CN219935930U - Novel chip test terminal - Google Patents
Novel chip test terminal Download PDFInfo
- Publication number
- CN219935930U CN219935930U CN202321165831.5U CN202321165831U CN219935930U CN 219935930 U CN219935930 U CN 219935930U CN 202321165831 U CN202321165831 U CN 202321165831U CN 219935930 U CN219935930 U CN 219935930U
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- China
- Prior art keywords
- terminal
- elastic
- novel chip
- chip test
- elastic piece
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- 238000012360 testing method Methods 0.000 title claims abstract description 41
- 229910000679 solder Inorganic materials 0.000 description 10
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 239000000523 sample Substances 0.000 description 2
- 229920000742 Cotton Polymers 0.000 description 1
- 230000005489 elastic deformation Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000002035 prolonged effect Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
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Abstract
The utility model discloses a novel chip test terminal which is characterized by comprising a first terminal part, a fixing part and a second terminal part; the first terminal part and the second terminal part are respectively arranged at two ends of the fixing part; the first terminal portion and the second terminal portion are both directed to the same side of the holding portion; the first terminal part comprises a first elastic sheet and two second elastic sheets; one ends of the two second elastic sheets are respectively fixed at two sides of one end of the first elastic sheet, and the other ends of the two second elastic sheets are both fixed with one end of the fixing part. The novel chip testing terminal disclosed by the utility model has a simple structure and can be reused, so that the testing cost can be reduced.
Description
Technical Field
The utility model belongs to the technical field of chip connection, and particularly relates to a novel chip test terminal.
Background
When the chip and the main board are tested, the chip is welded on the test main board in an SMT (Surface Mount Technology, surface assembling technology) mode, or the chip is connected with the main board through a probe type connector, however, the chip cannot be detached through the SMT welding mode, so that the test main board and the chip cannot be reused, the experimental cost is high, and the structure is complex and the cost is high by using the probe type connector to connect the test.
Disclosure of Invention
The utility model aims to provide a novel chip test terminal.
The utility model provides a novel chip test terminal, which comprises a first terminal part (1), a fixing part (2) and a second terminal part (3); the first terminal part (1) and the second terminal part (3) are respectively arranged at two ends of the fixing part (2); the first terminal part (1) and the second terminal part (3) are both oriented to the same side of the holding part (2); the first terminal part (1) comprises a first elastic sheet (13) and two second elastic sheets (11); one ends of the two second elastic pieces (11) are respectively fixed at two sides of one end of the first elastic piece (13), and the other ends of the two second elastic pieces (11) are fixed with one end of the fixing part (2).
Preferably, one end of the first elastic piece (13) away from the second elastic piece (11) is bent and extended towards the second terminal portion (3), so that the first elastic piece (13) is in a U-shaped structure.
Preferably, a first through hole (14) is arranged in the central area of the first elastic sheet (13). Preferably, a first groove (12) is further formed in the top of the first elastic sheet (13), and the first groove (12) and the first through hole (14) are coaxially arranged; the top aperture of the first groove (12) is larger than the bottom aperture, and the bottom aperture of the first groove (12) is the same as the aperture of the first through hole (14).
Preferably, both the second elastic pieces (11) are of an S-shaped structure.
Preferably, the second terminal portion (3) includes a third elastic piece (31) and a fourth elastic piece (33); one end of the third elastic sheet (31) is fixed at one end of the holding part (2) far away from the first terminal part (1); one end of the third elastic piece (31) far away from the fixing part (2) is fixed with one end of the fourth elastic piece (33); one end of the fourth elastic piece (33) far away from the third elastic piece (31) is bent and extended towards the direction of the first elastic piece (13).
Preferably, the third elastic sheet (31) is arc-shaped.
Preferably, the third elastic sheet (31) is provided with an opening.
Preferably, the first terminal part (1), the holding part (2) and the second terminal part (3) are integrally formed.
Preferably, the holding part (2) is sheet-shaped.
Preferably, the four top corners of the holding part (2) are provided with protruding parts (21) extending longitudinally and outwards.
The novel chip test terminal provided by the utility model is assembled with the test board (5) through the fixing part (2), so that the novel chip test terminal provided by the utility model is detachably assembled on the test board (5), the chip (4) and the test board (5) are reused for a plurality of times, the test cost is reduced, in addition, the novel chip test terminal provided by the utility model has a simple structure, can be produced in a continuous stamping die mode, the cost is greatly reduced, and the consistency of the terminal is obviously improved.
