CN220820128U

CN220820128U - Test equipment and test system

Info

Publication number: CN220820128U
Application number: CN202322284589.XU
Authority: CN
Inventors: 董彬斌; 陈诚
Original assignee: iFlytek Co Ltd
Current assignee: iFlytek Co Ltd
Priority date: 2023-08-24
Filing date: 2023-08-24
Publication date: 2024-04-19
Anticipated expiration: 2033-08-24

Abstract

The application provides test equipment and a test system. The communication circuit is used for acquiring a first input signal, the communication circuit is connected with the input end of the main control circuit, and the input end of the main control circuit is used for receiving a second input signal output by the communication circuit. The output end of the main control circuit is connected with the input end of the test information output circuit, the input end of the test information output circuit is used for receiving the control signal output by the main control circuit, the output end of the test information output circuit is connected with the tested functional module, and the output end of the test information output circuit is used for outputting test information to the tested functional module. Based on the above, the application converts the first input signal into the test information and outputs the test information to the tested functional module, so that the test of the functional module is realized by using the test information, the program perfection of the waiting main control board is not needed, and the test efficiency is high.

Description

Test equipment and test system

Technical Field

The present application relates to the field of testing functional modules, and in particular, to a testing device and a testing system.

Background

In the research and development process of the electronic equipment, certain functional modules in the electronic equipment are required to be tested so as to ensure that the functional modules can be used normally and improve the stability and reliability of the electronic equipment. At present, when testing a functional module, a main control board of electronic equipment needs to be matched, and the main control board provides information required by testing. Therefore, the test of the functional module at present can be performed after the program of the main control board is perfected, and the test efficiency of the functional module is affected.

Disclosure of Invention

In view of the foregoing, the present application provides a testing device and a testing system, which can improve the testing efficiency of functional modules in an electronic device.

The technical scheme provided by the application is as follows:

in a first aspect, embodiments of the present application provide a test apparatus comprising: the device comprises a communication circuit, a main control circuit and a test information output circuit;

The communication circuit is used for acquiring a first input signal, the communication circuit is connected with the input end of the main control circuit, and the input end of the main control circuit is used for receiving a second input signal output by the communication circuit;

The output end of the main control circuit is connected with the input end of the test information output circuit, and the input end of the test information output circuit is used for receiving the control signal output by the main control circuit;

the output end of the test information output circuit is connected with the tested functional module, and the output end of the test information output circuit is used for outputting test information to the tested functional module.

Further, in the test apparatus described above, the test information output circuit includes a timing control circuit;

the test information comprises a time sequence signal output by the time sequence control circuit;

the output end of the main control circuit is connected with the input end of the time sequence control circuit, and the output end of the time sequence control circuit is connected with the control end of the tested function module.

Further, in the test apparatus described above, the test information output circuit includes a power supply circuit;

the test information comprises a power supply source output by the power supply circuit;

The output end of the main control circuit is connected with the input end of the power supply circuit, and the output end of the power supply circuit is connected with the power end of the tested functional module.

Further, in the test apparatus described above, the power supply circuit includes a power converter;

The power supply end of the power converter is connected with the power supply equipment, the control end of the power converter is used as the input end of the power supply circuit, and the output end of the power converter is used as the output end of the power supply circuit.

Further, in the test apparatus described above, the power converter includes a first dc-dc converter;

The power end of the first direct current-direct current converter is connected with the power equipment, the control end of the first direct current-direct current converter is connected with the output end of the main control circuit, and the output end of the first direct current-direct current converter is connected with the power end of the tested functional module.

Further, in the test apparatus described above, the power converter includes a second dc-dc converter and a low dropout linear regulator;

The power end of the second direct current-direct current converter is connected with the power equipment, the output end of the second direct current-direct current converter is connected with the power end of the low dropout linear voltage regulator, the control end of the low dropout linear voltage regulator is connected with the output end of the main control circuit, and the output end of the low dropout linear voltage regulator is connected with the power end of the tested functional module.

Further, in the above test apparatus, a power end of the main control circuit is connected to an output end of the second dc-dc converter.

