CN219495505U - Temperature sampling circuit and battery management system - Google Patents

Temperature sampling circuit and battery management system Download PDF

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Publication number
CN219495505U
CN219495505U CN202320484826.4U CN202320484826U CN219495505U CN 219495505 U CN219495505 U CN 219495505U CN 202320484826 U CN202320484826 U CN 202320484826U CN 219495505 U CN219495505 U CN 219495505U
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voltage division
module
voltage
resistor
sampling
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杨凯
王路
李进
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Trina Energy Storage Solutions Jiangsu Co Ltd
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Trina Energy Storage Solutions Jiangsu Co Ltd
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    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02DCLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
    • Y02D10/00Energy efficient computing, e.g. low power processors, power management or thermal management

Abstract

The utility model provides a temperature sampling circuit and a battery management system, wherein the temperature sampling circuit is used for calculating temperature by sampling the partial pressure of a resistor to be tested and comprises a control module, a sampling module and a partial pressure module, the partial pressure module comprises a plurality of partial pressure groups connected in parallel, each partial pressure group comprises a partial pressure resistor, the sampling module is electrically connected with the resistor to be tested and is electrically connected with the partial pressure module, and is selectively electrically conducted with at least one partial pressure group, so that the selectable at least one partial pressure group is serially connected with the resistor to be tested to carry out partial pressure, and the sampling module is used for sampling the partial pressure of the resistor to be tested; the control module is electrically connected with the sampling module and is used for controlling the sampling module to be selectively electrically conducted with at least one voltage division group, obtaining the voltage division of the resistor to be tested sampled by the sampling module and calculating the temperature according to the resistance value of the at least one voltage division group and the voltage division of the resistor to be tested. The temperature sampling circuit and the battery management system provided by the utility model can improve the accuracy of temperature sampling.

Description

Temperature sampling circuit and battery management system
Technical Field
The utility model relates to the technical field of batteries, in particular to a temperature sampling circuit and a battery management system.
Background
At present, in an energy storage battery management system (Battery Manage System, abbreviated as BMS), a temperature is generally sampled by adopting a mode of dividing a voltage between a thermistor with a negative temperature coefficient (Negative Temperature Coefficient, abbreviated as NTC) and a resistor inside the energy storage battery management system, a resistance value of the corresponding thermistor can be converted by sampling the divided voltage, and then a temperature corresponding to the resistance value of the thermistor can be found out by comparing the temperature with a corresponding table of the resistance values of the thermistor.
In national standard GB/T34131-2017, the measurement error of temperature sampling is not more than + -2 ℃. However, due to the characteristic curve of the thermistor with negative temperature coefficient, some manufacturers of energy storage battery management systems can only achieve measurement errors of + -1 ℃ at about 25 ℃ for temperature sampling at present, and can only achieve measurement errors at higher temperature and/or lower temperature
Measurement errors of + -3 deg.c result in poor accuracy of temperature sampling.
Disclosure of Invention
The utility model aims to at least solve one of the technical problems in the prior art, and provides a temperature sampling circuit and a battery management system, which can improve the accuracy of temperature sampling.
The utility model provides a temperature sampling circuit for calculating temperature by sampling the voltage division of a resistor to be measured, which comprises a control module, a sampling module and a voltage division module, wherein the voltage division module comprises a plurality of voltage division groups connected in parallel, each voltage division group comprises a voltage division resistor, the sampling module is electrically connected with the resistor to be measured and the voltage division module, and is selectively electrically connected with at least one voltage division group, so that the selectable at least one voltage division group is serially connected with the resistor to be measured for voltage division, and the sampling module is used for sampling the voltage division of the resistor to be measured; the control module is electrically connected with the sampling module and is used for controlling the sampling module to be selectively electrically conducted with at least one voltage division group, obtaining the voltage division of the resistor to be tested sampled by the sampling module and calculating the temperature according to the resistance value of at least one voltage division group and the voltage division of the resistor to be tested.
Optionally, the voltage division module includes a first voltage division group, a second voltage division group and a third voltage division group, where the first voltage division group is electrically conducted with the sampling module, and the second voltage division group and the third voltage division group are selectively electrically conducted with the sampling module respectively.
Optionally, the resistance of the first voltage division group is 90kΩ -110kΩ, and/or the resistance of the equivalent resistances of the first voltage division group and the second voltage division group is 5kΩ -15kΩ, and/or the resistance of the equivalent resistances of the first voltage division group, the second voltage division group, and the third voltage division group is 0.7kΩ -1.3kΩ.
Optionally, the resistance of the first voltage division group is 100kΩ, and/or the resistance of the equivalent resistances of the first voltage division group and the second voltage division group is 10kΩ, and/or the resistance of the equivalent resistances of the first voltage division group, the second voltage division group, and the third voltage division group is 1kΩ.
Optionally, the first voltage dividing group includes a first voltage dividing resistor, the resistance value of the first voltage dividing resistor is 100kΩ, and/or the second voltage dividing group includes a second voltage dividing resistor and a third voltage dividing resistor connected in parallel, the resistance value of the second voltage dividing resistor is 25kΩ, the resistance value of the third voltage dividing resistor is 20kΩ, and/or the third voltage dividing resistor includes a fourth voltage dividing resistor and a fifth voltage dividing resistor connected in parallel, the resistance value of the fourth voltage dividing resistor is 2.5kΩ, and the resistance value of the fifth voltage dividing resistor is 2kΩ.
