CN220137289U

CN220137289U - Optoelectronic device testing arrangement

Info

Publication number: CN220137289U
Application number: CN202321874332.3U
Authority: CN
Inventors: 李念洲; 周莉; 廖明霞
Original assignee: Wuhan Yichen Optoelectronic Technology Co ltd
Current assignee: Wuhan Yichen Optoelectronic Technology Co ltd
Priority date: 2023-07-15
Filing date: 2023-07-15
Publication date: 2023-12-05
Anticipated expiration: 2033-07-15

Abstract

The utility model relates to an optoelectronic device testing device, which comprises a test bench and a receiving frame, wherein a tester is arranged on the surface of the test bench, a first mounting plate and a second mounting plate are arranged on the surface of the test bench, a fixed plate and a detection head are arranged on the surface of the first mounting plate, an opening is formed on the surface of the fixed plate, a limiting piece is arranged on the surface of the first mounting plate, a pushing unit is arranged between the fixed plate and the second mounting plate, a clamping unit is arranged on the limiting piece, and by arranging the first mounting plate, the fixed plate, the second mounting plate, the limiting piece, the pushing unit and the clamping unit on the test bench, a worker can put optoelectronic devices into the limiting piece orderly, and an automatic pushing and testing effect is realized by utilizing the cooperation of the pushing unit and the clamping unit, complicated operation treatment between the optoelectronic devices and the testing device is not needed, the testing efficiency of the optoelectronic devices is improved, and the practicability is stronger.

Description

Optoelectronic device testing arrangement

Technical Field

The utility model relates to the technical field of detection devices, in particular to an optoelectronic device testing device.

Background

The optoelectronic device is a core component for realizing photoelectric conversion function of the optical module, the optical device consists of a transmitting part and a receiving part, and common optical devices comprise components such as TOSA, ROSA, BOSA and the like.

In the production process of the photoelectric device, the quality of the photoelectric device is required to be tested, the corresponding photoelectric device and the testing device are required to be installed during the test operation, and the butt joint detection is carried out between the corresponding photoelectric device and the testing device, but the traditional testing device is excessively complicated in the disassembly and assembly operation of the photoelectric device during the use process, the manual operation and the testing device are required to be installed and disassembled, the corresponding photoelectric device to be tested is inconvenient to carry out the continuity test, and when a large number of photoelectric devices are required to be tested, the problem of low test efficiency exists, and the high-efficiency test is not facilitated.

Disclosure of Invention

Based on the above description, the utility model provides an optoelectronic device testing device, so as to solve the problem that the existing testing device is inconvenient to continuously test batch optoelectronic devices, and the testing efficiency is low.

The technical scheme for solving the technical problems is as follows: the utility model provides an optoelectronic device testing arrangement, includes testboard and material receiving frame, the surface mounting of testboard has the tester, the surface of testboard is equipped with first mounting panel and second mounting panel, the surface of first mounting panel is equipped with fixed plate and detection head, the opening has been seted up on the surface of fixed plate, the locating part sets up in the surface of first mounting panel, pushing unit sets up between fixed plate and second mounting panel, clamping unit, the clamping unit sets up on the locating part.

On the basis of the technical scheme, the utility model can be improved as follows.

Further, the locating part is including spill frame and a plurality of flange, and a plurality of the flange all sets up in the surface of fixed plate, the spill frame sets up on a plurality of flange and is mutually perpendicular's state between, the space looks adaptation and the intercommunication of space distance between the inner chamber space of spill frame and the a plurality of flange.

Further, the pushing unit mainly comprises an electric push rod and a connecting plate, the electric push rod is arranged on the surface of the second mounting plate, a protruding rod is arranged at one end of the electric push rod, the connecting plate is arranged on the outer side of the protruding rod, a protruding block protruding into the opening is arranged on the surface of the connecting plate, and a pushing rod protruding to a position between a plurality of protruding plates is further arranged on the surface of the connecting plate.

