CN221506960U - Clamping device for universal component aging test - Google Patents
Clamping device for universal component aging test Download PDFInfo
- Publication number
- CN221506960U CN221506960U CN202322889605.8U CN202322889605U CN221506960U CN 221506960 U CN221506960 U CN 221506960U CN 202322889605 U CN202322889605 U CN 202322889605U CN 221506960 U CN221506960 U CN 221506960U
- Authority
- CN
- China
- Prior art keywords
- probe
- motherboard
- clamping device
- sides
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 21
- 230000032683 aging Effects 0.000 title claims abstract description 17
- 239000000523 sample Substances 0.000 claims abstract description 68
- 241000234295 Musa Species 0.000 claims abstract description 14
- 235000018290 Musa x paradisiaca Nutrition 0.000 claims abstract description 14
- 238000009434 installation Methods 0.000 claims abstract description 6
- 238000003825 pressing Methods 0.000 claims description 5
- 230000008030 elimination Effects 0.000 abstract 1
- 238000003379 elimination reaction Methods 0.000 abstract 1
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 16
- 229910052742 iron Inorganic materials 0.000 description 8
- 239000003990 capacitor Substances 0.000 description 5
- 238000000034 method Methods 0.000 description 4
- 230000009471 action Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- CUGLICQCTXWQNF-UHFFFAOYSA-N 1,2-dichloro-3-(2,6-dichlorophenyl)benzene Chemical compound ClC1=CC=CC(C=2C(=CC=CC=2Cl)Cl)=C1Cl CUGLICQCTXWQNF-UHFFFAOYSA-N 0.000 description 1
- 230000004075 alteration Effects 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000002788 crimping Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000011835 investigation Methods 0.000 description 1
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
Abstract
The utility model discloses a clamping device for a universal component aging test, which comprises a motherboard and a daughter board, wherein the daughter board is uniformly arranged on the motherboard, a plurality of connecting terminals are arranged on the motherboard, a safety tube is arranged on one side, close to the connecting terminals, of the motherboard, a positive banana socket and a negative banana socket are respectively arranged at two ends of one side, above the motherboard, of the daughter board, the daughter board comprises a limiting plate and a probe board, the limiting plate is arranged on the motherboard through the connecting terminals, a plurality of limiting holes are formed in the limiting plate, a mounting groove is formed between the limiting holes on two sides of the limiting plate, and positioning pin holes are formed in two sides of the mounting groove. According to the utility model, the fusing fuse tube can be positioned to the failure unit, so that the failure elimination efficiency is improved compared with the prior clamp, the installation safety is improved, the stability and the safety of power-on are ensured, and the appearance of test components is protected.
Description
Technical Field
The utility model relates to the technical field of component ageing tests, in particular to a clamping device for a universal component ageing test.
Background
The components without mounting holes are mainly capacitors and filters, and when an aging (high temperature life) test is performed, a voltage is usually applied between the wire cases of the filters or a voltage is applied between the capacitor wires. Traditional power-up mode 1. Power-up mode between the line shells: the aging fixture used consists of an aging plate and an iron clamp, the left side of fig. 2 is the power-on mode of the aging fixture, a product body and leads are respectively fixed on the iron clamps in different rows, so that the body and the leads cannot move, the installation firmness of the aging fixture is ensured, the different rows of the iron clamps are respectively connected with different electrodes, finally, a row of fixed iron clamps of the filter shell are connected as one electrode, a row of iron clamps connected with the leads are used as the other electrode (between points), and the power-on function is realized through connecting wires welded on iron sheets; 2. the power-up mode between the wires is as follows: the used ageing clamp consists of an ageing plate and clamping pieces, a capacitor lead is inserted into the clamping pieces, so that the lead and the body cannot move, the installation firmness of the capacitor lead is ensured, the clamping pieces on two sides are respectively connected with different electrodes, and the function of power-on is realized through connecting wires welded on an iron sheet; the conventional approach has the following disadvantages: the appearance of sample is damaged easily to the iron clamp when fixed filter, adopts different anchor clamps when realizing that condenser interline, filter line shell are powered up between, and this kind of anchor clamps safeguard measure lacks, and the connecting wire exposes outside there is the potential safety hazard, and when taking place components and parts short circuit to become invalid, forms the current loop on the components and parts that lose efficacy, causes unable normal applied voltage on other normal components and parts, and the unable accurate positioning of components and parts that lose efficacy simultaneously need to test investigation on anchor clamps by one, work efficiency.
