CN2752881Y - Conductive microcrystalline electrostatic field delineator - Google Patents
Conductive microcrystalline electrostatic field delineator Download PDFInfo
- Publication number
- CN2752881Y CN2752881Y CN 200420082442 CN200420082442U CN2752881Y CN 2752881 Y CN2752881 Y CN 2752881Y CN 200420082442 CN200420082442 CN 200420082442 CN 200420082442 U CN200420082442 U CN 200420082442U CN 2752881 Y CN2752881 Y CN 2752881Y
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- probe
- conductive
- electrostatic field
- fixed supported
- crystallite
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Abstract
The utility model discloses a conductive microcrystalline electrostatic field delineator, which comprises fixed supporting plates loaded with conductive microcrystal and probes, wherein the two fixed supporting plates are arranged in parallel up and down; a conductive microcrystal plate is arranged towards the inner part of the utility model; a set of screw rods are connected between the upper fixed supporting plate and the lower fixed supporting plate; the plate surface of a recording pad of the upper fixed supporting plate and the conductive microcrystal surface of the lower fixed supporting plate are respectively provided with the probes which are communicated with each other. The utility model can enhance the service life and the experimental precision and can thoroughly overcome the defects of the existing electrostatic field delineator of easy abrasion and unstable and unbalance delineation, and the error between the experimental value and the theoretical value is less than 3%; in addition, by the overturning of the upper and the lower fixed supporting plates, the utility model can conveniently realize different experimental contents.
Description
Technical field
The utility model relates to a kind of physics electrostatic field experiment instrument, especially a kind of electrostatic field scanner that is used for education experiment.
Background technology
At present, the electrostatic field scanner that uses in the experiment of general physics electrostatic field mainly contains: originally use tank method conductive paper, used electro-conductive glass in recent years again, and the inhomogeneous meeting of the conductance of conductive paper makes mapping result's " distortion ", experimental error is big, in addition, conductive paper is easily scratched, and needs often to change; When tank method instrument uses, bedew desktop, books etc. easily.Following probe conductive rubber in the electro-conductive glass electrostatic field scanner is flexible, aging, the replacing difficulty; Metal probe electro-conductive glass coating easy to wear causes the experimental precision error big.
Summary of the invention
The utility model is to solve that existing electrostatic field scanner conductive paper easily scratches, the electro-conductive glass coating is easy to wear, cause technical matterss such as mapping " distortion " experimental error is big, provide a kind of mapping stable, balanced, experimental precision height, long service life and conductive crystallite electrostatic field scanner easily.
For solving the problems of the technologies described above, the technical solution adopted in the utility model is as follows:
A kind of conductive crystallite electrostatic field scanner comprises fixed supported slab and probe that conductive crystallite is housed, and two fixed supported slabs are up and down and are arranged in parallel, and the conductive crystallite plate inwardly is provided with, and is connected by one group of screw rod between the fixed supported slab up and down; Respectively be provided with the probe of a mutual conduction on the fixed supported slab conductive crystallite face of last fixed supported slab record backing plate face up and down.
On the conductive crystallite in the last fixed supported slab concentric electrode and parallel lead electrode are set respectively; On the conductive crystallite in the following fixed supported slab splitter shape electrode and collector electrode are set respectively.
Probe is installed in two ends of the U-shaped feeler arm of horizontal placement respectively up and down, and remains on the same pedal line, and the U-shaped feeler arm is fixedlyed connected with handle set.
Between last probe and the U-shaped feeler arm is that kink is connected, and on the probe thread end setting nut is housed, and is equipped with spring between setting nut and the U-shaped feeler arm.Between following probe and the U-shaped feeler arm is to be threaded, and is equipped with set nut on the probe threaded rod.Following probe is to be made by signal bronze.
