CN220914329U - Probe assembly and charging and discharging equipment - Google Patents

Probe assembly and charging and discharging equipment Download PDF

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Publication number
CN220914329U
CN220914329U CN202322718558.0U CN202322718558U CN220914329U CN 220914329 U CN220914329 U CN 220914329U CN 202322718558 U CN202322718558 U CN 202322718558U CN 220914329 U CN220914329 U CN 220914329U
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mounting
mounting member
support
limiting
along
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CN202322718558.0U
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请求不公布姓名
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Zhuhai Titans New Power Electronics Co Ltd
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Zhuhai Titans New Power Electronics Co Ltd
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Abstract

The utility model relates to the technical field of batteries and discloses a probe assembly and charging and discharging equipment, which comprise a supporting assembly and a plurality of mounting pieces, wherein the mounting pieces are detachably connected to the supporting assembly and sequentially arranged along a first direction, each mounting piece can move along a second direction relative to the supporting assembly so as to be assembled with or separated from the supporting assembly, each mounting piece is detachably provided with a plurality of probes, and the probes are arranged at intervals along the second direction. By adopting the probe assembly and the charging and discharging equipment, the operation is simpler and more convenient in the process of replacing the probe, and the replacement difficulty is lower.

Description

Probe assembly and charging and discharging equipment
Technical Field
The utility model relates to the technical field of batteries, in particular to a probe assembly and charging and discharging equipment.
Background
In the production process of the battery, the battery needs to be formed through a charging and discharging device so as to activate the battery and enable the battery to have the capacity of storing electricity. In order to improve the formation efficiency, a probe assembly of a charge/discharge device is provided with a plurality of probes, and a plurality of batteries are simultaneously formed by using the plurality of probes.
In order to ensure the normal use of the charging and discharging equipment, the probe assembly needs to be maintained. However, the whole probe assembly needs to be detached from the charging and discharging equipment during maintenance, the damaged probe is replaced, the operation is complicated in the replacement process of the probe, and the replacement difficulty of the probe is high due to the whole structure and the large weight of the probe assembly.
Disclosure of utility model
The embodiment of the utility model discloses a probe assembly and charging and discharging equipment, wherein in the process of replacing a probe, the operation is simpler and more convenient, and the replacement difficulty is lower.
In a first aspect, an embodiment of the present utility model discloses a probe assembly, including a support assembly and a plurality of mounting members, where the plurality of mounting members are detachably connected to the support assembly, and the plurality of mounting members are sequentially disposed along a first direction, and each of the mounting members is movable along a second direction relative to the support assembly to be assembled with or separated from the support assembly, and each of the mounting members is detachably provided with a plurality of probes, and the plurality of probes are disposed at intervals along the second direction.
As an alternative implementation manner, in an embodiment of the present utility model, the support assembly is provided with a plurality of sliding rail structures, and a plurality of sliding rail structures are arranged at intervals along the first direction, and each sliding rail structure is slidably provided with one mounting piece along the second direction.
In an alternative embodiment of the present utility model, the probe assembly further includes a plurality of sliding groove pieces, the plurality of sliding groove pieces are disposed on the support assembly at intervals along the first direction, the sliding groove pieces are provided with sliding rail structures, and the two sliding rail structures are respectively located on two adjacent sliding groove pieces and form a sliding rail.
In an alternative embodiment of the present utility model, each of the sliding rail structures includes a supporting portion and a guiding portion disposed on the sliding groove piece, where the two adjacent supporting portions are respectively located on two adjacent sliding groove pieces and are used for supporting one of the mounting pieces, and the two adjacent guiding portions are respectively located on two adjacent sliding groove pieces and are used for providing guidance for sliding one of the mounting pieces relative to the sliding rail structure along the second direction.
In an alternative embodiment of the present utility model, the supporting portion is disposed on a first surface of the sliding chute piece, and the two adjacent first surfaces are respectively located on two adjacent sliding chute pieces and abut against a surface of the mounting piece facing the supporting component to support one of the mounting pieces, and the guiding portion is disposed on a second surface of the sliding chute piece, and the two adjacent second surfaces are respectively located on two adjacent sliding chute pieces and abut against two sides of the mounting piece along the first direction, so as to provide guiding for sliding of one of the mounting pieces along the second direction relative to the sliding rail structure.
