CN214622745U - S-shaped elastic test piece and test equipment - Google Patents
S-shaped elastic test piece and test equipment Download PDFInfo
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- CN214622745U CN214622745U CN202120492440.9U CN202120492440U CN214622745U CN 214622745 U CN214622745 U CN 214622745U CN 202120492440 U CN202120492440 U CN 202120492440U CN 214622745 U CN214622745 U CN 214622745U
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Abstract
The utility model relates to the technical field of test equipment, in particular to an S-shaped elastic test piece and test equipment, wherein the S-shaped elastic test piece comprises a head part which is in contact connection with a test contact of an electronic device, an elastic part which is used for driving the head part to support the test contact along the X-axis direction, and a tail part which is used for being electrically connected with the test equipment; the head comprises a first testing elastic sheet used for abutting against the testing connection point along the X-axis direction and a second testing elastic sheet used for abutting against the testing connection point along the Y-axis direction. The utility model provides a S type elasticity test piece and test equipment can carry out reliable contact with electron device and be connected, and difficult pine takes off, and then improves the test reliability.
Description
Technical Field
The utility model relates to a test equipment technical field especially relates to a S type elasticity test piece and test equipment.
Background
Before an electronic device leaves a factory, an electrical test is required, generally, an elastic test piece for contacting with a test contact of the electronic device is arranged on a test station of a test instrument, and the elastic test piece has certain deformation capacity, so that the elastic test piece can support the test contact and keep contact type electrical connection with the electronic device.
At present market electronic device is of a great variety, and the test is more and more high to the requirement of electricity connection reliability, and traditional elasticity test piece breaks away from with electronic device's test contact easily, and the stability of electricity connection is relatively poor, is difficult to satisfy the requirement.
Therefore, there is a need for an improved elastic test strip that is easy to detach when it is in contact connection with an electronic device.
SUMMERY OF THE UTILITY MODEL
An object of the utility model is to provide a S type elasticity test piece and test equipment can carry out reliable contact with electron device and be connected, and difficult pine takes off, and then improves the test reliability.
In order to achieve the above objects, in one aspect, the present invention provides an S-shaped elastic test strip, which includes a head portion for contacting and connecting with a test contact of an electronic device, an elastic portion for urging the head portion to abut against the test contact along an X-axis direction, and a tail portion for electrically connecting with a circuit board of a test apparatus;
the head comprises a first testing elastic sheet used for abutting against the testing connection point along the X-axis direction and a second testing elastic sheet used for abutting against the testing connection point along the Y-axis direction.
Preferably, a spacing space is arranged between the first testing elastic sheet and the second testing elastic sheet.
Preferably, the length of the second testing elastic sheet is greater than that of the first testing elastic sheet, the surface of the first testing elastic sheet close to the testing contact is a first elastic sheet abutting surface, and the surface of the part of the second testing elastic sheet protruding out of the first testing elastic sheet facing the first testing elastic sheet is a second elastic sheet abutting surface;
the test contact comprises a first contact abutting surface abutting against the first elastic sheet abutting surface and a second contact abutting surface abutting against the second elastic sheet abutting surface.
Preferably, the second elastic sheet abutting surface is provided with a groove, and the second contact abutting surface is provided with a convex hook clamped in the groove.
Preferably, the protruding hook abuts against the groove.
Preferably, the elastic part is provided with a plurality of U-shaped elastic structures, and the directions of openings between two adjacent U-shaped elastic structures are opposite.
Preferably, the middle part of the elastic part is provided with an elastic through groove, and the elastic through groove divides the elastic part into a first serpentine part and a second serpentine part.
Preferably, the tail part is provided with a plurality of conical bosses.
In another aspect, a test apparatus is provided, comprising any one of the S-shaped elastic test strips.
The beneficial effects of the utility model reside in that: the utility model provides a test contact is supported from X axle direction and Y axle direction respectively to first test shell fragment and second test shell fragment, compares with traditional one-way supporting, and two-way supporting mode area of contact is bigger, and locking performance is also better, and not fragile test contact, so can carry out reliable contact with electron device and be connected, improve test reliability.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without inventive exercise.
FIG. 1 is a schematic structural diagram of an S-shaped elastic test strip according to an embodiment;
fig. 2 is a partially enlarged schematic view of a portion a in fig. 1.
In the figure:
1. a head portion; 101. a first test spring plate; 102. a second test spring plate; 1021. a groove; 103. an intervening space;
2. an elastic portion; 201. an elastic through groove; 202. a first serpentine; 203. a second serpentine;
3. a tail portion; 301. a conical boss;
4. testing the contact; 401. and (4) convex hooks.