Drawings
FIG. 1 is a schematic diagram of a novel chip test terminal according to the present utility model;
fig. 2 is a schematic structural diagram of the novel chip test terminal and the test board assembled in the present utility model.
Detailed Description
For the purpose of making the objects, technical solutions and advantages of the embodiments of the present utility model more apparent, the technical solutions of the embodiments of the present utility model will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present utility model, and it is apparent that the described embodiments are some embodiments of the present utility model, but not all embodiments of the present utility model. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.
As shown in fig. 1 and 2, the novel chip test terminal provided in the present embodiment includes a first terminal portion 1, a holding portion 2, and a second terminal portion 3; the first terminal part 1 and the second terminal part 3 are respectively arranged at two ends of the fixing part 2; the first terminal part 1 and the second terminal part 3 are both oriented to the same side of the holding part 2; the first terminal part 1 comprises a first elastic piece 13 and two second elastic pieces 11; one ends of the two second elastic pieces 11 are respectively fixed at two sides of one end of the first elastic piece 13, and the other ends of the two second elastic pieces 11 are both fixed with one end of the holding part 2. It can be understood by those skilled in the art that the fixing portion 2 is assembled with the test board 5, so that the novel chip test terminal provided in this embodiment is detachably assembled on the test board 5, so that the chip 4 and the test board 5 are reused for multiple times, and the cost of the test is reduced.
Further, an end of the first elastic piece 13 away from the second elastic piece 11 is bent and extended toward the second terminal portion 3, so that the first elastic piece 13 has a U-shaped structure. It will be appreciated by those skilled in the art that the first spring 13 of the U-shaped structure provides an increased contact surface with the solder balls 6 while providing a spring force, thereby achieving a good connection with the chip 4.
Further, a first through hole 14 is provided in a central area of the first elastic piece 13. Those skilled in the art will understand that the solder balls 6 of the chip 4 may fall into the first through holes 14, so as to further improve the stability of the first spring 13 and the solder balls 6. As will be appreciated by those skilled in the art, the aperture of the first through hole 14 can be designed according to the size of the solder ball 6, so that when the solder ball 6 contacts with the terminal, the bottom of the solder ball 6 can fall into the first through hole 14 of the terminal first, and when the chip 4 contacts with the terminal completely, the solder ball 6 falls into the first through hole 14 of the terminal, so that the terminal is prevented from being biased to a single side, the service life of the connector is prolonged, and the contact stability with the solder ball 6 is increased.
Further, a first groove 12 is further provided at the top of the first elastic piece 13, and the first groove 12 and the first through hole 14 are coaxially arranged; the top aperture of the first recess 12 is larger than the bottom aperture, and the bottom aperture of the first recess 12 is the same as the aperture of the first through hole 14. It can be understood by those skilled in the art that the top of the first through hole 14 is designed with a chamfer, so that the top aperture of the first groove 12 is larger than the bottom aperture, thus forming a slope around the top of the first through hole 14, further increasing the contact cotton area between the solder ball 6 and the first elastic sheet 13, and further improving the contact stability of the solder ball 6.
Further, both the second elastic pieces 11 have an S-shaped structure. Those skilled in the art will appreciate that the second spring 11 with an S-shaped structure can provide better elastic deformation, so as to protect the terminal from excessive pressing force of the chip 4, so that the terminal is deformed, thereby losing deformation force, and further, the service life of the novel chip testing terminal provided by the embodiment is improved.
Further, the second terminal portion 3 includes a third spring piece 31 and a fourth spring piece 33; one end of the third elastic piece 31 is fixed at one end of the holding portion 2 away from the first terminal portion 1; one end of the third elastic piece 31 far away from the holding portion 2 is fixed with one end of the fourth elastic piece 33; one end of the fourth elastic piece 33, which is far away from the third elastic piece 31, is bent and extended toward the first elastic piece 13. As will be appreciated by those skilled in the art, the fourth spring 33 is configured to contact the PCB.
Further, the third elastic piece 31 is arc-shaped. It will be appreciated by those skilled in the art that the curved third spring 31 may provide a certain deformation force, thereby reducing the pressing force when the fourth spring 33 contacts the PCB, and thus protecting the fourth spring 33 from damage.