Optionally, the voltage dividing resistors of each voltage dividing group include a pull-up resistor, one end of the voltage dividing resistor is electrically connected with a preset power supply, the preset power supply has a preset voltage, and the other end of the voltage dividing resistor is electrically connected with the sampling module.
Optionally, the number of the resistors to be tested is multiple, the temperature sampling circuit further includes a gating module, and the sampling module is selectively electrically connected with the multiple resistors to be tested through the gating module, is electrically connected with the voltage dividing module through the gating module, and is selectively electrically conducted with at least one voltage dividing group.
Optionally, the gating module has a plurality of selection ports and a plurality of communication ports, the sampling module has a plurality of gating ports, a plurality of gating ports are electrically connected with a plurality of selection ports, a plurality of communication ports are electrically connected with a plurality of resistors to be tested in a one-to-one correspondence manner, and a plurality of gating ports are used for sending signals to a plurality of selection ports so as to selectively electrically conduct a plurality of resistors to be tested with the sampling module through the cooperation of a plurality of selection ports.
Optionally, the sampling module has selection ports, and the number of the selection ports is the same as the number of the voltage division groups which can be selectively and electrically connected in the voltage division module, and the sampling module is electrically connected with the voltage division groups which can be selectively and electrically connected in a one-to-one correspondence manner through the selection ports.
Optionally, the number of the voltage dividing modules is multiple, the number of the gating modules is multiple, the sampling modules are provided with multiple sampling ports, the multiple voltage dividing modules are in one-to-one correspondence and are electrically connected with the multiple gating modules, and the sampling modules are in one-to-one correspondence with the multiple gating modules through the multiple sampling ports and are used for sampling the voltage division of the resistor to be tested, which is electrically connected with the corresponding gating modules, through the sampling ports.
The utility model also provides a battery management system comprising the temperature sampling circuit.
The utility model has the following beneficial effects:
according to the temperature sampling circuit provided by the utility model, the control module is used for controlling the sampling module to be selectively electrically conducted with the at least one voltage division group, so that the selectable at least one voltage division group and the resistor to be measured are subjected to series voltage division, the sampling module is used for sampling the voltage division of the resistor to be measured, the control module is used for obtaining the voltage division of the resistor to be measured, and the temperature is calculated according to the resistance value of the at least one voltage division group and the obtained voltage division of the resistor to be measured, so that for different temperature values or temperature intervals, the resistance values of different voltage groups and the calculated temperature of the voltage division of the resistor to be measured can be selected, then the measurement error generated due to the characteristic curve of the resistor to be measured can be compensated, and the temperature sampling precision can be improved.
The battery management system provided by the utility model can improve the accuracy of temperature sampling by means of the temperature sampling circuit provided by the utility model.
Drawings
Fig. 1 is a schematic structural diagram of a sampling module and a gating module of a temperature sampling circuit according to an embodiment of the present utility model;
fig. 2 is a schematic structural diagram of a voltage dividing module of the temperature sampling circuit according to an embodiment of the present utility model;
fig. 3 is a schematic structural diagram of another voltage dividing module of the temperature sampling circuit according to an embodiment of the present utility model;
FIG. 4 is a schematic view of a partial enlarged structure of FIG. 1;
reference numerals illustrate:
1-a sampling module; 2-a voltage dividing module; 3-a first voltage dividing resistor; 4-a second pressure division group; 41-a second voltage dividing resistor; 42-a third voltage dividing resistor; 5-a third partial pressure group; 51-fourth voltage dividing resistor; 52-a fifth voltage dividing resistor; 6-gating module.
Detailed Description
In order to enable those skilled in the art to better understand the technical scheme of the present utility model, the temperature sampling circuit and the battery management system provided by the present utility model are described in detail below with reference to the accompanying drawings.
As shown in fig. 1 to 4, an embodiment of the present utility model provides a temperature sampling circuit, configured to calculate a temperature by sampling a voltage division of a resistor to be measured (not shown in the drawings), including a control module (not shown in the drawings), a sampling module 1, and a voltage division module 2, where the voltage division module 2 includes a plurality of voltage division groups connected in parallel, each voltage division group includes a voltage division resistor, the sampling module 1 is electrically connected to the resistor to be measured and is electrically connected to the voltage division module 2, and is optionally electrically connected to at least one voltage division group, so that the optional at least one voltage division group is serially connected with the resistor to be measured for voltage division, and the sampling module 1 is configured to sample the voltage division of the resistor to be measured; the control module is electrically connected with the sampling module 1 and is used for controlling the sampling module 1 to be selectively electrically conducted with at least one voltage division group, obtaining the voltage division of the resistor to be tested sampled by the sampling module 1 and calculating the temperature according to the resistance value of the at least one voltage division group and the voltage division of the resistor to be tested.
