CN220107105U

CN220107105U - Test connecting wire of USB interface

Info

Publication number: CN220107105U
Application number: CN202321123171.4U
Authority: CN
Inventors: 邹华; 赵宇
Original assignee: Hefei Lianbao Information Technology Co Ltd
Current assignee: Hefei Lianbao Information Technology Co Ltd
Priority date: 2023-05-10
Filing date: 2023-05-10
Publication date: 2023-11-28
Anticipated expiration: 2033-05-10

Abstract

The embodiment of the utility model provides a test connecting wire of a USB interface, which is used for connecting a host side USB interface and a test side USB interface. The test connecting wire comprises a first interface and a second interface which are connected through a cable, a multipath connector is arranged in the first interface, a control chip is arranged in the first interface or the second interface, a first pair of connecting pins and a second pair of connecting pins are arranged on the first port, the second port is provided with the control pins, when an indication level signal is in a low level, a first passage between the first pair of connecting pins is conducted, a second passage between the second pair of connecting pins is disconnected, and when the indication level signal is in a high level, the first passage is disconnected, the second passage is communicated, and signal testing on two sides of the USB interface at the test end is facilitated. Therefore, for two different USB interfaces, the signal test on two sides of the USB interface can be completed without plugging and unplugging twice, and the problem of stub wires can be solved.

Description

Test connecting wire of USB interface

Technical Field

The utility model belongs to the technical field of USB connecting wires, and particularly relates to a test connecting wire of a USB interface.

Background

The electronic equipment is generally provided with USB interfaces of different types, one Type of the USB interfaces is a Type-C USB interface, the interfaces are not different in forward and reverse directions and can be randomly plugged and unplugged, and the use is convenient, so that the interfaces are more and more popular, and are more applied to the field of consumer electronics. The Type-C USB interface can be adapted for transmission of USB2.0, USB3.0, USB4, DP, TBT, PD signals, etc.

For USB interfaces, automatic testing of signal functions is required, but due to the difference of internal designs of products of different USB interfaces, for example, there are two connection modes between the A6/A7 terminal and the B6/B7 terminal in the Type-C USB interface, so that a situation that one test connection line cannot test two USB interfaces often occurs. The method comprises the following steps: as shown in fig. 1, the A6 terminal and the B6 terminal of the first test end USB interface 101 are connected, the A7 terminal and the B7 terminal are connected, the first test connection line 300 connects the host end USB interface 200 and the A6/A7 terminal, only the signal of the interface surface of the A6/A7 terminal can be tested, and then the USB interface needs to be replaced, so as to realize the test of the B6/B7 terminal, thereby completing the test of both surfaces. As shown in fig. 2, the A6/A7 terminal and the B6/B7 terminal inside the second test terminal USB interface 102 are not connected, and the signal test of the A6/A7 terminal and the B6/B7 terminal can be completed at one time by using the second test connection line 400. However, if the second test-end USB interface 102 shown in fig. 2 is tested by using the first test connection line 300, the second test-end USB interface 100 needs to be plugged and unplugged twice to complete the testing of both sides. As shown in fig. 3, if the first test-end USB interface 101 shown in fig. 1 is tested by the second test connection line 400, a stub occurs, which results in the test being affected, for example, the test A6/A7 terminal is tested, and then the connection line between the host-end USB interface 200 and the B6/B7 terminal is the stub. Therefore, two different USB interfaces generally need to use two different test connection lines, which increases the complexity of functional testing.

Disclosure of Invention

In view of the above problems in the prior art, an object of an embodiment of the present utility model is to provide a test connection line for a USB interface, through which, for two different USB interfaces, signal tests on both sides of the USB interface can be completed without plugging and unplugging the two different USB interfaces, and a manner of replacing the test connection line is not necessary, and the problem of stub wires can be solved.

