CN2533463Y - Quick sample feeding device for analyzing solid sample in high vacuum - Google Patents
Quick sample feeding device for analyzing solid sample in high vacuum Download PDFInfo
- Publication number
- CN2533463Y CN2533463Y CN 01273054 CN01273054U CN2533463Y CN 2533463 Y CN2533463 Y CN 2533463Y CN 01273054 CN01273054 CN 01273054 CN 01273054 U CN01273054 U CN 01273054U CN 2533463 Y CN2533463 Y CN 2533463Y
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- vacuum chamber
- sample
- microvacuum
- high vacuum
- solid samples
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Abstract
The utility model discloses a rapid sample introduction device which is used to analyze solid samples in microvacuum, and comprises a small scale auxiliary vacuum chamber 5 which is arranged in a microvacuum cavity 12, and a direct insert type and rotary sample introduction rod 2 which inserts into the auxiliary vacuum chamber 5 and the microvacuum cavity 12. A relative vacuum gap exists between the auxiliary vacuum chamber 5 and the microvacuum cavity 12; therefore, when the ample introduction rod 2 enters or come out of the microvacuum cavity 12, the vacuum degree in the microvacuum cavity 12 is hardly influenced, which enables the analysis of solid samples to be time-saving and labor-saving. The rapid sample introduction device of the utility model is simple-structured, convenient and flexible, can be used in any microvacuum equipments to analyze solid samples or to replace and analyze solid samples. The analysis process only needs a plurality of minutes and does not need halt the machine. The utility model is in particular suitable to analyze solid samples or the organic contaminating material which deposits on the surface of the solid samples in laser mass spectrometry or in ion emission spectrum such as laser.
Description
(1) technical field
The utility model is a kind of sampling device that detects and analyze, and especially relates to a kind of quick sampling device that high vacuum analysing solid sample and solids surface deposition have the organic contaminant of volatilization or half volatile that is used for.
(2) background technology
The composition of analysing solid sample is to be must be obligato in fields such as environment measuring and scientific researches; but in high-vacuum apparatus; analysis to solid sample; its traditional way is: earlier analyzed solid sample is placed on a fixed position in the high vacuum chamber; then to vacuumizing in the chamber; after sample to be analyzed finishes; must take out solid sample in breakdown high vacuum chamber; during as continuation or the analysis of replacing solid sample; then need to keep on again and again by above-mentioned steps; certainly will take time and effort like this, not only be unfavorable for the protection of high-vacuum apparatus but also the accuracy of impact analysis sample.Especially in environmental pollution detects and analyzes, the organic contaminant with volatilization or half volatile is deposited on solid surface, presses the just sample of express-analysis in time of traditional analytical approach, have a strong impact on the speed of obtaining accurate data.
(3) summary of the invention
The utility model provides a kind of quick sampling device that is used for the high vacuum analysing solid sample or analyzes the solid surface contaminant deposition at the above-mentioned problems in the prior art, its fundamental purpose is: when this device can be placed analysing solid sample flexibly and easily in the high vacuum chamber, do not influence the vacuum tightness in the high vacuum chamber, reach time saving and energy saving, the express-analysis solid sample obtains accurate data.
The utility model is used for the quick sampling device of high vacuum analysing solid sample, comprises a small-sized assisted vacuum chamber and a direct insertion rotatable sample feeding rod of inserting assisted vacuum chamber and high vacuum chamber that is arranged on the high vacuum chamber.Described small-sized assisted vacuum chamber is the vacuum chamber of a low vacuum made from metal tube, the vacuum tightness in its vacuum tightness and high vacuum chamber will differ 3~4 orders of magnitude, it is poor to form a relative vacuum, when sample feeding rod during into and out of the high vacuum chamber, to almost not influence of the vacuum tightness degree in the high vacuum chamber.Described direct insertion rotatable sample feeding rod, comprise by round metal mast certain-length, that surface smoothness is higher, it is bright that the top connects a hand that indicates the circumference scale, its side is placed the graduated scale parallel with sample feeding rod, this sample feeding rod is vertical moving up and down, and left rotation and right rotation can mark the position of analytic sample in the high vacuum chamber exactly.The lower end of sample feeding rod connects an interchangeable nonmetal sample casket, is used to place the analysing solid sample that different shape varies in size.Thereby the time and the accurate data of obtaining analysing solid sample that shorten sample introduction or change sample have been reached.
