CN220207662U - Multifunctional clamp for chip test - Google Patents

Abstract

The utility model discloses a multifunctional clamp for chip testing, which belongs to the technical field of chip clamping and comprises a bottom detection main board, wherein the top of the bottom detection main board is fixedly connected with a storage groove, a test chip is sleeved in the storage groove, the side edge of the test chip is fixedly connected with a chip line claw, the top of the test chip is fixedly attached with the top detection main board, the front end and the rear end of the bottom of the top detection main board are fixedly connected with a pin storage board, the left end and the right end of the top detection main board are fixedly connected with connecting blocks, the bottom of the bottom detection main board is fixedly connected with a bottom plate, the upper end of the bottom plate is rotatably connected with a damping ring, the damping ring is rotatably connected in the connecting blocks, the bottom detection main board is used for carrying out line detection on electric signals fed to a bottom contact, and the top detection main board can simultaneously carry out other chip auxiliary detection, so that multi-path test detection can be carried out while the chip clamping.

Description

Multifunctional clamp for chip test

Technical Field

The utility model relates to a clamp for chip testing, in particular to a multifunctional clamp for chip testing, and belongs to the technical field of chip clamping.

Background

The development prospect of the semiconductor industry is good, various chips are coming from the beginning, and various types of test probes are developed in a diversified way. Along with the gradual development of enterprises to industrialization and scale, market demands are gradually expanded, so that the research and development trend of chip production core technologies, process equipment, technical application and trend are critical to the improvement of product technical specifications and market competitiveness of enterprises.

The technology of using golden fingers to contact chip pins for chip testing has been developed for a long time, but the market test fixture cannot achieve the ideal effect of a test manufacturer, and most of the market test fixtures have the defects of large volume, inconvenient operation, low efficiency and the like, and the field cannot realize the requirement of mass production because the market is basically in a manual test stage, so that the chip test of the large pins basically belongs to a small number of tests, and in future fixture design innovation, innovation design is mainly carried out for the purposes of portability, practicability and simplification, so that the market test fixture needs to be upgraded and modified on the basis of the prior art.

Disclosure of Invention

The utility model aims to provide a multifunctional clamp for chip testing, which can solve the technical problems that the market-oriented testing clamp in the prior art cannot achieve the ideal effect of a testing manufacturer, and most of the defects exist in large volume, inconvenient operation, low efficiency and the like, and the field cannot meet the requirement of mass production because the multifunctional clamp is basically in a manual testing stage.

In order to solve the problems, the following technical scheme is provided:

the utility model provides a multifunctional clamp for chip test, detects the mainboard including the bottom, bottom detects mainboard top fixedly connected with storage tank, the inside cover of storage tank is equipped with test chip, test chip side fixedly connected with chip line claw, test chip top fixedly attached to has the top to detect the mainboard, both ends fixedly connected with deposits the faller around the top detects the mainboard bottom, both ends fixedly connected with linking block about the top detects the mainboard, bottom detection mainboard bottom fixedly connected with bottom plate, bottom plate top fixedly connected with lead screw, lead screw upper end swivelling joint has the damping ring, damping ring swivelling joint is inside linking block.

Further, the bottom contact is arranged at the top of the bottom detection main board, and the tail end of the chip circuit claw is correspondingly attached to the top end of the bottom contact.

Further, the inside sliding connection of needle deposit board has the contact needle, contact needle bottom corresponds laminating at chip circuit claw top.

Further, top detection mainboard top fixedly connected with roof, roof both sides bottom is equipped with the top contact, the laminating is corresponding at contact needle top to top contact bottom.

Further, the top of the top plate is fixedly connected with a handle.

Further, the bottom contact, the contact pin and the top contact are made of metal materials with good electric conductivity.

Further, the whole length of the contact needle is longer than the gap between the needle storage plate and the top plate.