Further, in the test apparatus described above, the communication circuit includes a man-machine interaction circuit.

Further, in the test apparatus described above, the man-machine interaction circuit includes a touch screen.

In a second aspect, embodiments of the present application provide a test system comprising a power supply device and a test device as described in any one of the above; the power supply device is connected with the test device.

Drawings

In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the following description will briefly explain the drawings used in the embodiments or the description of the prior art, and it is obvious that the drawings in the following description are only embodiments of the present application, and other drawings can be obtained according to the provided drawings without inventive effort for a person skilled in the art.

Fig. 1 is a schematic structural diagram of a test apparatus according to an embodiment of the present application.

Fig. 2 is a schematic structural diagram of another test apparatus according to an embodiment of the present application.

Fig. 3 is a schematic structural diagram of another test apparatus according to an embodiment of the present application.

Fig. 4 is a schematic structural diagram of another test apparatus according to an embodiment of the present application.

Fig. 5 is a schematic structural diagram of another test apparatus according to an embodiment of the present application.

Fig. 6 is a schematic diagram of a display interface of a touch screen according to an embodiment of the present application.

Fig. 7 is a schematic structural diagram of a test system according to an embodiment of the present application.

Detailed Description

The technical scheme of the embodiment of the application is suitable for an application scene for testing the functional module, and the functional module can be tested without waiting for the program perfection of the main control board, so that the test efficiency is high.

The electronic device is composed of electronic components such as an integrated circuit, a transistor, and a valve, and realizes various functions by using electronic software. The range of electronic devices is very broad, including but not limited to communication devices, computers, household appliances, medical devices, and the like. For example, the electronic device may be a mobile phone, a television, a tablet computer, a smart watch, a bracelet, a computer device, etc., which is not limited in this embodiment.

The above-mentioned functional modules refer to modules in the electronic device that can realize specific functions. The device comprises a communication module, a sensor module, a display module, a data storage module and the like. The communication module can realize functions of communication, data interaction and the like and comprises a Wi-Fi module, a Bluetooth module, a cellular network module, a ZigBee module and the like; the sensor module can realize the functions of acquiring physical parameters or state information of surrounding environment and the like, and comprises a temperature detection module, a humidity detection module, an illumination detection module, an acceleration detection module and the like; the display module can realize the functions of information display, man-machine interaction and the like and comprises a liquid crystal display screen module, a touch screen module, an indicator light module and the like; the data storage module can realize the functions of storing data, configuration information and the like of the electronic equipment, and comprises a flash memory module, an expansion storage module and the like.

In the production and research and development processes of the electronic equipment, certain functional modules in the electronic equipment need to be tested to ensure that the functional modules can be used normally. At present, when testing a functional module, a main control board of an electronic device is often required to be matched, and information required by the test is provided by the main control board, for example, a power supply and a control time sequence which meet the test requirements are provided by the main control board. However, the test mode leads to the fact that the test of the functional module can be performed after the program of the main control board is perfected, and the test efficiency of the functional module is affected.

Based on the above, the application provides a testing device and a testing system, wherein the testing device can improve the testing efficiency of functional modules in electronic equipment.

The following description of the embodiments of the present application will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present application, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the application without making any inventive effort, are intended to be within the scope of the application.

An embodiment of the present application provides a test apparatus, as shown in fig. 1, including: a communication circuit 11, a main control circuit 12, and a test information output circuit 13. The communication circuit 11 is connected with the input end of the main control circuit 12, the output end of the main control circuit 12 is connected with the input end of the test information output circuit 13, and the output end of the test information output circuit 13 is connected with the tested functional module.

The communication circuit 11 is for acquiring a first input signal. The first input signal refers to a test control signal input by a user when testing the tested functional module. The first Input signal carries information such as a power supply voltage Output instruction when the tested function module is tested, a control time sequence Output instruction of an IO (Input/Output) port of the tested function module, and the like.

