CN219960588U - Radio frequency test equipment - Google Patents

Abstract

The embodiment of the utility model discloses radio frequency test equipment. The radio frequency connectors with different types are arranged in the radio frequency test equipment, the number of the radio frequency connectors with any type is one or more, each radio frequency connector is connected with the test circuit, the test circuit can be connected with different equipment to be tested through the radio frequency connectors with different types, test signals are sent to the different equipment to be tested, reflected signals and test feedback signals of the equipment to be tested are received, the controller determines test data according to the test signals, the reflected signals and the test feedback signals, and the test data are displayed through the display device. Therefore, the device can be connected with different devices to be tested without configuring an additional radio frequency adapter, so that the different devices to be tested can be tested, the test operation is simplified, the test efficiency is improved, and the device has higher universality.

Description

Radio frequency test equipment

Technical Field

The utility model relates to the field of signal testing, in particular to radio frequency testing equipment.

Background

In scientific research and production processes, signal testing is usually required, so that the radio frequency test equipment is a high-precision intelligent test instrument which is very important in the field of signal testing and has a wider application range. The radio frequency test device can be used for measuring and analyzing functional characteristics (such as impedance characteristics and the like) and parameters (such as S parameters, reflection coefficients and the like) of various radio frequency and microwave devices and components (namely, devices to be tested), such as phased array radars, 5G base stations, antennas, filters, precision guidance devices, aerospace devices and the like.

In the prior art, a specific Type of radio frequency port (for example, N Type radio frequency port) is generally configured for a radio frequency test device to test a device to be tested having the same Type of radio frequency port, so that the radio frequency test device in the prior art can accurately measure and analyze the functional characteristics and parameters of the specific device to be tested in a predetermined test scenario. Further, the RF test device may also be connected to a plurality of devices under test having different types of RF ports via an RF adapter (e.g., an SMA RF adapter, etc.).

On the one hand, because the radio frequency test equipment in the prior art is only configured with one specific type of radio frequency port, the radio frequency test equipment cannot be suitable for different test scenes, and a plurality of to-be-tested equipment with different radio frequency ports cannot be tested, so that the limitation is high; on the other hand, in the switching process of adopting the radio frequency adapter in the prior art, a special torque wrench is generally required to be used so as to realize that the radio frequency test equipment is connected with the equipment to be tested through the external radio frequency adapter, so that the test operation is complicated, the test efficiency is low, and a plurality of special torque wrenches are required to be configured, so that the test cost is high.

Disclosure of Invention

Therefore, an object of the embodiments of the present utility model is to provide a radio frequency test device, which can test different devices to be tested without configuring an additional radio frequency adapter to connect the radio frequency test device and the devices to be tested, and has the advantages of simplifying test operation, improving test efficiency, and having higher universality.

In a first aspect, an embodiment of the present utility model provides a radio frequency test apparatus, including:

a plurality of radio frequency interfaces, wherein the plurality of radio frequency interfaces comprise radio frequency connectors with different models, and the number of the radio frequency connectors of any model is one or more; and

the test circuit is connected with the radio frequency interface and is configured to be connected with equipment to be tested through the radio frequency interface and send a test signal to the equipment to be tested for testing.

In some embodiments, the test circuit comprises:

at least one first radio frequency switch;

the radio frequency test device further comprises:

at least one key connected to the first radio frequency switch and configured to send a first control signal to the first radio frequency switch in response to being triggered;

wherein the first radio frequency switch is configured to connect with a corresponding one of the radio frequency interfaces in response to receiving the first control signal.

In some embodiments, the test circuit further comprises:

test signal generating means configured to generate the test signal.

In some embodiments, the test circuit further comprises:

at least one second radio frequency switch connected to the test signal generating means;

at least one directional coupler connected with the first radio frequency switch and the second radio frequency switch;

the test signal generating device is further configured to send the test signal to the device to be tested for testing through the directional coupler and the radio frequency interface.

In some embodiments, the test circuit further comprises:

at least one first test receiver connected to the directional coupler;

wherein the test signal generating means is further configured to transmit the test signal to the first test receiver via the directional coupler.

In some embodiments, the directional coupler is configured to obtain a reflected signal of the device under test through the radio frequency interface.

In some embodiments, the test circuit further comprises:

a second test receiver connected to the directional coupler;

wherein the directional coupler is further configured to transmit the reflected signal to the second test receiver.

In some embodiments, the test circuit further comprises:

and the third test receiver is configured to acquire a test feedback signal of the device to be tested through the radio frequency interface.

In some embodiments, the radio frequency test device further comprises:

a display device;

and the controller is connected with the first test receiver, the second test receiver and the third test receiver, and is configured to determine test data according to the test signals, the reflection signals and the test feedback signals, and display the test data through the display device.