According to the temperature sampling circuit provided by the embodiment of the utility model, the control module controls the sampling module 1 to be selectively electrically conducted with at least one voltage division group, so that the selectable at least one voltage division group and the resistor to be measured are in series voltage division, the sampling module 1 is used for sampling the voltage division of the resistor to be measured, the control module is used for obtaining the voltage division of the resistor to be measured, and the temperature is calculated according to the resistance value of the at least one voltage division group and the obtained voltage division of the resistor to be measured, so that for different temperature values or temperature intervals, the resistance values of different voltage groups and the calculated temperature of the voltage division of the resistor to be measured can be selected, then the measurement error generated due to the characteristic curve of the resistor to be measured can be compensated, and the accuracy of temperature sampling can be improved.
In practical application of the temperature sampling circuit, the control module can control the sampling module 1 to select different number of voltage-dividing groups or different voltage-dividing groups to be electrically conducted, so that the different number of voltage-dividing groups or different voltage-dividing groups are connected with the resistor to be measured in series to divide voltage, and therefore resistance values of the voltage-dividing resistor connected with the resistor to be measured in series are different, in the process, the sampling module 1 can sample the voltage division of the resistor to be measured, the control module can obtain the voltage division of the resistor to be measured sampled by the sampling module 1, calculate a temperature value or a temperature interval according to the obtained voltage division of the resistor to be measured, then select the voltage-dividing resistor corresponding to the resistance value according to the temperature value or the temperature interval (the resistance value of the voltage-dividing resistor connected with the resistor to be measured in series or the resistance value of the voltage-dividing resistor to be measured) to calculate, so as to compensate measurement errors generated at the temperature value or the temperature interval due to characteristic curves of the resistor to be measured in series, and further improve accuracy of temperature sampling.
However, the practical application manner of the temperature sampling circuit is not limited to this, for example, the control module may control the sampling module 1 to select to be electrically connected with a certain number of voltage dividing groups or one voltage dividing group, so that the certain number of voltage dividing groups or one voltage dividing group is connected in series with the to-be-measured resistor to divide the voltage, so that the resistance of the voltage dividing resistor connected in series with the to-be-measured resistor is the same, in this process, the sampling module 1 may sample the voltage of the to-be-measured resistor, the control module may obtain the voltage of the to-be-measured resistor sampled by the sampling module 1, and may calculate a temperature value or a temperature interval according to the obtained voltage of the to-be-measured resistor, and then select a voltage dividing resistor corresponding to the resistance (may be the resistance of the voltage dividing resistor connected in series with the to-be-measured resistor or not be the resistance of the voltage dividing resistor connected in series with the to be-measured resistor) to calculate, so as to compensate for the measurement error generated at the temperature value or the temperature interval due to the characteristic curve of the to-be-measured resistor, thereby able to obtain a more accurate temperature, and further able to improve the accuracy of temperature sampling.
Alternatively, the control module may comprise a micro control unit (Microcontroller Unit, abbreviated MCU).
Alternatively, the resistor to be measured may comprise a thermistor of negative temperature coefficient (Negative Temperature Coefficient, abbreviated NTC). Therefore, after the control module obtains the partial pressure of the resistor to be detected, the temperature value or the temperature interval corresponding to the resistance value of the thermistor can be found out by comparing the temperature with the corresponding table of the resistance value of the thermistor.
Alternatively, the sampling module 1 may include an Analog Front End sampling chip (AFE).
Alternatively, the model of the front-end sampling chip may include LTC6813.
As shown in fig. 2 and 3, in an embodiment of the present utility model, the voltage division module 2 may include a first voltage division group, a second voltage division group 4, and a third voltage division group 5, where the first voltage division group is electrically connected to the sampling module 1, and the second voltage division group 4 and the third voltage division group 5 are selectively electrically connected to the sampling module 1.
That is, the voltage dividing module 2 may include three voltage dividing groups of a first voltage dividing group, a second voltage dividing group 4 and a third voltage dividing group 5, where the voltage dividing resistor of the first voltage dividing group may be always electrically connected to the sampling module 1, the voltage dividing resistor of the first voltage dividing group may be always serially connected to the resistor to be measured for voltage division, the voltage dividing resistor of the second voltage dividing group 4 may be selectively electrically connected to the sampling module 1, the voltage dividing resistor of the second voltage dividing group 4 may be selectively serially connected to the resistor to be measured for voltage division, the voltage dividing resistor of the third voltage dividing group 5 may be selectively electrically connected to the sampling module 1, and the voltage dividing resistor of the third voltage dividing group 5 may be selectively serially connected to the resistor to be measured for voltage division.
Thus, the control module can be electrically conducted with the first voltage division group, or the first voltage division group and the second voltage division group 4, or the first voltage division group and the third voltage division group 5, or the first voltage division group, the second voltage division group 4 and the third voltage division group 5 through controlling the sampling module 1, so that different numbers of voltage division groups or different voltage division groups are serially connected with the resistor to be tested for voltage division, and the resistance of the voltage division resistor serially connected with the resistor to be tested is different.
In an embodiment of the present utility model, the resistance of the first voltage division group may be 90kΩ -110kΩ, and/or the resistance of the equivalent resistances of the first voltage division group and the second voltage division group 4 may be 5kΩ -15kΩ, and/or the resistance of the equivalent resistances of the first voltage division group, the second voltage division group 4, and the third voltage division group 5 may be 0.7kΩ -1.3kΩ.