The utility model adopts the conductive crystallite double-decker and is positioned at the probe of going up mutual conduction on the same vertical guide, and probe is made with signal bronze down.Greatly improved serviceable life and experimental precision, overcome thoroughly that existing electrostatic field scanner is easy to wear, unstable, the unbalanced drawback of mapping, the error of experiment value and theoretical value is less than 3 percent.In addition, by the upset of fixed supported slab up and down, can realize different experiment contents easily.
Description of drawings
The schematic perspective view of Fig. 1 when to be the utility model with splitter shape electrode and collector electrode do experiment;
The schematic perspective view of Fig. 2 when to be the utility model with concentric electrode and parallel lead electrode do experiment;
Fig. 3 is the utility model STRUCTURE DECOMPOSITION figure;
Fig. 4 is splitter shape electrode of the present utility model and collector electrode arrangenent diagram;
Fig. 5 is concentric electrode of the present utility model and parallel lead electrode arrangenent diagram.
Embodiment
The utility model will be further described below in conjunction with drawings and Examples.
As Fig. 1, shown in 2, the conductive crystallite electrostatic field scanner is by fixed supported slab 1a up and down, and 2a constitutes, last fixed supported slab 1a and the parallel placement of following fixed supported slab 2a, record surface is outside, conductive crystallite face 5,6,17,18 is inside, on four angles, locate between last fixed supported slab 1a and the following fixed supported slab 2a with four screw rods 3 with the level, and fixing with eight acorn nut 8.
On the fixed supported slab 2a conductive crystallite face of last fixed supported slab 1a record surface up and down, respectively place a probe 11,15, last probe 11 is installed in respectively on 9 two parallel support arm ends of U-shaped feeler arm with following probe 15, and keep last probe 11 and following probe 15 axis on same pedal line, the bottom of U-shaped feeler arm 9 is connected by screw retention with the column of handle set 4, and line nut 16 is housed on the column.
As shown in Figure 3, fixed supported slab 1a up and down, 2a are made up of a sheet frame 1, conductive crystallite plate 5,6,17,18, press box 7 and backing plate 10 respectively. Conductive crystallite plate 5,6,17,18 is placed on respectively in two sheet frames 1 and by press box 7 and is screwed, and pastes a backing plate 10 respectively with conductive crystallite plate 5,6,17,18 opposite positions above the sheet frame 1.
The bolt of last probe 11 partly is through in the coupling sleeve of U-shaped feeler arm 9 upper branch arms, on last probe 11 thread end setting nut 13 is housed, and adorns a stage clip 12 between the coupling sleeve of setting nut 13 and U-shaped feeler arm 9 upper branch arms.By being threaded, and be equipped with a set nut 14 on probe 15 threaded rods down between following probe 15 and U-shaped feeler arm 9 lower branch arms, be used for the fixing of probe 15 positions down.Following probe 15 probes are to be made by signal bronze, and are wear-resisting.
As Fig. 4, shown in 5, on the conductive crystallite 5,6 in the last fixed supported slab 1a concentric electrode and parallel lead electrode are set; On the conductive crystallite 17,18 in the following fixed supported slab 2a splitter shape electrode and collector electrode are set.Contact conductor is connected on the binding post 19, is shaped on conductance between electrode much smaller than electrode and every uniform conductive medium.
During experiment, connect direct supply (10V), moving handle seat 4, the movement locus of the probe up and down 11,15 on handle set 4 is the same.After finding tested point by the following probe 15 of conductive crystallite 5,6 tops, press the last probe 11 of recording chart top, on recording chart, stay next correspondence markings, move synchronous probe 11,15 at conductive crystallite 5, find out the identical point of some current potentials on 6, can depict equipotential line thus.In the time of need describing the electrostatic field equipotential line of each parallel wire of concentric cable, incite somebody to action fixed supported slab 1a up and down, the 2a upset by same experimental technique, just can realize easily.