In some embodiments, the controller is further configured to control the second radio frequency switch to conduct such that the test signal generating device is connected to the directional coupler through the second radio frequency switch.

The utility model is implemented by arranging radio frequency connectors with different types in radio frequency test equipment, wherein the number of the radio frequency connectors with any type is one or more, connecting each radio frequency connector with a test circuit, enabling the test circuit to be connected with different equipment to be tested through the radio frequency connectors with different types, sending test signals to different equipment to be tested, receiving reflected signals and test feedback signals of the equipment to be tested, determining test data by a controller according to the test signals, the reflected signals and the test feedback signals, and displaying the test data by a display device. Therefore, the device can be connected with different devices to be tested without configuring an additional radio frequency adapter, so that the different devices to be tested can be tested, the test operation is simplified, the test efficiency is improved, and the device has higher universality.

Drawings

The above and other objects, features and advantages of the present utility model will become more apparent from the following description of embodiments of the present utility model with reference to the accompanying drawings, in which:

FIG. 1 is a schematic diagram of a radio frequency test equipment circuit according to an embodiment of the present utility model;

FIG. 2 is a schematic diagram of a radio frequency test device according to an embodiment of the present utility model;

FIG. 3 is a circuit diagram of a test circuit in an embodiment of the utility model;

FIG. 4 is a circuit diagram of a first RF switch in an embodiment of the utility model;

FIG. 5 is an equivalent circuit diagram of a device under test in an embodiment of the utility model;

fig. 6 is an equivalent circuit diagram of testing a device under test in an embodiment of the present utility model.

Detailed Description

The present utility model is described below based on examples, but the present utility model is not limited to only these examples. In the following detailed description of the present utility model, certain specific details are set forth in detail. The present utility model will be fully understood by those skilled in the art without the details described herein. Well-known methods, procedures, flows, components and circuits have not been described in detail so as not to obscure the nature of the utility model.

Moreover, those of ordinary skill in the art will appreciate that the drawings are provided herein for illustrative purposes and that the drawings are not necessarily drawn to scale.

Unless specifically stated or limited otherwise, the terms "mounted," "connected," "secured" and the like should be construed broadly, as they may be fixed, removable, or integral, for example; can be mechanically or electrically connected; either directly or indirectly, through intermediaries, or both, may be in communication with each other or in interaction with each other, unless expressly defined otherwise. The specific meaning of the above terms in the present utility model can be understood by those of ordinary skill in the art according to the specific circumstances.

Meanwhile, it should be understood that in the following description, "circuit" refers to a conductive loop constituted by at least one element or sub-circuit through electrical connection or electromagnetic connection. When an element or circuit is referred to as being "connected to" another element or being "connected between" two nodes, it can be directly coupled or connected to the other element or intervening elements may be present and the connection between the elements may be physical, logical, or a combination thereof. In contrast, when an element is referred to as being "directly coupled to" or "directly connected to" another element, it means that there are no intervening elements present between the two.

Unless the context clearly requires otherwise, the words "comprise," "comprising," and the like in the description are to be construed in an inclusive sense as opposed to an exclusive or exhaustive sense; that is, it is the meaning of "including but not limited to".

In the description of the present utility model, it should be understood that the terms "first," "second," and the like are used for descriptive purposes only and are not to be construed as indicating or implying relative importance. Furthermore, in the description of the present utility model, unless otherwise indicated, the meaning of "a plurality" is two or more.

In the following description, a radio frequency test device, i.e., a network analyzer, is taken as an example. Network analyzers such as vector network analyzers (Vector Network Analyzer, VNA), scalar network analyzers (Scalar Network Analyzer, SNA), time domain network analyzers (Time Domain Network Analyzer, TDNA), mixed network analyzers (Heterodyne Network Analyzer, HNA), and the like. The vector network analyzer is used for measuring parameters such as amplitude and phase of a radio frequency signal, S parameters, impedance, reflection coefficient and the like. Scalar network analyzers are used to measure power and phase of radio frequency signals, etc. The time domain network analyzer is used for measuring time domain response, transmission characteristics, reflection characteristics and the like of the radio frequency signals. The mixing network analyzer can be used for measuring the amplitude and the phase of a radio frequency signal, and can also be used for measuring the performance of a high-frequency circuit and the like. It should be understood that the radio frequency test device according to the present utility model may also be a device capable of performing radio frequency signal test in the field of signal test, for example, the radio frequency test device may also be a spectrum analyzer, a power meter, a frequency meter, an electromagnetic field tester, etc. The spectrum analyzer is used for performing spectrum analysis on the radio frequency signal, and can measure parameters such as frequency, amplitude, bandwidth and the like of the radio frequency signal. The power meter is used for measuring the power of the radio frequency signal, and can test the parameters such as the output power, the input power and the like of the radio frequency signal. The frequency meter is used for measuring the frequency of the radio frequency signal, and can test parameters such as frequency stability, frequency precision and the like of the radio frequency signal. The electromagnetic field tester is used for measuring the electromagnetic field intensity of the radio frequency signal, and can test parameters such as radiation characteristics, electromagnetic compatibility and the like of the radio frequency signal.