The technical scheme adopted by the embodiment of the utility model is that the test connecting wire of the USB interface is used for connecting the USB interface of the host end and the USB interface of the test end. The test connecting wire comprises a first interface and a second interface which are connected through a cable, a multipath connector is arranged in the first interface, a control chip is arranged in the first interface or the second interface, the multipath connector is provided with a first port used for connecting the first interface and a second port used for connecting the second interface, the first port is provided with a first pair of connecting pins and a second pair of connecting pins, the second port is provided with a control pin, the control pin is provided with an indication level signal under the control of the control chip, when the indication level signal is in a low level, a first passage between the first pair of connecting pins is conducted, a second passage between the second pair of connecting pins is disconnected, and when the indication level signal is in a high level, the first passage is disconnected, the second passage is connected, and signal testing on two sides of the USB interface is facilitated.

Compared with the prior art, the embodiment of the utility model has the beneficial effects that: the first interface of test connecting wire is equipped with multichannel connector, is equipped with control chip in the second interface, and two ports of multichannel connector are connected with first interface and second interface respectively, through the cooperation of control chip and multichannel connector, can control the switching on and off of the inside passageway of multichannel connector of intercommunication between first interface and the second interface, when first passageway switches on, can carry out signal test to one interface face of USB interface, when the second passageway switches on, can carry out signal test to another interface face of USB interface. Therefore, the signal test on the two sides of the USB interface can be completed without plugging and unplugging twice, and a mode of replacing a test connecting wire is not needed. In addition, when the signal is tested, only one signal testing passage is needed between the host end USB interface and the multipath connector, and the multipath connector is arranged in the first interface, so that the stub between the host end USB interface and the testing end USB interface can be greatly shortened, and the quality of the signal is improved.

It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the utility model, as claimed.

An overview of various implementations or examples of the technology described in this disclosure is not a comprehensive disclosure of the full scope or all of the features of the technology disclosed.

Drawings

In the drawings, which are not necessarily drawn to scale, like numerals may describe similar components in different views. The same reference numerals with letter suffixes or different letter suffixes may represent different instances of similar components. The accompanying drawings illustrate various embodiments by way of example in general and not by way of limitation, and together with the description and claims serve to explain the inventive embodiments. Wherever possible, the same reference numbers will be used throughout the drawings to refer to the same or like parts. Such embodiments are illustrative and not intended to be exhaustive or exclusive of the present apparatus or method.

FIG. 1 is a schematic diagram showing the connection between a first conventional test-end USB interface and a host-end USB interface;

FIG. 2 is a schematic diagram illustrating a connection between a second conventional USB interface at a test end and a USB interface at a host end;

FIG. 3 is a schematic diagram illustrating a connection between a third conventional test-end USB interface and a host-end USB interface;

FIG. 4 is a schematic diagram showing a connection state of a test connection line according to a first embodiment of the present utility model with a host USB interface and a test USB interface structure, respectively;

FIG. 5 is a schematic diagram showing a test connection line in connection with a host USB interface and a test USB interface respectively according to a second embodiment of the present utility model;

FIG. 6 is a schematic diagram showing a connection state of a test connection line according to a third embodiment of the present utility model with a host USB interface and a test USB interface respectively; and

fig. 7 is a schematic diagram of a test connection line in a connection state with a host USB interface and a test USB interface structure according to a fourth embodiment of the present utility model.

Detailed Description

In order to make the objects, technical solutions and advantages of the embodiments of the present utility model more clear, the technical solutions of the embodiments of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present utility model. It will be apparent that the described embodiments are some, but not all, embodiments of the utility model. All other embodiments, which can be made by a person skilled in the art without creative efforts, based on the described embodiments of the present utility model fall within the protection scope of the present utility model.

Unless defined otherwise, technical or scientific terms used herein should be given the ordinary meaning as understood by one of ordinary skill in the art to which this utility model belongs. The terms "first," "second," and the like, as used herein, do not denote any order, quantity, or importance, but rather are used to distinguish one element from another. The word "comprising" or "comprises", and the like, means that elements or items preceding the word are included in the element or item listed after the word and equivalents thereof, but does not exclude other elements or items. The terms "connected" or "connected," and the like, are not limited to physical or mechanical connections, but may include electrical connections, whether direct or indirect. "upper", "lower", "left", "right", etc. are used merely to indicate relative positional relationships, which may also be changed when the absolute position of the object to be described is changed.