That is, the resistance of the first voltage division group is 90kΩ to 110kΩ, the resistance of the equivalent resistances of the first voltage division group and the second voltage division group 4 connected in parallel is 5kΩ to 15kΩ, and the resistance of the equivalent resistances of the first voltage division group, the second voltage division group 4 and the third voltage division group 5 connected in parallel is 0.7kΩ to 1.3kΩ. Thus, when the control module controls the sampling module 1 to be electrically conducted with the first voltage division group, the resistance value of the voltage division resistor connected with the resistor to be measured in series is 90k omega-110 k omega, when the control module controls the sampling module 1 to be electrically conducted with the first voltage division group and the second voltage division group 4, the resistance value of the voltage division resistor connected with the resistor to be measured in series is 5k omega-15 k omega, and when the control module controls the sampling module 1 to be electrically conducted with the first voltage division group, the second voltage division group 4 and the third voltage division group 5, the resistance value of the voltage division resistor connected with the resistor to be measured in series is 0.7k omega-1.3 k omega.
In an embodiment of the present utility model, the resistance of the first voltage division group may be 100kΩ, and/or the resistance of the equivalent resistors of the first voltage division group and the second voltage division group 4 may be 10kΩ, and/or the resistance of the equivalent resistors of the first voltage division group, the second voltage division group 4, and the third voltage division group 5 may be 1kΩ.
That is, the resistance of the first voltage division group is 100kΩ, the resistance of the equivalent resistances of the first voltage division group and the second voltage division group 4 connected in parallel is 10kΩ, and the resistance of the equivalent resistances of the first voltage division group, the second voltage division group 4, and the third voltage division group 5 connected in parallel is 1kΩ. Thus, when the control module controls the sampling module 1 to be electrically conducted with the first voltage-dividing group, the resistance value of the voltage-dividing resistor connected with the resistor to be tested in series is 100k omega, when the control module controls the sampling module 1 to be electrically conducted with the first voltage-dividing group and the second voltage-dividing group 4, the resistance value of the voltage-dividing resistor connected with the resistor to be tested in series is 10k omega, and when the control module controls the sampling module 1 to be electrically conducted with the first voltage-dividing group, the second voltage-dividing group 4 and the third voltage-dividing group 5, the resistance value of the voltage-dividing resistor connected with the resistor to be tested in series is 1k omega.
As shown in fig. 2 and 3, in an embodiment of the present utility model, the first voltage dividing group may include a first voltage dividing resistor 3, the resistance of the first voltage dividing resistor 3 may be 100kΩ, and/or the second voltage dividing group 4 may include a second voltage dividing resistor 41 and a third voltage dividing resistor 42 connected in parallel, the resistance of the second voltage dividing resistor 41 may be 25kΩ, the resistance of the third voltage dividing resistor 42 may be 20kΩ, and/or the third voltage dividing resistor 42 may include a fourth voltage dividing resistor 51 and a fifth voltage dividing resistor 52 connected in parallel, the resistance of the fourth voltage dividing resistor 51 may be 2.5kΩ, and the resistance of the fifth voltage dividing resistor 52 may be 2kΩ.
Because the first voltage dividing group, the second voltage dividing group 4 and the third voltage dividing group 5 are connected in parallel, that is, the first voltage dividing resistor 3, the second voltage dividing resistor 41, the third voltage dividing resistor 42, the fourth voltage dividing resistor 51 and the fifth voltage dividing resistor 52 are connected in parallel, when the control module controls the sampling module 1 to be electrically conducted with the first voltage dividing group, the sampling module 1 can be electrically conducted with the first voltage dividing resistor 3 with the resistance value of 100kΩ, so that the first voltage dividing resistor 3 with the resistance value of 100kΩ is connected in series with the resistor to be tested for voltage division; when the control module controls the sampling module 1 to be electrically conducted with the first voltage division group and the second voltage division group 4, the first voltage division resistor 3 with the resistance value of 100k omega, the second voltage division resistor 41 with the resistance value of 25k omega and the third voltage division resistor 42 with the resistance value of 20k omega can form an equivalent resistor with the resistance value of 10k omega, so that the voltage division resistor with the resistance value of 10k omega and the resistor to be tested are connected in series for voltage division; when the control module controls the sampling module 1 to be electrically conducted with the first voltage division group, the second voltage division group 4 and the third voltage division group 5, the first voltage division resistor 3 with the resistance value of 100k omega, the second voltage division resistor 41 with the resistance value of 25k omega, the third voltage division resistor 42 with the resistance value of 20k omega, the fourth voltage division resistor 51 with the resistance value of 2.5k omega and the fifth voltage division resistor 52 with the resistance value of 2k omega can form an equivalent resistance with the resistance value of 1k omega, so that the voltage division resistor with the resistance value of 1k omega and the resistor to be tested are serially connected for voltage division.
As shown in fig. 2 and fig. 3, in an embodiment of the present utility model, the voltage dividing resistors of each voltage dividing group may include pull-up resistors, one end of each voltage dividing resistor is electrically connected to a preset power source, the preset power source has a preset voltage, and the other end of each voltage dividing resistor is electrically connected to the sampling module 1.
By electrically connecting one end of the voltage dividing resistor with a preset power supply and the other end of the voltage dividing resistor with the sampling module 1, the voltage dividing resistor can be made to be a pull-up resistor, and the preset power supply has a preset voltage so as to provide voltage for the voltage dividing resistor.
