CN2283840Y

CN2283840Y - Repeatable programmed computer testing device for vehicle breakdown

Info

Publication number: CN2283840Y
Application number: CN 97200434
Authority: CN
Inventors: 刘均
Original assignee: YUANZHENG COMPUTER CO Ltd SHENZHEN CITY
Current assignee: YUANZHENG COMPUTER CO Ltd SHENZHEN CITY
Priority date: 1997-01-13
Filing date: 1997-01-13
Publication date: 1998-06-10
Anticipated expiration: 2007-01-13

Abstract

The utility model relates to a repeatable programmed computer testing device for vehicle failures, which is composed of a host computer circuit unit, a testing circuit unit, and a PC communication interface circuit unit. A feedback point and a testing point which are positioned in the host computer circuit unit are respectively connected with the testing circuit unit and the PC communication interface circuit unit. The host computer circuit unit is composed of a micro-computer central processor CPU5, a liquid crystal display 1, a keyboard 4, a repeatable programmed memorizer 2, a repeatable programmed word stock 3, a repeatable programmed information memorizer 6, and an auxiliary circuit 8. Adopting computers to test vehicle failures, the utility model has the advantages of high automation, powerful function, multi-function, small size, and simple operation and can be used for testing vehicles which are in various types and are manufactured by various manufacturers in the world.

Description

But overprogram vehicle failure Computerized examination device

The utility model relates to a kind of vehicle failure detection device, but especially a kind of computer technology that uses carries out the overprogram vehicle failure Computerized examination device that robotization detects to a plurality of system failure sign indicating numbers of automotive interior.

Present stage internal vapor many manual detection modes that also are in of studying in a school, also do not have many detection meanss, and many vehicle failure are adopted manual type to be difficult to detection maybe can't to detect.Automotive interior has many systems, some device can only be tested peer machine wherein, 86200985), device such as diagnostic vehicle of engineering machinery (patent announcement number 1049002) resemble the multiple parameter measuring apparatus of one-chip computer vehicular engine (number of patent application:, though be used for the test of power systems such as motor car engine, but not the multisystem test, neither detect by the vehicle failure sign indicating number.

The purpose of this utility model provides a kind of computerized Computerized examination device for cars, progressively breaks away from the situation that long-term dependence is manually overhauled so that vapour is protected on the row, enters into automatic phase.

The purpose of this utility model is achieved through the following technical solutions.

But a kind of overprogram vehicle failure Computerized examination device, form by host circuit unit, test circuit unit and PC communication interface circuit unit, feedback point in the host circuit unit links to each other with PC communication interface circuit unit with the test circuit unit respectively with check point, but but but the host circuit unit form by microcomputer center processor CPU5, LCD 1, keyboard 4 overprogram preface storer 2 overprogram character libraries, 3 overprogram information-storing devices 6 and auxiliary circuit 8.

Microcomputer center processing CPU5 in the described host circuit unit adopts the 89C52 single-chip microcomputer, and computer control circuit is connected with keyboard 4, LCD 1 by interface.

The described test circuit 9 that is complementary with host circuit can be according to the various design of different automotive types.

But overprogram vehicle failure Computerized examination device of the present utility model adopts the computer test vehicle failure, the automaticity height, function is strong, information capacity is big, can have that kinds of words shows, the multiple vehicle of test and Reprogrammable to be to realize multiple function, volume is little, simple to operate, can detect the automobile of a plurality of producers, multiple model in the world.

The utility model is described in further detail below in conjunction with accompanying drawing:

Fig. 1 is an automotive test theory diagram of the present utility model;

Fig. 2 is an overprogram theory diagram of the present utility model;

Fig. 3 is host circuit Fig. 1 of the present utility model;

Fig. 4 is host circuit Fig. 2 of the present utility model

Fig. 5 is test circuit figure of the present utility model;

Fig. 6 is PC communication interface circuit figure of the present utility model.

As shown in Figure 3, Figure 4, this device host CPU is selected the 89C52 single-chip microcomputer for use, and 21 is 7,4HC,138 318 code translators, but has determined the address of keyboard, LCD, 4 overprogram storeies and other device by them; 22 is 62256 random access memory, the intermediate data when having the free space of 16K to be used for storage running; 23 are respectively 74HC245,74HC374,74HC378, have constituted liquid crystal display control circuit by them; 18 all is 29c040, is electrically erasable nonvolatile memory, but is used to realize the overprogram function of this device; 14 is 36 pin sockets, can be used for connecting outside automotive test interface.

