CN220126907U - Chip test sorting unit - Google Patents

Chip test sorting unit Download PDF

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Publication number
CN220126907U
CN220126907U CN202320539026.8U CN202320539026U CN220126907U CN 220126907 U CN220126907 U CN 220126907U CN 202320539026 U CN202320539026 U CN 202320539026U CN 220126907 U CN220126907 U CN 220126907U
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China
Prior art keywords
sliding
chip
groove
gear
annular groove
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CN202320539026.8U
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Chinese (zh)
Inventor
姚俊生
刘育军
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Xi'an Lianxin Microelectronics Technology Co ltd
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Xi'an Lianxin Microelectronics Technology Co ltd
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Priority to CN202320539026.8U priority Critical patent/CN220126907U/en
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Abstract

The utility model discloses a chip testing and sorting device which comprises a placing table, wherein a chip tester is fixedly arranged on the front side wall of the placing table, two limiting frames are fixedly arranged at the top of the placing table, an annular groove, a mounting groove and four sliding grooves are formed in the placing table, gears are connected in the rotating mode of the placing table, a rotating mechanism is connected in the annular groove in a rotating mode, the rotating mechanism is connected with the gears in a meshed mode, limiting mechanisms are arranged in the four sliding grooves, extend into the annular groove and are connected with the annular groove in a sliding mode, the limiting mechanisms extend into the rotating mechanism and are connected with the rotating mechanism in a sliding mode, a driving mechanism is arranged in the mounting groove, and the driving mechanism is connected with the gears in a meshed mode. The utility model has reasonable structural design, can rapidly limit and fix the chip when testing and sorting the chip, reduces the working flow and reduces the working strength of staff.