The communication circuit 11 can acquire the first input signal input by the user. In some embodiments, the communication circuit 11 is a circuit capable of communicating with a host computer, such as a serial port communication circuit, a bus communication circuit, or the like. The user can input the first input signal through the upper computer, then the upper computer sends the first input signal to the communication circuit 11, and then the communication circuit 11 performs signal conversion on the first input signal to obtain a second input signal, and sends the second input signal to the input end of the main control circuit 12.

Specifically, the signal conversion means that the communication circuit 11 converts the first input signal into the second input signal that can be recognized by the main control circuit 12. In some embodiments, the first input signal is an analog signal, and the master circuit 12 can only recognize a digital signal, and the signal conversion needs to convert the first input signal belonging to the analog signal into the second input signal belonging to the digital signal. The functions of acquiring the first input signal and converting the first input signal into the second input signal may be implemented by an analog-to-digital converter.

The main control circuit 12 refers to a central processing unit (Central Processing Unit, CPU) of the test device, and may use chips such as STM and S3C as the CPU, which is not limited in this embodiment. The main control circuit 12 is responsible for reading the second input signal and converting the second input signal into a control signal that can be recognized by the test information output circuit 13. Although the signal conversion is performed, the control signal still carries the information such as the power supply voltage output command and the control timing output command. The output of the main control circuit 12 sends a control signal to the input of the test information output circuit 13.

It should be noted that, the method of obtaining the second input signal, converting the second input signal into the control signal, and controlling other devices or systems to operate based on the control signal are all conventional control methods that can be implemented by the CPU, which are not important to be protected in the present solution, and those skilled in the art need not perform creative labor to implement the control methods, which is not repeated herein.

The test information output circuit 13 is capable of generating test information from the control signal. The test information comprises voltage output according to a power supply voltage output instruction, control time sequence output according to a control time sequence output instruction of the IO port of the tested functional module and the like. The output end of the test information output circuit 13 sends the test information to the tested functional module to realize the test of the tested functional module.

In some embodiments, the test information output circuit 13 includes a voltage converter, such as a buck converter, a boost converter, a linear voltage regulator, and the like, which is not limited in this embodiment. The voltage converter is connected to an external power source. The voltage converter can convert the power supply voltage provided by the external power supply into the voltage meeting the power supply voltage output instruction requirement according to the control signal and then output the voltage.

The test information output circuit 13 may further include a timing processor, and the timing processor may generate a control timing according to the control signal and output the control timing according to the control timing output instruction requirement. Chips such as STM and S3C may be used as the timing processor, which is not limited in this embodiment.

It should be noted that, the method of converting the input voltage according to the control signal to obtain the voltage according to the power supply voltage output command and outputting the voltage is a conventional control method that can be implemented by the voltage converter, and the method of generating the control timing sequence according to the control signal and outputting the control timing sequence is a conventional control method that can be implemented by the processor, where the control method is not the key point to be protected in the present scheme, and those skilled in the art need not pay creative labor to implement the control method, which is not repeated herein.

The test apparatus of the above embodiment includes the communication circuit 11, the main control circuit 12, and the test information output circuit 13. The communication circuit 11 is configured to obtain a first input signal, the communication circuit 11 is connected to an input terminal of the master control circuit 12, and an input terminal of the master control circuit 12 is configured to receive a second input signal output by the communication circuit 11. The output end of the main control circuit 12 is connected with the input end of the test information output circuit 13, the input end of the test information output circuit 13 is used for receiving the control signal output by the main control circuit 2, the output end of the test information output circuit 13 is connected with the tested functional module, and the output end of the test information output circuit 13 is used for outputting test information to the tested functional module. Based on the above, the embodiment converts the first input signal into the test information and outputs the test information to the tested functional module, so that the test of the functional module is realized by using the test information, the program perfection of the main control board is not required to wait, and the test efficiency is high.

Further, for some electronic devices with larger volumes, such as televisions, refrigerators, etc., the main control board is often larger, and when different functional modules are tested in the prior art, the main control board needs to be frequently disassembled due to the assistance of the main control board, so that the testing efficiency is affected. By using the technical scheme of the application, even if testing is carried out aiming at different functional modules, the main control board does not need to be frequently disassembled, thereby achieving the purpose of improving the testing efficiency.

