CN220084941U - Novel probe for chip connection test - Google Patents
Novel probe for chip connection test Download PDFInfo
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- CN220084941U CN220084941U CN202321551199.8U CN202321551199U CN220084941U CN 220084941 U CN220084941 U CN 220084941U CN 202321551199 U CN202321551199 U CN 202321551199U CN 220084941 U CN220084941 U CN 220084941U
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- piece
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- holding
- novel probe
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- 239000000523 sample Substances 0.000 title claims abstract description 26
- 238000012360 testing method Methods 0.000 title claims abstract description 26
- 238000004519 manufacturing process Methods 0.000 abstract description 6
- 238000010586 diagram Methods 0.000 description 4
- 238000000034 method Methods 0.000 description 2
- 230000006835 compression Effects 0.000 description 1
- 238000007906 compression Methods 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 238000004080 punching Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
Abstract
The utility model discloses a novel probe for chip connection test, which is characterized by comprising a first terminal (1) and a second terminal (2); one end of the first terminal (1) is arranged on one side of the second terminal (2) in a sliding manner. Compared with the pogo pin structure, the novel probe for chip connection test disclosed by the utility model has better mass production, can be produced in batches by a die, can greatly reduce the cost, ensures the consistency of products, can be smaller and more precise in distance, and can meet the requirement of smaller and smaller chip distance at present.
Description
Technical Field
The utility model belongs to the technical field of chip connection, and particularly relates to a novel probe for chip connection test.
Background
The pogo pin is a precise connector applied to electronic products such as mobile phones and the like, and is widely applied to semiconductor equipment to play a role in connection.
The structural member of the existing chip connector, as shown in fig. 1, is generally connected with the main board by adopting a spring car member structure of pogo pins, and each chip needs to be turned separately to process the corresponding pogo pin, so that the manufacturing cost is high and the product consistency is poor.
Disclosure of Invention
The utility model aims to provide a novel probe for chip connection test.
The utility model provides a novel probe for chip connection test, which comprises a first terminal (1) and a second terminal (2); one end of the first terminal (1) is arranged on one side of the second terminal (2) in a sliding manner.
Preferably, the novel probe for chip connection test provided by the utility model further comprises a spring (3); one end of the spring (3) is connected with the bottom of the second terminal (2).
Preferably, the second terminal (2) comprises a first connecting piece (26); the first terminal (1) comprises a first elastic sheet (11); the first elastic sheet (11) is arranged on one side of the first connecting sheet (26) in a sliding manner.
Preferably, the first elastic sheet (11) is arc-shaped.
Preferably, the first terminal (1) further comprises a first holding piece (13) and a second connecting piece (12); the two ends of the second connecting sheet (12) are respectively fixed with the first holding sheet (13) and the first elastic sheet (11); the second connecting piece (12) is inclined to one side of the first holding piece (13).
Preferably, the width of the first holding piece (13) is larger than the width of the first elastic piece (11); the width of the bottom of the second connecting sheet (12) is the same as the width of the first holding sheet (13), and the width of the top of the second connecting sheet (12) is the same as the width of the first elastic sheet (11), so that the second connecting sheet (12) is in a trapezoid structure.
Preferably, both ends of the first holding piece (13) are provided with first positioning pieces (14) extending outwards.
Preferably, the first holding piece (13), the first positioning piece (14), the second connecting piece (12) and the first elastic piece (11) are of an integrated structure.
Preferably, the second terminal (2) further comprises a second spring piece (21); the second elastic sheet (21) is arranged at the top of the first connecting sheet (26); the second elastic sheet (21) and the first connecting sheet (26) are of an integral structure.
Preferably, an arc-shaped lug (22) protruding to one side of the second elastic piece (21) is arranged at the center of the second elastic piece; the top of the second elastic sheet (21) is of an arc-shaped structure.