Further, the third spring 31 is provided with an opening. Those skilled in the art will appreciate that this may reduce the application of the material without reducing the deformation performance of the third spring 31, thereby reducing the production cost of the enterprise.
Further, the first terminal portion 1, the holding portion 2 and the second terminal portion 3 are integrally formed. It can be understood by those skilled in the art that the novel chip test terminal provided by the embodiment has a simple structure, can be produced by a continuous stamping die, reduces the production links of enterprises, and also reduces the production cost.
Further, the holding portion 2 is sheet-shaped. Those skilled in the art will appreciate that the sheet-like holding portion 2 is easily punched out. The holding portion 2 may be provided in a hollow barrel-like structure.
Further, the four apex angles of the holding portion 2 are provided with protruding portions 21 extending longitudinally and outwardly. As will be appreciated by those skilled in the art, the protruding portion 21 is used to clamp the test terminal provided in the present embodiment to the test board 5.
Finally, it should be noted that: the above embodiments are only for illustrating the technical solution of the present utility model, and are not limiting; although the utility model has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical scheme described in the foregoing embodiments can be modified or some technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit and scope of the technical solutions of the embodiments of the present utility model.
Claims (10)
1. A novel chip test terminal, which is characterized by comprising a first terminal part (1), a fixing part (2) and a second terminal part (3); the first terminal part (1) and the second terminal part (3) are respectively arranged at two ends of the fixing part (2); the first terminal part (1) and the second terminal part (3) are both oriented to the same side of the holding part (2); the first terminal part (1) comprises a first elastic sheet (13) and two second elastic sheets (11); one ends of the two second elastic pieces (11) are respectively fixed at two sides of one end of the first elastic piece (13), and the other ends of the two second elastic pieces (11) are fixed with one end of the fixing part (2).
2. The novel chip testing terminal according to claim 1, wherein one end of the first spring piece (13) away from the second spring piece (11) is bent and extended toward the second terminal portion (3), so that the first spring piece (13) has a U-shaped structure.
3. The novel chip test terminal according to claim 2, wherein the central area of the first spring plate (13) is provided with a first through hole (14).
4. A novel chip testing terminal according to claim 3, wherein the top of the first spring plate (13) is further provided with a first groove (12), and the first groove (12) and the first through hole (14) are coaxially arranged; the top aperture of the first groove (12) is larger than the bottom aperture, and the bottom aperture of the first groove (12) is the same as the aperture of the first through hole (14).
5. The novel chip test terminal according to claim 4, wherein both of the second spring pieces (11) have an S-shaped structure.
6. The novel chip test terminal according to claim 5, wherein the second terminal portion (3) includes a third spring piece (31) and a fourth spring piece (33); one end of the third elastic sheet (31) is fixed at one end of the holding part (2) far away from the first terminal part (1); one end of the third elastic piece (31) far away from the fixing part (2) is fixed with one end of the fourth elastic piece (33); one end of the fourth elastic piece (33) far away from the third elastic piece (31) is bent and extended towards the direction of the first elastic piece (13).
7. The novel chip test terminal according to claim 6, wherein the third spring plate (31) is arc-shaped; the third elastic sheet (31) is provided with an opening.
8. The novel chip test terminal according to claim 7, wherein the first terminal portion (1), the holding portion (2) and the second terminal portion (3) are of an integrally formed structure.
9. The novel chip test terminal according to claim 8, wherein the holding portion (2) is sheet-like.
10. The novel chip test terminal according to claim 9, wherein four apex angles of the holding portion (2) are provided with protruding portions (21) extending longitudinally and outwardly.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321165831.5U CN219935930U (en) | 2023-05-15 | 2023-05-15 | Novel chip test terminal |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321165831.5U CN219935930U (en) | 2023-05-15 | 2023-05-15 | Novel chip test terminal |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN219935930U true CN219935930U (en) | 2023-10-31 |
Family
ID=88490626
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202321165831.5U Active CN219935930U (en) | 2023-05-15 | 2023-05-15 | Novel chip test terminal |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN219935930U (en) |
-
2023
- 2023-05-15 CN CN202321165831.5U patent/CN219935930U/en active Active
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| GR01 | Patent grant | ||
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