CN211180149U - General testing arrangement of low frequency cable subassembly conductivity - Google Patents

General testing arrangement of low frequency cable subassembly conductivity Download PDF

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Publication number
CN211180149U
CN211180149U CN201922214365.5U CN201922214365U CN211180149U CN 211180149 U CN211180149 U CN 211180149U CN 201922214365 U CN201922214365 U CN 201922214365U CN 211180149 U CN211180149 U CN 211180149U
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frequency cable
low
data
test
low frequency
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张联
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Chengdu Yihang Electronics Co ltd
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Chengdu Yihang Electronics Co ltd
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Abstract

The utility model relates to a general testing arrangement of low frequency cable subassembly conductivity, include: the system comprises a user interface device used for inputting test data by a user and receiving and displaying a test result, wherein the user interface device is connected with a data processing device with a chip, the data processing device is connected with an I/O resource device used for sending and receiving off-line level through a data bus, and the I/O resource device is connected with a test switching device used for being in butt joint with a connector interface of a low-frequency cable assembly to be tested through a discrete wire. The utility model discloses can effectively improve the efficiency of software testing to the connectivity of low frequency cable subassembly, reduce the time cost of test by a wide margin, improve efficiency of software testing. And simultaneously, the utility model discloses only test switching equipment need carry out corresponding adaptation according to the low frequency cable subassembly of difference, and other parts all need not change, have effectively guaranteed testing arrangement's commonality.