Detailed Description
In order to make the objects, features and advantages of the present invention more obvious and understandable, the embodiments of the present invention are clearly and completely described with reference to the drawings in the embodiments of the present invention, and obviously, the embodiments described below are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative efforts belong to the protection scope of the present invention.
In the description of the present invention, it is to be understood that when an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present. When a component is referred to as being "disposed on" another component, it can be directly on the other component or intervening components may also be present.
Furthermore, the terms "long", "short", "inner", "outer", and the like indicate orientations or positional relationships based on the orientations or positional relationships illustrated in the drawings, and are only for convenience of describing the present invention, but do not indicate or imply that the device or element referred to must have the specific orientation, operate in the specific orientation configuration, and thus, should not be construed as limiting the present invention.
The technical solution of the present invention is further explained by the following embodiments with reference to the accompanying drawings.
Referring to fig. 1 and 2, the present embodiment provides a test apparatus including an S-shaped elastic test strip for making contact connection with test contacts 4 of an electronic device to achieve electrical connection.
For convenience of description, the present embodiment constructs a rectangular coordinate system including an X axis and a Y axis, wherein the X axis direction and the Y axis direction are perpendicular to each other, and the S-shaped elastic test strip and the test contacts 4 are arranged along the X axis direction.
The S-shaped elastic test piece comprises a head part 1 which is used for being in contact connection with a test contact 4 of an electronic device, an elastic part 2 which is used for driving the head part 1 to abut against the test contact 4 along the X-axis direction, and a tail part 3 which is used for being electrically connected with a circuit board of test equipment.
The head 1 comprises a first testing elastic sheet 101 for abutting against the testing contact 4 along the X-axis direction and a second testing elastic sheet 102 for abutting against the testing contact 4 along the Y-axis direction.
The first testing elastic sheet 101 and the second testing elastic sheet 102 provided by the embodiment respectively support the testing contact 4 from the X-axis direction and the Y-axis direction, and compared with the traditional one-way support, the two-way support has larger contact area and better anti-loosening performance, so that reliable contact connection can be performed with an electronic device, and the testing reliability is improved.
In this embodiment, an interval space 103 is provided between the first testing elastic sheet 101 and the second testing elastic sheet 102, so that a certain deformation capacity is provided between the first testing elastic sheet 101 and the second testing elastic sheet 102. Further, the spacing space 103 includes a strip-shaped through groove located at one end close to the testing contact 4 and an inverted triangular through groove located at one end far from the testing contact 4, and this design scheme can enable a large lateral elastic force to be provided between the two testing elastic pieces.
The length of the second testing elastic sheet 102 is greater than that of the first testing elastic sheet 101, the surface of the first testing elastic sheet 101 close to the testing contact 4 is a first elastic sheet abutting surface, and the surface of the part of the second testing elastic sheet 102 protruding out of the first testing elastic sheet 101 facing the first testing elastic sheet 101 is a second elastic sheet abutting surface. The test contact 4 comprises a first contact abutting surface abutting against the first elastic sheet abutting surface and a second contact abutting surface abutting against the second elastic sheet abutting surface.
It should be noted that, after the test contact 4 abuts against the S-shaped elastic test piece, the elastic portion 2 will abut against the first test elastic piece 101 upward, so that the first test elastic piece 101 and the test contact 4 are in close contact under the acting force in the X-axis direction. The size of the space 103 when the S-shaped elastic test strip abuts against the test contact 4 is slightly larger than the size in the natural state, and after the test contact 4 abuts against the S-shaped elastic test strip, the second test spring 102 has a tendency to move in a direction approaching the first test spring 101, and the tendency forces the second test spring 102 to maintain close contact with the test contact 4 under the action force in the Y-axis direction.
Optionally, the second elastic sheet abutting surface is provided with a groove 1021, the second contact abutting surface is provided with a protruding hook 401 clamped into the groove 1021, so that the anti-loosening effect is achieved, further, the protruding hook 401 abuts against the groove 1021, and the contact area between the test contact 4 and the S-shaped elastic test strip is increased.
In this embodiment, the elastic portion 2 is provided with a plurality of U-shaped elastic structures, and the directions of openings between two adjacent U-shaped elastic structures are opposite, so that the elastic portion 2 is integrally S-shaped, and a large deformation elasticity is generated.