In an alternative embodiment of the present utility model, the support assembly includes a base plate and a plurality of support plates, where the plurality of support plates are disposed on the base plate at intervals along the first direction, a space is formed between two adjacent support plates, each support plate is provided with the chute member, and each mounting member is correspondingly located above one of the spaces.
As an optional implementation manner, in an embodiment of the present utility model, the probe assembly further includes a first limiting member and a second limiting member, where the first limiting member and the second limiting member are disposed at intervals in the support assembly along the second direction, and the first limiting member and the second limiting member are respectively abutted to two ends of the mounting member along the second direction, so as to limit the mounting member.
As an optional implementation manner, in an embodiment of the present utility model, the first limiting member is a first limiting plate, the second limiting member is a plurality of second limiting plates, the plurality of second limiting plates are sequentially arranged along the first direction, one of two adjacent second limiting plates is provided with a protruding portion, the other one of the two adjacent second limiting plates is provided with a recessed portion, the protruding portion is accommodated in the recessed portion, the first limiting plate abuts against one end of the mounting member along the second direction, and each second limiting plate abuts against one end of the mounting member along the second direction, which is away from the first limiting plate, so as to limit the plurality of mounting members.
As an optional implementation manner, in an embodiment of the present utility model, the probe assembly further includes a third limiting member and a fourth limiting member, where the third limiting member is disposed on the first limiting member and located at one end of the mounting member along the second direction, the third limiting member abuts against one surface of the mounting member, which faces away from the support assembly along the third direction, so as to limit the mounting member along the third direction, and the fourth limiting member is disposed on the second limiting member and located at one end of the mounting member, which faces away from the third limiting member along the second direction, and the fourth limiting member abuts against one surface of the mounting member, which faces away from the support assembly along the third direction, so as to limit the mounting member along the third direction.
As an optional implementation manner, in an embodiment of the present utility model, the third limiting member has a first positioning surface and a second positioning surface, the first positioning surface is abutted against a surface of the first limiting member, which is opposite to the second limiting member along the second direction, the second positioning surface is abutted against a surface of the mounting member, which is opposite to the supporting component along the third direction, so as to limit the mounting member along the third direction, and the fourth limiting member has a third positioning surface and a fourth positioning surface, the third positioning surface is abutted against a surface of the second limiting member, which is opposite to the first limiting member along the second direction, and the fourth positioning surface is abutted against a surface of the mounting member, which is opposite to the supporting component along the third direction, so as to limit the mounting member along the third direction.
As an alternative implementation manner, in an embodiment of the present utility model, the third limiting member further has a first chamfer, where the first chamfer is spaced from a surface of the mounting member facing away from the support assembly so as to avoid the mounting member, and the fourth limiting member further has a second chamfer, where the second chamfer is spaced from a surface of the mounting member facing away from the support assembly in the third direction so as to avoid the mounting member.
As an alternative implementation manner, in an embodiment of the present utility model, the probe assembly further includes a support, and each of the mounting members is provided with a plurality of supports, where the plurality of supports are arranged at intervals along the second direction, and the plurality of supports are used for supporting the wires of the probe.
As an optional implementation manner, in an embodiment of the present utility model, each support includes a first connection portion, a support portion, and a second connection portion that are sequentially connected, where one end of the first connection portion facing away from the support portion is connected to the mounting member, one end of the second connection portion facing away from the support portion is connected to the mounting member, and one side of the support portion facing toward the mounting member is used for supporting a wire of the probe.
In a second aspect, an embodiment of the present utility model discloses a charge-discharge apparatus, including the probe assembly disclosed in the first aspect.
