CN220872635U - BMS product power aging multi-station detection device - Google Patents

BMS product power aging multi-station detection device Download PDF

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Publication number
CN220872635U
CN220872635U CN202322616230.8U CN202322616230U CN220872635U CN 220872635 U CN220872635 U CN 220872635U CN 202322616230 U CN202322616230 U CN 202322616230U CN 220872635 U CN220872635 U CN 220872635U
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bms
products
detection device
bms products
power supply
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CN202322616230.8U
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曾秋特
沈水军
熊海子
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Guangdong Beite Electronics Co ltd
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Guangdong Beite Electronics Co ltd
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    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E60/00Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
    • Y02E60/10Energy storage using batteries

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Abstract

The utility model provides a BMS product power supply aging multi-station detection device, which relates to the technical field of power supply aging detection and comprises the following components: detect platform, a plurality of BMS products, support frame, equipment box, detection subassembly and spacing subassembly, place a plurality of BMS products on detecting the bench, install in the support frame that detects bench top both sides, install in the equipment box of support frame bottom, set up in the inside detection subassembly of equipment box for detect the power of a plurality of BMS products, set up the spacing subassembly on detecting the bench. This kind of BMS product power ageing multistation detection device can provide the simulation electric core voltage and supply power for a plurality of BMS products that receive ageing tests through detecting the subassembly, and overall integration is high, and debugging simple process, reduction in production cost can realize the simultaneous ageing tests of the MOS pipe that discharges of a plurality of BMS products fast, and overall test efficiency is high to can press from both sides tight placing a plurality of BMS products through spacing subassembly, prevent that a plurality of BMS products from following the test bench landing, avoid influencing a plurality of BMS products normal detection.