Claims (7)
1. a conductive crystallite electrostatic field scanner comprises conductive crystallite (5,6 is housed, fixed supported slab 17,18) (1a, 2a) and probe (11,15), it is characterized in that: (1a 2a) is up and down and is arranged in parallel for two fixed supported slabs, conductive crystallite plate (5,6,17,18) inwardly be provided with, (1a is connected by one group of screw rod (3) between 2a) fixed supported slab up and down; Respectively be provided with the probe (11,15) of a mutual conduction on last fixed supported slab (1a) record backing plate (10) face up and down fixed supported slabs (2a) conductive crystallites (5, the 6) face.
2. conductive crystallite electrostatic field scanner according to claim 1 is characterized in that, on the described conductive crystallite of going up in the fixed supported slab (1a) (17,18) concentric electrode and parallel lead electrode is set respectively.
3. conductive crystallite electrostatic field scanner according to claim 1 is characterized in that, on the conductive crystallite (17,18) in the described fixed supported slab (2a) down splitter shape electrode and collector electrode is set respectively.
4. according to the described conductive crystallite electrostatic field scanner of claim 1, it is characterized in that described probe (11,15) up and down is installed in two ends of the U-shaped feeler arm (9) of horizontal placement respectively, and remain on the same pedal line, U-shaped feeler arm (9) is fixedlyed connected with handle set (4).
5. according to claim 1 or 4 described conductive crystallite electrostatic field scanners, it is characterized in that, it is described that to go up between probe (11) and the U-shaped feeler arm (9) be that kink is connected, on last probe (11) thread end setting nut (13) is housed, is equipped with spring (12) between setting nut (13) and the U-shaped feeler arm (9).
6. according to claim 1 or 4 described conductive crystallite electrostatic field scanners, it is characterized in that, is to be threaded between described down probe (15) and the U-shaped feeler arm (9), is equipped with set nut (14) on following probe (15) threaded rod.
7. according to claim 1 or 4 described conductive crystallite electrostatic field scanners, it is characterized in that the described probe of probe (15) down is to be made by signal bronze.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200420082442 CN2752881Y (en) | 2004-09-01 | 2004-09-01 | Conductive microcrystalline electrostatic field delineator |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200420082442 CN2752881Y (en) | 2004-09-01 | 2004-09-01 | Conductive microcrystalline electrostatic field delineator |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN2752881Y true CN2752881Y (en) | 2006-01-18 |
Family
ID=35914291
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 200420082442 Expired - Fee Related CN2752881Y (en) | 2004-09-01 | 2004-09-01 | Conductive microcrystalline electrostatic field delineator |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN2752881Y (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101937624B (en) * | 2009-06-29 | 2012-02-22 | 西华师范大学 | Electrostatic field plotter |
| CN101762753B (en) * | 2008-12-23 | 2012-07-18 | 上海工程技术大学 | Intelligent electrostatic field mapping instrument |
| CN104408997A (en) * | 2014-11-06 | 2015-03-11 | 南阳理工学院 | Novel electrostatic field tracer |
| CN109147509A (en) * | 2018-07-17 | 2019-01-04 | 南阳理工学院 | Full-automatic conductive micro-crystal electrostatic field plotter and its application method |
-
2004
- 2004-09-01 CN CN 200420082442 patent/CN2752881Y/en not_active Expired - Fee Related
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101762753B (en) * | 2008-12-23 | 2012-07-18 | 上海工程技术大学 | Intelligent electrostatic field mapping instrument |
| CN101937624B (en) * | 2009-06-29 | 2012-02-22 | 西华师范大学 | Electrostatic field plotter |
| CN104408997A (en) * | 2014-11-06 | 2015-03-11 | 南阳理工学院 | Novel electrostatic field tracer |
| CN104408997B (en) * | 2014-11-06 | 2017-12-22 | 南阳理工学院 | Novel static electric field drawing apparatus |
| CN109147509A (en) * | 2018-07-17 | 2019-01-04 | 南阳理工学院 | Full-automatic conductive micro-crystal electrostatic field plotter and its application method |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20060118 Termination date: 20091009 |