FIG. 1 is a schematic diagram of a radio frequency test device circuit according to an embodiment of the present utility model. As shown in fig. 1, the Radio Frequency test device circuit of the present embodiment includes a controller 1, a display device 2, a test circuit 3, and a plurality of Radio Frequency interfaces RF (Radio Frequency). The controller 1 is connected to the display device 2 and the test circuit 3. The test circuit 3 is connected to a plurality of radio frequency interfaces RF, and the test circuit 3 can be connected to a plurality of devices A1, A2 to be tested via the plurality of radio frequency interfaces RF. Meanwhile, the devices A1 and A2 to be tested are devices with different types of radio frequency interfaces. Correspondingly, reference may be made to fig. 2 for a schematic diagram of a radio frequency test device.

FIG. 2 is a schematic diagram of a radio frequency test apparatus according to an embodiment of the present utility model. As shown in fig. 2, the radio frequency test device of the present embodiment includes the radio frequency test device circuit shown in fig. 1, a control panel 4, and a power switch 5. Wherein the power switch 5 is connected with the controller 1. The plurality of radio frequency interfaces RF comprise radio frequency connectors having different models. Specifically, the plurality of radio frequency interfaces RF includes a plurality of first-type radio frequency connectors and a plurality of second-type radio frequency connectors. The plurality of first model radio frequency connectors includes RF11 and RF12. The plurality of second-model radio frequency connectors includes RF21 and RF22. The control panel 4 includes a plurality of touch-controllable keys 41, 42 and a test option key 43, and the keys 41, 42 are connected with the test circuit 3, and the test option key 43 is connected with the controller 1. Meanwhile, the first type RF connectors RF11, RF12 and the second type RF connectors RF21, RF22 are connected with the test circuit 3, so that the test circuit 3 can be connected with different devices to be tested through different types of RF interfaces RF to test, and the type of the RF interface of the device to be tested A1 is the same as the type of the first type RF connectors RF11, RF12, and the type of the RF interface of the device to be tested A2 is the same as the type of the second type RF connectors RF21, RF22.

In this embodiment, the power switch 5 sends a power-on signal to the controller 1 in response to being triggered, so that the controller 1 controls each component in the network analyzer to be powered on.

In this embodiment, the controller 1 may be an electronic device having functions of data processing, data transmission, data storage, and the like. After receiving the power-on signal sent by the power switch 5, the controller 1 can control each component in the network analyzer to be powered on. Further, after the test circuit 3 is connected to the device to be tested through the multiple radio frequency interfaces RF, the controller 1 may control the test circuit 3 to send a test signal to the device to be tested, so as to implement the test of the device to be tested. Further, the controller 1 may determine the test data according to the test signal, the reflected signal of the device to be tested, and the test feedback signal, and display the test data through the display device 2.

In an alternative embodiment, after detecting that the test circuit 3 is connected to the device to be tested through the plurality of radio frequency interfaces RF, the controller 1 automatically sends a test start signal to the test circuit 3, so as to control the test circuit 3 to send a test signal to the device to be tested for testing.

In another alternative embodiment, the user may set the radio frequency signal parameters (such as S parameter, impedance, etc.) to be acquired through the test option key 43, and then the test option key 43 sends a test start signal to the controller 1 in response to being triggered, so that the controller 1 sends a test start signal to the test circuit 3 to control the test circuit 3 to send a test signal to the device to be tested for testing. Wherein the S-parameters (Scattering Parameters, SP), i.e. scattering parameters, are a set of parameters describing the transmission and reflection characteristics of the radio frequency signal in the radio frequency circuit. That is, the S-parameter characterizes the relationship between the voltage and current at the input port and the voltage and current at the output port. Thus, the S-parameter may be used to describe various characteristics of the radio frequency circuit, such as transmission characteristics, reflection characteristics, impedance matching, etc., so that the performance of the radio frequency circuit may be evaluated and the design of the radio frequency circuit may be optimized based on the S-parameter. Further, S parameters include S11, S12, S21, and S22. S11 represents an input reflection coefficient, namely an input return loss, and is used for describing a coefficient of reflecting a signal input by a radio frequency port back to the radio frequency port signal (namely a reflection signal), namely, because impedance mismatch exists between the device to be tested and the network analyzer, in the process that the test circuit 3 sends a test signal to the device to be tested through the radio frequency interface RF, part of the test signal is reflected at a receiving port of the device to be tested, namely, transmission of the test signal is interfered, and accuracy of a test result of the radio frequency signal is affected. S22 characterizes the output reflection coefficient, i.e. the output return loss. S12 characterizes the reverse transmission coefficient, i.e. the isolation. S21 characterizes the forward transmission coefficient, i.e. the gain.

