CN102981138A - Electric-energy-meter-use clock chip full performance test system and method thereof - Google Patents
Electric-energy-meter-use clock chip full performance test system and method thereof Download PDFInfo
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- CN102981138A CN102981138A CN2012104576798A CN201210457679A CN102981138A CN 102981138 A CN102981138 A CN 102981138A CN 2012104576798 A CN2012104576798 A CN 2012104576798A CN 201210457679 A CN201210457679 A CN 201210457679A CN 102981138 A CN102981138 A CN 102981138A
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Abstract
本发明提供一种电能表用时钟芯片全性能测试系统及其方法，系统包括测试模块、日计时误差测试仪和温度试验箱；置于测试模块中的时钟芯片输出秒脉冲信号，所述测试模块将秒脉冲信号输入日计时误差测试仪，通过调节温度试验箱的温度，测试模块和日计时误差测试仪测试不同温度下的晶体振荡输出频率偏差和日计时误差。本发明可对时钟芯片进行测试，同时可对采用该时钟芯片的电能表整机进行测试，采用芯片测试座形式装入时钟芯片，避免了在测试中的芯片焊接，提高测试效率和测试成本；具有扩展性，可针对不同的芯片外接相应的测试板即可进行测试；可对时钟芯片可靠性进行评估，实现时钟芯片的寿命预计。
The invention provides a clock chip full-performance testing system and method for an electric energy meter. The system includes a test module, a daily timing error tester and a temperature test chamber; the clock chip placed in the test module outputs a second pulse signal, and the test module Input the second pulse signal into the daily timing error tester, by adjusting the temperature of the temperature test chamber, the test module and the daily timing error tester test the crystal oscillation output frequency deviation and daily timing error at different temperatures. The present invention can test the clock chip, and at the same time can test the whole electric energy meter using the clock chip. The clock chip is loaded in the form of a chip test socket, which avoids the chip welding during the test, and improves the test efficiency and test cost; It has scalability, and can be tested by connecting the corresponding test board for different chips; it can evaluate the reliability of the clock chip and realize the life expectancy of the clock chip.
Description
Technical field
The invention belongs to control and technical field of measurement and test, be specifically related to a kind of electric energy meter clock chip full performance test system and method thereof.
Background technology
Along with the popularization of intelligent electric energy meter with popularize, the accuracy of clock is not only having important effect aspect block meter rate, the time-shared charge, provide important evidence for the analysis of intelligent electric energy meter operating condition, dsm simultaneously.The timing error of intelligent electric energy meter needs just can come into operation after tested.Clock chip is as the foundation of intelligent electric energy meter timing, and its quality has determined the accuracy of intelligent electric energy meter complete machine timing, only has through the qualified clock chip of full Performance Detection just to can be applicable in the intelligent electric energy meter.
Clock chip essence is to carry out the then cumulative date Hour Minute Second equal time information that obtains of frequency division by the concussion frequency that crystal oscillator is produced, and sends into processor by the computer communication mouth and process.Along with intelligent electric energy meter is more and more higher to the requirement of clock chip, the actual condition that need in electric energy meter, use according to clock chip, formulate the full method for testing performance of clock chip, comprise basic parameter test, environmental parameter test, to check its process design method.Timing error for intelligent electric energy meter only detects its error of time of day at present, does not take special checkout equipment and detection method for clock chip, causes occurring in the at the scene practical application timing error of intelligent electric energy meter.Therefore be necessary to provide a kind of electric energy meter with the full performance detecting system of clock chip and method thereof, guarantee the reliability of clock chip, for the electric energy meter timing precision provides safeguard.
Summary of the invention
In order to overcome above-mentioned the deficiencies in the prior art, the invention provides a kind of electric energy meter clock chip full performance test system and method thereof, can test clock chip, can test the electric energy meter complete machine that adopts this clock chip simultaneously, adopt the chip test base form clock chip of packing into, avoid the chips welding in test, improved testing efficiency and testing cost; Can finish basic performance tests, chip reliability test, the electric energy meter timing fail-test of clock chip, pilot project is comprehensive, and is simple to operate; Have extendability, can test for the external corresponding test board of different chips; Can assess the clock chip reliability, realize the biometrics of clock chip.