Preferably, the second terminal (2) further comprises a second holding piece (23) and a third elastic piece (24); one end of the third elastic sheet (24) is fixed with the bottom of the second holding sheet (23); one end of the third elastic sheet (24) far away from the second holding sheet (23) extends outwards to one side of the second holding sheet (23); the bottom of the third elastic piece (24) is connected with the top of the spring (3); the third elastic sheet (24) and the second holding sheet (23) are of an integrated structure.
Preferably, the second holding piece (23) is fixed at the bottom of the first connecting piece (26); second locating pieces (25) extending downwards are arranged at two ends of the bottom of the second fixing piece (23); the second holding piece (23) and the first connecting piece (26) are of an integral structure.
Compared with the pogo pin structure, the novel probe for chip connection test provided by the utility model has better mass production, can realize mass production of dies, can greatly reduce the cost, ensures the consistency of products, and can be smaller and more precise in distance, thereby meeting the requirement of smaller and smaller chip distance at present.
Drawings
Fig. 1 is a schematic diagram of a spring car component structure of pogo pin in the prior art according to the background of the utility model;
FIG. 2 is a schematic diagram of a first cross-sectional structure of a novel probe connection mount assembly for chip attach testing according to the present utility model;
FIG. 3 is a schematic diagram showing a second cross-sectional structure of a new probe connection mount assembly for chip attach testing according to the present utility model;
fig. 4 is a schematic top view of a second terminal according to an embodiment of the present utility model;
fig. 5 is a schematic left-view structural diagram of a second terminal according to an embodiment of the present utility model;
fig. 6 is a schematic front view of a second terminal according to an embodiment of the present utility model;
fig. 7 is a schematic bottom view of a second terminal according to an embodiment of the present utility model;
fig. 8 is a schematic left-view structure of a first terminal according to an embodiment of the present utility model;
fig. 9 is a schematic front view of a second terminal according to an embodiment of the present utility model;
fig. 10 is a schematic bottom view of a second terminal according to an embodiment of the present utility model.
Detailed Description
For the purpose of making the objects, technical solutions and advantages of the embodiments of the present utility model more apparent, the technical solutions of the embodiments of the present utility model will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present utility model, and it is apparent that the described embodiments are some embodiments of the present utility model, but not all embodiments of the present utility model. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.
As shown in fig. 2 to 10, the novel probe for chip attach testing provided in this embodiment includes a first terminal 1 and a second terminal 2; one end of the first terminal 1 is slidably disposed on one side of the second terminal 2. It can be understood by those skilled in the art that the top of the second terminal 2 is used for being connected with a chip, and the bottom of the first terminal 1 is used for being connected with a test PCB after a solder ball is soldered, and the electrical path of the novel probe for chip connection test provided by the embodiment is realized by sliding the top of the first terminal 1 on one side of the second terminal 2. The first terminal 1 and the second terminal 2 are both assembled on the connection base 4, and the first terminal 1 and the second terminal 2 are assembled through the connection base 4, which is not described herein. The novel probe provided by the implementation of the pogo pin structure has better mass production performance, can be produced in batches by a die, can be greatly reduced in cost, can ensure the consistency of products, can be smaller and more precise in distance, and can adapt to the requirement of smaller and smaller chip distance at present.
Further, the novel probe for chip connection test provided in this embodiment further includes a spring 3; one end of the spring 3 is connected to the bottom of the second terminal 2. It will be appreciated by those skilled in the art that the other end of the spring 3 is fixed to the connection base 4, and provides a support and a forward force to the second terminal 2, so that the second terminal 2 is in stable contact with the chip, and simultaneously provides a compression and resilience force to the second terminal 2, so as to adapt to chip tests of different types, and prevent the second terminal 2 from being damaged after the chip is pressed down.
Further, the second terminal 2 includes a first connecting piece 26; the first terminal 1 comprises a first spring piece 11; the first elastic piece 11 is slidably disposed on one side of the first connecting piece 26. As will be appreciated by those skilled in the art, when the second terminal 2 is assembled to the connection base 4, one side of the first connection piece 26 contacts the connection base 4, and the first spring piece 11 is slidably connected to the other side of the first connection piece 26, so that a conductive connection between the first terminal 1 and the second terminal 2 is achieved.