Disclosure of utility model
The utility model aims to provide a clamping device for a universal component aging test, which aims to solve the problems in the background technology.
In order to achieve the above purpose, the present utility model provides the following technical solutions: the utility model provides a general components and parts clamping device for ageing test, includes mother board and daughter board, the daughter board is evenly installed on the mother board, be provided with a plurality of connecting terminal above the mother board, the bumper is installed to one side that is close to connecting terminal above the mother board, anodal banana socket, negative pole banana socket are installed respectively at one side both ends above the mother board, the daughter board includes limiting plate and probe card, the limiting plate passes through connecting terminal and installs on the mother board, a plurality of spacing holes have been seted up above the limiting plate, the mounting groove has been seted up between the above-mentioned both sides limiting hole of limiting plate, the location pinhole has been seted up to the both sides of mounting groove, the probe board is installed on the limiting plate, a plurality of probes are installed to the lower extreme mid-mounting of probe board, be provided with the power-on hole between the probe of probe board's the lower extreme both sides, the locating pin is installed to the both sides of power-on hole, the cooperation is connected between locating pin and the locating pin, the above both sides of probe board install the preforming clamp, install the probe card on the two sides of probe card, install the probe card above the probe card.
Preferably, the short side where the limiting hole is located is provided with a fixing groove inwards.
Preferably, the mounting groove is connected with the connecting terminal in a matching way.
Preferably, the switch is electrically connected with the probe, and the pressing clamp is electrically connected with the power-on hole.
Preferably, the probe is configured as a retractable probe.
Preferably, the power-on hole is electrically connected with the probe.
Compared with the prior art, the utility model has the beneficial effects that:
1. According to the utility model, the boards are fixed through the locating pins, the fixed daughter board module is arranged on the motherboard, one end of the independent power-on Kong Yinxian is an electrode, the probe (or the lead wire at the other end) is an electrode, the probe board is powered on through the positive banana socket and the negative positive banana socket of the motherboard, and then whether the voltage of each daughter board is normal or not is detected, so that the power-on of the components can be realized;
2. The utility model adopts a multilayer structure for installation: different components can be arranged on the upper layers of the limiting plate and the probe plate; the design of single-point crimping multi-face contact is adopted: the single-point pressure welding filter shell of the probe plate protects the appearance of the filter; the change-over switch is adopted: the product is arranged on the limiting plate, and the change-over switch enables one pole of the probe to be disconnected with one end of the lead, so that the power-up between the wire shells is realized; the mounting product is on the upper layer of the probe plate, the change-over switch enables one pole of the probe to be connected with one end of the lead, the mounting product is on clamping pieces at two ends, the line-to-line power-up is realized, and a structural plate multipurpose mode is adopted: the same structural plate is used for realizing the power-on between the product line shell and the line.
Drawings
FIG. 1 is a schematic diagram of the overall structure of a clamping device for an aging test of a general component;
FIG. 2 is a top view of a motherboard of the clamping device for burn-in testing of a general component according to the present utility model;
FIG. 3 is a schematic diagram of a mechanism of a daughter board of the clamping device for the universal component burn-in test;
FIG. 4 is a bottom view of a probe card of the universal component burn-in fixture of the present utility model;
Fig. 5 is a top view of a probe card of the clamping device for burn-in test of a general component according to the present utility model.
In the figure: a motherboard 1; a sub-board 2; the PCB46 is connected to the terminal 3; a protective tube 4; a positive banana socket 5 and a negative banana socket 6; a limiting plate 7; a probe card 8; a limiting hole 9; a mounting groove 10; a registration pin hole 11; a probe 12; a power-on hole 13; a positioning pin 14; a tabletting clamp 15; a probe cap 16; a dowel pin nut 17; a change-over switch 18; a fixing groove 19.