Optionally, because the device to be tested may have impedance mismatch with the network analyzer, the accuracy of the radio frequency signal test result is affected, and in this case, the utility model may set an impedance matching network between the multiple radio frequency interfaces RF and the device to be tested, so that the device to be tested is impedance matched with the network analyzer. That is, the network analyzer may further include an impedance matching network, which may be implemented by a transformer, a transmission line having a predetermined characteristic impedance, an adjustable capacitor, an adjustable resistor, or the like.

The controller 1 may include a general-purpose computer hardware structure such as a memory and a processor, which are connected by a bus. Wherein the memory is adapted to store instructions or programs executable by the processor. The processor may be a stand-alone microprocessor or a collection of one or more microprocessors. Therefore, the processor controls each component in the network analyzer to be electrified, controls the test circuit 3 to send a test signal to be tested to test, controls other components in the network analyzer and the like by executing the instructions stored in the memory. The processor may be implemented by an MCU (Microcontroller Unit, micro control unit), a single chip microcomputer, a PLC (Programmable Logic Controller ), an FPGA (Field-Programmable Gate Array, field programmable gate array), a DSP (Digital Signal Processor ) or an ASIC (Application Specific Integrated Circuit, application specific integrated circuit).

In this embodiment, the first Type RF connectors RF11 and RF12 are N Type interfaces. The N Type interface belongs to a radio frequency coaxial connector and is used for connecting a network analyzer and equipment to be tested. Because the N Type interface has better waterproof, dustproof and anti-interference capabilities, the method can be suitable for a poor test scene. Meanwhile, the N Type interface has lower insertion loss and reflection loss, and can provide high-quality test signal transmission. And the connection mode of N Type interface is comparatively simple, adopts threaded connection mode generally, convenient and fast.

In this embodiment, the second type RF connectors RF21 and RF22 are SMA interfaces. The SMA interface belongs to a radio frequency coaxial connector and is used for connecting a network analyzer and equipment to be tested. The SMA interface has the characteristics of wider frequency range (such as DC-18 GHz), better impedance matching, better stability and the like, so that the SMA interface can be suitable for different testing scenes. Therefore, the network analyzer can be connected with different devices to be tested without configuring an additional radio frequency adapter, so that the different devices to be tested can be tested, the test operation is simplified, the test efficiency is improved, and the network analyzer has higher universality

In the present embodiment, the plurality of radio frequency interfaces RF are described as including the first type radio frequency connectors RF11, RF12 and the second type radio frequency connectors RF21 and RF22, but the plurality of radio frequency interfaces RF of the present embodiment may also include other types of radio frequency connectors, for example, the plurality of radio frequency interfaces RF may also include the third type radio frequency connector RF3 and the fourth type radio frequency connector RF4. The third type RF connector RF3 may be a BNC type RF connector (i.e., a radio frequency coaxial connector with a snap-in connection). The fourth type RF connector RF4 may be a TNC type RF connector (i.e., a micro connector), or the fourth type RF connector RF4 may be an MMCX type RF connector, an SMB type RF connector, or the like. Correspondingly, the present embodiment is described by taking two first-type RF connectors RF11, RF12 and two second-type RF connectors RF21 and RF22 as examples, but the number of the first-type RF connectors and the second-type RF connectors may be one or plural.

Alternatively, the plurality of radio frequency interfaces RF may have a predetermined distance from the lower bottom surface 6 of the network analyzer. That is, the heights of the plurality of radio frequency interfaces RF and the lower bottom surface 6 of the network analyzer can be appropriately adjusted according to the requirements, so that different numbers of radio frequency interfaces RF can be flexibly set. Thus, the method has higher universality.

In the present embodiment, the circuit diagram of the test circuit 3 may refer to fig. 3.