Compared with the prior art, the embodiment of the utility model has at least the following beneficial effects:
In the embodiment of the utility model, the plurality of mounting pieces are sequentially arranged along the first direction and are detachably connected with the supporting component, so that each mounting piece can move along the second direction to be assembled with or separated from the supporting component, and meanwhile, the plurality of probes are arranged by utilizing each mounting piece and can be detached relative to the mounting piece. Like this, when changing the probe, can be with the mounting that the probe corresponds through the mode of following the second direction removal disconnect the supporting component, with this probe disconnect mounting again, need not to dismantle the whole of probe subassembly, alleviate the weight of dismantling the part, the change operation of probe is comparatively simple and convenient, and the change degree of difficulty is lower.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present utility model, the drawings that are needed in the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present utility model, and other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic top view of a probe assembly according to an embodiment of the first aspect of the present utility model;
FIG. 2 is a schematic view of a left side view of a slide slot member disclosed in an embodiment of the first aspect of the present utility model;
FIG. 3 is a schematic top view of a chute member as disclosed in the embodiment of the first aspect of the utility model;
FIG. 4 is a schematic diagram of a structure of a left view of a probe assembly disclosed in an embodiment of the first aspect of the present utility model;
FIG. 5 is a schematic top view of a support assembly according to an embodiment of the first aspect of the present utility model;
FIG. 6 is a schematic view of a support assembly from a bottom view in accordance with an embodiment of the first aspect of the present utility model
FIG. 7 is a schematic diagram of a structure of a rear view of a probe assembly disclosed in an embodiment of the first aspect of the present utility model;
FIG. 8 is a schematic diagram of a front view of a probe assembly disclosed in an embodiment of the first aspect of the present utility model;
FIG. 9 is a schematic structural view of a third stop disclosed in an embodiment of the first aspect of the present utility model;
FIG. 10 is a schematic view of the structure of a probe disclosed in an embodiment of the first aspect of the present utility model;
FIG. 11 is a schematic structural view from the front of a mounting member and bracket connection as disclosed in an embodiment of the first aspect of the present utility model;
FIG. 12 is a schematic structural view of a left side view of a mounting member coupled to a bracket as disclosed in an embodiment of the first aspect of the present utility model;
Fig. 13 is a schematic block diagram of a charge and discharge apparatus disclosed in an embodiment of the second aspect of the present utility model.
Description of the main reference numerals
100. A probe assembly; 10. a support assembly; 10a, spacing space; 11. a bottom plate; 12. a support plate; 13. a first limiting member; 14. a second limiting piece; 14a, a boss; 14b, a recess; 20. a mounting member; 30. a probe; 31. a mounting base; 32. a probe body; 33. a conductive assembly; 331. a support; 332. a conductive sheet; 333. a connecting piece; 40. a chute member; 41. a slide rail structure; 41a, a supporting part; 41b, a guide part; 50. a third limiting member; 51. a first positioning surface; 52. a second positioning surface; 53. a first chamfer; 60. a fourth limiting member; 70. a bracket; 71. a first connection portion; 72. a support part; 73. a second connecting portion; 200. a charge-discharge device; x, a first direction; y, the second direction; z, third direction.
Detailed Description
The following description of the embodiments of the present utility model will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present utility model, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.
In the present utility model, the terms "upper", "lower", "left", "right", "front", "rear", "top", "bottom", "inner", "outer", "middle", "vertical", "horizontal", "lateral", "longitudinal" and the like indicate an azimuth or a positional relationship based on that shown in the drawings. These terms are only used to better describe the present utility model and its embodiments and are not intended to limit the scope of the indicated devices, elements or components to the particular orientations or to configure and operate in the particular orientations.
Also, some of the terms described above may be used to indicate other meanings in addition to orientation or positional relationships, for example, the term "upper" may also be used to indicate some sort of attachment or connection in some cases. The specific meaning of these terms in the present utility model will be understood by those of ordinary skill in the art according to the specific circumstances.
Furthermore, the terms "mounted," "configured," "provided," "connected," and "connected" are to be construed broadly. For example, it may be a fixed connection, a removable connection, or a unitary construction; may be a mechanical connection, or an electrical connection; may be directly connected, or indirectly connected through intervening media, or may be in internal communication between two devices, elements, or components. The specific meaning of the above terms in the present utility model can be understood by those of ordinary skill in the art according to the specific circumstances.
Furthermore, the terms "first," "second," and the like, are used primarily to distinguish between different devices, elements, or components (the particular species and configurations may be the same or different), and are not used to indicate or imply the relative importance and number of devices, elements, or components indicated. Unless otherwise indicated, the meaning of "a plurality" is two or more.
The utility model discloses a probe assembly and charging and discharging equipment, wherein in the process of replacing a probe, the operation is simple and convenient, and the replacement difficulty is low.
