly is set;
5, the user sets process and each status of processes that test need be passed through;
6, enter test
7, loop test is finished up to process
8, enter the product screening process, judge according to before record and setting value;
9, entering adjustment, carry out according to before record, mainly is to adjust circuit to adjust;
10, circulation adjustment is finished up to process;
11, enter the test that is used to verify, promptly adjusted components and parts are tested again;
12, loop test is finished up to process;
13, which is specification product in all products, which is substandard product to notify the user;
14, process finishes.

Claims (10)

1, a kind of test adjusting gear of quartz oscillator, it is characterized in that comprising processing enter, transport module and test adjusting module, described processing enter and test adjusting module interconnect by transport module, described test adjusting module comprises power supply, frequency meter and adjustment circuit, described power supply is electrically connected with other element or the circuit of test adjusting module respectively, and described frequency meter also is provided with the interface that can be connected outside quartz oscillator with the adjustment circuit.
2, the test adjusting gear of quartz oscillator according to claim 1 is characterized in that described test adjusting module also comprises the selection circuit, and described selection circuit also is provided with the interface that can connect outside quartz oscillator.
3, the test adjusting gear of quartz oscillator according to claim 1 and 2 is characterized in that described test adjusting module also comprises temperature controller.
4, the test adjusting gear of quartz oscillator according to claim 3 is characterized in that described test adjusting module is provided with can insert other element or circuit expansion interface.
5, the test adjusting gear of quartz oscillator according to claim 4 is characterized in that described processing enter can adopt common computer, or adopts single-chip microcomputer, or adopts process chip or circuit based on the robot calculator framework.
6, the test adjusting gear of quartz oscillator according to claim 5 is characterized in that the bus controller that described transport module adopts common computer to be suitable for, or special in being used for the control device or the circuit of electronic information transmission usefulness.
7, a kind of method for test adjusting that adopts the quartz oscillator of the described test adjusting gear of claim 1, it is characterized in that performance parameter by described frequency meter test quartz oscillator, and this performance parameter is sent to processing enter through transport module, processing enter is simultaneously by the work of transport module controlled frequency meter, and handle the performance parameter that is received, according to result control adjustment circuit the oscillatory circuit of quartz oscillator is adjusted again.
8, the method for test adjusting of quartz oscillator according to claim 7 is characterized in that described processing enter also can be by the different quartz oscillator of transport module control selection circuit selection.
9, the method for test adjusting of quartz oscillator according to claim 8 is characterized in that also can controlling the temperature of testing the working environment of adjusting by temperature controller.
10, the method for testing of quartz oscillator according to claim 9 is characterized in that the performance parameter of described frequency meter test quartz oscillator comprises frequency, frequency tolerance, temperature characterisitic, ageing rate, voltage characteristic, load characteristic, voltage controlled frequency scope.
CNB2005100333532A 2005-03-02 2005-03-02 Testing regulating device and method of quartz crystal osciuator CN100473995C (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CNB2005100333532A CN100473995C (en) 2005-03-02 2005-03-02 Testing regulating device and method of quartz crystal osciuator

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CNB2005100333532A CN100473995C (en) 2005-03-02 2005-03-02 Testing regulating device and method of quartz crystal osciuator

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CN1657957A true CN1657957A (en) 2005-08-24
CN100473995C CN100473995C (en) 2009-04-01

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Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101713811B (en) * 2009-10-29 2011-09-28 天津必利优科技发展有限公司 System for automatically testing parameters of quartz crystal oscillator
CN102565676A (en) * 2012-01-13 2012-07-11 平湖市电子有限公司 Automation measuring apparatus for crystal oscillator parameters
CN102914711A (en) * 2012-10-12 2013-02-06 中国电子科技集团公司第二十研究所 Method for simultaneously measuring measured pieces in different types in quartz crystal oscillator testing system
CN102928692A (en) * 2012-10-12 2013-02-13 中国电子科技集团公司第二十研究所 Method for measuring newly-added tested pieces in operation process of quartz crystal automatic testing system
CN102981138A (en) * 2012-11-14 2013-03-20 中国电力科学研究院 Electric-energy-meter-use clock chip full performance test system and method thereof
CN105301415A (en) * 2015-11-27 2016-02-03 廊坊中电熊猫晶体科技有限公司 Method for improving test of SMD quartz crystal resonator by employing network analyzer
CN107765164A (en) * 2017-09-28 2018-03-06 国营芜湖机械厂 A kind of circuit board high-frequency signal method of adjustment
CN107991600A (en) * 2017-11-29 2018-05-04 成都锐成芯微科技股份有限公司 Automatic test approach and its test system

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101609126B (en) * 2009-07-16 2013-04-24 广东大普通信技术有限公司 Automatic testing system of temperature compensating crystal oscillator

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08288741A (en) * 1995-04-14 1996-11-01 Matsushita Electric Ind Co Ltd Crystal oscillator and adjusting method therefor
GB2349995A (en) * 1999-05-14 2000-11-15 Ericsson Telefon Ab L M An oscillator in which when the frequency is adjusted the level is also adjusted
CN2449236Y (en) * 2000-10-27 2001-09-19 南京熊猫仪器仪表有限公司 Autoamtic positioning frequency-testing classifier for quartz chip
CN1371170A (en) * 2001-02-27 2002-09-25 谭洪斌 Frequency trimmer
CN2814427Y (en) * 2005-03-02 2006-09-06 欧阳槐清 Testing and regulating device for quartz crystal oscillator

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101713811B (en) * 2009-10-29 2011-09-28 天津必利优科技发展有限公司 System for automatically testing parameters of quartz crystal oscillator
CN102565676A (en) * 2012-01-13 2012-07-11 平湖市电子有限公司 Automation measuring apparatus for crystal oscillator parameters
CN102565676B (en) * 2012-01-13 2014-01-01 平湖市电子有限公司 Automation measuring apparatus for crystal oscillator parameters
CN102914711A (en) * 2012-10-12 2013-02-06 中国电子科技集团公司第二十研究所 Method for simultaneously measuring measured pieces in different types in quartz crystal oscillator testing system
CN102928692A (en) * 2012-10-12 2013-02-13 中国电子科技集团公司第二十研究所 Method for measuring newly-added tested pieces in operation process of quartz crystal automatic testing system
CN102928692B (en) * 2012-10-12 2014-10-29 中国电子科技集团公司第二十研究所 Method for measuring newly-added tested pieces in operation process of quartz crystal automatic testing system
CN102914711B (en) * 2012-10-12 2015-06-17 中国电子科技集团公司第二十研究所 Method for simultaneously measuring measured pieces in different types in quartz crystal oscillator testing system
CN102981138A (en) * 2012-11-14 2013-03-20 中国电力科学研究院 Electric-energy-meter-use clock chip full performance test system and method thereof
CN105301415A (en) * 2015-11-27 2016-02-03 廊坊中电熊猫晶体科技有限公司 Method for improving test of SMD quartz crystal resonator by employing network analyzer
CN105301415B (en) * 2015-11-27 2018-06-22 廊坊中电熊猫晶体科技有限公司 Improve the method using Network Analyzer test patch quartz-crystal resonator
CN107765164A (en) * 2017-09-28 2018-03-06 国营芜湖机械厂 A kind of circuit board high-frequency signal method of adjustment
CN107991600A (en) * 2017-11-29 2018-05-04 成都锐成芯微科技股份有限公司 Automatic test approach and its test system

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