Optionally, the middle part of elastic part 2 is equipped with elasticity and leads to groove 201, elasticity leads to groove 201 will elastic part 2 is separated for first snake-shaped part 202 and second snake-shaped part 203, has further improved the deformation elasticity of elastic part 2, is favorable to improving the biggest static friction force between S type elasticity test piece and the test connection 4 to the reinforcing is prevented taking off the performance.
Further, the number of the elastic through slots 201 may be one or more.
In this embodiment, afterbody 3 is equipped with a plurality of toper bosss 301, and toper boss 301 and test equipment' S circuit board joint further play the effect that prevents the aversion of S type elasticity test piece, reliability when greatly having improved the test of S type elasticity test piece. Specifically, the plurality of tapered bosses 301 are arranged laterally to form a saw-tooth shape.
The S-shaped elastic testing piece provided by the embodiment is based on the traditional similar products to perform structural optimization innovation, another new contact surface is added under the condition of the traditional single contact surface, the problem of poor test stability of the similar products can be effectively solved, the technical bias that the thickness of the elastic testing piece can only be increased for increasing the elastic force of the elastic testing piece in the industry is overcome, the risk that the appearance of the product is easily damaged due to overlarge elastic force is avoided, because the elastic force in the Y-axis direction is overlarge, the limit of static friction force can be broken through by the testing contact 4, and the S-shaped elastic testing piece pops out towards the direction far away from the second testing elastic piece 102.
The above embodiments are only used to illustrate the technical solution of the present invention, and not to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, it should be understood by those skilled in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; such modifications and substitutions do not depart from the spirit and scope of the present invention in its corresponding aspects.
Claims (9)
1. An S-shaped elastic test piece is characterized by comprising a head part, an elastic part and a tail part, wherein the head part is used for being in contact connection with a test contact of an electronic device, the elastic part is used for driving the head part to abut against the test contact along the X-axis direction, and the tail part is used for being electrically connected with a circuit board of test equipment;
the head comprises a first testing elastic sheet used for abutting against the testing connection point along the X-axis direction and a second testing elastic sheet used for abutting against the testing connection point along the Y-axis direction.
2. The S-shaped elasticity test piece of claim 1, wherein a spacing space is arranged between the first test spring piece and the second test spring piece.
3. The S-shaped elasticity test piece of claim 2, wherein the length dimension of the second test spring piece is greater than the length dimension of the first test spring piece, the surface of the first test spring piece close to the test contact is a first spring piece abutting surface, and the surface of the part of the second test spring piece protruding out of the first test spring piece facing the first test spring piece is a second spring piece abutting surface;
the test contact comprises a first contact abutting surface abutting against the first elastic sheet abutting surface and a second contact abutting surface abutting against the second elastic sheet abutting surface.
4. The S-shaped elasticity test piece according to claim 3, wherein the second elastic piece abutting surface is provided with a groove, and the second contact abutting surface is provided with a convex hook clamped in the groove.
5. The S-shaped elasticity test piece of claim 4, wherein the protruding hook abuts against the groove.
6. The S-shaped elasticity test piece according to claim 1, wherein the elastic part is provided with a plurality of U-shaped elastic structures, and the openings between two adjacent U-shaped elastic structures face in opposite directions.
7. The S-shaped elastic test strip of claim 6, wherein an elastic channel is disposed in the middle of the elastic portion, the elastic channel separating the elastic portion into a first serpentine portion and a second serpentine portion.
8. The S-shaped elastic test strip of claim 1, wherein the tail portion is provided with a plurality of tapered bosses.
9. A test apparatus comprising the S-shaped elastic test piece according to any one of claims 1 to 8.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202120492440.9U CN214622745U (en) | 2021-03-08 | 2021-03-08 | S-shaped elastic test piece and test equipment |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202120492440.9U CN214622745U (en) | 2021-03-08 | 2021-03-08 | S-shaped elastic test piece and test equipment |
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| CN214622745U true CN214622745U (en) | 2021-11-05 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN202120492440.9U Active CN214622745U (en) | 2021-03-08 | 2021-03-08 | S-shaped elastic test piece and test equipment |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113917306A (en) * | 2021-12-07 | 2022-01-11 | 深圳市诺泰芯装备有限公司 | High-temperature test piece module and device for packaged product |
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2021
- 2021-03-08 CN CN202120492440.9U patent/CN214622745U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113917306A (en) * | 2021-12-07 | 2022-01-11 | 深圳市诺泰芯装备有限公司 | High-temperature test piece module and device for packaged product |
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