Example of the first aspect
Referring to fig. 1 and 2, a schematic structural diagram of a probe assembly 100 according to a first embodiment of the present utility model is provided, the probe assembly 100 includes a support assembly 10 and a plurality of mounting members 20, the plurality of mounting members 20 are detachably connected to the support assembly 10, the plurality of mounting members 20 are sequentially arranged along a first direction x, each mounting member 20 can move along a second direction y relative to the support assembly 10 to be assembled with the support assembly 10 or separated from the support assembly 10, each mounting member 20 is detachably provided with a plurality of probes 30, and the plurality of probes 30 are spaced along the second direction y.
The second direction y and the first direction x are directions not parallel to each other, the first direction x may be a width direction of the mounting member 20, and the second direction y may be a length direction of the mounting member 20.
The multiple mounting members 20 are sequentially arranged along the first direction x, and the multiple mounting members 20 are detachably connected to the support assembly 10, so that each mounting member 20 can move along the second direction y to be assembled with the support assembly 10 or separated from the support assembly 10, meanwhile, multiple probes 30 are arranged by utilizing each mounting member 20, and the multiple probes 30 can be detached relative to the mounting member 20. Like this, when installed part 20 and supporting component 10 equipment, locate the probe 30 of installed part 20 can be used for switching on with the battery electricity, and probe 30 and wire connection can carry out the formation operation to the battery, and when changing probe 30, can be with the installed part 20 that probe 30 corresponds through follow second direction y removal mode dismantlement supporting component 10, with this probe 30 dismantlement installed part 20 again, need not to dismantle probe assembly 100 wholly, lighten the weight of dismantling the part, probe 30's change operation is comparatively simple and convenient, and the change degree of difficulty is lower.
In some embodiments, the support assembly 10 is provided with a plurality of sliding rail structures, which are spaced apart along the first direction x, and each sliding rail structure is slidably provided with a mounting member 20 along the second direction y. In this way, the mounting member 20 is arranged by means of a rail structure, which on the one hand is capable of supporting the mounting member 20 and on the other hand is capable of providing a guide for the sliding of the mounting member 20 in the second direction of the support assembly 10.
As illustrated in fig. 1 to 3, the probe assembly 100 further includes a plurality of sliding groove pieces 40, wherein the plurality of sliding groove pieces 40 are disposed on the support assembly 10 at intervals along the first direction x, the sliding groove pieces 40 are provided with sliding rail structures, and the two sliding rail structures are respectively disposed on two adjacent sliding groove pieces 40 and form a sliding rail. Thus, by providing a plurality of slide grooves 40 at intervals along the first direction x, the slide rail is formed by the slide rail structure of two adjacent slide grooves 40, and one mounting member 20 is mounted on one slide rail, so that the mounting member 20 slides along the second direction y relative to the support assembly 10.
In some embodiments, each sliding rail structure includes a supporting portion 41a and a guiding portion 41b disposed on the sliding groove piece 40, where the two adjacent supporting portions 41a are respectively disposed on the two adjacent sliding groove pieces 40 and are used for supporting one mounting piece 20, and the two adjacent guiding portions 41b are respectively disposed on the two adjacent sliding groove pieces 40 and are used for guiding one mounting piece 20 to slide along the second direction y relative to the sliding rail structure. In this way, the mounting member 20 is disposed with the adjacent two of the slide groove members 40, the support portion 41a provides support for the mounting member 20, and the guide portion 41b provides guidance for the mounting member 20 such that the mounting member 20 is capable of sliding relative to the support assembly 10 in the second direction y.
The supporting portion 41a is disposed on a first surface of the sliding chute 40, and is disposed on two adjacent sliding chute 40, and the two adjacent first surfaces are abutted against a surface of the mounting member 20 facing the supporting assembly 10 to support one mounting member 20, and the guiding portion 41b is disposed on a second surface of the sliding chute 40, and is disposed on two adjacent sliding chute 40, and the two adjacent second surfaces are abutted against two sides of the mounting member 20 along the first direction x, so as to provide guiding for sliding of one mounting member 20 along the second direction y relative to the sliding rail structure. In this way, the support portion 41a and the guide portion 41b are formed on the surface of the slide groove 40, the mount 20 is supported by the first surface of the slide groove 40 abutting against the surface of the mount 20, and the guide is realized by the second surface of the slide groove 40 abutting against the opposite sides of the mount 20, so that the structure is simple and reliable.
In some embodiments, as shown in fig. 4 to 6, the support assembly 10 includes a base plate 11 and a plurality of support plates 12, the plurality of support plates 12 are disposed on the base plate 11 at intervals along a first direction x, a spacing space 10a is formed between two adjacent support plates 12, each support plate 12 is provided with a chute member 40, and each mounting member 20 is correspondingly located above one spacing space 10 a. In this way, the plurality of support plates 12 are arranged at intervals along the first direction x, the adjacent two support plates 12 are formed into the spacing space 10a with openings, the sliding groove pieces 40 on the support plates 12 at two sides of the openings of the spacing space 10a can enable the plurality of mounting pieces 20 to be detachably connected to the openings of the plurality of spacing spaces 10a respectively, so that the probes 30 corresponding to the mounting pieces 20 are partially positioned in the corresponding spacing spaces 10a, the probes 30 corresponding to the adjacent mounting pieces 20 can be separated through the support plates 12, and mutual interference is avoided.
Wherein, the mounting member 20 may be a plate structure, and the mounting member 20 adopting the plate structure is more compact in cooperation with the supporting assembly 10, and has smaller thickness, smaller volume and weight, and is convenient for the disassembly and assembly of the probe 30.
In some embodiments, as shown in fig. 5 and 7, the probe assembly 100 further includes a first limiting member 13 and a second limiting member 14, where the first limiting member 13 and the second limiting member 14 are disposed on the support assembly 10 along the second direction y at intervals, and the first limiting member 13 and the second limiting member 14 respectively abut against two ends of the mounting member 20 along the second direction y, so as to limit the mounting member 20. In this way, when the probe 30 needs to be replaced, the first limiting member 13 or the second limiting member 14 can be removed, limiting of the mounting member 20 in the second direction y is released, at this time, the whole of the mounting member 20 and the probe 30 can be detached from the support assembly 10 in the second direction y, the probe 30 of the mounting member 20 is replaced, and after the replacement, the mounting member 20 can be moved in the second direction y to be assembled with the support assembly 10, and the previously detached first limiting member 13 or second limiting member 14 is assembled, so that the mounting member 20 is limited in the second direction y.
As shown in fig. 7 and 8, the first limiting member 13 is a first limiting plate, the second limiting member 14 is a plurality of second limiting plates, the plurality of second limiting plates are sequentially arranged along the first direction, one of the two adjacent second limiting plates is provided with a protruding portion 14a, the other of the two adjacent second limiting plates is provided with a recessed portion 14b, the protruding portion 14a is accommodated in the recessed portion 14b, the first limiting plate is abutted to one end of the mounting member 20 along the second direction y, and the plurality of second limiting plates are respectively abutted to one end of the mounting member 20 along the second direction y away from the first limiting plates in a one-to-one correspondence manner, so as to limit the first limiting plates by the plurality of mounting members 20. Like this, utilize bellying 14a and depressed part 14b cooperation, two adjacent second limiting plates can dismantle each other, when changing probe 30, can dismantle the second limiting plate that this probe 30 corresponds, other second limiting plates need not to dismantle to mount 20 when relative supporting component 10 removes with supporting component 10 separation, probe 30 can leave interval 10a from the position of this second limiting plate, reduce the weight of the second limiting plate of dismantling, the change degree of difficulty of probe 30 is lower.
In some embodiments, as shown in fig. 5, the probe assembly 100 further includes a third limiting member 50 and a fourth limiting member 60, the third limiting member 50 is disposed at the first limiting member 13 and located at one end of the mounting member 20 along the second direction y, the third limiting member 50 is abutted to one surface of the mounting member 20 facing away from the support assembly 10 along the third direction z so as to limit the mounting member 20 along the third direction z, the fourth limiting member 60 is disposed at the second limiting member 14 and located at one end of the mounting member 20 facing away from the third limiting member 50 along the second direction y, and the fourth limiting member 60 is abutted to one surface of the mounting member 20 facing away from the support assembly 10 along the third direction z so as to limit the mounting member 20 along the third direction z. The third direction z is not parallel to the first direction x and the second direction y. In this way, the third limiting member 50 and the fourth limiting member 60 limit the mounting member 20 along the third direction z, so that the mounting member 20 is prevented from being separated from the support assembly 10 along the third direction z, and the assembly reliability of the mounting member 20 and the support assembly 10 is improved. When the mounting member 20 moves relative to the support assembly 10 until one end of the mounting member 20 abuts against the third limiting member 50 provided on the first limiting member 13, and the other end abuts against the fourth limiting member 60 provided on the second limiting member 14, the third limiting member 50 and the fourth limiting member 60 can fix the mounting member 20 to the support assembly 10, and when one or both of the third limiting member 50 and the fourth limiting member 60 are released from the fixing action on the mounting member 20, the mounting member 20 can move along the second direction y and be separated from the support assembly 10.