Description

BMS product power aging multi-station detection device
Technical Field
The utility model relates to the technical field of power supply aging detection, in particular to a BMS product power supply aging multi-station detection device.
Background
When the aging test is carried out on the BMS product of the core part of the new energy automobile, the external effective stress of heat, electricity or various combinations is applied to the electronic components in a high-temperature environment, the severe working environment is simulated, potential faults in the electronic components are exposed in an accelerating way, then the electric parameter measurement is carried out, circuit boards with failures or parameters changed are screened and removed, and along with the continuous development of the new energy automobile, the quantity of BMS products monitoring batteries is increased, and the quality requirements on the products are increased.
Along with the large-scale industrialized production of BMS products, if abnormal occurs in the discharge MOS tube of the BMS products, the battery core is indirectly short-circuited through the BMS to generate large current output, and unpredictable results are caused, so that the aging of the safety performance of the discharge MOS tube of the BMS products is very important, a set of simulation battery system is provided for simulating the power supply of the battery core and a set of current source for carrying out aging test on the single body of the battery system, if a plurality of BMS products are tested, a corresponding equipment test system is required, the volume of production equipment and the difficulty of the production process are increased, the overall cost is high, the efficiency is low, the overall occupied area is large, and the production efficiency is influenced.
Disclosure of utility model
The technical problems to be solved by the utility model are as follows: the utility model provides a BMS product power aging multistation detection device can provide the simulation electric core voltage through detecting the subassembly and supply power for a plurality of BMS products that receive the aging test, and whole integrated level is high, and debugging simple process, reduction in production cost can realize the simultaneous aging test of the discharge MOS pipe of a plurality of BMS products fast, and whole test efficiency is high.
The technical problems to be solved by the utility model are realized by adopting the following technical scheme:
A BMS product power supply aging multi-station detection device comprises: detect platform, a plurality of BMS products, support frame, equipment box, detection subassembly and spacing subassembly, place in a plurality of BMS products on the detection platform, install in the support frame of detection platform top both sides, install in the equipment box of support frame bottom, set up in the inside detection subassembly of equipment box for detect a plurality of the power of BMS product, set up in spacing subassembly on the detection platform is used for a plurality of the BMS product is spacing fixed.
Further, the detection assembly includes: install in the host computer of equipment box outer end one side, equipment box inside one side is equipped with MCU controller, MCU controller bottom is equipped with programmable current source, set up in multichannel voltage acquisition block of programmable current source one side, multichannel voltage acquisition block top is equipped with the front end power supply, front end power supply one side be equipped with the diode, install in many wires of multichannel voltage acquisition block bottom, many wire bottom is equipped with connecting plug, can provide the simulation battery cell voltage through detecting the subassembly and give a plurality of BMS products power supply of waiting for ageing test, and whole integrated level is high, and debugging simple process, reduction in production cost can realize the simultaneous ageing test of the discharge MOS pipe of a plurality of BMS products fast, and whole efficiency of software testing is high.
Further, the spacing subassembly includes: install in polylith fixed plate on the detection platform, the polylith the fixed plate inboard is equipped with the grip block, the grip block with be equipped with the spring between the fixed plate, install in the pull rod of grip block one end, pull rod one end is installed and is drawn the piece, set up in the movable hole in fixed plate middle part, the pull rod runs through the movable hole with draw piece fixed connection can press from both sides a plurality of BMS products through spacing subassembly and tightly place, prevents that a plurality of BMS products from detecting bench landing, avoids influencing a plurality of BMS products normal detection.
Further, the MCU controller is a singlechip controller, and the MCU controller is connected with the upper computer, the programmable current source, the multipath voltage acquisition block and the front-end power supply.
Further, the front-end power supply is composed of a controllable voltage-stabilizing and current-stabilizing circuit and a resistor voltage-dividing plate, the controllable voltage-stabilizing and current-stabilizing circuit comprises a plurality of operational amplifiers, resistors, capacitors and MOS tube groups, the resistor voltage-dividing plate is composed of a plurality of high-precision low-temperature drift resistors, the front-end power supply is composed of the controllable voltage-stabilizing and current-stabilizing circuit and the low-temperature drift resistor voltage-dividing plate, analog cell voltage is provided for supplying power to a plurality of BMS products which are connected with the aging test, the overall integration level is high, the simultaneous aging test of the discharging MOS tubes of the plurality of BMS products can be realized rapidly, and the overall test efficiency is high.
Further, the diode is composed of a large current diode, the diode is connected with a plurality of BMS products in parallel, the diode is directly connected with a plurality of BMS products in parallel, and abnormal diode follow current continuous test is prevented from occurring in a plurality of BMS products.
Further, the grip block is kept away from one side of pull rod is equipped with a plurality of anti-skidding granule, and a plurality of anti-skidding granule adopts rubber materials to make, closely laminates with a plurality of BMS products through anti-skidding granule on the grip block, increases the stability of a plurality of BMS products.
The beneficial effects of the utility model are as follows:
Can provide the simulation electric core voltage and supply power for a plurality of BMS products that receive ageing tests through detecting the subassembly, whole integrated level is high, and debugging simple process, reduction in production cost can realize the simultaneous ageing tests of discharge MOS pipe of a plurality of BMS products fast, and whole test efficiency is high to can press from both sides tight placing a plurality of BMS products through spacing subassembly, prevent that a plurality of BMS products from following the landing of detecting bench, avoid influencing a plurality of BMS products and normally detect.
Drawings
Fig. 1 is a schematic diagram of the overall structure of the present utility model.
Fig. 2 is a schematic overall cross-sectional view of the present utility model.
Fig. 3 is a schematic cross-sectional view of the equipment cabinet of the present utility model.
Fig. 4 is a schematic structural view of the inspection bench according to the present utility model.
Fig. 5 is an enlarged schematic view of fig. 2a in accordance with the present utility model.
Fig. 6 is a circuit schematic of the present utility model.
Fig. 7 is a circuit flow diagram of the present utility model.
In fig. 1-7: 1. a detection table; 101. BMS products; 2. a support frame; 3. an equipment box; 301. an upper computer; 302. an MCU controller; 303. a programmable current source; 304. a multi-path voltage acquisition block; 305. a front end power supply; 306. a diode; 307. a wire; 308. a connection plug; 4. a fixing plate; 401. a clamping plate; 402. a spring; 403. a pull rod; 404. pulling blocks; 405. a movable hole; 406. anti-slip particles.
Detailed Description
The technical solutions of the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present application, and it is apparent that the described embodiments are only some embodiments of the present application, but not all embodiments, and all other embodiments obtained by those skilled in the art without making creative efforts based on the embodiments of the present application are included in the protection scope of the present application.
The embodiment of the application provides a BMS product power supply aging multi-station detection device, which can supply power to a plurality of BMS products which are subjected to aging test by simulating cell voltage through a detection assembly, has high overall integration level, simple debugging process and low production cost, can rapidly realize simultaneous aging test of discharge MOS tubes of a plurality of BMS products, has high overall test efficiency, can clamp and place a plurality of BMS products through a limiting assembly, prevents the plurality of BMS products from sliding off a detection table, and avoids influencing normal detection of the plurality of BMS products.
The application is described in detail below with reference to the drawings and the detailed description.
Examples
As shown in fig. 1-2, a multi-station detection device for power supply aging of BMS products includes: detect platform 1, a plurality of BMS products 101, support frame 2, equipment box 3, detection subassembly and spacing subassembly, place a plurality of BMS products 101 on detecting platform 1, install in support frame 2 of detecting platform 1 top both sides, install in equipment box 3 of support frame 2 bottom, set up in the inside detection subassembly of equipment box 3 for detect the power of a plurality of BMS products 101, set up the spacing subassembly on detecting platform 1, be used for spacing fixedly to a plurality of BMS products 101.
In some embodiments, referring to fig. 1, 2, 3, 6, and 7, the detection assembly comprises: the upper computer 301 is arranged on one side of the outer end of the equipment box 3, the MCU controller 302 is arranged on one side of the inner portion of the equipment box 3, the programmable current source 303 is arranged at the bottom of the MCU controller 302, the multipath voltage acquisition block 304 is arranged on one side of the programmable current source 303, the front end power supply 305 is arranged at the top of the multipath voltage acquisition block 304, the diode 306 is arranged on one side of the front end power supply 305, the wires 307 are arranged at the bottom of the multipath voltage acquisition block 304, the connecting plugs 308 are arranged at the bottoms of the wires 307, the MCU controller 302 is a single-chip microcomputer controller, and the MCU controller 302 is connected with the upper computer 301, the programmable current source 303, the multipath voltage acquisition block 304 and the front end power supply 305.
When detecting a plurality of BMS products 101, the BMS products 101 are placed on the detection table 1, connection plugs 308 on wires 307 are inserted into sockets at the BMS products 101 to be connected, the upper computer 301 is also known as U I interface software, and is matched with the MCU controller 302 for use under relevant test requirements filled by clients, wherein the MCU controller 302 is a singlechip controller, the MCU controller 302 is connected with the upper computer 301, the programmable current source 303, the multi-path voltage acquisition block 304 and the front-end power supply 305, the MCU controller 302 controls the front-end power supply 305 and the programmable current source 303 to output corresponding voltage and current values, the acquisition values of the multi-path voltage acquisition block 304 are received, corresponding judgment is made and returned to the upper computer 301, the upper computer 301 feeds back the current running condition of the clients in the form of U I interface, and the MCU controller 302 can provide simulated battery cell voltage to a plurality of BMS products 101 to be subjected to ageing test for power supply.
Referring to fig. 7, the front-end power supply 305 is composed of a controllable voltage-stabilizing and current-stabilizing circuit and a resistor voltage-dividing plate, the controllable voltage-stabilizing and current-stabilizing circuit is composed of a plurality of operational amplifiers, resistors, capacitors and MOS tube groups, the resistor voltage-dividing plate is composed of a plurality of high-precision low-temperature drift resistors, the front-end power supply 305 outputs corresponding multi-string voltages to simulate analog cell voltages required by parallel connection of a plurality of BMS products 101 at the rear end, negative ends of the BMS products 101 are correspondingly connected in series, so that discharge MOS tubes of the BMS products 101 are connected in series, the front-end power supply 305 is composed of the controllable voltage-stabilizing and current-stabilizing circuit and the low-temperature drift resistor voltage-dividing plate, the analog cell voltages are provided for supplying power to the BMS products 101 which are connected with the aging test, the whole integration level is high, and the simultaneous aging test of the discharge MOS tubes of the BMS products 101 can be realized rapidly, and the whole test efficiency is high.