FIG. 3 is a circuit diagram of a test circuit in an embodiment of the utility model. As shown in fig. 3, the test circuit in this embodiment includes a test signal generating device 31, a second test receiver 32, a third test receiver 33, a plurality of first test receivers, a plurality of first radio frequency switches, a plurality of directional couplers, and a plurality of second radio frequency switches. Wherein the plurality of first test receivers includes 341 and 342. The plurality of first radio frequency switches includes S1a and S1b. The plurality of directional couplers includes 351 and 352. The plurality of second radio frequency switches includes S2a and S2b. Specifically, the test signal generating device 31 is connected to a plurality of second radio frequency switches S2a and S2b. The directional coupler 351 is connected to the first test receiver 341, the second test receiver 32, the first rf switch S1a, and the second rf switch S2a. The first radio frequency switch S1a is connected to the first type radio frequency connector RF11 and the second type radio frequency connector RF 21. The directional coupler 352 is connected to the second radio frequency switch S2b, the third test receiver 33, the first radio frequency switch S1b and the first test receiver 342. The first radio frequency switch S1b is connected to the first type radio frequency connector RF12 and the second type radio frequency connector RF22. Further, the controller 1 may be connected to the test signal generating means 31, the second test receiver 32, the third test receiver 33, the plurality of first test receivers, the plurality of first radio frequency switches, the plurality of directional couplers and the plurality of second radio frequency switches in the test circuit 3.

In the present embodiment, an example of a connection between a key and a first rf switch is described, that is, the key 41 of the control panel 4 of the rf test device shown in fig. 2 is connected to the first rf switch S1a of the test circuit of the present embodiment, and the key 42 is connected to the first rf switch S1b. However, the user may set a predetermined number of keys to connect with a predetermined number of the first radio frequency switches according to the requirement, where the predetermined number and the predetermined number may be one or multiple. For example, one key may be connected to the two first rf switches S1a, S1b, in which case only one key may be provided. For example, it is also possible to connect two keys 41, 42 to a first rf switch S1a, i.e. two keys are connected to a first rf switch, while keys 41, 42 are connected to a first rf switch S1b. Further, in this embodiment, two first receivers, two first radio frequency switches, two directional couplers and two second radio frequency switches are taken as an example for illustration, but the number of the first receivers, the first radio frequency switches, the directional couplers and the second radio frequency switches may be one, or may be two or more, and the user may set the number according to the needs. Therefore, the application range of the network analyzer can be improved, and the network analyzer has higher universality.

In this embodiment, the test signal generating device 31 may be implemented by a built-in signal source device such as a radio frequency signal generator, a radio frequency signal synthesizer, etc. for providing a test signal.

Optionally, the user may set the test signal generating device 31 through the controller 1 by using the test option button 43 in the control panel 4, so that the test signal generating device 31 generates test signals with predetermined frequencies, powers and phases according to the user setting, so as to meet different test requirements. Meanwhile, the test signal generating device 31 supports various radio frequency signal test modes, such as a single frequency test, a sweep frequency test, a modulation test, and the like.

Alternatively, the test signal generating device 31 may also receive the test signal provided by the external signal source device, thereby providing a test signal with higher output power and wider frequency range.

In this embodiment, the second radio frequency switches S2a and S2b may be implemented by single pole single throw radio frequency switches (single pole single throw, SPST). Further, the controller 1 may control the second radio frequency switches S2a and S2b to be turned on or off so that the test signal generating device 31 is connected with the directional couplers 351 and/or 352. Specifically, the controller 1 may send a high-level voltage signal to the second rf switches S2a and S2b to control the second rf switches S2a and S2b to be turned on, and the controller 1 may also send a low-level voltage signal to the second rf switches S2a and S2b to control the second rf switches S2a and S2b to be turned off. Thus, after the second radio frequency switch S2a or S2b is turned on, the test signal generating device 31 may be connected to the directional coupler 351 or 352, such that the test signal generating device 31 transmits the test signal to the device under test via the directional coupler 351, the first radio frequency switch S1a, or the test signal generating device 31 transmits the test signal to the device under test via the directional coupler 352, the first radio frequency switch S1b, and the plurality of radio frequency interfaces RF. In the following description, it is explained taking an example that the test signal generating device 31 transmits a test signal to a device under test through the directional coupler 351, the first RF switch S1a, and the first-model RF connector RF11, and receives a test feedback signal of the device under test through the first-model RF connector RF12, the first RF switch S1b, the directional coupler 352, and the third test receiver 33.

In an alternative embodiment, the controller 1 automatically controls the second radio frequency switches S2a and S2b to be turned on after detecting that the test circuit 3 is connected to the device to be tested via a plurality of radio frequency interfaces RF. Correspondingly, the controller 1 automatically controls the second radio frequency switches S2a and S2b to be turned off after detecting that the test circuit 3 is disconnected from the device to be tested through the plurality of radio frequency interfaces RF.

In another alternative embodiment, the second rf switches S2a and S2b are controlled to be turned on after the user sets the test signal generating means 31 through the controller 1 via the test option key 43 in the control panel 4, i.e. the test signal generating means 31 generates a test signal.