Fig. 6 is the PC communication interface, and one end is connected with main frame by 36 n pin package ns 14 during programming, and the other end is connected with PC.One of them comparer and two NPN triodes have been finished the level conversion of main frame and PC.Under the control of programming software, can realize overprogram function to main frame.

Shown in Fig. 1 automotive test theory diagram, 5 is CPU, and it is the central control unit of complete machine, and 1 is LCD, display operation information and test result under the control of CPU5, and LCD 1 is a dot matrix type, can show various literal, numeral or figure; 4 is keyboard, and CPU5 is the button result of inquiry keyboard at any time, and the user can input to operational order among the CPU5 by keyboard 4, and CPU5 can carry out corresponding operation according to operational order; But store whole working procedures in the overprogram program storage 4, it has determined whole operational processs of CPU5; But 3 is the overprogram character library, and storage inside has the lattice information of character display, and the different lattice information of packing into can make this device realize that different literal shows; But 6 is the overprogram information-storing device, and the neighbourhood is deposited in inside the automobile fault information data, and CPU5 can therefrom call content corresponding according to different diagnostic trouble code, is presented on the LCD 1; 7 is common interface circuit, can connect multiple functional circuit by this this device of circuit, and as the test circuit to different automobile types, different vehicles has different circuit forms; CPU5 can carry out two-way communication with automobile circuit by common interface circuit 7 and test circuit 9, carries out different system testings with regard to the may command automobile circuit like this, and test result is sent back this device.

Shown in Fig. 2 automotive test theory diagram, after connecting PC communication interface 9, this device can communicate with PC, under the control of PC programming software, can carry out overprogram to 2 in this device, 3,6; So just can change control program, character library dot matrix, automobile information data in this device at any time, help making this device to realize multiple function and update.

Shown in Fig. 4 circuit, but 18 is the overprogram program storage, makes code translator 19 be low level when needs are programmed, and at this

moment

19,20,24 combination of circuits makes 19 to be high level, 19,20,24, combination of circuits makes 18 to be equivalent to program storage, and CPU5 can move to write the program in it; But the structure of each overprogram program storage 18 is identical, is electrically erasable nonvolatile memory, but they have different addresses, and they are used as data-carrier store; They under the cooperation respectively of storer 20, but formed character library, data bank 1, the data bank 2 of overprogram; CPU5 writes data inside when needs are programmed, and usual state CPU5 is from they reading of data, to obtain needed dot matrix font and data information.

Claims

1, but a kind of overprogram vehicle failure Computerized examination device, by the host circuit unit, test circuit unit and PC communication interface circuit unit are formed, feedback point in the host circuit unit links to each other with PC communication interface circuit unit with the test circuit unit respectively with check point, and it is characterized in that: the host circuit unit is by microcomputer center processor CPU (5), LCD (1), keyboard (4), but overprogram preface storer (2), but overprogram character library circuit (3), but overprogram information-storing device (6) common interface circuit (7) and auxiliary circuit (8) are formed.Each several part passes through data bus, address bus, and plug (14) connects.

2, but overprogram vehicle failure Computerized examination device according to claim 1, it is characterized in that described test circuit unit is made up of test circuit (11) automobile specified test bench (12) and automobile circuit (13), test circuit by or the input end of door (15) be connected with common interface circuit (7) by 36 n pin package ns (14), or the output terminal of door (15) links to each other with phase inverter (16) input end, the output terminal of phase inverter (16) is connected with automobile specified test bench (12) by plug (14), the output terminal of totalizer (17) links to each other with 4 n pin package ns (14), and output terminal links to each other with 36 n pin package ns (14).

But 3, overprogram vehicle failure Computerized examination device according to claim 1 is characterized in that described PC communication interface circuit unit is made up of common interface circuit (7), PC communication interface (9) and PC (10).

But 4, overprogram vehicle failure Computerized examination device according to claim 1, it is characterized in that but overprogram character library circuit (3) is made up of storer (20), code translator (19) and electrically erasable nonvolatile memory (18), link to each other with address wire by data line.

But 5, overprogram vehicle failure Computerized examination device according to claim 1, it is characterized in that: the microcomputer center processing CPU (5) in the host circuit unit adopts the 89C52 single-chip microcomputer, and computer control circuit is connected with keyboard (4), LCD (1) by plug (14).