CN219758335U

CN219758335U - Integrated IC testing device for front feeding and discharging

Info

Publication number: CN219758335U
Application number: CN202321016697.2U
Authority: CN
Inventors: 沈巧琳; 丁向东
Original assignee: Shenzhen Chuangxin Online Testing Service Co ltd
Current assignee: Shenzhen Chuangxin Online Testing Service Co ltd
Priority date: 2023-04-27
Filing date: 2023-04-27
Publication date: 2023-09-26
Anticipated expiration: 2033-04-27

Abstract

The utility model discloses an integrated IC testing device for front surface loading and unloading, which comprises: the front of the test seat is provided with a test area, a plurality of probes are arranged in the test area, and a test circuit board electrically connected with the probes is arranged in the test seat. The front of the test seat is provided with a retainer corresponding to the test areas one by one, the integrated ICs to be tested are placed in the retainer, and the retainer can press the integrated ICs to be tested until the integrated ICs to be tested are contacted and conducted with the probes. The utility model has the beneficial effects that: according to the testing device, the retainer is arranged, the integrated IC to be tested is placed in the retainer, and the retainer is used for pressing the integrated IC to be tested until the integrated IC to be tested is contacted with a plurality of probes to be conducted, so that the feeding and discharging of the integrated IC are labor-saving, and the use is more convenient.

Description

Integrated IC testing device for front feeding and discharging

Technical Field

The utility model relates to the technical field of integrated IC testing devices, in particular to an integrated IC testing device capable of feeding and discharging materials on the front surface.

Background

The integrated circuit test is generally a semi-automatic test device, and the integrated IC needs to be fed and discharged manually. The existing integrated circuit testing device is provided with a material feeding and discharging device from the top of the testing seat and a material feeding and discharging device from the front of the testing seat. The testing device for feeding and discharging materials on the top is generally used for standing, so that workers are tired, and the testing device for feeding and discharging materials on the front surface can work in a standing or sitting mode, and the use is convenient. The integrated circuit batch test base with the application number of CN202121290954.2 applied before by our department belongs to the structure of front loading and unloading, but the device adopts flip and base lock to compress tightly the integrated IC to be tested, flip lock and open need harder, use still inconvenient.

Disclosure of Invention

Aiming at the problems existing in the prior art, the main purpose of the utility model is to provide an integrated IC testing device with front feeding and discharging, which aims at providing a testing device with front feeding and discharging.

In order to achieve the above object, the integrated IC testing device for front feeding and discharging according to the present utility model includes: the front of the test seat is provided with a test area, a plurality of probes are arranged in the test area, and a test circuit board electrically connected with the probes is arranged in the test seat. The front of the test seat is provided with a retainer corresponding to the test areas one by one, the integrated ICs to be tested are placed in the retainer, and the retainer can press the integrated ICs to be tested until the integrated ICs to be tested are contacted and conducted with the probes.

Preferably, the holder is "U" -shaped.

Preferably, the holder is provided with a slide bar which slides in the test seat in a direction perpendicular to the front face of the test seat.

Preferably, a spring is sleeved on the sliding rod, and the spring can drive the sliding rod to slide so as to drive the retainer to press the integrated IC to be tested to be in contact with and conduction with the probes.

Preferably, the front surface of the test seat is provided with a limit strip, and the limit strip is positioned right above the test area.

Compared with the prior art, the utility model has the beneficial effects that: according to the testing device, the retainer is arranged, the integrated IC to be tested is placed in the retainer, and the retainer is used for pressing the integrated IC to be tested until the integrated IC to be tested is contacted with a plurality of probes to be conducted, so that the feeding and discharging of the integrated IC are labor-saving, and the use is more convenient.

Drawings

In order to more clearly illustrate the embodiments of the present utility model or the technical solutions in the prior art, the drawings that are required in the embodiments or the description of the prior art will be briefly described, and it is obvious that the drawings in the following description are only some embodiments of the present utility model, and other drawings may be obtained according to the structures shown in these drawings without inventive effort for a person skilled in the art.

