CN220820163U - Multi-station test board for chip test - Google Patents
Multi-station test board for chip test Download PDFInfo
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- CN220820163U CN220820163U CN202322180590.8U CN202322180590U CN220820163U CN 220820163 U CN220820163 U CN 220820163U CN 202322180590 U CN202322180590 U CN 202322180590U CN 220820163 U CN220820163 U CN 220820163U
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- 238000012360 testing method Methods 0.000 title claims abstract description 166
- 230000001681 protective effect Effects 0.000 claims abstract description 9
- 238000007599 discharging Methods 0.000 claims 2
- 238000009434 installation Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 210000001503 joint Anatomy 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000004377 microelectronic Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 230000007306 turnover Effects 0.000 description 1
- 235000012431 wafers Nutrition 0.000 description 1
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Abstract
The application relates to the field of chip testing, and discloses a multi-station test board for chip testing. According to the chip testing device, the upper end of the chip testing device main body is fixedly connected with the fixed connecting plate, the upper surface of the fixed connecting plate is fixedly connected with the mounting pad, the rotating motor is arranged above the mounting pad, the output end of the rotating motor is connected with the rotating shaft, the other end of the rotating shaft is connected with the rotating wheel, the rotating wheel is arranged in the rotating disc, the lower end of the rotating disc is provided with four different testing heads, each testing head comprises a connecting column, a protective sleeve and a testing joint, when different chips are tested, the rotating motor is started, the corresponding testing heads are rotated to the proper positions according to the different testing plates, the rotating motor drives the rotating shaft and the rotating wheel to rotate, at the moment, the rotating disc also rotates, and the testing joints connected below the connecting columns can butt the different testing plates, so that the efficiency of chip testing can be improved.
Description
Technical Field
The application belongs to the technical field of chip testing equipment, and particularly relates to a multi-station testing board for chip testing.
Background
An integrated circuit is a type of microelectronic device or component. The components such as transistors, resistors, capacitors, inductors and the like required in a circuit and wiring are interconnected by adopting a certain process, are manufactured on a small or a few small semiconductor wafers or dielectric substrates, and are then packaged in a tube shell to form the microstructure with the required circuit function. The majority of applications in the semiconductor industry today are silicon-based integrated circuits. The integrated circuit chip comprises a silicon substrate, a circuit, a fixed seal ring and an electronic element with at least one group of protection rings mixed with a grounding ring. After the integrated circuit chip is processed, relevant test processing is needed to judge whether the tested integrated circuit chip is good or not.
The utility model discloses a multi-station test board for chip testing, which comprises a base, wherein a groove is formed in the upper side of the base, a test seat is rotatably arranged in the groove through a rotating shaft, a sliding groove and a screw are arranged on the upper side of the test seat, a test board is slidably arranged on the screw through sliding block threads, a test connecting hole is formed in the middle of the test board, a plurality of groups of sliding groove, screw and test board are arranged, a stand is arranged in the middle of the upper side of the base, a test pen is arranged at the top of the stand through a cylinder, a motor is connected with the lower end of the rotating shaft through a gear set in a transmission manner, the test board is slidably arranged in the sliding groove of the test seat through the sliding block and the screw, the sliding groove, the screw and the test board are provided with a plurality of groups, and the lower end of the rotating shaft of the test seat is connected with the motor through the gear set in a transmission manner, so that the test seat can be driven to horizontally rotate through the motor and the gear set, different test boards can be switched for test use, the test is alternately arranged, and the test pen is tested, and the efficiency of chip testing is greatly improved.
However, in this application, a plurality of different test boards are used, the chip test head is single, and the test head is compatible with the chip, and the test head needs to be selected appropriately according to parameters such as the packaging form, the pin number, the spacing and the like of the chip.
Disclosure of utility model
The application aims at: in order to solve the above-mentioned suitable test head, a multi-station test board for chip test is provided.
The technical scheme adopted by the application is as follows: the utility model provides a multistation test board for chip test, includes chip test equipment main part, the upper end fixedly connected with fixed connection board of chip test equipment main part, fixed connection board's upper surface fixedly connected with installation pad, the top of installation pad is provided with the rotating electrical machines, the output of rotating electrical machines is connected with the axis of rotation, the other end of axis of rotation is connected with the rotation wheel, and rotates the inside of wheel at the carousel, the lower extreme of carousel is provided with four different test heads, the test head is including spliced pole, protective sheath and test joint.
Through adopting above-mentioned technical scheme, when the chip of difference tests, can start rotating electrical machines, rotate the suitable position with the test head that corresponds according to the test board of difference, the rotating electrical machines can drive axis of rotation and rotor wheel and rotate, and the carousel also can follow the rotation this moment, is connected with the spliced pole surface that the carousel is connected with the protective sheath, can protect equipment to a certain extent, and the test joint that the spliced pole below is connected can dock different test boards, can improve the efficiency of chip test like this.
In a preferred embodiment, the two ends of the main body of the chip testing device are provided with a feed inlet and a discharge outlet, and a workbench is arranged between the feed inlet and the discharge outlet.