Detailed Description
The following description of the embodiments of the present utility model will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present utility model, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.
Referring to fig. 1-5, the present utility model provides a technical solution: the utility model provides a clamping device for universal components and parts ageing test, including mother board 1 and daughter board 2, daughter board 2 evenly installs on mother board 1, be provided with a plurality of PCB46 connecting terminal 3 above mother board 1, one side that is close to PCB46 connecting terminal 3 above mother board 1 installs insurance pipe 4, positive banana socket 5 is installed respectively at the both ends of one side above mother board 1, negative pole banana socket 6, daughter board 2 includes limiting plate 7 and probe card 8, limiting plate 7 passes through PCB46 connecting terminal 3 and installs on mother board 1, a plurality of spacing holes 9 have been seted up on limiting plate 7, set up mounting groove 10 between limiting plate 7's the upper both sides limiting hole 9, location pinhole 11 have been seted up to the both sides of mounting groove 10, probe board 8 is installed on limiting plate 7, probe card 8's lower extreme mid-mounting has a plurality of probes 12, be provided with between probe card 8's lower extreme both sides probes 12 and add electrical hole 13, install locating pin 14 between locating pin 14 and the locating pinhole 11 cooperation is connected between the both sides, the upper both sides of probe card 8 are installed through PCB46 connecting terminal 3, install the mounting groove 9 has the mounting groove 10 between the probe card 17, the probe card's of the probe card 8 is installed at the both sides 17, the middle part is installed at the probe card 8 is installed at the upper both sides of the middle part 16, the side of the probe card is installed at the middle part is installed at the probe card 17, the side is installed at the middle part is installed at the probe 17, the probe card is installed at the middle part is installed at the 17.
In the utility model, the short side of the limiting hole 9 is provided with a fixing groove 19 inwards.
The mounting groove 10 is matched and connected with the connecting terminal 3 of the PCB 46.
In the utility model, the change-over switch 18 is electrically connected with the probe 12, and the pressing clamp 15 is electrically connected with the power-on hole 13.
The probe 12 is configured as a retractable probe in the present utility model.
In the utility model, the power-on hole 13 is electrically connected with the probe 12.
Working principle: and (3) power is applied between the wire shells: the limiting plate 7 is vertically upwards penetrated through the locating hole of the limiting plate 7 from the PCB46 connecting terminal 3 on the motherboard 1 with the power supply plate, then the filter is put into the corresponding groove of the limiting plate 7, and the probe plate 8 is covered to insert the lead end into the clamping pieces at two sides; and (3) power is applied between the wires: the limiting plate 7 vertically penetrates through the PCB46 connecting terminals 3 on the motherboard 1 with the power supply plate (the locating holes of the limiting plate 7 are upward, then the probe plate 8 is covered, the lead ends of the capacitors are inserted into the clamping pieces on two sides, the plates are fixed through the locating pins 14, the module of the fixed daughter board 2 is arranged on the motherboard 1, one end of the lead of the independent power supply hole 13 is an electrode, the probe 12 or the other end of the lead is an electrode, the probe plate 8 is powered through the positive banana socket 5 and the negative positive banana socket 5 of the motherboard 1, and then the power supply of the components can be realized by detecting whether the voltage of each daughter board 2 is normal or not.
It is noted that relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Moreover, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus.
Although embodiments of the present utility model have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made therein without departing from the principles and spirit of the utility model, the scope of which is defined in the appended claims and their equivalents.