Referring to fig. 3, fig. 6 and fig. 7, the diode 306 is composed of a large current diode, the diode 306 is connected with the plurality of BMS products 101 in parallel, the plurality of BMS products 101 are all connected with a diode 306 and a pair of collecting points of the multi-path voltage collecting block 304 in parallel, the diode 306 plays a role in that the discharging MOS of the plurality of BMS products 101 to be tested is abnormal, the multi-path voltage collecting block 304 can continuously age continuously, the voltage change of the discharging MOS of each of the plurality of BMS products 101 is monitored in real time, the positive end of the programmable current source 303 is connected with the negative end P-point of the last of the plurality of BMS products 101, the negative end is connected with the negative end B-point of the first of the plurality of BMS products 101, the discharging direction of the plurality of BMS products 101 is simulated, the diode 306 is directly connected with the plurality of BMS products 101 in parallel, the other plurality of BMS products 101 are prevented from being abnormal, and the continuous current test can be performed through the diode 306.
In some embodiments, referring to fig. 1, 2, 4 and 5, the spacing assembly comprises: install polylith fixed plate 4 on detecting platform 1, polylith fixed plate 4 inboard is equipped with grip block 401, be equipped with spring 402 between grip block 401 and the fixed plate 4, install in the pull rod 403 of grip block 401 one end, pull block 404 is installed to pull rod 403 one end, set up in the movable hole 405 at fixed plate 4 middle part, pull rod 403 runs through movable hole 405 and pull block 404 fixed connection, when detecting a plurality of BMS products 101, put a plurality of BMS products 101 on detecting platform 1, grasp pull block 404 outwards pulling pull rod 403, make pull rod 403 pull grip block 401 compress tightly spring 402 from movable hole 405, make the pull distance between grip block 401, put a plurality of BMS products 101 into between the grip block 401, at this moment, loosen pull block 404, spring 402 resumes deformation, let grip block 401 press from both sides to a plurality of BMS products 101 and press from both sides and place, prevent that a plurality of BMS products 101 from detecting platform 1 from the landing, avoid influencing a plurality of BMS products 101 normal detection.
Wherein, referring to fig. 4, the grip block 401 is kept away from one side of pull rod 403 and is equipped with a plurality of anti-skidding granule 406, and a plurality of anti-skidding granule 406 adopts rubber materials to make, and grip block 401 is when pressing from both sides tightly a plurality of BMS products 101, closely laminates with a plurality of BMS products 101 through anti-skidding granule 406 on the grip block 401, increases the stability of a plurality of BMS products 101.
This device can provide the simulation electric core voltage through detecting the subassembly and give a plurality of BMS products 101 power supply that receive ageing tests, and overall integration is high, and debugging simple process, reduction in production cost can realize the simultaneous ageing tests of discharge MOS pipe of a plurality of BMS products 101 fast, and overall test efficiency is high to can press from both sides tightly placing a plurality of BMS products 101 through spacing subassembly, prevent that a plurality of BMS products 101 from detecting bench 1 landing, avoid influencing a plurality of BMS products 101 normal detection. The specific embodiment is as follows: when detecting a plurality of BMS products 101, the BMS products 101 are placed on the detection table 1, connecting plugs 308 on wires 307 are inserted into sockets at the BMS products 101 to be connected, the upper computer 301 is also called UI interface software, and is matched with the MCU controller 302 for use under relevant test requirements filled by clients, wherein the MCU controller 302 is a singlechip controller, the MCU controller 302 is connected with the upper computer 301, the programmable current source 303, the multi-path voltage acquisition block 304 and the front-end power source 305, the MCU controller 302 controls the front-end power source 305 and the programmable current source 303 to output corresponding voltage and current values, the acquisition values of the multi-path voltage acquisition block 304 are received, corresponding judgment is made and returned to the upper computer 301, the upper computer 301 feeds back the current running condition of the clients in the form of UI interface, and can provide simulated cell voltage to a plurality of BMS products 101 to be subjected to ageing test, the whole integration level is high, the debugging process is simple, and production cost is reduced.
When detecting a plurality of BMS products 101, put a plurality of BMS products 101 on detecting platform 1, grasp pull block 404 outwards pulling pull rod 403, make pull rod 403 draw grip block 401 to compress tightly spring 402 from movable hole 405 for pull distance between grip block 401, put a plurality of BMS products 101 between grip block 401, at this moment, loosen pull block 404, spring 402 resumes deformation, let grip block 401 press from both sides tightly a plurality of BMS products 101 and place, prevent a plurality of BMS products 101 from detecting platform 1 landing, avoid influencing a plurality of BMS products 101 normal detection.
In the foregoing embodiments, the descriptions of the embodiments are emphasized, and for parts of one embodiment that are not described in detail, reference may be made to related descriptions of other embodiments.
The foregoing details of the device for detecting power aging of a BMS product in multiple stations according to the embodiments of the present application are described in detail, and specific examples are applied to illustrate the principles and embodiments of the present application, and the description of the foregoing examples is only for helping to understand the technical scheme and core idea of the present application, and those skilled in the art should understand: the technical solutions described in the foregoing embodiments may be modified or some technical features may be replaced with other technical solutions, where the modifications or replacements do not make the essence of the corresponding technical solutions deviate from the scope of the technical solutions of the embodiments of the present application.