In yet another alternative embodiment, the controller 1 automatically controls the second rf switches S2a and S2b to be turned on after receiving the power-on signal transmitted from the power switch 5. Correspondingly, after receiving the shutdown signal sent by the power switch 5, the controller 1 automatically controls the second radio frequency switches S2a and S2b to be turned off, and controls each component in the network analyzer to be powered down.

In the present embodiment, the test signal generating means 31 transmits the test signal to the first test receiver 341 through the directional coupler 351 while the test signal generating means 31 transmits the test signal to the device under test through the directional coupler 351, the first radio frequency switch S1a, and the first model radio frequency connector RF11. That is, the test signal is used as a reference signal.

In this embodiment, the directional couplers 351 and 352 are used to distribute the test signals to different radio frequency interfaces RF, and can obtain the reflected signals of the device to be tested through the radio frequency interfaces RF. For example, the directional coupler 351 transmits the test signal to the first test receiver 341 and the first model radio frequency connector RF11. Meanwhile, the directional coupler 351 transmits the reflected signal of the device to be tested transmitted by the first type RF connector RF11 to the second test receiver 32, that is, the directional coupler 351 performs separation processing on the reflected signal and the test signal with opposite directions on the same physical path, so as to extract the reflected signal and transmit the extracted signal to the second test receiver 32. The directional coupler 352 in turn sends the test feedback signal of the device under test transmitted by the first model RF connector RF12 to the third test receiver 33.

In the present embodiment, the directional couplers 351 and 352 may be implemented by microwave directional couplers, millimeter wave directional couplers, adjustable directional couplers, bidirectional directional couplers, or the like. The microwave directional coupler is suitable for testing in a higher frequency range, and the normal working frequency range is usually 1GHz-50GHz, so that a high-precision test result can be provided. The millimeter wave directional coupler is suitable for testing millimeter wave frequency range, and the normal working frequency range is 50 GHz-500 GHz. The adjustable directional coupler can adjust the distribution proportion of the test signal by adjusting the distance between the coupler and the reflector, and can provide a flexible test scheme. The bidirectional directional coupler can simultaneously perform forward and reverse tests, so that the test efficiency and accuracy are improved. Therefore, the application range of the network analyzer can be improved, and the network analyzer has higher universality.

In this embodiment, the test receiver is used to receive and process signals. That is, the test receiver may amplify, filter, detect, etc., the received signal to output a test result. And the controller 1 determines the test data according to the test results of the test receivers, namely the test signal, the reflection signal and the test feedback signal, and the test data is displayed through the display device. Specifically, the first test receiver 341 is configured to receive a test signal as a reference signal. The second test receiver 32 is for receiving reflected signals of the device under test. The third test receiver 33 is arranged to receive a test feedback signal transmitted by the test equipment. Further, each test receiver in the present embodiment may be implemented by a microwave receiver, a millimeter wave receiver, or the like.

Alternatively, the first test receiver 342 may pass through the directional coupler 352 via the first radio frequency switch S1b and the reflected signal of the test feedback signal transmitted by the first model radio frequency connector RF12. That is, since the device to be tested may have impedance mismatch with the network analyzer, the test feedback signal of the device to be tested is reflected at the first type RF connector RF12, i.e. the transmission of the test feedback signal is disturbed.

In this embodiment, the first rf switches S1a and S1b may be implemented by single pole double throw rf switches (Single Pole Double Throw, SPDT). Meanwhile, the key 41 in the control panel 4 is connected with the first RF switch S1a, the key 42 is connected with the first RF switch S1b, so that the first RF switch S1a is controlled by the key 41 to be connected with the first RF connector RF11 or the second RF connector RF21, and the first RF switch S1b is controlled by the key 42 to be connected with the first RF connector RF12 or the second RF connector RF22. In the following description, the first rf switch S1a and the key 41 are exemplified. In particular, reference may be made to fig. 4.

Fig. 4 is a circuit diagram of a first rf switch in an embodiment of the utility model. As shown in fig. 4, the first radio frequency switch S1a of the present embodiment includes a controlled switch S1a1 and a control circuit S1a2. The controlled switch S1a1 includes nodes a1, a2 and a3, and the node a1 of the controlled switch S1a1 is connected to the first type RF connector RF11. The node a2 of the controlled switch S1a1 is connected to the second type radio frequency connector RF 21. The node a3 of the controlled switch S1a1 is connected to the directional coupler 351. The key 41 and the control circuit S1a2.