In order to keep the following description of the embodiments of the present utility model clear and concise, the detailed description of known functions and known components thereof have been omitted. The test-end USB interface in the present utility model may be the first test-end USB interface 101 or the second test-end USB interface 102.

As shown in fig. 4 and 5, an embodiment of the present utility model provides a test connection line for a USB interface, which is used for connection between a host USB interface 200 and a test USB interface, the test connection line includes a first interface 500 and a second interface 600 connected by a cable, a multiplexer 501 is disposed in the first interface 500, a control chip 601 is disposed in the first interface 500 or the second interface 600, the multiplexer 501 has a first port for connecting the first interface 500 and a second port for connecting the second interface 600, the first port is provided with a first pair of connection pins and a second pair of connection pins, the second port is provided with a control pin 5015, the control pin 5015 has an indication level signal under the control of the control chip 601, when the indication level signal is low, a first path between the first pair of connection pins is turned on and a second path between the second pair of connection pins is turned off, and when the indication level signal is high, the first path is turned off and the second path between the first path and the second path is turned on, so that the test signal of the test USB interface is convenient for the test connection of the two sides.

The connection mode of the A6/A7 terminal and the B6/B7 terminal inside the test-end USB interface in fig. 4 and fig. 5 is different, fig. 4 shows a first test-end USB interface, and fig. 5 shows a second test-end USB interface. In some embodiments, the test-side USB interface and the host-side USB interface 200 are Type-C USB interfaces, respectively. The first pair of connection pins may then be connected to both the A6 and A7 terminals, or to the B6 and B7 terminals. The multiple connector 501 may be a device of model NCT3958Y, or may be a device of another model or a self-made device.

Inside the multipath connector 501, the control pin 5015 forms a first path with a first pair of connection pins, and the control pin 5015 forms a second path with a second pair of connection pins. When the test connection line is connected to the host USB interface 200 and the test USB interface, the control chip 601 may default to the low level signal in the initial state, and the control pin 5015 of the multi-path connector 501 receives the low level signal indicating the level of the control chip 601, and at this time, the first path is connected, so that the second path is disconnected (the inside of the second path is high-impedance, such as 100k resistor), and signal test is performed on the interface surfaces of the A6 and A7 terminals. After the signal test of the interface surfaces of the A6 and A7 terminals is completed, the control pin 5015 receives the high-level indication level signal of the control chip 601, disconnects the first path (the inside of the first path is high-resistance), and connects the second path to perform the signal test of the interface surfaces of the B6 and B7 terminals. Therefore, for the test-end USB interface and the test-end USB interface shown in fig. 1 and fig. 2 respectively, although the connection modes between the internal A6/A7 terminal and the internal B6/B7 terminal are different, the multi-path connector 501 controls one path to be turned on and the other path to be turned off in two paths, so that the signal test on both sides of the USB interface can be completed without plugging and unplugging twice, and the mode of replacing the test connection line is not needed.

In addition, the wiring of the test connection line of the present utility model is different from that of the second test connection line 400 shown in fig. 2, only one signal test path is needed between the host side USB interface and the multiple connectors during signal test, and the multiple connectors 501 of the test connection line of the present utility model are disposed in the first interface 500, so that there is no stub between the host side USB interface 200 and the multiple connectors 501, and stub between the host side USB interface 200 and the test side USB interface is greatly shortened, so that the test connection line of the present utility model can also solve the problem of stub and improve signal quality.