In order to realize the foregoing invention purpose, the present invention takes following technical scheme:
A kind of electric energy meter clock chip full performance test system is provided, and described system comprises test module, error of time of day test cell and temperature test chamber; Place the clock chip output pps pulse per second signal of test module, described test module is inputted the error of time of day test cell with pps pulse per second signal, by regulating the temperature of temperature test chamber, crystal oscillation output frequency deviation and error of time of day under test module and the error of time of day test cell test different temperatures.
Described test module comprises chip test base, chip crystal oscillation frequency lead-out terminal, current detecting unit, chip power-consumption test output terminal, frequency test unit, electric energy meter integration module, chip periphery circuit and adjustable direct voltage source.
Described clock chip places described chip test base, chip crystal oscillation frequency lead-out terminal rate of connections test cell, current detecting unit connects chip power consumption test lead-out terminal, and adjustable direct voltage source is described chip periphery circuit and the power supply of electric energy meter integration module.
Described current detecting unit comprises digital microampere meter, and described electric energy meter integration module comprises testing base and electric energy meter.
Described system carries out output frequency test, chip power-consumption test, error of time of day test, temperature frequency difference test, the test of temperature error of time of day and temperature power consumption test to clock chip.
A kind of electric energy meter clock chip full performance test method is provided, said method comprising the steps of:
Step 1: the crystal oscillation output frequency of test clock chip and crystal oscillation temperature frequency difference;
Step 2: test clock chip power-consumption and clock chip temperature power consumption;
Step 3: the error of time of day of test clock chip and temperature error of time of day;
Step 4: the crystal oscillation temperature output frequency of test clock chip.
Described step 1 may further comprise the steps:
Step 1-1: clock chip is placed described chip test base, and probe is placed described frequency test unit, the crystal oscillation output frequency of test clock chip;
Step 1-2: clock chip is placed described chip test base, and chip test base placed in the temperature test chamber, different temperature spots is set, limit maximum operating temperature according to clock chip begins test, select the different time interval that test point is set, until temperature is the limit minimum operating temperature of clock chip, each test point time stops setting-up time, test clock chip crystal oscillation temperature frequency difference.
Described step 2 may further comprise the steps:
Step 2-1: clock chip is placed described electric energy meter, test its loop current by described digital microampere meter, the simulation electric energy meter moves different operating modes, and the test electric energy meter moves the clock chip power consumption under the different operating modes;
Step 2-2: clock chip is placed described chip test base, and chip test base placed in the temperature test chamber, different temperature spots is set, limit maximum operating temperature according to clock chip begins test, select the different time interval that test point is set, until temperature is the limit minimum operating temperature of clock chip, each test point time stops setting-up time, test clock chip temperature power consumption.
Described step 3 may further comprise the steps:
Step 3-1: clock chip is placed described electric energy meter, and in the pulse access error of time of day test cell with electric energy meter output second, the error of time of day of test clock chip;
Step 3-2: clock chip is placed described chip test base, and chip test base placed in the temperature test chamber, different temperature spots is set, limit maximum operating temperature according to clock chip begins test, select the different time interval that test point is set, until temperature is the limit minimum operating temperature of clock chip, each test point time stops setting-up time, the temperature error of time of day of test clock chip.
Described step 4 may further comprise the steps:
Step 4-1: clock chip is placed in the temperature test chamber, and set temperature is its highest storing temperature, and specific requirement arranges storage time according to clock chip, leaves standstill the crystal oscillation output frequency of test clock chip under the normal temperature after taking out;
Step 4-2: clock chip is placed in the temperature test chamber, and set temperature is its minimum storing temperature, and specific requirement arranges storage time according to clock chip, leaves standstill the crystal oscillation temperature output frequency of test clock chip under the normal temperature after taking out.
Compared with prior art, beneficial effect of the present invention is:
(1) the present invention can test clock chip, can test the electric energy meter complete machine that adopts this clock chip simultaneously;
(2) adopt the chip test base form clock chip of packing into, avoided the chips welding in test, improve testing efficiency and testing cost;
(3) can finish the test of basic performance tests, chip reliability, the electric energy meter timing fail-test of clock chip, pilot project is comprehensive, and is simple to operate;
(4) adopt modular design, adopt different test modules for different test requests, and have extendability, can test for the external corresponding test board of different chips;
(5) can assess the clock chip reliability, realize the biometrics of clock chip.