Description

General testing arrangement of low frequency cable subassembly conductivity
Technical Field
The utility model relates to a testing arrangement specifically says to general testing arrangement of low frequency cable subassembly conductivity.
Background
The cable assembly is an assembly combination of a set of wires, cables, connectors and accessories, and can be installed or disassembled as one component after processing, arrangement and arrangement. All the wiring of the machine can be assembled by a plurality of cable components, so that the cable components are the most basic constituent units of the whole machine interconnection and are also the core of the whole machine cable interconnection design technology. The low-frequency cable assembly is commonly used for low-speed digital signal transmission, the low-speed digital signal transmission has low requirement on the cable assembly, and the requirement can be met only by detecting connectivity, so a connectivity testing device is required for the cable assembly of the low-speed digital signal.
Because the low frequency cable subassembly is diversified, the universal meter is directly adopted to manually detect the on-off of the pins of the low frequency cable subassembly one by one usually, and the on-off condition of each pin is manually recorded, so that the detection mode is obviously low in efficiency and needs to be improved.
SUMMERY OF THE UTILITY MODEL
The utility model provides a general testing arrangement of low frequency cable subassembly continuity to the low frequency cable subassembly continuity test that provides high efficiency and commonality.
The utility model discloses general testing arrangement of low frequency cable subassembly conductivity, include: the system comprises a user interface device used for inputting test data by a user and receiving and displaying a test result, wherein the user interface device is connected with a data processing device with a chip, the data processing device is connected with an I/O resource device used for sending and receiving off-line level through a data bus, and the I/O resource device is connected with a test switching device used for being in butt joint with a connector interface of a low-frequency cable assembly to be tested through a discrete wire.
The user inputs the detection data through the user interface equipment, and the user interface equipment sends the test data to the data processing equipment; or receiving and displaying the test result returned by the data processing equipment. An input device and a display device are included in the user interface apparatus.
The data processing equipment receives test data sent by the user interface equipment through a chip in the data processing equipment, maps the test data into corresponding write-in addresses, write-in data, waiting time, read addresses and theoretical read data, writes the corresponding write-in data into the write-in addresses through a parallel data bus, sets the waiting time according to the length of a low-frequency line, reads the data from the read addresses through the parallel data bus after waiting for the waiting time, judges whether the read data is the same as the theoretical read data, if the read data is the same as the theoretical read data, the test is passed, otherwise, the test is not passed, and finally sends a test result to the user interface equipment for display.
The I/O resource equipment converts various data transmitted by the data processing equipment through the bus into corresponding offline high/low levels and transmits the offline high/low levels to the test switching equipment; or, the high/low level transmitted by the test switching equipment off line is converted into the data on the corresponding address to be transmitted to the data processing equipment through the bus.
The test switching equipment is used for adapting to a connector interface of the low-frequency cable assembly to be tested.
Furthermore, in the test switching equipment, a plug is provided for butting against a connector interface of the low-frequency cable assembly to be tested, the plug is provided with a connected insulator and an insulating head, a built-in circuit board is arranged in the insulator, a data cable welded with the circuit board is arranged at the rear end of the insulator, a butting hole is arranged at the front end of the insulating head, and a conductive terminal is arranged in the butting hole and welded on the circuit board and electrically connected with the data cable.
One preferred configuration is that the transverse arrangement of the conductive terminals in the docking aperture is: the data cable comprises a power supply terminal, a first pair of differential signal terminals, a ground terminal, a second pair of differential signal terminals, a receiving terminal, a third pair of differential signal terminals and a transmitting terminal, wherein each terminal in the conductive terminals is respectively arranged in one-to-one correspondence with the data cable.
Preferably, an observation window is arranged on the insulator of the plug, and indicator lights with different colors corresponding to the observation window are arranged on the circuit board. After the plug is in butt joint with the connector of the low-frequency cable assembly, if the power supply or other signal terminals have no data signal transmission, the red indicator lamp on the circuit board is used for prompting, and the green indicator lamp is turned on when the plug is normal. The operating personnel can in time know the communication state through the colour of observation window observation pilot lamp.
Optionally, in order to enable the plug to be more firmly connected with the connector of the low-frequency cable assembly to be tested and avoid poor contact or the situation that the plug falls off in the test process, a buckle for fixing the plug and the connector interface of the low-frequency cable assembly to be tested is arranged on the plug, and the plug can be tightly and firmly connected with the connector of the low-frequency cable assembly to be tested through the buckle.
On the basis, each low-frequency line in the connector interface of the low-frequency cable assembly to be tested is correspondingly connected with one discrete line for receiving the offline level and one discrete line for sending the offline level in the test switching equipment respectively.
Furthermore, the user interface device is connected with the data processing device through a wireless network in the form of Ethernet or local area network.
Furthermore, the data processing device and the I/O resource device share one system-level chip, so that the structure of the whole testing device can be simplified, the data processing is centralized, the intermediate transmission process is reduced, and the conversion among data is avoided.
The utility model discloses a general testing arrangement of low frequency cable subassembly continuity can effectively improve the efficiency of software testing to low frequency cable subassembly connectivity, has overcome the test limitation of manual test and record among the prior art, has reduced the time cost of test by a wide margin, has improved efficiency of software testing. And simultaneously the utility model discloses a testing arrangement has still guaranteed the commonality of test, and only test switching equipment need carry out corresponding adaptation according to the low frequency cable subassembly of difference, and other parts all need not change, only need according to the low frequency cable subassembly of difference input different test data can, effectively guaranteed testing arrangement's commonality.
The utility model discloses in the data processing procedure that involves, all can be by the ordinary skilled person in this field according to the conventional principle of low frequency cable subassembly test and data processing, combine the utility model discloses a concrete application realizes, and this part is not the utility model discloses an innovation place.
The above-mentioned aspects of the present invention will be further described in detail with reference to the following embodiments. This should not be understood as limiting the scope of the above-described subject matter of the present invention to the following examples only. Various substitutions and alterations according to the general technical knowledge and conventional means in the field are included in the scope of the present invention without departing from the technical idea of the present invention.
Drawings
Fig. 1 is a block diagram of the general testing device for conductivity of the low-frequency cable assembly of the present invention.
Fig. 2 is a schematic diagram of a plug structure of the test patch device of fig. 1.
Fig. 3 is a schematic view of the internal structure of fig. 2.
Detailed Description
The utility model discloses in the data processing procedure that involves, all can be by the ordinary skilled person in this field according to the conventional principle of low frequency cable subassembly test and data processing, combine the utility model discloses a concrete application realizes, and this part is not the utility model discloses an innovation place.
As shown in fig. 1 the utility model discloses a general testing arrangement of low frequency cable subassembly conductivity, include: user interface equipment for user to input test data and receive and display test result, the user interface equipment includes input device and display device. The user interface device is connected to a data processing device having a chip through an ethernet, and the data processing device is connected to an I/O resource device for transmitting and receiving an offline level through a data bus. The I/O resource equipment is connected with test switching equipment which is used for being in butt joint with a connector interface of the low-frequency cable assembly to be tested through discrete lines, and each low-frequency line in the connector interface of the low-frequency cable assembly to be tested is correspondingly connected with one discrete line for receiving the offline level and one discrete line for sending the offline level in the test switching equipment respectively.
As shown in fig. 2 and 3, the test adapter is provided with a plug for mating with the connector interface of the low frequency cable assembly to be tested. The plug is internally provided with an insulator 1 and an insulating head 2 which are connected, and the plug is also provided with a buckle 3 which enables the plug and a connector interface of the low-frequency cable component to be tested to be mutually fixed. A built-in circuit board 6 is provided inside the insulator 1. The rear end of the insulator 1 is provided with a data cable 4 welded with the circuit board 6, the front end of the insulating head 2 is provided with a butt joint hole 5, a conductive terminal is arranged in the butt joint hole, and the conductive terminal is welded on the circuit board 6 and is electrically connected with the data cable 4. Wherein the transverse arrangement of the conductive terminals is as follows: a power supply terminal 71, a first pair of differential signal terminals 72, a ground terminal 75, a second pair of differential signal terminals 73, a reception terminal 76, a third pair of differential signal terminals 74, and a transmission terminal 77. The conductive terminals respectively correspond to the data cables. One low-frequency line in the connector interface of the low-frequency cable assembly to be tested corresponds to one receiving terminal 76 and one transmitting terminal 77, and the receiving discrete line and the transmitting discrete line in the data cable 4 are correspondingly connected through the receiving terminal 76 and the transmitting terminal 77 respectively.
An observation window 8 is arranged on the insulator 1 of the plug, and indicator lights 9 with different colors corresponding to the observation window 8 are arranged on the circuit board 6. After the plug is in butt joint with the connector of the low-frequency cable assembly, if no data signal is transmitted by a power supply or other signal terminals, a red indicator lamp on the circuit board 6 is used for prompting, and if the plug is normal, a green indicator lamp is turned on. The operator can observe the color of the indicator light 9 through the observation window 8, and can know the communication state in time.
The user inputs the detection data through the user interface equipment, and the user interface equipment sends the test data to the data processing equipment; or receiving and displaying the test result returned by the data processing equipment.
The data processing equipment receives test data sent by the user interface equipment through a chip in the data processing equipment, maps the test data into corresponding write-in addresses, write-in data, waiting time, read addresses and theoretical read data, writes the corresponding write-in data into the write-in addresses through a parallel data bus, sets the waiting time according to the length of a low-frequency line, reads the data from the read addresses through the parallel data bus after waiting for the waiting time, judges whether the read data is the same as the theoretical read data, if the read data is the same as the theoretical read data, the test is passed, otherwise, the test is not passed, and finally sends a test result to the user interface equipment for display.
The I/O resource equipment converts various data transmitted by the data processing equipment through the bus into corresponding offline high/low levels and transmits the offline high/low levels to the test switching equipment; or, the high/low level transmitted by the test switching equipment off line is converted into the data on the corresponding address to be transmitted to the data processing equipment through the bus.
The data processing equipment and the I/O resource equipment share a ZYNQ series system-level chip of Xilinx company, so that the structure of the whole testing device can be simplified, the data processing is centralized, the intermediate transmission process is reduced, and the conversion among data is avoided.
The test switching equipment is used for adapting to a connector interface of the low-frequency cable assembly to be tested.
When the connectivity of the low-frequency cable assembly is tested through the testing equipment, firstly, a testing vector is established: according to the connection relation between the low-frequency cable assembly to be tested and the test switching equipment, establishing a mapping relation between the discrete lines and n low-frequency lines in a connector interface of the low-frequency cable assembly to be tested, wherein each low-frequency line corresponds to two discrete lines, for example, the low-frequency line 1 is connected with the receiving discrete line 1 and the sending discrete line 1W, the low-frequency line 2 is connected with the receiving discrete line 2 and the sending discrete line 2, and so on, wherein the sending discrete line is used for sending high/low levels, and the receiving discrete line is used for receiving the high/low levels sent by the sending discrete line;
then, according to the mapping relation between the 2n discrete lines and the n low-frequency lines, establishing the mapping relation between the low-frequency lines and the writing address, the writing data, the reading address and the theoretical reading data; then according to the length of the low-frequency line, establishing a mapping relation between the low-frequency line and the waiting time;
and finally, establishing a test vector of the low-frequency line according to the mapping relation between the low-frequency line and the write address, the write data, the waiting time, the read address and the theoretical read data.
And step two, executing a test vector: the user interface equipment sends the test vector of the low-frequency line to the data processing equipment; and then the data processing equipment maps the test vector into a write address, write data, waiting time, a read address and theoretical read data, writes corresponding write data into the write address through a parallel data bus, reads data from the read address through the parallel data bus after the waiting time, judges whether the read data is the same as the theoretical read data, if so, the current test case of the low-frequency line passes the test, otherwise, the current test case does not pass the test. And if the test case which does not pass once appears in the test process, terminating the subsequent test case test of the low-frequency line. And finally, the data processing equipment sends the test result to the user interface equipment through the Ethernet.
And the user interface equipment receives the returned result and stores the returned result, if all the test cases of the low-frequency line pass, the low-frequency line is displayed to be normal, and otherwise, the low-frequency cable is displayed to be abnormal.
For the same low-frequency cable assembly, the connectivity test of the low-frequency cable assembly can be executed for multiple times only by once establishing the test vector.

Claims (8)

1. General testing arrangement of low frequency cable subassembly conductivity, its characteristic includes: the system comprises a user interface device used for inputting test data by a user and receiving and displaying a test result, wherein the user interface device is connected with a data processing device with a chip, the data processing device is connected with an I/O resource device used for sending and receiving off-line level through a data bus, and the I/O resource device is connected with a test switching device used for being in butt joint with a connector interface of a low-frequency cable assembly to be tested through a discrete wire.
2. The low frequency cable assembly continuity universal test apparatus of claim 1, wherein: the test switching equipment is characterized in that a plug in butt joint with a connector interface of a low-frequency cable assembly to be tested is arranged, an insulator (1) and an insulating head (2) which are connected are arranged in the plug, a built-in circuit board (6) is arranged inside the insulator (1), a data cable (4) welded with the circuit board (6) is arranged at the rear end of the insulator (1), a butt joint hole (5) is formed in the front end of the insulating head (2), and a conductive terminal is arranged in the butt joint hole and welded on the circuit board (6) and electrically connected with the data cable (4).
3. The low frequency cable assembly continuity universal test apparatus of claim 2, wherein: the transverse arrangement of the conductive terminals in the butt-joint holes is as follows: the data cable comprises a power supply terminal (71), a first pair of differential signal terminals (72), a ground terminal (75), a second pair of differential signal terminals (73), a receiving terminal (76), a third pair of differential signal terminals (74) and a transmitting terminal (77), wherein each terminal in the conductive terminals is respectively arranged in one-to-one correspondence with the data cable (4).
4. The low frequency cable assembly continuity universal test apparatus of claim 3, wherein: an observation window (8) is arranged on the insulator (1) of the plug, and indicator lights (9) with different colors corresponding to the observation window (8) are arranged on the circuit board (6).
5. The low frequency cable assembly continuity universal test apparatus of claim 2, wherein: the plug is provided with a buckle (3) which enables the plug and the connector interface of the low-frequency cable component to be tested to be mutually fixed.
6. General test apparatus for the conductivity of low frequency cable assemblies as claimed in any one of claims 1 to 5, characterized by: each low-frequency line in the connector interface of the low-frequency cable assembly to be tested is correspondingly connected with one discrete line for receiving the offline level and one discrete line for sending the offline level in the test switching equipment respectively.
7. General test apparatus for the conductivity of low frequency cable assemblies as claimed in any one of claims 1 to 5, characterized by: the user interface equipment is connected with the data processing equipment through a wireless network.
8. General test apparatus for the conductivity of low frequency cable assemblies as claimed in any one of claims 1 to 5, characterized by: the data processing device and the I/O resource device share one system level chip.
CN201922214365.5U 2019-12-10 2019-12-10 General testing arrangement of low frequency cable subassembly conductivity Active CN211180149U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201922214365.5U CN211180149U (en) 2019-12-10 2019-12-10 General testing arrangement of low frequency cable subassembly conductivity

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201922214365.5U CN211180149U (en) 2019-12-10 2019-12-10 General testing arrangement of low frequency cable subassembly conductivity

Publications (1)

Publication Number Publication Date
CN211180149U true CN211180149U (en) 2020-08-04

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN201922214365.5U Active CN211180149U (en) 2019-12-10 2019-12-10 General testing arrangement of low frequency cable subassembly conductivity

Country Status (1)

Country Link
CN (1) CN211180149U (en)

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