Claims (6)
1. The utility model provides a general components and parts clamping device for ageing test, includes mother board (1) and daughter board (2), its characterized in that: the daughter board (2) is uniformly arranged on the motherboard (1), a plurality of connecting terminals (3) are arranged on the motherboard (1), a safety tube (4) is arranged on one side, close to the connecting terminals (3), of the motherboard (1), a positive banana socket (5) and a negative banana socket (6) are respectively arranged at two ends of one side, above the motherboard (1), of the motherboard (1), the daughter board (2) comprises a limiting plate (7) and a probe board (8), the limiting plate (7) is arranged on the motherboard (1) through the connecting terminals (3), a plurality of limiting holes (9) are formed in the limiting plate (7), an installation groove (10) is formed between limit holes (9) on two sides of the upper surface of the limit plate (7), positioning pin holes (11) are formed on two sides of the installation groove (10), the probe plate (8) is installed on the upper surface of the limit plate (7), a plurality of probes (12) are installed in the middle of the lower end of the probe plate (8), an energizing hole (13) is formed between the probes (12) on two sides of the lower end of the probe plate (8), positioning pins (14) are installed on two sides of the energizing hole (13), the positioning pins (14) are connected with the positioning pin holes (11) in a matched mode, the probe card is characterized in that the pressing clips (15) are arranged on two sides of the upper surface of the probe card (8), a probe cap (16) is arranged between the pressing clips (15) in the middle of the upper surface of the probe card (8), positioning pin nuts (17) are arranged on two sides of the upper surface middle power-on hole (13) of the probe card (8), and a change-over switch (18) is arranged on one side of the upper surface of the probe card (8).
2. The clamping device for the universal component burn-in test of claim 1, wherein: the short side of the limiting hole (9) is provided with a fixing groove (19) inwards.
3. The clamping device for the universal component burn-in test of claim 1, wherein: the mounting groove (10) is connected with the connecting terminal (3) in a matching way.
4. The clamping device for the universal component burn-in test of claim 1, wherein: the switch (18) is electrically connected with the probe (12), and the pressing clamp (15) is electrically connected with the power-on hole (13).
5. The clamping device for the universal component burn-in test of claim 1, wherein: the probe (12) is configured as a retractable probe.
6. The clamping device for the universal component burn-in test of claim 1, wherein: the power-on hole (13) is electrically connected with the probe (12).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202322889605.8U CN221506960U (en) | 2023-10-27 | 2023-10-27 | Clamping device for universal component aging test |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202322889605.8U CN221506960U (en) | 2023-10-27 | 2023-10-27 | Clamping device for universal component aging test |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN221506960U true CN221506960U (en) | 2024-08-09 |
Family
ID=92131645
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202322889605.8U Active CN221506960U (en) | 2023-10-27 | 2023-10-27 | Clamping device for universal component aging test |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN221506960U (en) |
-
2023
- 2023-10-27 CN CN202322889605.8U patent/CN221506960U/en active Active
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN106896244B (en) | Aging clamp and method for testing contact condition and aging result by using same | |
| JPH07225245A (en) | Conductive contact unit | |
| CN216559122U (en) | Hall current sensor is testing arrangement in batches | |
| CN206248695U (en) | A kind of vertical SMD aluminium electrolutic capacitor high temperature load experiment tool | |
| CN221506960U (en) | Clamping device for universal component aging test | |
| CN111175644A (en) | Circuit board test auxiliary device, test system and test method | |
| CN213986586U (en) | Test fixture of chip capacitor | |
| CN201327520Y (en) | Test tool for connector | |
| CN213986758U (en) | Current tracing clamp for primary battery discharge performance testing equipment | |
| CN109696601B (en) | Needle bed aging and detecting device | |
| CN221765550U (en) | Clamping device for aging test of metal shaft screw-mounted filter | |
| CN220357102U (en) | Quick batch clamping fixture for ageing test of cylindrical welding filter | |
| CN218382955U (en) | Large-capacity aging base for electronic element | |
| CN218866020U (en) | Display module electricity endurance experiment installation device | |
| CN220231882U (en) | Multifunctional assessment board suitable for patch type capacitor | |
| CN215728286U (en) | Test fixture for lead capacitor | |
| CN210109258U (en) | ICT test fixture | |
| CN218036956U (en) | Aging screening clamp for plate type filter capacitor | |
| CN218734220U (en) | Filter with self-protection function | |
| CN214895658U (en) | High definition image detection circuit board SMT paster electric capacity resistance check out test set | |
| CN219777862U (en) | Electrical property detection device for fuse production and processing | |
| CN115825613A (en) | Display module electrical endurance experiment installation device and use method | |
| CN221631485U (en) | Connecting device for circuit board environmental stress screening test | |
| CN101881897B (en) | Test tool and testing method for back light inverter module | |
| CN211404823U (en) | A kind of interface unit |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant |