CN221199756U - Testing device and testing seat thereof - Google Patents

Abstract

A testing device and a testing seat thereof are provided, wherein the testing device comprises a circuit board and a testing seat. The circuit board comprises a plurality of first contacts and second contacts. The test seat comprises a seat body, a first guide connecting piece, a second guide connecting piece, a plurality of first telescopic probes and a plurality of second telescopic probes. The first guide connecting piece and the second guide connecting piece are respectively positioned on the base body and are used for respectively contacting the first electrode and the second electrode of the object to be detected. The first telescopic probes are distributed on the first guide connecting piece at intervals, are electrically connected with the first guide connecting piece and respectively contact with the first contact. The second telescopic probes are distributed on the second guide connecting piece at intervals, are electrically connected with the second guide connecting piece and respectively contact with the second contact points. Through the structure, the utility model can enable the telescopic probes to be closely contacted with the contacts of the circuit board according to the height fluctuation of the electrodes of the object to be tested, and improves the conductive efficiency of the testing device on the object to be tested, thereby enabling the measuring effect to be more accurate.

Description

Testing device and testing seat thereof

Technical Field

The present utility model relates to a testing device, and more particularly to a testing device with a testing seat.

Background

The conventional probe device comprises a main circuit board, a probe head and a test board, wherein the probe head is arranged between the main circuit board and the test board and is respectively contacted with corresponding contacts of the main circuit board through a plurality of probes. Therefore, when the object to be tested (device under test, DUT) placed on the test bench moves to and touches the probe heads, the probe heads respectively touch the conductive pads of the object to be tested, and the object to be tested is electrically tested, so that whether the object to be tested has defects is judged.

However, the conductive pads of the object to be tested are not completely equal in position, so that the conductive pads have different heights. When the probe head touches the conductive pads of the object to be tested, the probes of the probe head cannot fully and truly contact the corresponding contacts of the main circuit board, resulting in misalignment of test performance.

Disclosure of utility model

The utility model provides a testing device and a testing seat thereof, which are used for solving the problems in the prior art.

According to one embodiment of the present utility model, a test apparatus includes a circuit board and a test socket. The circuit board comprises a plurality of first contacts and a plurality of second contacts. The test seat comprises a seat body, a first guide connecting piece, a second guide connecting piece, a plurality of first telescopic probes and a plurality of second telescopic probes. The first guide connecting piece is positioned on the base body and used for contacting a first electrode of an object to be detected. The second conductive member is located on the base and physically separated from the first conductive member for contacting a second electrode of the object to be tested. The first telescopic probes are distributed on the first guide connecting piece at intervals, are electrically connected with the first guide connecting piece and respectively contact with the first contacts. The second telescopic probes are distributed on the second guide connecting piece at intervals, are electrically connected with the second guide connecting piece and respectively contact with the second joints.

According to one or more embodiments of the present utility model, in the testing apparatus, the first conductive member includes a first receiving seat and a first pressing post, and a surface of the first receiving seat facing the circuit board has a plurality of first slots, each of which is used for receiving one of the first retractable probes. The first touch column is connected with one surface of the first needle containing seat, which is opposite to the circuit board, and is used for contacting with a first electrode of an object to be detected. The second guide connector comprises a second needle containing seat and a second touching column, and one surface of the second needle containing seat facing the circuit board is provided with a plurality of second slots. Each second slot is used for accommodating one second telescopic probe. The second contact post is connected with one side of the second needle containing seat back to the circuit board and used for contacting a second electrode of the object to be detected.

According to one or more embodiments of the present utility model, in the testing apparatus, each of the first pogo pins includes a first pin body and a first pogo spring. The first telescopic springs are respectively connected with the first needle body and one of the first slots. Each second telescopic probe comprises a second probe body and a second telescopic spring. The second telescopic springs are respectively connected with the second needle body and one of the second slots.

According to one or more embodiments of the present utility model, in the testing apparatus, the first contact post is used for contacting an end surface of the object to be tested and the second contact post is used for contacting an end surface of the object to be tested, and each of the first contact post and the second contact post includes an uneven embossed surface.

According to one or more embodiments of the present utility model, in the testing apparatus, the base includes a first module and a second module. The first module is connected with the circuit board and is provided with a first slot. The second module is overlapped and fixed on the first module and is provided with a second slot and a separation rib. The second slot is communicated with the first slot, the separation rib is positioned in the second slot, and the second slot is separated into a first accommodating area and a second accommodating area. The first containing needle seat is limited in the first containing area and the first slot, and the second containing needle seat is limited in the second containing area and the second slot.

According to one embodiment of the present utility model, a test socket includes a socket body, a first conductive member, a second conductive member, a plurality of first pogo pins and a plurality of second pogo pins. The first guide connecting piece is positioned on the base body and used for contacting a first electrode of an object to be detected. The second conductive member is located on the base and physically separated from the first conductive member for contacting a second electrode of the object to be tested. The first telescopic probes are distributed on the first guide connecting piece at intervals, are electrically connected with the first guide connecting piece and respectively contact with a plurality of first contacts of a circuit board. The second telescopic probes are distributed on the second guide connecting piece at intervals, are electrically connected with the second guide connecting piece and respectively contact with a plurality of second contacts of the circuit board.

According to one or more embodiments of the present utility model, in the test socket, the first conductive member includes a first receptacle and a first contact post. One surface of the first needle containing seat is provided with a plurality of first slots. Each first slot is used for accommodating one first telescopic probe, and the first touch column is connected with the other surface of the first needle accommodating seat and is used for contacting with a first electrode of an object to be detected. The second guide connector comprises a second needle accommodating seat and a second touch pressing column. One surface of the second needle containing seat is provided with a plurality of second slots, each second slot is used for containing one second telescopic probe, and the second touching and pressing column is connected with the other surface of the second needle containing seat and used for contacting a second electrode of the object to be detected.

In accordance with one or more embodiments of the present utility model, in the test socket, each of the first pogo pins includes a first pin body and a first pogo spring. The first telescopic springs are respectively connected with the first needle body and one of the first slots. Each second telescopic probe comprises a second probe body and a second telescopic spring. The second telescopic springs are respectively connected with the second needle body and one of the second slots.

According to one or more embodiments of the present utility model, in the test socket, the first contact post is configured to contact an end surface of the object to be tested, and the second contact post is configured to contact an end surface of the object to be tested, and each of the end surfaces includes an uneven embossed surface.

According to one or more embodiments of the present utility model, in the test socket, the socket body includes a first module and a second module. The first module is connected with the circuit board and is provided with a first slot. The second module is overlapped and fixed on the first module and is provided with a second slot and a separation rib. The second slot is communicated with the first slot, the separation rib is positioned in the second slot, and the second slot is separated into a first accommodating area and a second accommodating area. The first containing needle seat is limited in the first containing area and the first slot, and the second containing needle seat is limited in the second containing area and the second slot.

Therefore, through the structure, the testing device and the testing seat thereof can enable the first telescopic probe and the second telescopic probe to be in close contact with the first contact and the second contact of the circuit board according to the height fluctuation of the first electrode and the second electrode of the object to be tested, so that the conductivity of the testing device to the object to be tested is improved, and the measuring effect is more accurate.

The above description is merely illustrative of the problems to be solved, the technical means to solve the problems, the efficacy of the utility model, etc., and the specific details of the utility model are set forth in the following description and related drawings.

Drawings

The foregoing and other objects, features, advantages and embodiments of the utility model will be apparent from the following description taken in conjunction with the accompanying drawings in which:

FIG. 1 is a cross-sectional view of a testing apparatus and an operation schematic diagram thereof according to an embodiment of the present utility model;

FIG. 2 is a perspective view of the test seat of FIG. 1;

FIG. 3 is an exploded view of the test seat of FIG. 1;

Fig. 4 is a perspective view of the test socket of fig. 1 viewed in another direction.

[ Symbolic description ]

10 Test device

100 Carrier

200 Circuit board

210 First contact

220 Second contact

230 Positioning hole

300 Test seat

301,302 Faces

310, Seat body

320 First module

321 First grooving

330 Second module

331 Second grooving

332 First groove

333 Second trench

334 Separation rib

335A first accommodation area

335B second accommodation area

336 Positioning through hole

340 First positioning column

350 Second positioning column

351 First spacing spring

352 Second spacing spring

360 Bolt

370 First guide connector

371 First needle holder

371A Top surface

371B bottom surface

372 First slot

373 First contact post

374 First embossed surface

380 Second guide connector

381 Second needle holder

381A top surface

381B bottom surface

382 Second slot

383 Second contact post

384 Second embossed surface

390 Third positioning column

410 First telescoping probe

411 First needle body

412 First telescopic spring

420 Second telescoping probe

421 Second needle

422 Second telescopic spring

500:Object to be measured

501 Top surface

510 First electrode

520 Second electrode

X, Y, Z, major axis direction

Detailed Description

Various embodiments of the utility model are disclosed in the accompanying drawings, and for purposes of explanation, numerous practical details are set forth in the following description. However, it will be understood by those skilled in the art that these practical details are not necessary in some embodiments of the present utility model and are not, therefore, to be taken as limiting the present utility model. Furthermore, for the sake of simplicity of the drawing, some conventional structures and elements are shown in the accompanying drawings in a simplified schematic manner. In addition, the dimensions of the various elements in the drawings are not drawn to scale for the convenience of the reader.

FIG. 1 is a cross-sectional view of a testing device 10 and an operation schematic thereof according to an embodiment of the present utility model. Fig. 2 is a perspective view of the test socket 300 of fig. 1. As shown in fig. 1 and 2, the test apparatus 10 includes a carrier 100, a circuit board 200 and a test socket 300. The test seat 300 is located between the carrier 100 and the circuit board 200. The surface of the circuit board 200 facing the test socket 300 has a plurality of first contacts 210 and a plurality of second contacts 220. The carrier 100 is used for placing an object 500 to be tested. The top surface 501 of the object 500 has a first electrode 510 and a second electrode 520. The test socket 300 includes a socket body 310, a first conductive connector 370, a second conductive connector 380, a plurality of first pogo pins 410 and a plurality of second pogo pins 420. The first conductive member 370 is disposed on the base 310 and is used for contacting the first electrode 510 of the object 500. The second conductive element 380 is located on the base 310 and physically separated from the first conductive element 370, so as to contact the second electrode 520 of the object 500. The first pogo pins 410 are spaced apart on the first conductive members 370, electrically connected to the first conductive members 370, and respectively contacting the first contacts 210 one by one. For example, the first pogo pins 410 are arranged according to a 2X6 array, however, the present utility model is not limited thereto, and in other embodiments, the first pogo pins 410 are arranged according to a 10X10 array because of other requirements or limitations. The second pogo pins 420 are distributed on the second conductive members 380 at intervals, electrically connected to the second conductive members 380, and respectively contact the second contacts 220 one by one. For example, the second pogo pins 420 are arranged according to a 2X6 array, however, the present utility model is not limited thereto, and in other embodiments, the second pogo pins 420 are arranged according to a 10X10 array, because of other requirements or limitations.

Thus, when the object 500 on the carrier 100 moves to the test seat 300, the first conductive element 370 and the second conductive element 380 are electrically connected to the first electrode 510 and the second electrode 520 of the object 500, respectively, the signal of the object 500 can be transmitted to the circuit board 200 through the test seat 300, so that the circuit board 200 electrically detects the object 500.

Thus, since the first pogo pins 410 and the second pogo pins 420 can be compressed independently, the first pogo pins 410 and/or the second pogo pins 420 corresponding to the test device 10 can be compressed correspondingly according to the height fluctuation of the first electrode 510 and the second electrode 520 of the object 500, thereby maintaining the characteristics of the first electrode 510 and the second electrode 520 closely contacting the circuit board.

Fig. 3 is an exploded view of the test seat 300 of fig. 1. More specifically, as shown in fig. 1 and 3, the first conductive member 370 includes a first receiving seat 371 and a first contact post 373. The first receptacle 371 includes a top face 371A and a bottom face 371B opposite to each other. The first receiving socket 371 has a plurality of first slots 372. These first slots 372 are formed on the top surface 371A of the first receptacle base 371, respectively. Each first slot 372 is configured to receive one of the first pogo pins 410. Further, each of the first slots 372 is linear (fig. 1), for example, extending in the Z-axis direction. One end of the first contact column 373 is fixedly inserted into the bottom surface 371B of the first receiving seat 371, and the other end thereof is removably contacted with the first electrode 510 of the object 500 to be measured. The second connector 380 includes a second receptacle holder 381 and a second contact post 383. The second receptacle 381 includes a top surface 381A and a bottom surface 381B opposite to each other. The second receptacle 381 has a plurality of second slots 382. These second slots 382 are respectively formed on the top surface 381A of the second receptacle holder 381. Each of the second slots 382 is configured to receive one of the second pogo pins 420. Further, each of the first slots 372 is linear (fig. 1), for example, extending in the Z-axis direction. One end of the second contact post 383 is fixedly inserted into the bottom surface 381B of the second receptacle 381, and the other end thereof is removably contacted with the second electrode 520 of the object 500 to be measured.

In addition, each first pogo pin 410 includes a first pin 411 and a first pogo spring 412. The first extension springs 412 are respectively connected to the first needle 411 and one of the first slots 372. In other words, one end of the first extension spring 412 is sleeved to the first needle 411, and the other end abuts against the bottom of the first slot 372. Each second pogo pin 420 includes a second pin 421 and a second pogo spring 422. The second extension springs 422 are respectively connected to the second needle 421 and one of the second slots 382. In other words, one end of the second extension spring 422 is sleeved to the second needle 421, and the other end abuts against the bottom of the second slot 382.

Thus, the first expansion spring 412 can absorb the pressure fed back by the first needle 411 and/or the first needle holder 371 at two sides thereof, so as to reflect the degree of fluctuation of the first electrode 510 corresponding to the first expansion probe 410; similarly, the second telescopic spring 422 can absorb the pressure fed back by the second needle 421 and/or the second needle holder 381 at two sides thereof, so as to reflect the fluctuation degree of the second electrode 520 corresponding to the second telescopic probe 420.

Furthermore, the base 310 includes a first module 320 and a second module 330. The first module 320 is connected to the circuit board 200. For example, the base 310 further includes one or more first positioning posts 340, and the first positioning posts 340 pass through the first module 320 and the second module 330 and protrude from a surface (e.g., the surface 301) of the first module 320 facing the circuit board 200. The surface of the circuit board 200 facing the base 310 further includes one or more positioning holes 230. Therefore, the circuit board 200 can be fixedly coupled to the first module 320 by the first positioning posts 340 being inserted into the positioning holes 230.

The second module 330 is stacked and fixed on the first module 320, for example, locked on one side of the first module 320 by bolts 360. The first module 320 is disposed through a first slot 321, and the second module 330 is disposed through a second slot 331 and a partition rib 334. Therefore, when the second module 330 is stacked on the first module 320, the second slot 331 is coaxially connected to the first slot 321, and the partition rib 334 is disposed in the second slot 331 and separates the second slot 331 into a first accommodating area 335A and a second accommodating area 335B.

The first receiving seat 371 is limited in the first receiving area 335A and the first slot 321, and one end of the first contact post 373 extends out of the second module 330 (fig. 1) from the second slot 331. The second receiving seat 381 is limited in the second receiving area 335B and the second slot 331, and one end of the second pressing post 383 extends out of the second module 330 (fig. 1) from the second slot 331.

For example, but not limited to, the shape (like a rectangle) of the first receiving area 335A is substantially the same as the shape (like a rectangle) of the first receiving needle base 371, such that the first receiving needle base 371 cannot traverse or rotate within the first receiving area 335A. The shape (like a rectangle) of the second receiving area 335B is substantially the same as the shape (like a rectangle) of the second receiving hub 381, such that the second receiving hub 381 cannot traverse or rotate within the second receiving area 335B.

In addition, the first module 320 further has at least one second positioning post 350 facing the second module 330, and the second module 330 further has at least one positioning through hole 336. In this way, each second positioning post 350 is inserted into the corresponding positioning through hole 336, so as to facilitate the second module 330 being smoothly overlapped on the first module 320.

The second module 330 further includes a plurality of first grooves 332, a plurality of second grooves 333, a plurality of first stop springs 351, and a plurality of second stop springs 352. The first trench 332 and the second trench 333 are both located on a surface of the second module 330 facing the first module 320, the second trench 333 is disposed opposite to the first trench 332, and further, the second slot 331 is located between the second trench 333 and the first trench 332, and connects the second trench 333 and the first trench 332. The first spacing spring 351 is located in the first groove 332, and the second spacing spring 352 is located in the second groove 333.

For example, the long axis direction X of the first groove 332 is orthogonal to the long axis direction Z of the first slot 372, and is orthogonal to the long axis direction Y of the first receptacle 371. The long axis direction X of the second groove 333 is orthogonal to the long axis direction Z of the second slot 382, and is orthogonal to the long axis direction Y of the second receptacle holder 381.

Thus, when the first receiving seat 371 is in the first receiving area 335A, one end of the first limiting spring 351 pushes the first receiving seat 371 against the partition rib 334, thereby fixing the first receiving seat 371 in the first receiving area 335A. Similarly, when the second receiving seat 381 is in the second receiving area 335B, one end of the second limiting spring 352 pushes the second receiving seat 381 toward the partition rib 334, so as to fix the second receiving seat 381 in the second receiving area 335B.

Fig. 4 is a perspective view of the test socket 300 of fig. 1 viewed in another direction. As shown in fig. 1 and 4, an end surface of the first contact pillar 373 facing away from the circuit board 200 includes a first embossed surface 374 with irregularities, and an end surface of the second contact pillar 383 facing away from the circuit board 200 includes a second embossed surface 384 with irregularities. Thus, when the first conductive member 370 contacts the first electrode 510 of the object 500 and the second conductive member 380 contacts the second electrode 520 of the object 500, the first embossed surface 374 of the first conductive member 370 can be more stably fixed to the first electrode 510 of the object 500, and the second embossed surface 384 of the second conductive member 380 can be more stably fixed to the second electrode 520 of the object 500.

In addition, the side 302 of the test socket 300 opposite to the circuit board 200 further extends out of at least one third positioning post 390 for positioning the test socket 300 on a device.

Therefore, through the structure, the testing device and the testing seat can enable the first telescopic probe and the second telescopic probe to be in close contact with the contacts of the circuit board according to the height fluctuation of each electrode of the object to be tested, and the conductivity of the testing device on the object to be tested is improved, so that the measuring effect is more accurate.

Finally, the embodiments disclosed above are not intended to limit the utility model, but one skilled in the art can make various modifications and adaptations without departing from the spirit and scope of the utility model. The scope of the utility model is therefore defined in the appended claims.

Claims (10)

1. A test apparatus, comprising:

a circuit board comprising a plurality of first contacts and a plurality of second contacts; and

A test seat, comprising:

a base;

A first conductive member disposed on the base for contacting a first electrode of an object to be tested;

The second guide connecting piece is positioned on the base body and is physically separated from the first guide connecting piece so as to contact a second electrode of the object to be detected;

The first telescopic probes are distributed on the first guide connecting piece at intervals, are electrically connected with the first guide connecting piece and respectively contact with the first contacts; and

The second telescopic probes are distributed on the second guide connecting piece at intervals, are electrically connected with the second guide connecting piece and respectively contact with the second contacts.

2. The testing device of claim 1, wherein the first conductive member comprises a first receiving socket and a first pressing post, wherein a surface of the first receiving socket facing the circuit board has a plurality of first slots, each of the plurality of first slots is used for receiving one of the plurality of first retractable probes, and the first pressing post is connected to a surface of the first receiving socket facing away from the circuit board for contacting the first electrode of the object to be tested; and

The second guide connector comprises a second needle containing seat and a second pressing column, wherein one surface of the second needle containing seat facing the circuit board is provided with a plurality of second slots, each of the second slots is used for containing one of the second telescopic probes, and the second pressing column is connected with one surface of the second needle containing seat facing away from the circuit board and is used for contacting the second electrode of the object to be tested.

3. The testing device of claim 2, wherein each of the plurality of first pogo pins comprises a first pin body and a first pogo spring, the first pogo spring being connected to one of the first pin body and the plurality of first slots, respectively; and

Each of the plurality of second telescopic probes comprises a second needle body and a second telescopic spring, and the second telescopic spring is respectively connected with the second needle body and one of the plurality of second slots.

4. The testing device of claim 2, wherein the first contact post is configured to contact an end surface of the object and the second contact post is configured to contact an end surface of the object, respectively, comprises an embossed surface.

5. The testing device of claim 2, wherein the housing comprises:

the first module is connected with the circuit board and provided with a first slot; and

A second module, which is overlapped and fixed on the first module and is provided with a second slot and a separation rib, wherein the second slot is communicated with the first slot, the separation rib is positioned in the second slot and separates the second slot into a first accommodating area and a second accommodating area,

The first needle accommodating seat is limited in the first accommodating area and the first slot, and the second needle accommodating seat is limited in the second accommodating area and the second slot.

6. A test seat, comprising:

a base;

A first conductive member disposed on the base for contacting a first electrode of an object to be tested;

The second guide connecting piece is positioned on the base body and is physically separated from the first guide connecting piece so as to contact a second electrode of the object to be detected;

The first telescopic probes are distributed on the first guide connector at intervals and are electrically connected with the first guide connector to contact with a plurality of first contacts of a circuit board; and

The second telescopic probes are distributed on the second guide connecting piece at intervals and are electrically connected with the second guide connecting piece to contact the second contacts of the circuit board.

7. The test socket of claim 6, wherein the first conductive member comprises a first receiving socket and a first pressing post, one surface of the first receiving socket is provided with a plurality of first slots, each of the plurality of first slots is used for receiving one of the plurality of first telescopic probes, and the first pressing post is connected with the other surface of the first receiving socket and is used for contacting the first electrode of the object to be tested; and

The second guide connector comprises a second needle accommodating seat and a second touch column, one surface of the second needle accommodating seat is provided with a plurality of second slots, each of the second slots is used for accommodating one of the second telescopic probes, and the second touch column is connected with the other surface of the second needle accommodating seat and is used for contacting the second electrode of the object to be detected.

8. The test socket of claim 7, wherein one of the plurality of first pogo pins comprises a first pin body and a first pogo spring, the first pogo spring being connected to the first pin body and one of the plurality of first slots, respectively; and

One of the plurality of second telescopic probes comprises a second needle body and a second telescopic spring, and the second telescopic spring is respectively connected with the second needle body and one of the plurality of second slots.

9. The test socket of claim 7, wherein the first contact post is configured to contact an end surface of the test object and the second contact post is configured to contact an end surface of the test object, respectively, comprises an uneven embossed surface.

10. The test seat of claim 7, wherein the seat body comprises:

A first module having a first slot; and

A second module, which is overlapped and fixed on the first module and is provided with a second slot and a separation rib, wherein the second slot is communicated with the first slot, the separation rib is positioned in the second slot and separates the second slot into a first accommodating area and a second accommodating area,

The first needle accommodating seat is limited in the first accommodating area and the first slot, and the second needle accommodating seat is limited in the second accommodating area and the second slot.