As shown in fig. 2 and 3, optionally, the other end of the first voltage division group may be directly electrically connected to the sampling module 1 through an electrical signal line, so that the first voltage division group may be always electrically connected to the sampling module 1, the other end of the second voltage division group 4 may be electrically connected to the sampling module 1 through a first switch, so that the second voltage division group 4 may be selectively electrically connected to the sampling module 1, and the other end of the third voltage division group 5 may be electrically connected to the sampling module 1 through a second switch, so that the third voltage division group 5 may be selectively electrically connected to the sampling module 1.
As shown in fig. 1 and fig. 4, in an embodiment of the present utility model, the number of resistors to be measured may be plural, and the temperature sampling circuit may further include a gating module 6, where the sampling module 1 is selectively electrically connected to the plural resistors to be measured through the gating module 6, and is electrically connected to the voltage dividing module 2 through the gating module 6, and is selectively electrically connected to at least one voltage dividing group.
In practical application, the battery may have a plurality of to-be-measured temperature points to be detected, which requires a plurality of to-be-measured resistors to be arranged in one-to-one correspondence with a plurality of to-be-measured Wen Dianwei, so that the temperatures of the to-be-measured temperature points of the battery can be calculated by sampling the partial pressures of the plurality of to-be-measured resistors.
As shown in fig. 1 and fig. 4, in an embodiment of the present utility model, the strobe module 6 may have a plurality of selection ports and a plurality of communication ports, the sampling module 1 may have a plurality of strobe ports, the plurality of strobe ports are electrically connected to the plurality of selection ports, the plurality of communication ports are electrically connected to the plurality of resistors to be tested in a one-to-one correspondence manner, and the plurality of strobe ports are used for sending signals to the plurality of selection ports, so that the plurality of communication ports and the plurality of resistors to be tested are selectively electrically conducted through cooperation of the plurality of selection ports.
In practical applications, the multiple gating ports may send, for example, a high-level signal or a low-level signal to the multiple selection ports, or the multiple gating ports may not send a signal to the multiple selection ports, so that the multiple selection ports may form different signal combinations of the high-level signal and the low-level signal, or form a state of not receiving the signal, so that multiple resistors to be tested and the sampling module 1 can be selectively electrically conducted through cooperation of the multiple selection ports.
Optionally, the number of selected ports may be less than the number of connected ports, so that the number of selected ports is less than the number of gate ports of the resistors to be tested, and the partial voltages of all the resistors to be tested can be sampled, for example, the gate module 6 may use a 3-gate 8-way chip, the 3-gate 8-way chip may have 3 selected ports and 8 connected ports, the 3 selected ports may be electrically connected with the 3 gate ports in a one-to-one correspondence manner, and the 8 connected ports may be electrically connected with the 8 resistors to be tested in a one-to-one correspondence manner, so that the partial voltages of the 8 resistors to be tested may be sampled by means of the 3 gate ports.
As shown in fig. 1 to 3, in an embodiment of the present utility model, the sampling module 1 may have selection ports, and the number of the selection ports is the same as the number of the voltage division groups that can be selectively electrically connected in the voltage division module 2, and the sampling module 1 is electrically connected to the voltage division groups that can be selectively electrically connected through the selection ports in a one-to-one correspondence.
As shown in fig. 1-3, for example, the second voltage dividing group 4 and the third voltage dividing group 5 are respectively and selectively communicated with the sampling module 1, so that the number of the selection ports of the adopted module can be two, one of the two selection ports is electrically connected with the second voltage dividing group 4, the other is electrically connected with the third voltage dividing group 5, and the first voltage dividing group is always electrically communicated with the sampling module 1 through the gating module 6, therefore, the sampling module 1 does not need to be separately provided with the selection ports to be electrically connected with the first voltage dividing group, thereby realizing the electrical connection of the sampling module 1 and the voltage dividing module 2, being selectively electrically communicated with at least one voltage dividing group, and being capable of reducing the number of the selection ports.
As shown in fig. 1 to fig. 4, in an embodiment of the present utility model, the number of the voltage division modules 2 may be plural, the number of the gate modules 6 may be plural, the sampling module 1 may have plural sampling ports, the plural voltage division modules 2 are electrically connected to the plural gate modules 6 in one-to-one correspondence, and the sampling module 1 is electrically connected to the plural gate modules 6 in one-to-one correspondence through the plural sampling ports, for sampling the voltage division of the resistor to be tested electrically connected to the corresponding gate module 6 through the sampling ports.
That is, the sampling module 1 is electrically connected to the plurality of gate modules 6 through the plurality of sampling ports in one-to-one correspondence, so as to be electrically connected to the plurality of voltage dividing modules 2 through the plurality of gate modules 6 in one-to-one correspondence, and, since each gate module 6 may be electrically connected to at least one resistor to be tested, the sampling module 1 is electrically connected to the plurality of gate modules 6 through the plurality of sampling ports in one-to-one correspondence, may be electrically connected to the resistor to be tested electrically connected to the corresponding gate module 6 through the sampling port, so as to be able to sample the voltage division of the resistor to be tested electrically connected to the corresponding gate module 6 through the sampling port.