The quick sampling device of the utility model is simple in structure, flexible to operation, applicable to express-analysis solid sample in any high-vacuum apparatus, especially be useful in laser mass spectrometry instrument, the laser plasma emission spectrum solid sample or be deposited on the analysis of other material on solid sample surface.
(4) description of drawings
Fig. 1 is the structural representation that the utility model is used for the quick sampling device of high vacuum analysing solid sample.
As shown in Figure 1, the quick sampling device of the utility model comprises that the round handle 1 on direct insertion rotatable sample feeding rod 2 and sample feeding rod top and side have rule 9, the lower end connects the sample casket 15 of placing solid sample, and small-sized assisted vacuum chamber 5 is made up of annex vacuum gauge 6, valve 7 and vacuum pump 8; Assisted vacuum chamber 5 is interconnected with high vacuum chamber 12 by the quick through way valve 10 of selective type.(5) embodiment
As shown in Figure 1, the utility model has one with internal diameter Φ 10mm, the stainless-steel tube of external diameter Φ 14mm is the assisted vacuum chamber 5 of cavity, the wedge shape is made in the upper end in assisted vacuum chamber 5, constitute a dynamic seal (packing) with round rubber O-ring seal 4 and direct insertion rotatable sample feeding rod 2, fastening by metal retention means 3, the middle part in assisted vacuum chamber 5 connects internal diameter Φ 4mm, the stainless-steel tube 13 of external diameter Φ 6mm, the vacuum gauge 6 of the vacuum tightness that is used to observe assisted vacuum chamber 5 is housed on this pipe and is used to regulate the valve 7 and the vacuum pump 8 of assisted vacuum chamber 5 vacuum tightnesss, guarantee that direct insertion rotatable sample feeding rod 2 do not destroy the vacuum tightness in high vacuum chamber 12 when sample introduction.Direct insertion rotatable sample feeding rod 2 is made by stainless steel bar or copper rod, handle 1 and side that the circumference scale is equipped with on the top are placed a rule 9, sample feeding rod 2 can move up and down, left rotation and right rotation, write down the position of analyzed solid sample 11 in high vacuum chamber 12, the lower end of sample feeding rod 2 have one can be by the interchangeable nonmetal sample casket 15 of the size and the shape of various analysing solid samples 11, analysing solid sample 11 just in time places in this sample casket 15.Direct insertion rotatable sample feeding rod 2 enters assisted vacuum chamber 5 through O-ring seal 4, enters active region 14 by the high vacuum chamber 12 of commercially available high-vacuum apparatus by the vertical latus rectums quick through way valve 10 of selective type consistent with sample feeding rod 2 external diameters that insert of sample feeding rod 2 then.
Claims (4)
1, a kind of quick sampling device that is used for the high vacuum analysing solid sample, it comprises the small-sized assisted vacuum chamber (5) and the direct insertion rotatable sample feeding rod (2) of inserting assisted vacuum chamber (5) and high vacuum chamber (12) that are positioned on the high vacuum chamber (12), it is characterized in that: the vacuum tightness of the vacuum tightness of assisted vacuum chamber (5) and high vacuum chamber (12) has a relative vacuum poor, and described assisted vacuum chamber (5) is interconnected by the quick through way valve of selective type (10) with high vacuum chamber (12).
2, quick sampling device according to claim 1 is characterized in that: direct insertion rotatable sample feeding rod (2) top has one to have the handle (1) of circumference scale with side a graduated scale (9) parallel with sample feeding rod (2) to be arranged.
3, quick sampling device according to claim 1, it is characterized in that: there are a shape, the big or small interchangeable nonmetal sample casket (15) identical with various analysing solid samples (11) in direct insertion rotatable sample feeding rod (2) lower end, and analysing solid sample (11) just in time places in this sample casket (15).
4, quick sampling device according to claim 1 is characterized in that: the body of rod of direct insertion rotatable sample feeding rod (2) vertically inserts the latus rectum quick through way valve of the selective type consistent with body of rod external diameter (10) into and out of high vacuum chamber (12).
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN 01273054 CN2533463Y (en) | 2001-12-24 | 2001-12-24 | Quick sample feeding device for analyzing solid sample in high vacuum |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN 01273054 CN2533463Y (en) | 2001-12-24 | 2001-12-24 | Quick sample feeding device for analyzing solid sample in high vacuum |
Publications (1)
Publication Number | Publication Date |
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CN2533463Y true CN2533463Y (en) | 2003-01-29 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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CN 01273054 Expired - Fee Related CN2533463Y (en) | 2001-12-24 | 2001-12-24 | Quick sample feeding device for analyzing solid sample in high vacuum |
Country Status (1)
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CN (1) | CN2533463Y (en) |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102607929A (en) * | 2012-03-05 | 2012-07-25 | 中国科学院地质与地球物理研究所 | Pneumatic type sample loader |
CN101551357B (en) * | 2009-02-26 | 2013-02-06 | 中国兵器工业集团第五三研究所 | ICP-MS measuring method of trace metal impurities in high purity lead |
CN104280280A (en) * | 2014-10-13 | 2015-01-14 | 赵烨梁 | Device for preparing unimolecular sample by microleakage sample injection method |
CN105842042A (en) * | 2016-05-31 | 2016-08-10 | 中国科学院理化技术研究所 | Low temperature sample cavity |
CN105891318A (en) * | 2016-06-12 | 2016-08-24 | 江苏天瑞仪器股份有限公司 | Matrix-assisted laser desorption ion source sampling device |
CN107860783A (en) * | 2017-10-23 | 2018-03-30 | 中国科学院化学研究所 | XPS sampling devices |
CN107991330A (en) * | 2017-11-13 | 2018-05-04 | 中国科学院化学研究所 | The apparatus and method for preparing liquid nitrogen mud frozen samples |
-
2001
- 2001-12-24 CN CN 01273054 patent/CN2533463Y/en not_active Expired - Fee Related
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101551357B (en) * | 2009-02-26 | 2013-02-06 | 中国兵器工业集团第五三研究所 | ICP-MS measuring method of trace metal impurities in high purity lead |
CN102607929A (en) * | 2012-03-05 | 2012-07-25 | 中国科学院地质与地球物理研究所 | Pneumatic type sample loader |
CN102607929B (en) * | 2012-03-05 | 2013-11-06 | 中国科学院地质与地球物理研究所 | Pneumatic type sample loader |
CN104280280A (en) * | 2014-10-13 | 2015-01-14 | 赵烨梁 | Device for preparing unimolecular sample by microleakage sample injection method |
CN105842042A (en) * | 2016-05-31 | 2016-08-10 | 中国科学院理化技术研究所 | Low temperature sample cavity |
CN105891318A (en) * | 2016-06-12 | 2016-08-24 | 江苏天瑞仪器股份有限公司 | Matrix-assisted laser desorption ion source sampling device |
CN107860783A (en) * | 2017-10-23 | 2018-03-30 | 中国科学院化学研究所 | XPS sampling devices |
CN107860783B (en) * | 2017-10-23 | 2019-09-24 | 中国科学院化学研究所 | XPS sampling device |
CN107991330A (en) * | 2017-11-13 | 2018-05-04 | 中国科学院化学研究所 | The apparatus and method for preparing liquid nitrogen mud frozen samples |
CN107991330B (en) * | 2017-11-13 | 2020-01-10 | 中国科学院化学研究所 | Device and method for preparing liquid nitrogen mud frozen sample |
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C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
C19 | Lapse of patent right due to non-payment of the annual fee | ||
CF01 | Termination of patent right due to non-payment of annual fee |