In an alternative embodiment, the key 41 sends a first control signal to the control circuit S1a2 in the first radio frequency switch S1a in response to being triggered, so that the control circuit S1a2 sends a second control signal to the controlled switch S1a 1. The second control signal may be a high level voltage signal that is greater than a predetermined threshold. The controlled switch S1a1 receives the second control signal to be conducted to the node a1 so that the first type RF connector RF11 is connected to the directional coupler 351 through the first RF switch S1 a.

In another alternative embodiment, the key 41 sends a third control signal to the control circuit S1a2 in the first radio frequency switch S1a in response to being triggered, so that the control circuit S1a2 sends a fourth control signal to the controlled switch S1a 1. The fourth control signal may be a low level voltage signal, the low level voltage signal being equal to or less than a predetermined threshold. The controlled switch S1a1 receives the fourth control signal to be conducted to the node a2 so that the second-type RF connector RF21 is connected to the directional coupler 351 through the first RF switch S1 a.

In yet another alternative embodiment, the key 41 sends a fifth control signal to the control circuit S1a2 in the first radio frequency switch S1a in response to being triggered, so that the control circuit S1a2 controls the controlled switch S1a1 to be turned off. That is, when the key 41 is activated for the first time, the first RF switch S1a is connected to the first-type RF connector RF11. When the key 41 is activated for the second time, the first RF switch S1a is connected to the second type RF connector RF 21. When the key 41 is triggered for the third time, the first rf switch S1a is turned off. Therefore, the test circuit 3 can be connected with different devices to be tested through a plurality of radio frequency interfaces RF for testing, the test operation is simplified, the test efficiency is improved, and the universality is higher.

Alternatively, the keys 41, 42 may be connected to the control circuit S1a2 in the first rf switch S1a, i.e. two keys are connected to one first rf switch. Similarly, if the key 41 is activated, the first RF switch S1a is connected to the first type RF connector RF11. If the key 42 is activated, the first radio frequency switch S1a is connected to the second type radio frequency connector RF 21. Meanwhile, the keys 41 and 42 are connected with a control circuit in the first radio frequency switch S1b, so that the first radio frequency switch S1b is controlled by the keys 41 and 42 and is connected with the first type radio frequency connector RF12 or the second type radio frequency connector RF22. Correspondingly, after the controller 1 receives the shutdown signal sent by the power switch 5, the first rf switches S1a and S1b may be controlled to be turned off.

Alternatively, the key 41 may be connected to the control circuit of the first rf switches S1a, S1b, i.e. one key is connected to two first rf switches. That is, only one key 41 is provided, so that the two first rf switches S1a, S1b are controlled by the key 41 to be connected with the corresponding rf interface. For example, when the key 41 is first activated, the first RF switch S1a is connected to the first-type RF connector RF11, while the first RF switch S1b is connected to the first-type RF connector RF12. When the key 41 is activated for the second time, the first RF switch S1a is connected to the second type RF connector RF21, and the first RF switch S1b is connected to the second type RF connector RF22. When the key 41 is activated for the third time, the first rf switches S1a and S1b are turned off. Therefore, a user can set a preset number of keys to be connected with a preset number of first radio frequency switches according to the requirements, so that the radio frequency switch has higher universality.

In the present embodiment, the controller 1 may determine the test data according to the test signal acquired by the first test receiver 341, the reflected signal acquired by the second test receiver 32, and the test feedback signal acquired by the third test receiver 33. The test data includes S11 parameters, S21 parameters, and the like. Specifically, the controller 1 may determine the S11 parameter according to a ratio of the reflected signal acquired by the second test receiver 32 to the test signal acquired by the first test receiver 341. Meanwhile, the controller 1 may determine S21 the parameter according to a ratio of the test feedback signal acquired by the third test receiver 33 to the test signal acquired by the first test receiver 341. Further, the controller 1 may display the test data on the display device 2.