Further, a plurality of the channels are formed in the surfaces of the convex plates, the clamping units comprise third mounting plates, the third mounting plates are arranged on the surfaces of the convex plates through fixing bolts, and silica gel strips protruding into the channels are arranged on the surfaces of the third mounting plates.

Further, the surface of testboard has seted up the through-hole, the one side of connecting plate is outstanding to in the through-hole, the one end of protruding pole is outstanding to the inboard of connecting plate and is equipped with stop nut.

Further, the surfaces of the convex plates and the third mounting plate are provided with mutually matched slots, and bolts are arranged between the convex plates and the third mounting plate through the slots.

Further, the surfaces of the convex plates are respectively provided with a plurality of limiting plates, and the limiting plates are respectively contacted with the surface of the third mounting plate.

Further, one end of the bolt protrudes to the outer side of the third mounting plate and is provided with a protrusion.

Compared with the prior art, the technical scheme of the utility model has the following beneficial technical effects:

through set up first mounting panel, fixed plate, second mounting panel, locating part, propelling movement unit and clamping unit on the testboard for the staff can put into the locating part with photoelectron device is orderly, and utilizes the cooperation of propelling movement unit and clamping unit to realize automatic propelling movement and test's effect, need not the staff and carries out loaded down with trivial details operation between electron device and the testing arrangement and handle, has improved electron device's test efficiency, and the practicality is stronger.

Drawings

FIG. 1 is a schematic diagram of the overall structure of the present utility model;

FIG. 2 is a schematic view of another view angle structure of the whole present utility model;

FIG. 3 is a schematic top view of the present utility model;

fig. 4 is an enlarged schematic view of the structure of fig. 2 a according to the present utility model.

In the drawings, the list of components represented by the various numbers is as follows:

1. a test bench; 11. a first mounting plate; 112. a fixing plate; 1121. an opening; 12. a second mounting plate; 13. a through port; 14. a material receiving frame; 2. a tester; 3. a detection head; 4. a limiting piece; 41. a concave frame; 42. a convex plate; 421. a channel; 422. a limiting plate; 5. a pushing unit; 51. an electric push rod; 52. a connecting plate; 521. a bump; 53. a push rod; 6. a clamping unit; 61. a third mounting plate; 611. a silica gel strip; 7. a protruding rod; 9. a limit nut; 10. a plug pin; 101. a protrusion.

Detailed Description

In order that the utility model may be readily understood, a more complete description of the utility model will be rendered by reference to the appended drawings. Embodiments of the utility model are illustrated in the accompanying drawings. This utility model may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.

Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this utility model belongs. The terminology used herein in the description of the utility model is for the purpose of describing particular embodiments only and is not intended to be limiting of the utility model.

The embodiment provides an optoelectronic device testing device, which comprises a testing table 1, a receiving frame 14 for collecting tested optoelectronic devices, a limiting piece 4 for limiting throwing, pushing and clamping the optoelectronic devices to be tested, a pushing unit 5 and a clamping unit 6, wherein as shown in fig. 1-4, a tester 2 is arranged on the surface of the testing table 1, a first mounting plate 11 and a second mounting plate 12 are arranged on the surface of the testing table 1, a fixing plate 112 and a detection head 3 which is matched and connected with the tester 2 are arranged on the surface of the first mounting plate 11, and an opening 1121 is formed in the surface of the fixing plate 112;

the limiting piece 4 is arranged on the first mounting plate 11, wherein the limiting piece 4 comprises a concave frame 41 and two convex plates 42 which are positioned on the same plane with the detection head 3, the surfaces of the two convex plates 42 are provided with channels 421, the two convex plates 42 are arranged on the surface of the fixed plate 112, the concave frame 41 is arranged on the two convex plates 42 and is in a mutually perpendicular state, the space distance between the inner cavity space of the concave frame 41 and the two convex plates 42 is matched and is in a mutually communicated state, so that a worker can orderly stack photoelectronic devices to be detected into the concave frame 41, and the photoelectronic devices in the concave frame 41 can orderly enter between the two convex plates 42;