As shown in fig. 9, the third limiting member 50 has a first positioning surface 51 and a second positioning surface 52, the first positioning surface 51 abuts against a surface of the first limiting member 13 facing away from the second limiting member 14 along the second direction y, the second positioning surface 52 abuts against a surface of the mounting member 20 facing away from the supporting member 10 along the third direction z to limit the mounting member 20 along the third direction z, the fourth limiting member 60 has a third positioning surface abutting against a surface of the second limiting member 14 facing away from the first limiting member 13 along the second direction y, and a fourth positioning surface abutting against a surface of the mounting member 20 facing away from the supporting member 10 along the third direction z to limit the mounting member 20 along the third direction z. In this way, the third stopper 50 is provided on the first stopper 13 by the first positioning surface 51 abutting against the first stopper 13, the fourth stopper 60 is provided on the second stopper 14 by the third positioning surface abutting against the second stopper 14, and the second positioning surface 52 and the fourth positioning surface can abut against the mount 20 to limit the mount in the third direction z, thereby fixing the mount 20 and the support assembly 10.
Optionally, the third limiting member 50 further has a first chamfer 53 spaced from a side of the mounting member 20 facing away from the support assembly 10 to clear the mounting member 20, and the fourth limiting member 60 further has a second chamfer spaced from a side of the mounting member 20 facing away from the support assembly 10 to clear the mounting member 20. Thus, taking the first chamfer 53 as an example, the first chamfer 53 is utilized to avoid the mounting member 20, so that the mounting member 20 is difficult to mount and dismount due to interference between the mounting member 20 and the third limiting member 50 and the fourth limiting member 60 when the mounting member 20 can move along the second direction y, and the mounting member 20 is beneficial to entering the space formed by the second positioning surface 52 and the supporting portion 41a toward one end of the first limiting member 13 along the second direction y, and entering the space formed by the fourth positioning surface and the supporting portion 41a toward one end of the second limiting member 14 along the second direction y, so as to mount the mounting member 20.
The structure of the fourth limiting member 60 may refer to the structure of the third limiting member 50 shown in fig. 9, and specific structures such as the third positioning surface, the fourth positioning surface, and the second chamfer are not shown in the drawings and are labeled one by one.
In some embodiments, as shown in fig. 10, the probe 30 includes a mounting base 31, a probe body 32, and a conductive component 33, where the mounting base 31 is detachably connected to the mounting member 20, the probe body 32 is disposed on the mounting base 31, and the conductive component 33 is electrically connected to the probe body 32 and the conductive wire. In this way, the mounting seat 31 is detachably connected to the mounting member 20, and when the mounting member 20 is detached from the support assembly 10, the mounting seat 31 can be detached from the mounting member 20, so that the probe 30 can be replaced. The conductive component 33 can electrically connect the probe body 32 with the conductive wire, so that the battery can be subjected to formation operation when the probe body 32 is conducted with the battery.
Illustratively, the conductive assembly 33 includes a support 331, a conductive sheet 332, and a connector 333, wherein the support 331 is connected to the mounting base 31, the conductive sheet 332 is disposed on the support 331, the conductive sheet 332 is electrically connected to the conductive wire, and the connector 333 is electrically connected to the conductive sheet 332 and the probe body 32. Thus, by electrically connecting the conductive sheet 332 with the conductive wire, the conductive wire can be in contact with the conductive sheet 332 and be separated from each other, fixation can be achieved without adopting a welding manner, adverse effects caused by welding can be avoided, and maintainability of the probe 30 can be improved.
Alternatively, as shown in fig. 11 and 12, the probe assembly 100 further includes a plurality of holders 70 provided for each of the mounting members 20, the plurality of holders 70 being spaced apart in the second direction y, the plurality of holders 70 being for supporting the wires of the probes 30. In this way, the plurality of brackets 70 support the wires, and when the mounting piece 20 moves relative to the supporting component 10, the brackets 70 can drive the wires to move simultaneously, so that the situation that the wires are pulled loose or even broken and damaged due to the relative position change of the wires and the probes 30 arranged on the mounting piece 20 is avoided, and the maintainability of the probes 30 can be improved.