The connection mode of the A6/A7 terminal and the B6/B7 terminal inside the test-end USB interface in fig. 6 and 7 is different, fig. 6 shows a first test-end USB interface, and fig. 7 shows a second test-end USB interface. In some embodiments, the first interface 500 and the second interface 600 are Type-C USB interfaces that cooperate with the test-side USB interface and the host-side USB interface 200, respectively. In the case that the test-end USB interface and the host-end USB interface 200 are Type-C USB interfaces, 12 terminals may be disposed on two sides of the first interface 500 and the second interface 600, and may be connected with the test-end USB interface or the host-end USB interface 200 in forward and reverse directions, so as to facilitate connection between the test-end USB interface and the host-end USB interface 200 and signal testing of the test-end USB interface.

As shown in fig. 6 and 7, in some embodiments, when the first interface 500 is connected to the test-end USB interface, the first pair of connection pins are connected to the A6 and A7 terminals of the test-end USB interface through the first interface 500, respectively, and the second pair of connection pins are connected to the B6 and B7 terminals of the test-end USB interface through the first interface 500, respectively. The first pair of connection pins is connected to the A6 and A7 terminals, and the second pair of connection pins is connected to the B6 and B7 terminals, it being understood that on this basis, when the connection direction of the first interface 500 or the test-side USB interface is changed, the first pair of connection pins is connected to the B6 and B7 terminals, and the second pair of connection pins is connected to the A6 and A7 terminals.

As shown in fig. 6 and 7, in some embodiments, the second port is further provided with a first ground pin 5016, where when the control pin 5015 is a low signal or a high signal, the first ground pin 5016 is a low signal. The first grounding pin 5016 is matched with the control pin 5015, and when the first grounding pin 5016 is a low level signal and the control pin 5015 is a low level signal or a high level signal, the first grounding pin 5016 is used for switching different paths. When the first grounding pin 5016 is a high level signal, the test connection line can be in a non-working state _。

As shown in fig. 6 and 7, in some embodiments, the second port is further provided with a third pair of connection pins, and when the second interface 600 is connected to the host USB interface 200, the third pair of connection pins are connected to the A6 and A7 terminals of the host USB interface 200 through the second interface 600, respectively. The first pair of connection pins includes 5011 pin and 5012 pin, the second pair of connection pins includes 5013 pin and 5014 pin, and the third pair of connection pins includes 5017 pin and 5018 pin. After the host end USB interface 200 is connected with the test end USB interface through the test connecting line, the A6 and A7 terminals of the host end USB interface 200 are respectively communicated with the 5017 pin and the 5018 pin, when the first passage is communicated, the 5017 pin and the 5018 pin are respectively communicated with the 5011 pin and the 5012 pin, and when the second passage is communicated, the 5017 pin and the 5018 pin are respectively communicated with the 5013 pin and the 5014 pin. This can avoid stub wires between the host-side USB interface 200 and the test connection lines.

As shown in fig. 6 and 7, in some embodiments, the second port is further provided with a power pin 5019, and when the second interface 600 is connected to the host USB interface 200, the power pin 5019 is connected to the B6 terminal of the host USB interface 200 through the second interface 600. The power pin 5019 connects the test connection line with the power through the B6 terminal of the USB interface 200 at the host end, which is beneficial for the test connection line to successfully complete the signal test of the USB interface at the test end.

As shown in fig. 6 and 7, in some embodiments, the second interface 600 is provided with a power adapter 602, where the power adapter 602 is connected to the control chip 601, and when the second connector is connected to the test-end USB interface, an A5 or B5 port of the test-end USB interface is connected to the power adapter 602 through the second interface 600. The A5 or B5 port of the test end USB interface is connected to the control chip 601 through the power adapter 602, so that the control chip 601 accesses an adapted current (e.g. 0.5A).

As shown in fig. 6 and 7, in some embodiments, when the second interface 600 is connected to the host USB interface 200, the control chip 601 is connected to the B7 terminal of the host USB interface 200 through the second interface 600. After the control chip 601 obtains that the host finishes the signal test of one side of the USB interface at the test end, a high-level signal is sent to the multipath connector 501, so as to perform the signal test of the other side.

As shown in fig. 6 and 7, in some embodiments, the multiple connector 501 further includes a second ground pin positioned at the first port of the multiple connector 501.