Compared with the prior art, the utility model has the beneficial effects that:

1. according to the utility model, a test chip is placed in a storage groove, so that a chip circuit claw at the edge of the test chip is contacted with a bottom contact, a top detection main board is pushed by a handle to slide, so that the bottom of a contact pin is contacted with the chip circuit claw, meanwhile, the top of the contact pin is contacted with a top contact, an electric signal is introduced into the bottom contact through the bottom detection main board to perform circuit detection, and the top detection main board can simultaneously perform other chip auxiliary detection, so that multiple paths of test detection can be performed while the chip is clamped;

2. according to the utility model, through the damping ring rotatably arranged at the upper end of the screw rod, the top detection main board can be manually lifted and lowered, so that the top detection main board can rapidly fix and hold the chip, the whole detection device has higher operability, and the efficiency of chip detection is improved;

specific embodiments of the utility model are disclosed in detail below with reference to the following description and drawings, indicating the manner in which the principles of the utility model may be employed. It should be understood that the embodiments of the utility model are not limited in scope thereby. The embodiments of the utility model include many variations, modifications and equivalents within the spirit and scope of the appended claims.

Drawings

The accompanying drawings are included to provide a further understanding of the utility model and are incorporated in and constitute a part of this specification, illustrate the utility model and together with the embodiments of the utility model, serve to explain the utility model. In the drawings:

FIG. 1 is a schematic diagram of a front view of a multifunctional fixture for chip testing according to the present utility model;

FIG. 2 is a schematic side view of a multi-functional fixture for chip testing according to the present utility model;

fig. 3 is a schematic view of the structure of a multifunctional fixture for chip testing according to the present utility model from the bottom perspective.

In the figure: 1. a bottom detection main board; 2. a storage tank; 3. a bottom contact; 4. a bottom plate; 5. a screw rod; 6. testing the chip; 7. chip line claws; 8. a contact pin; 9. a joint block; 10. a top detection main board; 11. a needle storage plate; 12. a top plate; 13. a top contact; 14. a handle; 15. a damping ring.

Detailed Description

The utility model is further described in connection with the following detailed description, in order to make the technical means, the creation characteristics, the achievement of the purpose and the effect of the utility model easy to understand.

As shown in fig. 1-3, the embodiment provides a multifunctional clamp for chip testing, which is characterized by comprising a bottom detection main board 1, wherein the top of the bottom detection main board 1 is fixedly connected with a storage groove 2, a test chip 6 is sleeved in the storage groove 2, a chip line claw 7 is fixedly connected to the side edge of the test chip 6, a top detection main board 10 is fixedly attached to the top of the test chip 6, a needle storage board 11 is fixedly connected to the front end and the rear end of the bottom of the top detection main board 10, a connecting block 9 is fixedly connected to the left end and the right end of the top detection main board 10, a bottom plate 4 is fixedly connected to the bottom of the bottom detection main board 1, a screw rod 5 is fixedly connected to the top of the bottom plate 4, a damping ring 15 is rotatably connected to the upper end of the screw rod 5, and the damping ring 15 is rotatably connected to the inside the connecting block 9.

In this embodiment, as shown in fig. 1-3,

preferably, the bottom detects mainboard 1 top and is equipped with bottom contact 3, chip circuit claw 7 end corresponds the laminating on bottom contact 3 top, the inside sliding connection of needle board 11 has contact needle 8, contact needle 8 bottom corresponds the laminating on chip circuit claw 7 top, top detects mainboard 10 top fixedly connected with roof 12, roof 12 both sides bottom is equipped with top contact 13, top contact 13 bottom corresponds the laminating at contact needle 8 top for chip circuit claw 7 can contact bottom detection mainboard 1 and top detection mainboard 10 simultaneously, thereby realize the multichannel detection of many pairs of chips.

Preferably, the top of the top plate 12 is fixedly connected with a handle 14, so that the overall operability is improved, and a good clamping effect and good convenience are achieved for the chip clamp.

Preferably, the bottom contact 3, the contact pin 8 and the top contact 13 are made of metal materials with good electric conductivity, so that good transmissibility of the whole electric signal is ensured.

Preferably, the whole length of the contact needle 8 is longer than the gap between the needle storage plate 11 and the top plate 12, so that the contact needle 8 is prevented from falling off from the needle storage plate 11 to influence the whole detection effect.