As shown in fig. 1 to fig. 4, the application of the temperature sampling circuit provided by the embodiment of the present utility model will be described in detail below with a specific embodiment, in which the control module adopts a micro control unit (Microcontroller Unit, abbreviated as MCU), the sampling module 1 adopts a Front sampling chip (abbreviated as AFE) with a model of LTC6813, the gating module 6 may adopt a 3-gate 8 chip with a model of MC74HC4051A, the number of gating modules 6 is two, the number of voltage dividing modules 2 is two, and the resistance to be measured is a thermistor with a negative temperature coefficient (Negative Temperature Coefficient, abbreviated as NTC), but for the temperature sampling circuit provided by the embodiment of the present utility model, the types of the control module, the sampling module 1, the gating module 6 and the resistance to be measured are not limited thereto, and the numbers of the control module, the sampling module 1, the voltage dividing module 2 and the gating module 6 are not limited thereto.
When the battery management system (Battery Manage System, abbreviated as BMS) starts to operate, the control module wakes up and configures the sampling module 1 through the serial peripheral interface (Serial Peripheral Interface, abbreviated as SPI) communication bus, configures the ports GPIO1 and GPIO2 of the general purpose Input output (General Purpose Input Output, abbreviated as GPIO) ports of the sampling module 1 as analog Input (Analog to Digital, abbreviated as AD) (i.e., voltage Input) ports, configures the ports GPIO 3-GPIO 9 as Input & output (abbreviated as IO) ports, the two voltage dividing modules 2 may each include a first voltage dividing group, a second voltage dividing group 4 and a third voltage dividing group 5, the two gating modules 6 each have 3 selected ports and 8 connected ports, the 3 selected ports are respectively the ports a, the ports B and the ports C, and the 8 connected ports are respectively the ports X0 to X7.
The port GPIO1 may be used as one sampling port of the sampling module 1 and electrically connected to the electrical signal point RTOUT1 of one gating module 6 through the electrical signal line ADC T1, and the port GPIO2 may be used as another sampling port of the sampling module 1 and electrically connected to the electrical signal point RTOUT2 of another gating module 6 through the electrical signal line ADC T2, so that the sampling module 1 is electrically connected to two gating modules 6. The port GPIO3 may be electrically connected to the port a as one selected port of the gating module 6 through the electrical signal line X1 as one gating port of the sampling module 1, the port GPIO4 may be electrically connected to the port B as another selected port of the gating module 6 through the electrical signal line X2 as another gating port of the sampling module 1, and the port GPIO5 may be electrically connected to the port C as another selected port of the gating module 6 through the electrical signal line X3 as another gating port of the sampling module 1. The port GPIO6 may be electrically connected to the third voltage division group 5 of the one voltage division module 2 through the electrical signal line IO1 as one selection port of the sampling module 1, the port GPIO7 may be electrically connected to the second voltage division group 4 of the one voltage division module 2 through the electrical signal line IO2 as another selection port of the sampling module 1, the port GPIO8 may be electrically connected to the third voltage division group 5 of the other voltage division module 2 through the electrical signal line IO3 as another selection port of the sampling module 1, and the port GPIO9 may be electrically connected to the second voltage division group 4 of the other voltage division module 2 through the electrical signal line IO4 as another selection port of the sampling module 1. The ports X0-X7 of one gating module 6 can be electrically connected with 8 resistors to be tested through the electric signal lines RT 9-RT 16 in a one-to-one correspondence manner, and can be electrically conducted with the electric signal points RTOUT1 through the electric signal lines RT 9-RT 16 in a one-to-one correspondence manner, so that the 8 resistors to be tested are conducted with the sampling module 1 through the electric signal lines RT 9-RT 16 in a one-to-one correspondence manner, the ports X0-X7 of the other gating module 6 can be electrically connected with the other 8 resistors to be tested through the electric signal lines RT 1-RT 8 in a one-to-one correspondence manner, and can be electrically conducted with the electric signal points RTOUT2 through the electric signal lines RT 1-RT 8 in a one-to-one correspondence manner, so that the other 8 resistors to be tested are conducted with the sampling module 1 through the electric signal lines RT 1-RT 8 in a one-to-one correspondence manner. The two voltage division modules 2 may be electrically connected to a preset power supply through a preset voltage point VREF2, one voltage division module 2 may be electrically connected to one gating module 6 through an electrical signal point RTOUT1, and the other voltage division module 2 may be electrically connected to the other gating module 6 through an electrical signal point RTOUT 2.
In practical application, the sampling module 1 may send electrical signals to the ports a-C of the two gating modules 6 through the electrical signal lines X1-X3 corresponding to the ports GPIO 3-GPIO 5 one by one, so as to control the ports X0-X7 of one gating module 6 to be electrically conducted with 8 resistors to be tested in sequence through the electrical signal lines RT 1-RT 8, and control the ports X0-X7 of the other gating module 6 to be electrically conducted with the other 8 resistors to be tested in sequence through the electrical signal lines RT 9-RT 16. Specifically, as shown in table 1 below, taking control of the port X1 as an example, when the port GPIO 3-GPIO 5 sends an electrical signal to the port a-port C via the electrical signal line X1-electrical signal line X3, and the ports C and B are L (representing low level), and the port a is H (representing high level), the Enable column of the port X1 is L, and represents that the port X0 is started, so that the electrical signal line RT9 and the electrical signal point RTOUT1 can be electrically conducted, so that 1 resistor to be tested electrically connected to the electrical signal line RT9 can be electrically conducted with the sampling module 1, and control of the port X0 and the port X2-port X7 is similar to control of the port X1, which will not be described again herein, see table 2 below in detail, when the ports a-port C are both X (representing unrelated positions), the Enable column is H, and the ports X0-port X7 are opened (NONE).