Illustratively, each bracket 70 includes a first connection portion 71, a support portion 72, and a second connection portion 73 connected in sequence, wherein an end of the first connection portion 71 facing away from the support portion 72 is connected to the mounting member 20, an end of the second connection portion 73 facing away from the support portion 72 is connected to the mounting member 20, and a side of the support portion 72 facing toward the mounting member 20 is used for supporting a wire of the probe 30. In this way, the first and second connection portions 71 and 73 are connected to the mount 20 such that a space is formed between the support portion 72 and the mount 20, providing a space for the wire, so that the wire can be supported toward one side of the mount 20 by the support portion 72.
The embodiment of the first aspect of the present utility model provides a probe assembly 100 in which a plurality of mounting members 20 are sequentially disposed in a first direction x and the plurality of mounting members 20 are detachably coupled to a support assembly 10 such that each mounting member 20 can be moved in a second direction y to be assembled with the support assembly 10 or separated from the support assembly 10, while a plurality of probes 30 are disposed using each mounting member 20 and the plurality of probes 30 are detachable with respect to the mounting member 20. Like this, when installed part 20 and supporting component 10 equipment, locate the probe 30 of installed part 20 can be used for switching on with the battery electricity, and probe 30 and wire connection can carry out the formation operation to the battery, and when changing probe 30, can be with the installed part 20 that probe 30 corresponds through follow second direction y removal mode dismantlement supporting component 10, with this probe 30 dismantlement installed part 20 again, need not to dismantle probe assembly 100 wholly, lighten the weight of dismantling the part, probe 30's change operation is comparatively simple and convenient, and the change degree of difficulty is lower.
Embodiments of the second aspect
Referring to fig. 13, a schematic and simplified structural diagram of a charge and discharge apparatus 200 according to a second embodiment of the present utility model is provided, where the charge and discharge apparatus 200 includes the probe assembly 100 according to the first embodiment.
An embodiment of the second aspect of the present utility model provides a charging and discharging apparatus 200, in which the operation is simpler and more convenient and the replacement difficulty is lower in the replacement process of the probe.
The above describes in detail a probe assembly and a charging and discharging device disclosed in the embodiments of the present utility model, and applies examples herein to describe the principles and embodiments of the present utility model, the description of the above examples is only for helping to understand the core ideas of the probe assembly and the charging and discharging device of the present utility model; meanwhile, as those skilled in the art will have variations in the specific embodiments and application scope in accordance with the ideas of the present utility model, the present description should not be construed as limiting the present utility model in view of the above.

Claims (14)

1. A probe assembly, comprising:
A support assembly; and
The mounting pieces are detachably connected to the supporting component, the mounting pieces are sequentially arranged along the first direction, each mounting piece can move relative to the supporting component along the second direction so as to be assembled with or separated from the supporting component, each mounting piece is detachably provided with a plurality of probes, and the probes are arranged at intervals along the second direction.
2. The probe assembly of claim 1, wherein the support assembly is provided with a plurality of rail structures, a plurality of the rail structures being spaced apart along the first direction, each rail structure being slidably provided with one of the mounting members along the second direction.
3. The probe assembly of claim 2, further comprising a plurality of slide grooves spaced apart along the first direction from the support assembly, the slide grooves being provided with the slide rail structures, the slide rail structures being disposed on two adjacent slide grooves and the two adjacent slide rail structures forming a slide rail.
4. A probe assembly according to claim 3, wherein each of the slide rail structures includes a support portion and a guide portion disposed on the slide rail member, the support portions being disposed on two adjacent slide rail members respectively and the support portions being disposed to support one of the mounting members, the guide portions being disposed on two adjacent slide rail members respectively and the guide portions being disposed to provide guidance for sliding movement of one of the mounting members relative to the slide rail structure in the second direction.