Description

Chip test sorting unit
Technical Field
The utility model relates to the technical field of chip production, in particular to a chip testing and sorting device.
Background
The chip is an integrated circuit and is composed of a large number of transistors, and after the chip is manufactured, the chip is required to be placed below a chip tester for testing, and defective products are removed.
In the prior art, when testing and sorting chips, the chips are fixed on a placing table, then the chips are tested and sorted by using a chip tester, when the chips are fixed, the two sides of the chips are generally fixed, and then the front and the back of the chips are fixed, and when the chips are fixed, the chips are required to be step by step, so that the operation flow of workers is complicated, the working strength of the workers is high, and therefore, the chip testing and sorting device is designed to solve the problems.
Disclosure of Invention
The utility model aims to solve the problems in the prior art and provides a chip test sorting device.
In order to achieve the above purpose, the present utility model adopts the following technical scheme:
the utility model provides a chip test sorting unit, includes places the platform, the preceding lateral wall fixed mounting who places the platform has the chip tester, the top fixed mounting who places the platform has two spacing frames, annular channel, mounting groove and four spouts have been seted up on placing the platform, place the platform internal rotation and be connected with the gear, the ring channel internal rotation is connected with slewing mechanism, slewing mechanism and gear engagement are connected, four all be equipped with stop gear in the spout, four stop gear all extends to in the annular channel and rather than sliding connection, four stop gear all extends to in the slewing mechanism and rather than sliding connection, be equipped with driving mechanism in the mounting groove, driving mechanism and gear engagement are connected.
Preferably, the rotating mechanism comprises a toothed ring which is rotationally connected in the annular groove, four driving grooves are uniformly formed in the toothed ring in a penetrating mode, and the toothed ring is in meshed connection with the gear.
Preferably, the limit mechanism comprises a sliding block which is slidably connected in the sliding groove, a clamping plate is fixedly arranged at the top of the sliding block, a first spring is fixedly connected between the sliding block and the inner wall of the sliding groove, a sliding rod is fixedly arranged on the sliding block, the sliding rod extends into the annular groove and is slidably connected with the annular groove, a stop lever is fixedly arranged at the top of the sliding rod, and the stop lever extends into the opposite driving groove and is slidably connected with the opposite driving groove.
Preferably, the driving mechanism comprises a sliding plate which is slidably connected in the mounting groove, a second spring is fixedly connected between the sliding plate and the inner wall of the mounting groove, a rack is fixedly mounted on the sliding plate and is in meshed connection with the gear, and a pull rod is fixedly mounted at the end part of the rack.
Preferably, a rubber pad is mounted at the clamping end of the clamping plate.
Preferably, a rubber sleeve is sleeved on the pull rod.
Compared with the prior art, the utility model has the beneficial effects that:
1. through gear, drive mechanism, slewing mechanism and stop gear's setting, it can be when carrying out test sorting to the chip, carries out spacing fixedly to the chip fast, reduces work flow, has reduced staff's working strength.
2. Through the setting of two spacing frames, it can be spacing to placing the box of placing the chip, avoids the staff to touch the condition emergence of placing the box landing from placing the bench at the in-process of operation.
In conclusion, the chip testing device is reasonable in structural design, and can be used for rapidly limiting and fixing the chip when testing and sorting the chip, so that the working flow is reduced, and the working intensity of staff is reduced.
Drawings
Fig. 1 is a schematic structural diagram of a chip test sorting apparatus according to the present utility model;
FIG. 2 is a top view of a structure on a placement table;
FIG. 3 is a top cross-sectional view of a structure on a placement table;
FIG. 4 is an enlarged view of the structure at A in FIG. 3;
FIG. 5 is an enlarged view of the structure at B in FIG. 3;
fig. 6 is an enlarged view of the structure at C in fig. 3.
In the figure: the device comprises a placing table 1, a limiting frame 2, a chip tester 3, a pull rod 4, a clamping plate 5, a ring groove 6, a toothed ring 7, a sliding groove 8, a sliding block 9, a sliding rod 10, a first spring 11, a blocking rod 12, a driving groove 13, a gear 14, a mounting groove 15, a rack 16, a sliding plate 17 and a second spring 18.
Detailed Description
The following description of the embodiments of the present utility model will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present utility model, but not all embodiments.
Referring to fig. 1-6, a chip test sorting device comprises a placing table 1, wherein a chip tester 3 is fixedly arranged on the front side wall of the placing table 1, two limiting frames 2 are fixedly arranged on the top of the placing table 1, a placing box for placing chips can be limited by the arrangement of the two limiting frames 2, the situation that a worker touches the placing box to slide from the placing table in the operation process is avoided, an annular groove 6, a mounting groove 15 and four sliding grooves 8 are formed in the placing table 1, a gear 14 is rotationally connected to the placing table 1, a rotating mechanism is rotationally connected to the annular groove 6, the rotating mechanism is in meshed connection with the gear 14, the rotating mechanism comprises a toothed ring 7 rotationally connected to the annular groove 6, four driving grooves 13 are uniformly formed in the toothed ring 7 in a penetrating mode, and the toothed ring 7 is in meshed connection with the gear 14;
the four sliding grooves 8 are internally provided with limiting mechanisms, the four limiting mechanisms extend into the annular groove 6 and are in sliding connection with the annular groove 6, the four limiting mechanisms extend into the rotating mechanism and are in sliding connection with the rotating mechanism, the limiting mechanisms comprise sliding blocks 9 which are in sliding connection with the sliding grooves 8, clamping plates 5 are fixedly arranged at the tops of the sliding blocks 9, rubber pads are arranged at the clamping ends of the clamping plates 5, first springs 11 are fixedly connected between the sliding blocks 9 and the inner walls of the sliding grooves 8, sliding rods 10 are fixedly arranged on the sliding blocks 9, the sliding rods 10 extend into the annular groove 6 and are in sliding connection with the annular groove, stop rods 12 are fixedly arranged at the tops of the sliding rods 10, and the stop rods 12 extend into opposite driving grooves 13 and are in sliding connection with the driving grooves 13;
the mounting groove 15 is internally provided with a driving mechanism, the driving mechanism is in meshed connection with the gear 14, the driving mechanism comprises a sliding plate 17 which is in sliding connection with the mounting groove 15, a second spring 18 is fixedly connected between the sliding plate 17 and the inner wall of the mounting groove 15, a rack 16 is fixedly arranged on the sliding plate 17, the rack 16 is in meshed connection with the gear 14, the end part of the rack 16 is fixedly provided with a pull rod 4, a rubber sleeve is sleeved on the pull rod 4, and the chip can be rapidly limited and fixed through the arrangement of the gear 14, the driving mechanism, the rotating mechanism and the limiting mechanism when the chip is tested and sorted, so that the working flow is reduced, and the working strength of workers is reduced.
The utility model can explain its functional principle by the following modes of operation:
when the chip is required to be tested and sorted, firstly, an operator places the good product placing box and the bad product placing box in the left limiting frame 2 and the right limiting frame 2 respectively, the pull rod 4 is pulled leftwards, the pull rod 4 drives the rack 16 to slide, the rack 16 drives the gear 14 to rotate, the gear 14 drives the toothed ring 7 to rotate, when the toothed ring 7 rotates, the driving groove 13 on the toothed ring 7 extrudes the stop lever 12 to drive the sliding rod 10 to slide, the sliding rod 10 drives the clamping plates 5 on the sliding block 9 to slide, the four clamping plates 5 in the four sliding grooves 8 are far away relatively, at this moment, the operator places the chip between the four clamping plates 5, the pull rod 4 is loosened, the sliding plate 17 drives the rack 16 to slide and reset under the action of the elastic force of the second spring 18, the rack 16 drives the toothed ring 7 to reversely rotate through the gear 14, the four clamping plates 5 are gradually close to each other to tightly prop against the chip, then the chip tester 3 is started to test the chip, after the test, the operator pulls the clamping plates 5 leftwards again to be separated from tightly against the chip, and takes out the chip, if the chip is placed in the bad product placing box, and places the bad product in the bad product placing box.
The foregoing is only a preferred embodiment of the present utility model, but the scope of the present utility model is not limited thereto, and any person skilled in the art, who is within the scope of the present utility model, should make equivalent substitutions or modifications according to the technical scheme of the present utility model and the inventive concept thereof, and should be covered by the scope of the present utility model.