Description of drawings
Fig. 1 is the structural representation that electric energy meter is used clock chip full performance test system in the embodiment of the invention;
Wherein, 1-chip crystal oscillation frequency lead-out terminal, 2-current detecting unit, 3-chip test base, 4-chip power-consumption test output terminal, 5-chip periphery circuit, 6-frequency test unit, 7-temperature control panel, 8-electric energy meter integration module, the 9-adjustable direct voltage source, 10-error of time of day test cell, 11-temperature test chamber.
Embodiment
Below in conjunction with accompanying drawing the present invention is described in further detail.
Such as Fig. 1, a kind of electric energy meter clock chip full performance test system is provided, described system comprises test module, error of time of day test cell 10 and temperature-controlled cabinet 11; Place the clock chip output pps pulse per second signal of test module, described test module is inputted error of time of day test cell 10 with pps pulse per second signal, by regulating the temperature of temperature-controlled cabinet 11, crystal oscillation output frequency deviation and error of time of day under test module and the error of time of day test cell 10 test different temperatures.
Described temperature test chamber 11 comprises temperature control panel 7, observation window, temperature sensor, fan blower, well heater, temperature regulator.
Described test module comprises chip test base 3, chip crystal oscillation frequency lead-out terminal 1, current detecting unit 2, chip power-consumption test output terminal 4, frequency test unit 6, electric energy meter integration module 8, chip periphery circuit 5 and adjustable direct voltage source 9.
Described clock chip places described chip test base 3, chip crystal oscillation frequency lead-out terminal 1 rate of connections test cell 6, current detecting unit 2 connects chip power consumption test lead-out terminal 4, and adjustable direct voltage source 9 is described chip periphery circuit 5 and 8 power supplies of electric energy meter integration module.
Described current detecting unit 2 comprises digital microampere meter, and described electric energy meter integration module 8 comprises testing base and electric energy meter.
Described system carries out output frequency test, chip power-consumption test, error of time of day test, temperature frequency difference test, the test of temperature error of time of day and temperature power consumption test to clock chip.
A kind of electric energy meter clock chip full performance test method is provided, said method comprising the steps of:
Step 1: the crystal oscillation output frequency of test clock chip and crystal oscillation temperature frequency difference;
Step 2: test clock chip power-consumption and clock chip temperature power consumption;
Step 3: the error of time of day of test clock chip and temperature error of time of day;
Step 4: the crystal oscillation temperature output frequency of test clock chip.
Described step 1 may further comprise the steps:
Step 1-1: clock chip is placed described chip test base 3, and probe is placed described frequency test unit 6, the crystal oscillation output frequency of test clock chip;
Step 1-2: clock chip is placed described chip test base 3, and chip test base 3 placed in the temperature-controlled cabinet 11, different temperature spots is set, limit maximum operating temperature according to clock chip begins test, per 10 ℃ arrange a test point, until temperature is the limit minimum operating temperature of clock chip, each test point time stops 1h, test clock chip crystal oscillation temperature frequency difference.
Described step 2 may further comprise the steps:
Step 2-1: clock chip is placed described electric energy meter, test its loop current by described digital microampere meter, the simulation electric energy meter moves different operating modes, and the test electric energy meter moves the clock chip power consumption under the different operating modes;
Step 2-2: clock chip is placed described chip test base 3, and chip test base 3 placed in the temperature-controlled cabinet 11, different temperature spots is set, limit maximum operating temperature according to clock chip begins test, per 10 ℃ arrange a test point, until temperature is the limit minimum operating temperature of clock chip, each test point time stops 1h, test clock chip temperature power consumption.
Described step 3 may further comprise the steps:
Step 3-1: clock chip is placed described electric energy meter, and in the pulse access error of time of day test cell with electric energy meter output second, the error of time of day of test clock chip;
Step 3-2: clock chip is placed described chip test base 3, and chip test base 3 placed in the temperature-controlled cabinet 11, different temperature spots is set, limit maximum operating temperature according to clock chip begins test, per 10 ℃ arrange a test point, until temperature is the limit minimum operating temperature of clock chip, each test point time stops 1h, the temperature error of time of day of test clock chip.