FUNCTION TABLE-MC74HC4051A
X=Don’t Care
TABLE 1
In practical application, the sampling circuit can sequentially switch the voltage division group of electric conduction between the preset voltage point VREF2 and the electric signal point RTOUT1 and the voltage division group of point conduction between the preset voltage point VREF2 and the electric signal point RTOUT2 through the electric signal line IO 1-electric signal line IO4 in one-to-one correspondence with the port GPIO 6-port GPIO9, so that the first voltage division group, the second voltage division group 4 and the third voltage division group 5 with the equivalent resistance value of 1kΩ are connected in series to divide the voltage, or the first voltage division group and the second voltage division group 4 with the equivalent resistance value of 10kΩ are connected in series to divide the voltage, or the first voltage division group with the resistance value of 100kΩ is connected in series to the resistance to be measured. Specifically, as shown in the following table 2, taking the control of the series voltage division between the first voltage division group and the second voltage division group 4 with the equivalent resistance value of 10kΩ and the resistor to be tested as an example, when the port GPIO6 sends an electrical signal to the electrical signal line IO1, so that the electrical signal line IO1 is H/Z (representing high level or high impedance), the port GPIO7 sends an electrical signal to the electrical signal line IO2, so that the electrical signal line IO2 is L (representing low level), the third voltage division group 5 electrically connected to the electrical signal line IO1 is not conducted with the electrical signal point RTOUT1, and the second voltage division group 4 electrically connected to the electrical signal line IO2 is conducted with the electrical signal point RTOUT1, so that at this time, the control of the series voltage division between the first voltage division group and the second voltage division group 4 with the equivalent resistance value of 10kΩ and the resistor to be tested is similar to the control of the series voltage division between the first voltage division group and the second voltage division group 4 with the equivalent resistance to be tested, and the control of the series voltage division between the first voltage division group and the second voltage division group 4 with the resistor to be tested are not described herein, and the detailed table will be described below.
IO1 IO2 VREF2-RTOUT1 resistance
H/Z H/Z 100K
H/Z L 10K
L L 1K
IO3 IO4 VREF2-RTOUT2 resistance
H/Z H/Z 100K
H/Z L 10K
L L 1K
TABLE 2
In practical application, after the voltage division of the resistor to be tested can pass through the filter circuit, an analog voltage signal is input to the sampling module 1 through the port GPIO1 by the electric signal line ADC T1, or is input to the sampling module 1 through the port GPIO2 by the electric signal line ADC T2, the sampling module 1 samples the analog voltage signals of the port GPIO1 and the port GPIO2, and then the sampled analog voltage signals can be uploaded to the control module through the serial peripheral interface (Serial Peripheral Interface, abbreviated as SPI) communication bus, and the control module can perform filtering conversion on the sampled analog voltage signals according to the resistance value and the temperature correspondence table of the resistor to be tested, and select a corresponding voltage set according to the converted temperature value or temperature interval to calculate the temperature of the battery to be tested corresponding to the final resistor to be tested.
For example, alternatively, a first partial pressure group having a resistance value of 100kΩ may be selected in a temperature range of-40 ℃ to-6 ℃, a first partial pressure group and a second partial pressure group 4 having a resistance value of 10kΩ may be selected in a temperature range of-5 ℃ to 55 ℃, and a first partial pressure group, a second partial pressure group 4 and a third partial pressure group 5 having a resistance value of 1kΩ may be selected in a temperature range of 56 ℃ to 125 ℃.
As shown in Table 3 below, table 3 is a negative temperature coefficient thermistor resistance versus temperature correspondence table, as shown in Table 4 below and Table 5 below, in which-40 ℃, -5 ℃, 25 ℃, 55 ℃ and 125 ℃ can be selected as comparison temperature points, taking 1% of analog voltage signal sampling accuracy as an example, comparing the error of temperature sampling in the prior art (Table 4) with the error of temperature sampling in the temperature sampling circuit provided in the embodiment of the present utility model (Table 5), it can be seen that the error of temperature sampling in the prior art at-5 ℃, 25 ℃ and 55 ℃ can reach an error of 1 ℃, the temperature sampling circuit can meet the national standard requirements, the temperature sampling errors at-40 ℃ and 125 ℃ are 4 ℃ and 5 ℃ respectively, and cannot meet the national standard requirements, the temperature sampling errors at-40 ℃, -5 ℃, 25 ℃ and 55 ℃ can reach the national standard requirements, the temperature sampling error at 125 ℃ is 2 ℃, and the temperature sampling circuit can also meet the national standard requirements, so that the temperature sampling circuit provided by the embodiment of the utility model can improve the temperature sampling precision.
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TABLE 3 Table 3
TABLE 4 Table 4
TABLE 5
The embodiment of the utility model also provides a battery management system which comprises the temperature sampling circuit provided by the embodiment of the utility model.