The second grounding pin may be provided in two, including 5020 pin and 5021 pin.

As shown in fig. 6 and 7, when the test-side USB interface and the host-side USB interface 200 are connected by the test connection line, the A1, A2, A3, A4, A5, A8, A9, a10, a11, a12, B1, B2, B3, B4, B5, B8, B9, B10, B11, B12 terminals of the test-side USB interface are connected to the A1, A2, A3, A4, A5, A8, A9, a10, a11, a12, B1, B2, B3, B4, B5, B8, B9, B10, B11, B12 terminals of the host-side USB interface 200, respectively, and the A5 or B5 ports can be used to transmit and receive signals, respectively, for initial connection operations of the host-side USB interface 200 and the test-side USB interface. Wherein the connection line between the connection terminal and the terminals (at least the A1, a12, B1, B12, A4, A9, B4, B9 terminals) is capable of supporting the overcurrent capability of 5A.

The above description is intended to be illustrative and not limiting, and variations, modifications, alternatives, and variations of the above embodiments may be made by those of ordinary skill in the art within the scope of the present disclosure. Also, the above examples (or one or more aspects thereof) may be used in combination with each other, and it is contemplated that the embodiments may be combined with each other in various combinations or permutations.

Claims

1. The utility model provides a test connecting wire of USB interface, is used for the connection of host computer end USB interface and test end USB interface, its characterized in that, test connecting wire includes first interface and the second interface of being connected through the cable, be equipped with multichannel connector in the first interface, be equipped with control chip in first interface or the second interface, multichannel connector has be used for connecting first port of first interface and be used for connecting the second port of second interface, first port is equipped with first pair of connecting pin and second pair of connecting pin, the second port is equipped with the control pin, the control pin is in under control of control chip has the instruction level signal, when the instruction level signal is low level, switch on with first passageway between the first pair of connecting pin and disconnection and second are to the second passageway between the connecting pin, and when the instruction level signal is high level, disconnection first passageway and intercommunication the second passageway, be convenient for the signal test to the both sides of test end USB interface.

2. The USB interface test connection of claim 1, wherein the test-side USB interface and the host-side USB interface are Type-C USB interfaces, respectively.

3. The USB interface test connection of claim 2, wherein the first interface and the second interface are Type-C USB interfaces respectively mated with the test-side USB interface and the host-side USB interface.

4. A test connection line for a USB interface according to claim 3, wherein when the first interface is connected to the test-side USB interface, the first pair of connection pins are connected to the A6 and A7 terminals of the test-side USB interface through the first interface, respectively, and the second pair of connection pins are connected to the B6 and B7 terminals of the test-side USB interface through the first interface, respectively.

5. A test connection line for a USB interface as claimed in claim 3, wherein the second port is further provided with a first ground pin, and the first ground pin is a low level signal when the control pin is a low level signal or a high level signal.

6. A test connection line for a USB interface according to claim 3, wherein the second port is further provided with a third pair of connection pins, and the third pair of connection pins are connected to the A6 and A7 terminals of the host-side USB interface through the second interface, respectively, when the second interface is connected to the host-side USB interface.

7. A test connection line for a USB interface as claimed in claim 3, wherein said second port is further provided with a power pin, said power pin being connected to a B6 terminal of said host-side USB interface via said second interface when said second interface is connected to said host-side USB interface.

8. A test connection line for a USB interface according to claim 3, wherein the second interface is provided with a power adapter, the power adapter being connected to the control chip, and the A5 port of the test-end USB interface being connected to the power adapter through the second interface when the second interface is connected to the test-end USB interface.

9. A test connection line for a USB interface as claimed in claim 3, wherein said control pin is connected to the B7 terminal of said host-side USB interface via said second interface when said second interface is connected to said host-side USB interface.

10. A test connection line for a USB interface as claimed in claim 3, wherein the multi-way connector further comprises a second ground pin positioned at the first port of the multi-way connector.