For example, reference may be made to fig. 5 and 6. Fig. 5 and 6 are equivalent circuit diagrams for testing a device under test in an embodiment of the present utility model. Referring first to fig. 5, the device A1 to be tested is connected with the first model radio frequency connectors RF11 and RF12. And connects the device to be tested A2 with the second model RF connector RF 21. After each component in the network analyzer is powered on, the second rf switches S2a and S2b are turned on. At this time, the user needs to test the device A1 to be tested, and the user can control the first radio frequency switch S1a to be conducted to the node A1 and the first radio frequency switch S1b to be conducted to the node b1 through the keys 41 and 42 in the control panel 4 respectively, so that the first radio frequency switch S1a is connected with the first type radio frequency connector RF11, and the first radio frequency switch S1b is connected with the first type radio frequency connector RF12, so that the network analyzer is connected with the device A1 to be tested. A test signal is generated by the test signal generating means 31 and sent to the first test receiver 341 and the device A1 to be tested. The directional coupler 351 then acquires the reflected signal of the device under test A1 through the first type RF connector RF11 for transmission to the second test receiver 32, while the directional coupler 352 acquires the test response signal of the device under test A1 through the first type RF connector RF12 for transmission to the third test receiver 33. The controller 1 determines test data from the test signals, the reflected signals and the test feedback signals of the respective test receivers, and the test data is displayed by the display device 2. Thereby, the test of the device A1 to be tested is completed. Further, referring to fig. 6, when the user needs to test the device A2 to be tested, the user can control the first RF switch S1a to be turned on to the node A2 and the first RF switch S1b to be turned off through the keys 41 and 42 in the control panel 4, so that the first RF switch S1a is connected with the second type RF connector RF21, and further the network analyzer is connected with the device A2 to be tested. A test signal is generated by the test signal generating means 31 and sent to the first test receiver 341 and the device A2 to be tested. The directional coupler 351 in turn obtains the reflected signal of the device A2 under test via the second model RF connector RF21 for transmission to the second test receiver 32. At this time, since the user does not have a need to acquire the test feedback signal of the device A2 to be tested, the network analyzer may be configured to include only one first-model RF connector RF11, one second-model RF connector RF21, one first RF switch S1a, one directional coupler 351, one first test receiver 341, and one second RF switch S2a. Further, the controller 1 determines test data from the test signals and the reflected signals of the respective test receivers, and the test data is displayed by the display device 2. Thereby, the test of the device A2 to be tested is completed.

The utility model is implemented by arranging radio frequency connectors with different types in radio frequency test equipment, wherein the number of the radio frequency connectors with any type is one or more, connecting each radio frequency connector with a test circuit, enabling the test circuit to be connected with different equipment to be tested through the radio frequency connectors with different types, sending test signals to different equipment to be tested, receiving reflected signals and test feedback signals of the equipment to be tested, determining test data by a controller according to the test signals, the reflected signals and the test feedback signals, and displaying the test data by a display device. Therefore, the device can be connected with different devices to be tested without configuring an additional radio frequency adapter, so that the different devices to be tested can be tested, the test operation is simplified, the test efficiency is improved, and the device has higher universality.

The above description is only of the preferred embodiments of the present utility model and is not intended to limit the present utility model, and various modifications and variations may be made to the present utility model by those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present utility model should be included in the protection scope of the present utility model.

Claims (10)

1. A radio frequency test device, the radio frequency test device comprising:

a plurality of radio frequency interfaces, wherein the plurality of radio frequency interfaces comprise radio frequency connectors with different models, and the number of the radio frequency connectors of any model is one or more; and

the test circuit is connected with the radio frequency interface and is configured to be connected with equipment to be tested through the radio frequency interface and send a test signal to the equipment to be tested for testing.

2. The radio frequency test device of claim 1, wherein the test circuit comprises:

at least one first radio frequency switch;

the radio frequency test device further comprises:

at least one key connected to the first radio frequency switch and configured to send a first control signal to the first radio frequency switch in response to being triggered;

wherein the first radio frequency switch is configured to connect with a corresponding one of the radio frequency interfaces in response to receiving the first control signal.

3. The radio frequency test device of claim 2, wherein the test circuit further comprises:

test signal generating means configured to generate the test signal.

4. The radio frequency test device of claim 3, wherein the test circuit further comprises:

at least one second radio frequency switch connected to the test signal generating means;

at least one directional coupler connected with the first radio frequency switch and the second radio frequency switch;

the test signal generating device is further configured to send the test signal to the device to be tested for testing through the directional coupler and the radio frequency interface.

5. The radio frequency test device of claim 4, wherein the test circuit further comprises:

at least one first test receiver connected to the directional coupler;

wherein the test signal generating means is further configured to transmit the test signal to the first test receiver via the directional coupler.

6. The radio frequency test device of claim 5, wherein the directional coupler is configured to obtain a reflected signal of the device under test through the radio frequency interface.

7. The radio frequency test device of claim 6, wherein the test circuit further comprises:

a second test receiver connected to the directional coupler;

wherein the directional coupler is further configured to transmit the reflected signal to the second test receiver.

8. The radio frequency test device of claim 7, wherein the test circuit further comprises:

and the third test receiver is configured to acquire a test feedback signal of the device to be tested through the radio frequency interface.

9. The radio frequency test device of claim 8, further comprising:

a display device;

and the controller is connected with the first test receiver, the second test receiver and the third test receiver, and is configured to determine test data according to the test signals, the reflection signals and the test feedback signals, and display the test data through the display device.

10. The radio frequency test device of claim 9, wherein the controller is further configured to control the second radio frequency switch to conduct such that the test signal generating means is connected to the directional coupler through the second radio frequency switch.