As an alternative embodiment, as shown in fig. 2, the test information output circuit 13 includes a timing control circuit 131. The test information includes a timing signal output by the timing control circuit 131, an output end of the main control circuit 12 is connected to an input end of the timing control circuit 131, and an output end of the timing control circuit 131 is connected to a control end of the tested functional module.

Specifically, the timing control circuit 131 is configured to output a timing signal under the control of the main control circuit 12. The timing signal refers to a logic control signal, which is used for performing timing control on the relevant pins of the tested functional module. The related pins refer to pins at the control end of the tested functional module, including RESET pins, EN enable pins, and the like, which are not limited in this embodiment.

As shown in fig. 2, the timing control circuit 131 includes a plurality of timing output ports, and different timing output ports may be configured to output timing signals of different pins, where the plurality of timing output ports are respectively connected to an output terminal of the master control circuit 12 and a control terminal of the tested functional module.

Specifically, the master circuit 12 itself has the capability of generating a timing signal, which increases the production cost of the test apparatus if the timing processor is provided as described in the above embodiments. In order to save production costs, the control signal in the embodiment of the present application includes a timing signal, that is, the control circuit 12 may generate the timing signal according to the second input signal, and then send the timing signal to the timing output port, where the timing output port sends the timing signal to the control end of the tested functional module.

The specific number of the timing output ports can be set according to actual requirements, and the embodiment is not limited. In the embodiment shown in fig. 2, the 4 timing output ports are provided only for illustrating the present technical solution, and are not particularly limited.

It should be noted that, the methods of obtaining the second input signal and generating the timing signal based on the input signal are all conventional control methods that can be implemented by the CPU, which are not important to be protected in this scheme, and those skilled in the art can implement the control methods without performing creative labor, which is not described herein.

In the above embodiment, the timing control circuit 131 is configured to output the timing signal required for testing, without waiting for the program improvement of the main control board, and the testing efficiency is high.

As an alternative embodiment, as shown in fig. 3, the test information output circuit 13 includes a power supply circuit 132. The test information comprises a power supply source output by a power supply circuit, an output end of the main control circuit 12 is connected with an input end of the power supply circuit 132, and an output end of the power supply circuit 132 is connected with a power supply end of the tested functional module.

Specifically, the power supply circuit 132 is configured to output a power supply under the control of the main control circuit 12. The power supply refers to a power supply required by the tested functional module for normally completing the test. The power supply circuit 132 is connected with the power end of the tested functional module, so as to achieve the purpose of supplying power to the tested functional module.

Specifically, the user may determine the power supply voltage required by the tested functional module in advance, and then determine the first input signal based on the power supply voltage, and the main control circuit 12 may generate the control signal according to the second input signal, so as to control the voltage of the power supply output by the power supply circuit 132 to conform to the power supply voltage required by the tested functional module.

As described in the above embodiments, the power supply circuit 132 may be a voltage converter connected to an external power source, for example, a buck converter, a boost converter, a linear voltage regulator, etc. connected to the external power source, and the description of the above embodiments may be specifically referred to, and details thereof are omitted herein.

In the above embodiment, the power supply circuit 132 is configured to output the power supply required for the test, without waiting for the program improvement of the main control board, and the test efficiency is high.

As an alternative embodiment, as shown in fig. 4, the test information output circuit 13 includes a timing control circuit 131 and a power supply circuit 132. The timing control circuit in this embodiment is the same as that in the above embodiment, and the power supply circuit is the same as that in the above embodiment, and those skilled in the art may refer to the description of the above embodiment, and a detailed description thereof is omitted herein.

In the above embodiment, the timing control circuit 131 is configured to output the timing signal required for the test, and the power supply circuit 132 is configured to output the power supply required for the test, so that the program of the main control board is not required to be perfected, and the test efficiency is high.