Further, the first elastic piece 11 is arc-shaped. As will be appreciated by those skilled in the art, such a structure can protect the first connecting piece 26 from being scratched by the sharp portion at the top of the first spring piece 11, thereby improving the use rate of the second terminal 2.
Further, the first terminal 1 further includes a first holding piece 13 and a second connecting piece 12; the two ends of the second connecting piece 12 are respectively fixed with the first holding piece 13 and the first elastic piece 11; the second connecting piece 12 is inclined to one side of the first holding piece 13. It will be appreciated by those skilled in the art that, after the first terminal 1 is assembled to the connection base 4, the first elastic sheet 11 can be firmly clamped on the first connection sheet 26 by the elastic force provided by the second connection sheet 12 which is obliquely arranged, so that the connection stability of the novel probe provided by the embodiment can be ensured.
Further, the width of the first holding piece 13 is larger than the width of the first elastic piece 11; the width of the bottom of the second connecting piece 12 is the same as the width of the first holding piece 13, and the width of the top of the second connecting piece 12 is the same as the width of the first elastic piece 11, so that the second connecting piece 12 has a trapezoid structure. It can be understood by those skilled in the art that the width of the first elastic sheet 11 is smaller, so that the sliding resistance between the first elastic sheet 11 and the first connecting sheet 26 is smaller, so that the sliding is smoother, and the second connecting sheet 12 with the trapezoid structure can save materials while ensuring the elasticity, thereby reducing the production cost.
Further, the first fixing piece 13 is provided with a first positioning piece 14 extending outwards at two ends. As will be appreciated by those skilled in the art, the first positioning piece 14 is used to mount the first terminal 1 on the connection base 4 so that it does not shake.
Further, the first holding piece 13, the first positioning piece 14, the second connecting piece 12 and the first elastic piece 11 are integrally formed. As will be appreciated by those skilled in the art, such a structure enables the first terminal 1 to be formed by a plurality of times of stamping, facilitating processing while ensuring uniformity of the terminals.
Further, the second terminal 2 further includes a second spring piece 21; the second elastic sheet 21 is arranged on the top of the first connecting sheet 26; the second elastic piece 21 and the first connecting piece 26 are integrally formed. It will be appreciated by those skilled in the art that the second terminal 2 may be obtained by stamping, so that the terminal is simple to machine and consistent performance is ensured. The second elastic piece 21 is used for being connected with the chip.
Further, an arc-shaped lug 22 protruding to one side of the second elastic piece 21 is arranged at the center of the second elastic piece; the top of the second elastic piece 21 is in an arc structure. It will be appreciated by those skilled in the art that the arc-shaped tab 22 may be formed by punching the second elastic sheet 21, and the tab may enable a certain displacement in the pin needle pressing process, and may also have better contact performance with respect to the pogpin straight up and down structure.
Further, the second terminal 2 further includes a second holding piece 23 and a third spring piece 24; one end of the third elastic piece 24 is fixed with the bottom of the second holding piece 23; one end of the third elastic sheet 24 away from the second holding sheet 23 extends outwards to one side of the second holding sheet 23; the bottom of the third elastic piece 24 is connected with the top of the spring 3; the third elastic piece 24 and the second holding piece 23 are integrally formed. As will be appreciated by those skilled in the art, the third spring piece 24 is configured to interface with the spring 3 to ensure stability and sliding up and down of the first terminal 1.
Further, the second holding piece 23 is fixed to the bottom of the first connecting piece 26; the two ends of the bottom of the second holding piece 23 are provided with second positioning pieces 25 extending downwards; the second holding piece 23 and the first connecting piece 26 are integrally formed. The second positioning piece 25 is used for fitting and positioning the second terminal 2, as will be understood by those skilled in the art.
