CN2735322Y - Asterism real-time measuring device of optical system - Google Patents

Asterism real-time measuring device of optical system Download PDF

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Publication number
CN2735322Y
CN2735322Y CN 200420085949 CN200420085949U CN2735322Y CN 2735322 Y CN2735322 Y CN 2735322Y CN 200420085949 CN200420085949 CN 200420085949 CN 200420085949 U CN200420085949 U CN 200420085949U CN 2735322 Y CN2735322 Y CN 2735322Y
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CN
China
Prior art keywords
optical system
asterism
real
microscope
measuring device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
CN 200420085949
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Chinese (zh)
Inventor
王虎
张毅
赵建科
车驰骋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
XiAn Institute of Optics and Precision Mechanics of CAS
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XiAn Institute of Optics and Precision Mechanics of CAS
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Priority to CN 200420085949 priority Critical patent/CN2735322Y/en
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Publication of CN2735322Y publication Critical patent/CN2735322Y/en
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Abstract

The utility model belongs to the photoelectric measurement technique is an asterism real-time measuring device of optical system which is provided with an optical bench with an illuminating source, a measured optical system lens and a microscope. The rear of the objective lens of the microscope is provided with an area array CCD, the output end of which is connected with a computer with a collecting card. The lights from the illuminating source are received by the area array CCD via the optical bench, the measured optical system lens and the objective lens of the microscope, and then through the image processing of the computer, the size of the asterism image is calculated. Adopting the area array CCD as the detector, the measured object image can be collected so as to rapidly interpret with high measurement accuracy.

Description

Optical system asterism real-time measurement apparatus
Technical field
The utility model belongs to the photoelectric measurement technology, particularly a kind of optical system asterism real-time measurement apparatus that relates to.
Background technology
By investigating pointolite through become the light distribution of diffraction image after the optical system on different cross section before and after the image planes, i.e. asterism picture can be evaluated the image quality of optical system qualitatively.The distortion of this diffraction pattern and between each diffraction ring distribution and ideally the difference of luminous energy can reflect the defective of optical system or optical element very delicately.Traditional in the past asterism measuring method all is by means of visual instruments such as microscopes, its measurement mechanism mainly comprises that by one the optical bench of light source, tested optical system lens and microscope form, survey crew is directly observed and is measured by microscopical eyepiece, so efficient is lower, the measurement structure instability, waste time and energy, and artificial factor is bigger when measuring.When observing its diffraction pattern, be difficult for discovering some details; When measuring the energy distribution situation, owing to be subjected to the influence of survey crew, its result also is different.
Summary of the invention
Technical problem to be solved in the utility model is: a kind of interpretation fast is provided, and the higher optical system asterism real-time measurement apparatus of measuring accuracy.
The technical scheme that addresses the above problem is: the optical system asterism real-time measurement apparatus that is provided has of being arranged in order and comprises the optical bench of light source, tested optical system lens and microcobjective, special feature of the present utility model is to be provided with a surface array charge-coupled device in above-mentioned microcobjective back, is connected to the computing machine of a band capture card at the output terminal of this surface array charge-coupled device.The light that light source sends is received by surface array charge-coupled device through behind optical bench, tested optical system lens and the micro objective, carries out Flame Image Process by computing machine again, calculates the size of asterism picture.
The photosensitive unit of surface array charge-coupled device exists the geometric space of a definite form to arrange, and the geometric accuracy of its sensitization pixel guarantees that by photoetching process cumulative errors is less than 1 micron, and each locations of pixels addressable.The utility model with surface array charge-coupled device as detector, the measurement target picture can be gathered, avoided artificial factor, eliminated eye fatigue, alleviated labour intensity, measuring accuracy is improved greatly, and improved efficiency, and can carry out many people's observations, its testing result can also be preserved with the picture form, in order to examination.
Description of drawings
Accompanying drawing is the structural principle synoptic diagram of an embodiment of the utility model.
Embodiment
As shown in the figure: optical bench 1 comprises light source 11, optical filter 12, condenser 13, star tester 14 and parallel light tube object lens 15, be provided with a tested optical system lens 2 in the back of parallel light tube object lens 15, again is microscope 3, microcobjective 3 back are connected to a surface array charge-coupled device 4, and the output terminal of surface array charge-coupled device 4 and computing machine 5 join.The light that light source 11 sends mating plate 12 back after filtration is focused on the star tester on 14 by condenser 13, be parallel beam by the light behind the parallel light tube object lens 15 again, amplified by microcobjective 3 by tested optical system lens 2 backs then, received by surface array charge-coupled device 4 again, look like to carry out image acquisition with the 5 pairs of tested optical system asterisms of computing machine that have capture card at last, calculate the size of asterism picture by Flame Image Process, asterism shape and size are listed with diagrammatic form.
Star tester Circularhole diameter in this example is 0.4mm; The parallel light tube focal length is 35mm; Tested optical system focal length is 250mm; Surface array charge-coupled device adopts the MTV-1881EX type, and image pick-up card resolution is 800 * 600, and the optical system asterism of being surveyed is 0.053mm at meridian and sagitta of arc direction.

Claims (1)

1, a kind of optical system asterism real-time measurement apparatus, have of being arranged in order and comprise the optical bench (1) of light source, tested optical system lens (2) and microcobjective (3), it is characterized in that being provided with a surface array charge-coupled device (4), be connected to the computing machine (5) of a band capture card at the output terminal of this surface array charge-coupled device (4) in the back of described microcobjective (3).
CN 200420085949 2004-09-16 2004-09-16 Asterism real-time measuring device of optical system Expired - Lifetime CN2735322Y (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN 200420085949 CN2735322Y (en) 2004-09-16 2004-09-16 Asterism real-time measuring device of optical system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN 200420085949 CN2735322Y (en) 2004-09-16 2004-09-16 Asterism real-time measuring device of optical system

Publications (1)

Publication Number Publication Date
CN2735322Y true CN2735322Y (en) 2005-10-19

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN 200420085949 Expired - Lifetime CN2735322Y (en) 2004-09-16 2004-09-16 Asterism real-time measuring device of optical system

Country Status (1)

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CN (1) CN2735322Y (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103292981A (en) * 2013-05-22 2013-09-11 中国科学院上海光学精密机械研究所 Measuring device and calibration method for optical lens distortion
CN103439086A (en) * 2013-08-29 2013-12-11 中国科学院光电研究院 Non-contact method and device for detecting curved-surface prism
CN108195371A (en) * 2017-12-26 2018-06-22 清华大学 The extracting method of the more stellar targets of high dynamic based on DMD, apparatus and system

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103292981A (en) * 2013-05-22 2013-09-11 中国科学院上海光学精密机械研究所 Measuring device and calibration method for optical lens distortion
CN103439086A (en) * 2013-08-29 2013-12-11 中国科学院光电研究院 Non-contact method and device for detecting curved-surface prism
CN103439086B (en) * 2013-08-29 2016-03-30 中国科学院光电研究院 A kind of method of non-contact detection curved surface prism and device
CN108195371A (en) * 2017-12-26 2018-06-22 清华大学 The extracting method of the more stellar targets of high dynamic based on DMD, apparatus and system
CN108195371B (en) * 2017-12-26 2020-04-10 清华大学 DMD-based high-dynamic multi-satellite target extraction method, device and system

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C14 Grant of patent or utility model
GR01 Patent grant
C17 Cessation of patent right
CX01 Expiry of patent term

Expiration termination date: 20140916

Granted publication date: 20051019