As an alternative embodiment, the power supply circuit of this embodiment includes a power converter, where a power supply terminal of the power converter is connected to the power supply device, a control terminal of the power converter is used as an input terminal of the power supply circuit, and an output terminal of the power converter is used as an output terminal of the power supply circuit.

The power converter is used for converting the power of the power supply device under the control of the main control circuit 12 so that the power of the power supply source output by the power converter accords with the power required by the tested functional module.

As an alternative embodiment, the power converter includes a first dc-dc converter. A dc-dc converter means a device for converting a dc power supply of a certain voltage level to a dc power supply of another voltage level.

The power supply end of the first direct current-direct current converter is used as the power supply end of the power converter to be connected with the power supply equipment, the control end of the first direct current-direct current converter is used as the control end of the power converter to be connected with the output end of the main control circuit, and the output end of the first direct current-direct current converter is used as the output end of the power converter to be connected with the power supply end of the tested functional module.

The number of the first dc-dc converters and the specification of the first dc-dc converters can be set by those skilled in the art according to practical situations, and the embodiment is not limited. In a specific embodiment, as shown in fig. 5, two first dc-dc converters are provided, DCDC11 and DCDC12, respectively. The voltage of the power supply device is 18V, the DCDC11 is used for converting the direct-current voltage of 18V into the direct-current voltage of 12V, and the DCDC12 is used for converting the direct-current voltage of 18V into the direct-current voltage of 5V.

As an alternative embodiment, the power converter includes a second dc-dc converter and a low dropout linear regulator. The low dropout linear regulator is a common power electronic device for adjusting an input voltage to a stable output voltage, while maintaining a low dropout, i.e. a small difference between the input voltage and the output voltage.

The power supply end of the second direct current-direct current converter is used as the power supply end of the power converter to be connected with the power supply equipment, the output end of the second direct current-direct current converter is connected with the power supply end of the low-dropout linear voltage regulator, the control end of the low-dropout linear voltage regulator is used as the control end of the power converter to be connected with the output end of the main control circuit, and the output end of the low-dropout linear voltage regulator is used as the output end of the power converter to be connected with the power supply end of the tested functional module.

In this embodiment, the step adjustment is performed on the power supply voltage of the power supply device. The power supply voltage of the power supply equipment is adjusted to a first voltage value by utilizing the second direct current-direct current converter, and then the first voltage value is adjusted to a voltage value required by the tested functional module in the testing process by utilizing the low-dropout linear regulator.

Thus, the second DC-DC converter can provide high-efficiency voltage conversion, reduce energy loss and heat, and the low-dropout linear voltage regulator can provide lower output voltage noise and better stability. By combining the two power supplies, a more stable and clean power supply output can be obtained while high-efficiency conversion is maintained.

A second dc-dc converter may be connected to a plurality of low dropout regulators according to the above-described embodiments, and the number of second dc-dc converters and low dropout regulators may be set according to actual situations, which is not limited in this embodiment.

As shown in fig. 5, in a specific embodiment, a second dc-dc converter DCDC2 is provided, and two low dropout linear regulators LDO are connected to the second dc-dc converter DCDC2, where the two low dropout linear regulators LDO are LDO1 and LDO2, respectively. The voltage of the power supply device is 18V, the second DC-DC converter DCDC2 is used for adjusting the DC voltage of 18V to 5V, the LDO1 is used for adjusting the DC voltage of 5V to 1.8V, and the LDO2 is used for adjusting the DC voltage of 5V to 1.2V.

The driving voltage of the main control board of some electronic devices is very high, for example, the main control board of some electronic devices is driven by 220V voltage, and when the functional module is tested by using the mode of the prior art, the main control board is required to be powered, so that the risk of electric shock exists. In the embodiment of the application, the main control board is not required to be used for auxiliary power supply, so that the voltage requirement of the functional module can be realized after simple voltage adjustment by adopting the power supply equipment with the output voltage similar to the voltage of the tested functional module, the test is completed, the electric shock risk in the test process is avoided, and the life safety of related staff is ensured.