Finally, it should be noted that: the above embodiments are only for illustrating the technical solution of the present utility model, and are not limiting; although the utility model has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical scheme described in the foregoing embodiments can be modified or some technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit and scope of the technical solutions of the embodiments of the present utility model.
Claims (10)
1. A novel probe for chip attach testing, characterized by comprising a first terminal (1) and a second terminal (2); one end of the first terminal (1) is arranged on one side of the second terminal (2) in a sliding manner.
2. The novel probe for chip attach testing according to claim 1, further comprising a spring (3); one end of the spring (3) is connected with the bottom of the second terminal (2).
3. The novel probe for chip attach testing according to claim 2, characterized in that the second terminal (2) comprises a first connection tab (26); the first terminal (1) comprises a first elastic sheet (11); the first elastic sheet (11) is arranged on one side of the first connecting sheet (26) in a sliding manner;
the first elastic sheet (11) is arc-shaped.
4. A novel probe for chip attach testing according to claim 3, characterized in that the first terminal (1) further comprises a first holding piece (13) and a second connecting piece (12); the two ends of the second connecting sheet (12) are respectively fixed with the first holding sheet (13) and the first elastic sheet (11); the second connecting piece (12) is inclined to one side of the first holding piece (13).
5. The novel probe for chip attach test according to claim 4, wherein the width of the first holding piece (13) is larger than the width of the first spring piece (11); the width of the bottom of the second connecting sheet (12) is the same as the width of the first holding sheet (13), and the width of the top of the second connecting sheet (12) is the same as the width of the first elastic sheet (11), so that the second connecting sheet (12) is in a trapezoid structure;
the two ends of the first holding piece (13) are provided with first positioning pieces (14) extending outwards.
6. The novel probe for chip attach test according to claim 5, wherein the first holding piece (13), the first positioning piece (14), the second connecting piece (12) and the first spring piece (11) are in an integral structure.
7. The novel probe for chip attach testing according to claim 6, characterized in that the second terminal (2) further comprises a second spring plate (21); the second elastic sheet (21) is arranged at the top of the first connecting sheet (26); the second elastic sheet (21) and the first connecting sheet (26) are of an integral structure.
8. The novel probe for chip connection test according to claim 7, wherein the second spring plate (21) is provided with an arc-shaped lug (22) protruding to one side thereof at the center position; the top of the second elastic sheet (21) is of an arc-shaped structure.
9. The novel probe for chip attach testing according to claim 8, characterized in that the second terminal (2) further comprises a second holding piece (23) and a third spring piece (24); one end of the third elastic sheet (24) is fixed with the bottom of the second holding sheet (23); one end of the third elastic sheet (24) far away from the second holding sheet (23) extends outwards to one side of the second holding sheet (23); the bottom of the third elastic piece (24) is connected with the top of the spring (3); the third elastic sheet (24) and the second holding sheet (23) are of an integrated structure.
10. The new probe for chip attach testing according to claim 9, characterized in that the second holding piece (23) is fixed at the bottom of the first connecting piece (26); second locating pieces (25) extending downwards are arranged at two ends of the bottom of the second fixing piece (23); the second holding piece (23) and the first connecting piece (26) are of an integral structure.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321551199.8U CN220084941U (en) | 2023-06-16 | 2023-06-16 | Novel probe for chip connection test |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321551199.8U CN220084941U (en) | 2023-06-16 | 2023-06-16 | Novel probe for chip connection test |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN220084941U true CN220084941U (en) | 2023-11-24 |
Family
ID=88828140
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202321551199.8U Active CN220084941U (en) | 2023-06-16 | 2023-06-16 | Novel probe for chip connection test |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN220084941U (en) |
-
2023
- 2023-06-16 CN CN202321551199.8U patent/CN220084941U/en active Active
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| GR01 | Patent grant | ||
| GR01 | Patent grant |