the pushing unit 5 is arranged between the fixed plate 112 and the second mounting plate 12, wherein the pushing unit 5 mainly comprises an electric push rod 51 and a connecting plate 52, the electric push rod 51 is arranged on the surface of the second mounting plate 12, one end of the electric push rod 51 is provided with a convex rod 7, the connecting plate 52 is sleeved on the outer side of the convex rod 7, the surface of the connecting plate 52 is provided with a convex block 521 protruding into an opening 1121, the shape and the size of the convex block 521 are matched with those of the opening 1121, the surface of the connecting plate 52 is also provided with a pushing rod 53 protruding between the two convex plates 42, the electric push rod 51 drives the connecting plate 52 and the pushing rod 53 to retract back and forth, and the pushing rod is matched with the limiting piece 4, so that the one-by-one pushing test of optoelectronic devices between the two convex plates 42 is conveniently realized;

the clamping unit 6 is arranged on the limiting piece 4, wherein the clamping unit 6 mainly comprises a third mounting plate 61, the third mounting plate 61 is arranged on the surface of the convex plate 42, the surface of the third mounting plate 61 is provided with a silica gel strip 611 protruding into the channel 421, opposite surfaces of the two silica gel strips 611 protrude between the two convex plates 42, clamping limitation on an optoelectronic device positioned between the two convex plates 42 is achieved, and the pushing unit 5 is prevented from driving the pushed optoelectronic device to displace in the reciprocating motion process.

As shown in fig. 1-3, in this embodiment, the surface of the test bench 1 is provided with a through hole 13 in a penetrating manner, so as to prevent external impurities from falling and remaining in the through hole 13, the movable space of the through hole 13 is matched with the diameter of the optoelectronic device to be tested, the connection board 52 is designed in an L-shaped structure, one surface of the connection board 52 protrudes into the through hole 13, one end of the protruding rod 7 protrudes into the inner side of the connection board 52, one end surface of the protruding rod 7 is provided with a screw thread and is provided with a limit nut 9, thereby realizing the limiting effect on the movable distance of the connection board 52, enabling the optoelectronic device after the detection to fall into the material receiving frame 14 after the movement of the connection board 52, and avoiding the situation that the opening 1121 is excessively large due to the driving of the pushing unit 5, so as to cause the optoelectronic device which is not tested to fall.

As shown in fig. 4, in this embodiment, the surfaces of the two convex plates 42 and the third mounting plate 61 are provided with mutually adapted slots, a plug pin 10 is disposed between the convex plates 42 and the third mounting plate 61 through the slots, the surfaces of the two convex plates 42 are respectively provided with two limiting plates 422, the two limiting plates 422 are respectively contacted with the surface of the third mounting plate 61, one end of the plug pin 10 protrudes to the outer side of the third mounting plate 61 and is provided with a protrusion 101, so that the third mounting plate 61 and the convex plates 42 are more convenient to assemble and disassemble, and during specific installation, a worker can mutually correspond the third mounting plate 61 and the convex plates 42 through the limiting plates 422, and then take the plug pin 10 through the protrusions 101 and insert the plug pin into the space between the third mounting plate 61 and the convex plates 42 to realize limiting and fixing.

When the testing device is used, a worker can orderly put a plurality of photoelectronic devices to be tested into the concave frame 41 from top to bottom and slide down to contact with the surface of the pushing rod 53, so that the photoelectronic devices are positioned between the concave frame 41 and the two convex plates 42 in a stacked mode, then the worker can start the electric push rod 51, the telescopic rod of the electric push rod 51 drives the convex rod 7 to move to the right side to enable the limit nut 9 to contact with one surface of the connecting plate 52, at the moment, the electric push rod 51 continues to move to the right and drives the connecting plate 52 and the pushing rod 53 to simultaneously move to the right through the through hole 13, after the pushing rod 53 moves for a certain distance, the photoelectronic devices to be tested lose the bearing of the pushing rod 53 and fall to contact with the surface of the convex block 521, then the telescopic rod of the electric push rod 51 stretches out and resets, the pushing rod 53 is utilized to push the photoelectronic device to be detected which falls onto the surface of the convex block 521, after the photoelectronic device to be detected is pushed between the two convex plates 42, the right-most photoelectronic device to be detected is contacted with the detection head 3, the detected data is transmitted to the tester 2, after the test is completed, the electric push rod 51 is contracted again, the opening 1121 is opened, the photoelectronic device after the test is completed falls into the material receiving frame 14, the silicon rubber strip 611 protruding into the convex plates 42 limits the photoelectronic device to be detected subsequently, sliding is avoided, and therefore efficient test of the photoelectronic device is realized through reciprocating motion of the pushing unit 5.