As an alternative embodiment, as shown in fig. 5, the power supply terminal of the main control circuit 12 is connected to the output terminal of the second dc-dc converter DCDC 2. The power supply output by the second dc-dc converter DCDC2 is used for supplying power to the main control circuit 12, so as to ensure that the main control circuit 12 can work.

In a specific embodiment, as shown in fig. 5, the test information output circuit 13 includes the timing control circuit 131 and the power supply circuit 132 of the above embodiment, and the power supply circuit 132 includes a first power supply circuit and a second power supply circuit. The first power supply circuit and the second power supply circuit comprise power converters, wherein the power converter of the first power supply circuit comprises the first direct current-direct current converter DCDC1 of the above embodiment; the power converter of the second power supply circuit comprises the second dc-dc converter DCDC2 and the low dropout linear regulator LDO of the above embodiments.

As an alternative embodiment, the communication circuit comprises a man-machine interaction circuit. The user can input the input information through the man-machine interaction circuit, and the user does not need to be connected with an upper computer, so that the testing cost is effectively reduced.

As an alternative embodiment, the human-machine interaction circuit comprises a touch screen. As shown in fig. 6, the display screen includes an output voltage setting interface, an IO timing setting interface, and a relative timing control setting interface between signals. The user can input the power supply voltage output instruction in the input information through the output voltage setting interface, and the user can input the control time sequence output instruction in the input information through the relative time sequence control setting interface between the IO time sequence setting interface and the signal.

An embodiment of the present application provides a test system, as shown in fig. 7, including a power supply device 21 and a test device 22 in the above embodiment; the power supply device 21 is connected to the test device 22.

It should be noted that, in the present specification, each embodiment is described in a progressive manner, and each embodiment is mainly described as different from other embodiments, and identical and similar parts between the embodiments are all enough to be referred to each other. The modules and sub-modules in the device and the terminal of the embodiments of the present application may be combined, divided, and deleted according to actual needs, and features described in the embodiments may be replaced or combined.

In the embodiments provided in the present application, it should be understood that the disclosed terminal and apparatus may be implemented in other manners. For example, the division of a module or sub-module is merely a logical function division, and there may be other manners of division when actually implemented, for example, multiple sub-modules or modules may be combined or integrated into another module, or some features may be omitted or not performed. Alternatively, the coupling or direct coupling or communication connection shown or discussed with each other may be an indirect coupling or communication connection via some interfaces, devices or modules, which may be in electrical, mechanical, or other forms.

The modules or sub-modules illustrated as separate components may or may not be physically separate, and components that are modules or sub-modules may or may not be physical modules or sub-modules, i.e., may be located in one place, or may be distributed over multiple network modules or sub-modules. Some or all of the modules or sub-modules may be selected according to actual needs to achieve the purpose of the embodiment.

In addition, each functional module or sub-module in the embodiments of the present application may be integrated in one processing module, or each module or sub-module may exist alone physically, or two or more modules or sub-modules may be integrated in one module.

Finally, it is further noted that relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Moreover, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that an article or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such article or apparatus. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in an article or device comprising the element.

The previous description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present application. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the application. Thus, the present application is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A test apparatus, comprising: the device comprises a communication circuit, a main control circuit and a test information output circuit;

2. The test apparatus of claim 1, wherein the test information output circuit comprises a timing control circuit;

3. The test apparatus according to claim 1 or 2, wherein the test information output circuit comprises a power supply circuit;

4. A test device according to claim 3, wherein the power supply circuit comprises a power converter;

5. The test apparatus of claim 4, wherein the power converter comprises a first dc-dc converter;

6. The test apparatus of claim 4 or 5, wherein the power converter comprises a second dc-dc converter and a low dropout linear regulator;

7. The test apparatus of claim 6, wherein a power supply terminal of the master circuit is connected to an output terminal of the second dc-dc converter.

8. The test apparatus of claim 1, wherein the communication circuit comprises a human-machine interaction circuit.

9. The test apparatus of claim 8, wherein the human-machine interaction circuit comprises a touch screen.

10. A test system comprising a power supply device and a test device as claimed in any one of claims 1 to 9; the power supply device is connected with the test device.