5. The probe assembly of claim 4, wherein the support portion is disposed on a first surface of the sliding chute member, and two adjacent first surfaces are respectively disposed on two adjacent sliding chute members and abut against a surface of the mounting member facing the support assembly to support one of the mounting members, and the guide portion is disposed on a second surface of the sliding chute member, and two adjacent second surfaces are respectively disposed on two adjacent sliding chute members and abut against two sides of the mounting member along the first direction, so as to provide guidance for sliding one of the mounting members along the second direction relative to the sliding rail structure.
6. A probe assembly according to claim 3, wherein the support assembly comprises a base plate and a plurality of support plates, the plurality of support plates are arranged on the base plate at intervals along the first direction, an interval space is formed between two adjacent support plates, each support plate is provided with the chute member, and each mounting member is correspondingly positioned above one interval space.
7. The probe assembly of any one of claims 1 to 6, further comprising a first limiting member and a second limiting member, wherein the first limiting member and the second limiting member are disposed on the support assembly at intervals along the second direction, and the first limiting member and the second limiting member are respectively abutted to two ends of the mounting member along the second direction so as to limit the mounting member.
8. The probe assembly of claim 7, wherein the first limiting member is a first limiting plate, the second limiting member is a plurality of second limiting plates, the second limiting plates are sequentially arranged along the first direction, one of two adjacent second limiting plates is provided with a protruding portion, the other of the two adjacent second limiting plates is provided with a recessed portion, the protruding portion is accommodated in the recessed portion, the first limiting plate is abutted to one end of the mounting member along the second direction, and each second limiting plate is abutted to one end of one mounting member along the second direction, which is away from the first limiting plate, so as to limit the plurality of mounting members.
9. The probe assembly of claim 7, further comprising a third limiting member and a fourth limiting member, wherein the third limiting member is disposed at one end of the first limiting member and located at one end of the mounting member in the second direction, the third limiting member abuts against one surface of the mounting member facing away from the support assembly in the third direction to limit the mounting member in the third direction, the fourth limiting member is disposed at one end of the second limiting member and located at one end of the mounting member facing away from the third limiting member in the second direction, and the fourth limiting member abuts against one surface of the mounting member facing away from the support assembly in the third direction to limit the mounting member in the third direction.
10. The probe assembly of claim 9, wherein the third stop member has a first positioning surface and a second positioning surface, the first positioning surface being in abutment with a surface of the first stop member facing away from the second stop member in the second direction, the second positioning surface being in abutment with a surface of the mounting member facing away from the support assembly in the third direction to stop the mounting member in the third direction, the fourth stop member having a third positioning surface and a fourth positioning surface, the third positioning surface being in abutment with a surface of the second stop member facing away from the first stop member in the second direction, the fourth positioning surface being in abutment with a surface of the mounting member facing away from the support assembly in the third direction to stop the mounting member in the third direction.
11. The probe assembly of claim 10, wherein the third stop member further has a first chamfer disposed in spaced relation to a side of the mounting member facing away from the support assembly to clear the mounting member, and the fourth stop member further has a second chamfer disposed in spaced relation to a side of the mounting member facing away from the support assembly in the third direction to clear the mounting member.
12. The probe assembly of any one of claims 1 to 6, further comprising a plurality of brackets, each of the mounting members being provided with a plurality of the brackets spaced apart along the second direction, the plurality of brackets being configured to support a wire of the probe.
13. The probe assembly of claim 12, wherein each of the brackets includes a first connection portion, a support portion, and a second connection portion connected in sequence, an end of the first connection portion facing away from the support portion being connected to the mounting member, an end of the second connection portion facing away from the support portion being connected to the mounting member, and a side of the support portion facing toward the mounting member being used for supporting a wire of the probe.
14. A charge and discharge apparatus comprising a probe assembly as claimed in any one of claims 1 to 13.
CN202322718558.0U 2023-10-10 2023-10-10 Probe assembly and charging and discharging equipment Active CN220914329U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202322718558.0U CN220914329U (en) 2023-10-10 2023-10-10 Probe assembly and charging and discharging equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202322718558.0U CN220914329U (en) 2023-10-10 2023-10-10 Probe assembly and charging and discharging equipment

Publications (1)

Publication Number Publication Date
CN220914329U true CN220914329U (en) 2024-05-07

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN202322718558.0U Active CN220914329U (en) 2023-10-10 2023-10-10 Probe assembly and charging and discharging equipment

Country Status (1)

Country Link
CN (1) CN220914329U (en)

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