Described step 4 may further comprise the steps:
Step 4-1: clock chip is placed in the temperature-controlled cabinet 11, and set temperature is its highest storing temperature, and the time is 500h, leaves standstill 2h, the crystal oscillation output frequency of test clock chip under the normal temperature after taking out;
Step 4-2: clock chip is placed in the temperature-controlled cabinet 11, and set temperature is its minimum storing temperature, and the time is 500h, leaves standstill 2h, the crystal oscillation temperature output frequency of test clock chip under the normal temperature after taking out.
Should be noted that at last: above embodiment is only in order to illustrate that technical scheme of the present invention is not intended to limit, although with reference to above-described embodiment the present invention is had been described in detail, those of ordinary skill in the field are to be understood that: still can make amendment or be equal to replacement the specific embodiment of the present invention, and do not break away from any modification of spirit and scope of the invention or be equal to replacement, it all should be encompassed in the middle of the claim scope of the present invention.
Claims (10)
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Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103558578A (en) * | 2013-10-30 | 2014-02-05 | 国家电网公司 | Thermistor detection system for electronic electric energy meter and method of system |
| CN106199484A (en) * | 2016-06-23 | 2016-12-07 | 潍坊五洲浩特电气有限公司 | Mainboard error of time of day automatic debugging system |
| CN108226756A (en) * | 2018-01-29 | 2018-06-29 | 深圳市兴威帆电子技术有限公司 | The test system and its test method of a kind of clock chip |
| CN109541443A (en) * | 2019-01-10 | 2019-03-29 | 北京智芯微电子科技有限公司 | Real-time clock detection device and method |
| CN110837073A (en) * | 2019-10-21 | 2020-02-25 | 浙江恒业电子有限公司 | Intelligent ammeter clock error adjustment test system and method |
| CN112578332A (en) * | 2020-12-23 | 2021-03-30 | 无锡芯明圆微电子有限公司 | Electric energy meter self-calibration method based on chip built-in RC oscillator |
| CN116609642A (en) * | 2023-07-18 | 2023-08-18 | 上海孤波科技有限公司 | Chip test error compensation method and device, electronic equipment and storage medium |
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| CN1657957A (en) * | 2005-03-02 | 2005-08-24 | 欧阳槐清 | A testing and adjusting device and method for a quartz crystal oscillator |
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Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103558578A (en) * | 2013-10-30 | 2014-02-05 | 国家电网公司 | Thermistor detection system for electronic electric energy meter and method of system |
| CN106199484A (en) * | 2016-06-23 | 2016-12-07 | 潍坊五洲浩特电气有限公司 | Mainboard error of time of day automatic debugging system |
| CN108226756A (en) * | 2018-01-29 | 2018-06-29 | 深圳市兴威帆电子技术有限公司 | The test system and its test method of a kind of clock chip |
| CN108226756B (en) * | 2018-01-29 | 2020-06-02 | 深圳市兴威帆电子技术有限公司 | Test system and test method of clock chip |
| CN109541443A (en) * | 2019-01-10 | 2019-03-29 | 北京智芯微电子科技有限公司 | Real-time clock detection device and method |
| CN110837073A (en) * | 2019-10-21 | 2020-02-25 | 浙江恒业电子有限公司 | Intelligent ammeter clock error adjustment test system and method |
| CN112578332A (en) * | 2020-12-23 | 2021-03-30 | 无锡芯明圆微电子有限公司 | Electric energy meter self-calibration method based on chip built-in RC oscillator |
| CN112578332B (en) * | 2020-12-23 | 2023-12-29 | 无锡芯明圆微电子有限公司 | Electric energy meter self-calibration method based on chip built-in RC oscillator |
| CN116609642A (en) * | 2023-07-18 | 2023-08-18 | 上海孤波科技有限公司 | Chip test error compensation method and device, electronic equipment and storage medium |
| CN116609642B (en) * | 2023-07-18 | 2023-09-19 | 上海孤波科技有限公司 | Chip test error compensation method and device, electronic equipment and storage medium |
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Application publication date: 20130320 |