The application principle and the application flow of the utility model are as follows: placing the test chip 6 inside the storage tank 2, enabling the chip circuit claw 7 at the edge of the test chip 6 to contact with the bottom contact 3, pushing the top detection main board 10 to slide through the 14 handle, enabling the bottom of the contact pin 8 to contact with the chip circuit claw 7, simultaneously enabling the top of the contact pin 8 to contact with the top contact 13, enabling the bottom detection main board 1 to charge the electric signal into the bottom contact 3 for circuit detection, enabling the top detection main board 10 to simultaneously perform other chip auxiliary detection, enabling multi-path test detection to be performed while clamping the chip

In the description of the present utility model, it should be noted that the directions or positional relationships indicated by the terms "upper", "lower", "inner", "outer", "front", "rear", "both ends", "one end", "the other end", etc. are based on the directions or positional relationships shown in the drawings, are merely for convenience of describing the present utility model and simplifying the description, and do not indicate or imply that the devices or elements referred to must have a specific direction, be configured and operated in the specific direction, and thus should not be construed as limiting the present utility model. Furthermore, the terms "first," "second," and the like, are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.

In the description of the present utility model, it should be noted that, unless explicitly specified and limited otherwise, the terms "mounted," "provided," "connected," and the like are to be construed broadly, and may be either fixedly connected, detachably connected, or integrally connected, for example; can be mechanically or electrically connected; can be directly connected or indirectly connected through an intermediate medium, and can be communication between two elements. The specific meaning of the above terms in the present utility model can be understood by those of ordinary skill in the art according to specific circumstances.

While the utility model has been described in connection with specific embodiments, it will be apparent to those skilled in the art that the description is intended to be illustrative and not limiting in scope. Various modifications and alterations of this utility model will occur to those skilled in the art in light of the spirit and principles of this utility model, and such modifications and alterations are also within the scope of this utility model.

Claims (7)

1. A multifunctional clamp for chip testing is characterized by comprising a bottom detection main board (1), a storage groove (2) is fixedly connected to the top of the bottom detection main board (1), a test chip (6) is sleeved inside the storage groove (2), a chip circuit claw (7) is fixedly connected to the side of the test chip (6), a top detection main board (10) is fixedly attached to the top of the test chip (6), a storage needle board (11) is fixedly connected to the front end and the rear end of the bottom of the top detection main board (10), connecting blocks (9) are fixedly connected to the left end and the right end of the top detection main board (10), a bottom plate (4) is fixedly connected to the bottom of the bottom detection main board (1), a screw rod (5) is fixedly connected to the top of the bottom plate (4), a damping ring (15) is rotatably connected to the upper end of the screw rod (5), and the damping ring (15) is rotatably connected to the inside the connecting blocks (9).

2. The multifunctional clamp for chip testing according to claim 1, wherein the bottom contact (3) is arranged at the top of the bottom detection main board (1), and the tail end of the chip circuit claw (7) is correspondingly attached to the top end of the bottom contact (3).

3. The multifunctional clamp for chip testing according to claim 2, wherein the inside of the needle storage plate (11) is slidably connected with a contact needle (8), and the bottom of the contact needle (8) is correspondingly attached to the top end of the chip circuit claw (7).

4. A multifunctional clamp for chip testing according to claim 3, wherein the top of the top detection main board (10) is fixedly connected with a top plate (12), top contacts (13) are arranged at the bottoms of two sides of the top plate (12), and the bottoms of the top contacts (13) are correspondingly attached to the tops of the contact pins (8).

5. The multifunctional clamp for chip testing according to claim 4, wherein a handle (14) is fixedly connected to the top of the top plate (12).

6. The multifunctional clamp for chip testing according to claim 4, wherein the bottom contact (3), the contact pin (8) and the top contact (13) are made of metal materials with good electric conductivity.

7. A multifunctional clamp for chip testing according to claim 4, characterized in that the contact pins (8) have an overall length that is greater than the gap between the pin plate (11) and the top plate (12).