Claims (7)

1. BMS product power aging multistation detection device, its characterized in that includes: the BMS detection device comprises a detection table (1), a plurality of BMS products (101), a support frame (2), an equipment box (3), a detection assembly and a limiting assembly;
A plurality of BMS products (101) placed on the inspection table (1);
the support frames (2) are arranged on two sides of the top of the detection table (1);
The equipment box (3) is arranged at the bottom of the supporting frame (2);
The detection component is arranged inside the equipment box (3) and is used for detecting the power supply of a plurality of BMS products (101);
The limiting assembly is arranged on the detection table (1) and used for limiting and fixing a plurality of BMS products (101).
2. The BMS product power aging multi-station detection device according to claim 1, wherein the detection assembly comprises:
The upper computer (301) is arranged at one side of the outer end of the equipment box (3), one side of the inner part of the equipment box (3) is provided with the MCU controller (302), and the bottom of the MCU controller (302) is provided with the programmable current source (303);
The multi-channel voltage acquisition block (304) is arranged at one side of the programmable current source (303), a front-end power supply (305) is arranged at the top of the multi-channel voltage acquisition block (304), and a diode (306) is arranged at one side of the front-end power supply (305);
And a plurality of wires (307) arranged at the bottom of the multipath voltage acquisition block (304), wherein connecting plugs (308) are arranged at the bottoms of the wires (307).
3. The BMS product power aging multi-station detection device according to claim 1, wherein the limit assembly comprises:
A plurality of fixing plates (4) arranged on the detection table (1), clamping plates (401) are arranged on the inner sides of the fixing plates (4), and springs (402) are arranged between the clamping plates (401) and the fixing plates (4);
A pull rod (403) arranged at one end of the clamping plate (401), wherein a pull block (404) is arranged at one end of the pull rod (403);
The pull rod (403) penetrates through the movable hole (405) and is fixedly connected with the pull block (404).
4. The multi-station detection device for power supply aging of the BMS product according to claim 2, wherein the MCU controller (302) is a single-chip microcomputer controller, and the MCU controller (302) is connected with the upper computer (301), the programmable current source (303), the multi-path voltage acquisition block (304) and the front-end power supply (305).
5. The multi-station detection device for power supply aging of the BMS product according to claim 2, wherein the front-end power supply (305) is composed of a controllable voltage-stabilizing and current-stabilizing circuit and a resistance voltage-dividing plate, and the controllable voltage-stabilizing and current-stabilizing circuit is composed of a plurality of operational amplifiers, resistors, capacitors and MOS tube groups, and the resistance voltage-dividing plate is composed of a plurality of high-precision low-temperature drift resistors.
6. The BMS product power aging multi-station detection device according to any one of claims 1 or 2, wherein said diode (306) is composed of a high current diode, said diode (306) being connected in parallel with a number of said BMS products (101).
7. The multi-station detection device for power aging of the BMS product according to claim 3, wherein a plurality of anti-slip particles (406) are arranged on one side of the clamping plate (401) away from the pull rod (403), and the anti-slip particles (406) are made of rubber materials.
CN202322616230.8U 2023-09-26 2023-09-26 BMS product power aging multi-station detection device Active CN220872635U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202322616230.8U CN220872635U (en) 2023-09-26 2023-09-26 BMS product power aging multi-station detection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202322616230.8U CN220872635U (en) 2023-09-26 2023-09-26 BMS product power aging multi-station detection device

Publications (1)

Publication Number Publication Date
CN220872635U true CN220872635U (en) 2024-04-30

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN202322616230.8U Active CN220872635U (en) 2023-09-26 2023-09-26 BMS product power aging multi-station detection device

Country Status (1)

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CN (1) CN220872635U (en)

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