FIG. 1 is a perspective view of an embodiment of the present utility model;

FIG. 2 is a cross-sectional block diagram of an embodiment of the present utility model;

FIG. 3 is a view showing the structure of the cage of FIG. 2 after a certain distance is pulled apart;

the achievement of the objects, functional features and advantages of the present utility model will be further described with reference to the accompanying drawings, in conjunction with the embodiments.

Detailed Description

The utility model provides an integrated IC testing device for front feeding and discharging.

Referring to fig. 1 to 3, fig. 1 is a perspective view showing an embodiment of the present utility model, fig. 2 is a sectional view showing an embodiment of the present utility model, and fig. 3 is a view showing a cage of fig. 2 after being separated a certain distance.

As shown in fig. 1 to 3, in an embodiment of the present utility model, the front-side feeding and discharging integrated IC testing device includes: the test seat 1, the front of test seat 1 is equipped with test area 2, is equipped with a plurality of probes 3 in the test area 2, is equipped with in the test seat 1 with a plurality of probes 3 electric connection's test circuit board 8. The front of the test seat 1 is provided with a retainer 4 corresponding to the test areas 2 one by one, the integrated ICs to be tested are placed in the retainer 4, and the retainer 4 can press the integrated ICs to be tested to be in contact conduction with the probes 3. The retainer 4 is U-shaped, and the integrated IC to be tested is placed in the U-shaped retainer 4 from the upper opening.

The retainer 4 is provided with the slide bar 5, the slide bar 5 slides in the test seat 1 along the direction vertical to the front surface of the test seat 1, during testing, the retainer 4 is slid to be away from the test area 2 for a small distance, the integrated IC to be tested is conveniently placed in the test area, and then the retainer 4 provided with the integrated IC to be tested slides towards the test area 2, so that the integrated IC to be tested is in contact conduction with a plurality of probes 3. The spring 6 is sleeved on the slide bar 5, the spring 6 can drive the slide bar 5 to drive the retainer 4 to slide towards the test area 2, so that the retainer 4 is driven to press the integrated IC to be tested to be in contact with the probes 3, and the pressing force of the spring 6 can enable the integrated IC to be tested to be in contact with the probes 3 all the time, so that good contact is ensured. The front of the test seat 1 is provided with a limit strip 7, and the limit strip 7 is positioned right above the test area 2, so that when the integrated IC to be tested is extruded in the compression process, the integrated IC cannot slide out from the upper opening of the U-shaped retainer 4.

According to the testing device, the retainer 4 is arranged, the integrated IC to be tested is placed in the retainer 4, and the retainer 4 is used for pressing the integrated IC to be tested until the integrated IC to be tested is contacted with the probes 3, so that the feeding and discharging integrated ICs are labor-saving, and the use is more convenient. When the device is not in use, the retainer 4 can also play a role in protecting the probes 3 in the test area 2 to a certain extent because the retainer 4 is positioned right in front of the test area 2.

The foregoing description is only of the preferred embodiments of the present utility model and is not intended to limit the scope of the utility model, and all equivalent structural changes made by the description of the present utility model and the accompanying drawings or direct/indirect application in other related technical fields are included in the scope of the utility model.

Claims

1. An integrated IC testing apparatus for front side loading and unloading, comprising: the testing device comprises a testing seat, wherein the front surface of the testing seat is provided with a testing area, a plurality of probes are arranged in the testing area, and a testing circuit board electrically connected with the probes is arranged in the testing seat; the front of the test seat is provided with a retainer corresponding to the test areas one by one, the integrated ICs to be tested are placed in the retainer, and the retainer can press the integrated ICs to be tested to be in contact conduction with a plurality of probes.

2. The front side loading and unloading integrated IC test device of claim 1, wherein the holder is "U" -shaped.

3. The front side loading and unloading integrated IC test device according to claim 2, wherein a slide bar is provided on the holder, and the slide bar slides in the test seat in a direction perpendicular to the front side of the test seat.

4. The front loading and unloading integrated IC testing device according to claim 3, wherein a spring is sleeved on the slide bar, and the spring can drive the slide bar to slide and drive the retainer to press the integrated IC to be tested to be in contact with and conduction with the plurality of probes.

5. The front side loading and unloading integrated IC test apparatus according to any one of claims 2 to 4, wherein a limit bar is disposed on the front side of the test seat, and the limit bar is located directly above the test area.