Through adopting above-mentioned technical scheme, the business turn over of chip is placed in the setting of feed inlet and discharge gate of being convenient for, raises the efficiency, and the setting of workstation provides test space for equipment.
In a preferred embodiment, the upper surface of the workbench is provided with a test placement plate, and the surface of the test placement plate is provided with four test plates.
Through adopting above-mentioned technical scheme, the setting of board can rotate is placed in the test, and a plurality of test boards can use in turn, improves test equipment's life-span and work efficiency.
In a preferred embodiment, the bottom end of the main body of the chip testing apparatus is fixedly connected with a supporting seat.
Through adopting above-mentioned technical scheme, the supporting seat provides holding power for whole equipment, makes the more stable work of chip test equipment main part.
In a preferred embodiment, a PLC control cabinet is provided on one side of the outer surface of the chip testing apparatus body.
Through adopting above-mentioned technical scheme, be convenient for control chip test equipment main part for work is more convenient.
In a preferred embodiment, a motor is arranged at the bottom end of the chip testing device main body, a rotating gear is connected to the output end of the motor, a rotating shaft is connected to the rotating gear, and a test placing plate is connected to the rotating shaft.
Through adopting above-mentioned technical scheme, the setting of motor provides power for the rotation that the board was placed in the test, and rotation gear and pivot are connected it, provide the guide effect for the rotation.
In a preferred embodiment, the inner side of the test board is provided with a test connecting hole, a groove is arranged below the test connecting hole, a screw is connected to the inside of the groove, and a screw knob is fixedly connected to the outer end of the screw.
Through adopting above-mentioned technical scheme, can test different chips through rotatory screw rod knob adjustment distance.
In summary, due to the adoption of the technical scheme, the beneficial effects of the application are as follows:
In the application, when different chips are tested, the rotating motor is started, the corresponding test heads are rotated to proper positions according to different test boards, the rotating motor drives the rotating shaft and the rotating wheel to rotate, the rotating disc also rotates at the moment, the outer surface of the connecting column connected with the rotating disc is connected with the protective sleeve, the equipment can be protected to a certain extent, and the test connector connected under the connecting column can be abutted against different test boards, so that the efficiency of chip test can be improved.
Drawings
FIG. 1 is a schematic diagram of the main structure of a test apparatus according to the present application;
FIG. 2 is a schematic cross-sectional view of a test apparatus according to the present application;
FIG. 3 is a schematic diagram of a test head according to the present application;
FIG. 4 is a schematic diagram of a test board structure according to the present application.
The marks in the figure: 1. a chip testing apparatus main body; 2. a work table; 3. fixing the connecting plate; 4. a support base; 5. a mounting pad; 6. testing the placing plate; 7. a feed inlet; 8. a discharge port; 9. a rotating electric machine; 10. a PLC control cabinet; 11. a turntable; 12. a test head; 13. a connecting column; 14. a protective sleeve; 15. testing the joint; 16. a rotating shaft; 17. a rotating wheel; 18. a motor; 19. rotating the gear; 20. a rotating shaft; 21. testing the joint hole; 22. a screw knob; 23. a groove; 24. a screw; 25. and (5) testing the board.
Detailed Description
For the purpose of making the objects, technical solutions and advantages of the embodiments of the present application more apparent, the technical solutions in the embodiments of the present application will be clearly and completely described in the following in conjunction with the embodiments of the present application, and it is apparent that the described embodiments are some embodiments of the present application, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the application without making any inventive effort, are intended to be within the scope of the application.
Examples:
Referring to fig. 1-3, a multi-station test board for chip test, including chip test equipment main part 1, chip test equipment main part 1's upper end fixedly connected with fixed connection board 3, fixed connection board 3's upper surface fixedly connected with installation pad 5, installation pad 5's top is provided with rotating electrical machines 9, rotating electrical machines 9's output is connected with axis of rotation 16, axis of rotation 16's the other end is connected with rotation wheel 17, and rotation wheel 17 is in carousel 11's inside, carousel 11's lower extreme is provided with four different test heads 12, test head 12 is including spliced pole 13, protective sheath 14 and test joint 15, when different chips carry out the test, can start rotating electrical machines 9, will correspond test head 12 according to different test boards and rotate suitable position, rotating electrical machines 9 can drive axis of rotation 16 and rotation wheel 17 and rotate, carousel 11 also can follow the rotation this moment, the spliced pole 13 surface that is connected with carousel 11 is connected with protective sheath 14, can protect equipment to a certain extent, test joint 15 that the spliced below spliced pole 13 can dock different test boards, can improve chip test efficiency like this.
Referring to fig. 1, both ends of a chip testing apparatus main body 1 are provided with a feed inlet 7 and a discharge outlet 8, a workbench 2 is provided in the middle of the feed inlet 7 and the discharge outlet 8, the feed inlet 7 and the discharge outlet 8 are arranged to facilitate the in-out placement of chips, the efficiency is improved, and the workbench 2 is arranged to provide a testing space for the apparatus.