The foregoing description of the preferred embodiments of the utility model is not intended to limit the utility model to the precise form disclosed, and any such modifications, equivalents, and alternatives falling within the spirit and scope of the utility model are intended to be included within the scope of the utility model.

Claims

1. An optoelectronic device testing device comprises a testing table (1) and a receiving frame (14), and is characterized in that,

the surface of the test bench (1) is provided with a tester (2), the surface of the test bench (1) is provided with a first mounting plate (11) and a second mounting plate (12), the surface of the first mounting plate (11) is provided with a fixing plate (112) and a detection head (3), and the surface of the fixing plate (112) is provided with an opening (1121);

the limiting piece (4) is arranged on the surface of the first mounting plate (11) and used for limiting the position of the photoelectric device;

the pushing unit (5) is arranged between the fixed plate (112) and the second mounting plate (12) and is used for pushing the position of the photoelectric device;

and the clamping unit (6) is arranged on the limiting piece (4) and used for clamping and limiting the photoelectric device.

2. The optoelectronic device testing apparatus according to claim 1, wherein the limiting member (4) comprises a concave frame (41) and a plurality of convex plates (42), the plurality of convex plates (42) are all disposed on the surface of the fixing plate (112), the concave frame (41) is disposed on the plurality of convex plates (42) and is in a mutually perpendicular state, and the space distance between the inner cavity space of the concave frame (41) and the plurality of convex plates (42) is adapted and mutually communicated.

3. The optoelectronic device testing apparatus according to claim 1, wherein the pushing unit (5) mainly comprises an electric push rod (51) and a connecting plate (52), the electric push rod (51) is mounted on the surface of the second mounting plate (12), a protruding rod (7) is disposed at one end of the electric push rod (51), the connecting plate (52) is disposed on the outer side of the protruding rod (7), a protruding block (521) protruding into the opening (1121) is disposed on the surface of the connecting plate (52), and a pushing rod (53) protruding between the plurality of protruding plates (42) is disposed on the surface of the connecting plate (52).

4. The optoelectronic device testing apparatus according to claim 2, wherein the surfaces of the plurality of convex plates (42) are provided with channels (421), the clamping unit (6) comprises a third mounting plate (61), the third mounting plate (61) is disposed on the surface of the convex plate (42), and the surface of the third mounting plate (61) is provided with a silica gel strip (611) protruding into the channels (421).

5. An optoelectronic device testing apparatus according to claim 3, wherein the surface of the test bench (1) is provided with a through hole (13), one surface of the connecting plate (52) protrudes into the through hole (13), and one end of the protruding rod (7) protrudes into the inner side of the connecting plate (52) and is provided with a limit nut (9).

6. The optoelectronic device testing apparatus according to claim 4, wherein the surfaces of the plurality of convex plates (42) and the third mounting plate (61) are respectively provided with mutually matched slots, and bolts (10) are arranged between the convex plates (42) and the third mounting plate (61) through the slots.

7. An optoelectronic device testing apparatus according to claim 2, wherein the surfaces of the plurality of convex plates (42) are respectively provided with a plurality of limiting plates (422), and the plurality of limiting plates (422) are respectively contacted with the surface of the third mounting plate (61).

8. An optoelectronic device testing apparatus according to claim 6, wherein one end of the pin (10) protrudes outside the third mounting plate (61) and is provided with a protrusion (101).