Claims (6)

1. The utility model provides a chip test sorting unit, includes places platform (1), its characterized in that, the preceding lateral wall fixed mounting who places platform (1) has chip tester (3), the top fixed mounting who places platform (1) has two spacing frames (2), annular channel (6), mounting groove (15) and four spout (8) have been seted up on placing platform (1), place platform (1) internal rotation is connected with gear (14), annular channel (6) internal rotation is connected with rotary mechanism, rotary mechanism and gear (14) meshing are connected, four all be equipped with stop gear in spout (8) all extend to in annular channel (6) and rather than sliding connection, four stop gear all extend to in the rotary mechanism and rather than sliding connection, be equipped with driving mechanism in mounting groove (15), driving mechanism and gear (14) meshing are connected.
2. The chip testing and sorting device according to claim 1, wherein the rotating mechanism comprises a toothed ring (7) rotatably connected in the annular groove (6), four driving grooves (13) are uniformly formed in the toothed ring (7) in a penetrating mode, and the toothed ring (7) is meshed with the gear (14).
3. The chip testing and sorting device according to claim 2, wherein the limiting mechanism comprises a sliding block (9) which is slidably connected in the sliding groove (8), a clamping plate (5) is fixedly arranged at the top of the sliding block (9), a first spring (11) is fixedly connected between the sliding block (9) and the inner wall of the sliding groove (8), a sliding rod (10) is fixedly arranged on the sliding block (9), the sliding rod (10) extends into the annular groove (6) and is slidably connected with the annular groove, a stop lever (12) is fixedly arranged at the top of the sliding rod (10), and the stop lever (12) extends into the opposite driving groove (13) and is slidably connected with the opposite driving groove.
4. The chip testing and sorting device according to claim 1, wherein the driving mechanism comprises a sliding plate (17) slidably connected in the mounting groove (15), a second spring (18) is fixedly connected between the sliding plate (17) and the inner wall of the mounting groove (15), a rack (16) is fixedly installed on the sliding plate (17), the rack (16) is in meshed connection with the gear (14), and a pull rod (4) is fixedly installed at the end part of the rack (16).
5. A chip test handler according to claim 3, wherein the clamping end of the clamping plate (5) is fitted with rubber pads.
6. The chip testing and sorting device according to claim 4, wherein the pull rod (4) is sleeved with a rubber sleeve.
CN202320539026.8U 2023-03-20 2023-03-20 Chip test sorting unit Active CN220126907U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202320539026.8U CN220126907U (en) 2023-03-20 2023-03-20 Chip test sorting unit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202320539026.8U CN220126907U (en) 2023-03-20 2023-03-20 Chip test sorting unit

Publications (1)

Publication Number Publication Date
CN220126907U true CN220126907U (en) 2023-12-05

Family

ID=88951740

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202320539026.8U Active CN220126907U (en) 2023-03-20 2023-03-20 Chip test sorting unit

Country Status (1)

Country Link
CN (1) CN220126907U (en)

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