The battery management system provided by the embodiment of the utility model can improve the accuracy of temperature sampling by means of the temperature sampling circuit provided by the embodiment of the utility model.
In summary, the temperature sampling circuit and the battery management system provided by the embodiment of the utility model can improve the accuracy of temperature sampling.
It is to be understood that the above embodiments are merely illustrative of the application of the principles of the present utility model, but not in limitation thereof. Various modifications and improvements may be made by those skilled in the art without departing from the spirit and substance of the utility model, and are also considered to be within the scope of the utility model.

Claims (11)

1. The temperature sampling circuit is used for calculating temperature by sampling the partial pressure of a resistor to be measured and is characterized by comprising a control module, a sampling module and a partial pressure module, wherein the partial pressure module comprises a plurality of partial pressure groups connected in parallel, each partial pressure group comprises a partial pressure resistor, the sampling module is electrically connected with the resistor to be measured and the partial pressure module, and is selectively electrically connected with at least one partial pressure group so as to lead the at least one partial pressure group to be selectively connected with the resistor to be measured in series for partial pressure, and the sampling module is used for sampling the partial pressure of the resistor to be measured;
the control module is electrically connected with the sampling module and is used for controlling the sampling module to be selectively electrically conducted with at least one voltage division group, obtaining the voltage division of the resistor to be tested sampled by the sampling module and calculating the temperature according to the resistance value of at least one voltage division group and the voltage division of the resistor to be tested.
2. The temperature sampling circuit of claim 1, wherein the voltage division module comprises a first voltage division group, a second voltage division group, and a third voltage division group, the first voltage division group being in electrical communication with the sampling module, the second voltage division group and the third voltage division group being in selectable electrical communication with the sampling module, respectively.
3. The temperature sampling circuit according to claim 2, wherein the resistance of the first voltage division group is 90kΩ -110kΩ, and/or the resistance of the equivalent resistances of the first voltage division group and the second voltage division group is 5kΩ -15kΩ, and/or the resistance of the equivalent resistances of the first voltage division group, the second voltage division group, and the third voltage division group is 0.7kΩ -1.3kΩ.
4. A temperature sampling circuit according to claim 3, wherein the resistance of the first voltage division group is 100kΩ, and/or the resistances of the equivalent resistances of the first voltage division group and the second voltage division group are 10kΩ, and/or the resistances of the equivalent resistances of the first voltage division group, the second voltage division group, and the third voltage division group are 1kΩ.
5. The temperature sampling circuit according to claim 4, wherein the first voltage dividing group comprises a first voltage dividing resistor, the resistance value of the first voltage dividing resistor is 100kΩ, and/or the second voltage dividing group comprises a second voltage dividing resistor and a third voltage dividing resistor connected in parallel, the resistance value of the second voltage dividing resistor is 25kΩ, the resistance value of the third voltage dividing resistor is 20kΩ, and/or the third voltage dividing resistor comprises a fourth voltage dividing resistor and a fifth voltage dividing resistor connected in parallel, the resistance value of the fourth voltage dividing resistor is 2.5kΩ, and the resistance value of the fifth voltage dividing resistor is 2kΩ.
6. The temperature sampling circuit of claim 1, wherein the voltage dividing resistors of each voltage dividing group comprise a pull-up resistor, one end of each voltage dividing resistor is electrically connected with a preset power supply, the preset power supply has a preset voltage, and the other end of each voltage dividing resistor is electrically connected with the sampling module.
7. The temperature sampling circuit of claim 1, wherein the number of resistors to be measured is a plurality, the temperature sampling circuit further comprising a gating module, the sampling module being selectively electrically connected to the plurality of resistors to be measured through the gating module, and being electrically connected to the voltage dividing module through the gating module, and being selectively electrically conductive to at least one of the voltage dividing groups.
8. The temperature sampling circuit of claim 7, wherein the strobe module has a plurality of select ports and a plurality of communication ports, the sampling module has a plurality of strobe ports, the plurality of strobe ports are electrically connected with the plurality of select ports, the plurality of communication ports are electrically connected with the plurality of resistors to be measured in one-to-one correspondence, and the plurality of strobe ports are used for sending signals to the plurality of select ports to selectively electrically conduct the plurality of resistors to be measured with the sampling module through cooperation of the plurality of select ports.
9. The temperature sampling circuit of claim 7, wherein the sampling module has selection ports, and the number of the selection ports is the same as the number of the voltage division groups selectively electrically connected in the voltage division module, and the sampling module is electrically connected to the voltage division groups selectively electrically connected through the selection ports in one-to-one correspondence.
10. The temperature sampling circuit according to claim 9, wherein the number of the voltage dividing modules is a plurality, the number of the gating modules is a plurality, the sampling modules are provided with a plurality of sampling ports, the plurality of the voltage dividing modules are in one-to-one correspondence with the plurality of the gating modules and are electrically connected with the plurality of the gating modules, and the sampling modules are electrically connected with the plurality of the gating modules through the plurality of the sampling ports and are used for sampling the voltage division of the resistor to be measured electrically connected with the corresponding gating modules through the sampling ports.
11. A battery management system comprising a temperature sampling circuit according to any one of claims 1-10.
CN202320484826.4U 2023-03-14 2023-03-14 Temperature sampling circuit and battery management system Active CN219495505U (en)

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