Referring to fig. 4, the upper surface of the working table 2 is provided with a test placement plate 6, the surface of the test placement plate 6 is provided with four test plates 25, the test placement plate 6 can be rotated, and a plurality of test plates 25 can be used alternately, so that the service life and the working efficiency of the test equipment are improved.
Referring to fig. 1, a supporting seat 4 is fixedly connected to the bottom end of a main body 1 of the chip testing apparatus, and the supporting seat 4 provides supporting force for the whole apparatus, so that the main body 1 of the chip testing apparatus works more stably.
Referring to fig. 1, a PLC control cabinet 10 is provided at one side of an outer surface of a chip testing apparatus main body 1, so that the chip testing apparatus main body 1 is conveniently controlled, and the work is more convenient.
Referring to fig. 2, a motor 18 is provided at the bottom end of the chip testing apparatus main body 1, a rotation gear 19 is connected to the output end of the motor 18, a rotation shaft 20 is connected to the rotation gear 19, and the rotation shaft 20 is connected to the test placement plate 6, the motor 18 is configured to power the rotation of the test placement plate 6, and the rotation gear 19 and the rotation shaft 20 are connected to provide a guiding function for the rotation.
Referring to fig. 4, a test connection hole 21 is provided at the inner side of a test board 25, a groove 23 is provided at the lower side of the test connection hole 21, a screw 24 is connected to the inside of the groove 23, a screw knob 22 is fixedly connected to the outer end of the screw 24, and different chips can be tested by rotating the screw knob 22 to adjust the distance.
The implementation principle of the embodiment of the multi-station test board for chip test is as follows:
When different chips are tested, the rotating motor 9 can be started, the corresponding test head 12 is rotated to a proper position according to different test boards, the rotating motor 9 can drive the rotating shaft 16 and the rotating wheel 17 to rotate, the rotating disc 11 can also rotate at the moment, the outer surface of the connecting column 13 connected with the rotating disc 11 is connected with the protective sleeve 14, equipment can be protected to a certain extent, the test connector 15 connected below the connecting column 13 can be connected with different test boards in a butt joint mode, and therefore the efficiency of chip test can be improved.
The above embodiments are only for illustrating the technical solution of the present application, and are not limiting; although the application has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical scheme described in the foregoing embodiments can be modified or some technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit and scope of the technical solutions of the embodiments of the present application.
Claims (7)
1. The utility model provides a multistation test board for chip test, includes chip test equipment main part (1), its characterized in that: the chip test equipment comprises a chip test equipment main body (1), wherein a fixed connection plate (3) is fixedly connected to the upper end of the chip test equipment main body (1), a mounting pad (5) is fixedly connected to the upper surface of the fixed connection plate (3), a rotating motor (9) is arranged above the mounting pad (5), the output end of the rotating motor (9) is connected with a rotating shaft (16), the other end of the rotating shaft (16) is connected with a rotating wheel (17), the rotating wheel (17) is arranged inside a rotating disc (11), four different test heads (12) are arranged at the lower end of the rotating disc (11), and the test heads (12) comprise connecting columns (13), protective sleeves (14) and test joints (15).
2. The multi-station test board for chip testing as defined in claim 1, wherein: the chip testing device is characterized in that two ends of the chip testing device main body (1) are provided with a feeding hole (7) and a discharging hole (8), and a workbench (2) is arranged between the feeding hole (7) and the discharging hole (8).
3. A multi-station test board for chip testing as defined in claim 2, wherein: the upper surface of workstation (2) is provided with test and places board (6), the surface of test and place board (6) is provided with four test boards (25).
4. The multi-station test board for chip testing as defined in claim 1, wherein: the bottom end of the chip testing equipment main body (1) is fixedly connected with a supporting seat (4).
5. The multi-station test board for chip testing as defined in claim 1, wherein: a PLC control cabinet (10) is arranged on one side of the outer surface of the chip testing equipment main body (1).
6. The multi-station test board for chip testing as defined in claim 1, wherein: the chip test equipment is characterized in that a motor (18) is arranged at the bottom end of the chip test equipment body (1), a rotating gear (19) is connected to the output end of the motor (18), a rotating shaft (20) is connected to the rotating gear (19), and a test placing plate (6) is connected to the rotating shaft (20).
7. A multi-station test board for chip testing as defined in claim 3, wherein: the inside of test board (25) is provided with test connecting hole (21), the below of test connecting hole (21) is provided with recess (23), and the internal connection of recess (23) has screw rod (24), the outer end fixedly connected with screw rod knob (22) of screw rod (24).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202322180590.8U CN220820163U (en) | 2023-08-15 | 2023-08-15 | Multi-station test board for chip test |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202322180590.8U CN220820163U (en) | 2023-08-15 | 2023-08-15 | Multi-station test board for chip test |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN220820163U true CN220820163U (en) | 2024-04-19 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202322180590.8U Active CN220820163U (en) | 2023-08-15 | 2023-08-15 | Multi-station test board for chip test |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN220820163U (en) |
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2023
- 2023-08-15 CN CN202322180590.8U patent/CN220820163U/en active Active
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