CN218727871U - Temperature simulation mechanism and temperature test equipment - Google Patents
Temperature simulation mechanism and temperature test equipment Download PDFInfo
- Publication number
- CN218727871U CN218727871U CN202222808646.5U CN202222808646U CN218727871U CN 218727871 U CN218727871 U CN 218727871U CN 202222808646 U CN202222808646 U CN 202222808646U CN 218727871 U CN218727871 U CN 218727871U
- Authority
- CN
- China
- Prior art keywords
- branch
- temperature
- simulation
- resistance
- transmission branch
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
- Y02E60/10—Energy storage using batteries
Landscapes
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The utility model relates to the BMS testing technical field and discloses a temperature testing device, which comprises a temperature simulation mechanism and a temperature signal acquisition mechanism; the temperature simulation mechanism comprises a connector, a simulation assembly and a switching assembly; the number of the analog components is at least two; the analog component comprises a low-resistance branch circuit, a first constant-value resistor, a high-resistance branch circuit and a second constant-value resistor; the resistance values of the first constant value resistor and the second constant value resistor are different; the switching component comprises a first transmission branch, a second transmission branch and a switching element; the switching element is used for controlling the respective communication states of the first transmission branch and the second transmission branch. By accessing fixed value resistors with different resistance values, the test of data samples with multiple groups of resistance values is realized instead of environment temperature change, the test accuracy is improved, and the test efficiency is improved by simple operation. And through setting up multiunit simulation subassembly, guarantee once only to the test of multiunit temperature signal acquisition branch road, further improve efficiency of software testing.
Description
Technical Field
The utility model relates to a BMS tests technical field, especially relates to a temperature simulation mechanism and temperature test equipment.
Background
A BMS (BATTERY MANAGEMENT SYSTEM) BATTERY SYSTEM is commonly called a BATTERY caregiver or a BATTERY manager, and is mainly used for intelligently managing and maintaining each BATTERY cell, preventing overcharge and overdischarge of the BATTERY, prolonging the service life of the BATTERY, and monitoring the state of the BATTERY. Be provided with multiple module in the BMS, and temperature signal gathers the module and is exactly one of the important module of BMS, gathers the temperature that is used for monitoring electric core through temperature signal to prevent the thermal runaway's the condition. The existing BMS generally uses a mode of voltage division by a built-in resistor and an NTC (Negative Temperature Coefficient) in series in Temperature signal acquisition, and the NTC refers to a thermistor phenomenon and a component made of materials, wherein the resistance decreases in an exponential relationship with the Temperature rise and has a Negative Temperature Coefficient. The change of the cell temperature can cause the change of the resistance value of the NTC, and then the temperature of the cell can be determined by detecting the resistance value of the NTC.
The temperature signal acquisition module of current BMS needs to be tested before leaving the factory, the current way is to connect a temperature sensitive resistor in series on the temperature signal acquisition module, replace NTC in the actual work through temperature sensitive resistor and carry out the partial pressure, but because the test environment temperature is almost the fixed value, so the resistance value of the reaction temperature of test is the fixed value, lack multiunit sample test data, lead to testing inaccurate, and because be provided with multiunit temperature signal acquisition branch road in the BMS, so just need insert temperature sensitive resistor in proper order and test in each branch road, lead to the efficiency of software testing low.
SUMMERY OF THE UTILITY MODEL
The to-be-solved technical problem of the utility model is:
the test result is inaccurate and the test efficiency is low.
In order to solve the technical problem, the utility model provides a temperature simulation mechanism, include:
a connector;
the simulation assemblies are connected with the connectors, and the number of the simulation assemblies is at least two; the analog component comprises a low-resistance branch circuit, a first constant-value resistor arranged on the low-resistance branch circuit, a high-resistance branch circuit and a second constant-value resistor arranged on the high-resistance branch circuit; the first constant resistor and the second constant resistor have different resistance values; and
the switching component is connected with the analog component; the switching assembly comprises a first transmission branch, a second transmission branch and a switching element for connecting the first transmission branch and the second transmission branch; the first transmission branch circuit is connected with each of the low-resistance branch circuits of the simulation assembly in sequence, the second transmission branch circuit is connected with each of the high-resistance branch circuits of the simulation assembly in sequence, the first transmission branch circuit is connected with the second transmission branch circuit in parallel and grounded and then connected with the connector, and the switch element is used for controlling the respective communication states of the first transmission branch circuit and the second transmission branch circuit.
Compared with the prior art, the temperature simulation mechanism has the beneficial effects that:
through set up first definite value resistance on low resistance branch road, set up second definite value resistance on high resistance branch road, the respective connected state of first transmission branch road and second transmission branch road is controlled to the switching element, through the definite value resistance of switching in different resistance values, replaces ambient temperature's change and tests, realizes the data sample test of multiunit resistance value, improves the accuracy of test, easy operation improves efficiency of software testing moreover. And through setting up multiunit simulation subassembly, guarantee once only to the test of multiunit temperature signal acquisition branch road, further improve efficiency of software testing.
In one embodiment, the switching element includes a first switch disposed on the first transmission branch and a second switch disposed on the second transmission branch.
In one embodiment, the switching element is a single-pole two-way switch, and two contacts of the switching element are respectively arranged on the first transmission branch and the second transmission branch.
In one embodiment, the resistance value of the second fixed resistor is greater than the resistance value of the first fixed resistor.
In one embodiment, the resistance value of the second fixed resistor is twice that of the first fixed resistor.
In one embodiment, the number of the simulation components is four, and the simulation components are arranged in parallel and in sequence.
A temperature testing apparatus comprising:
the temperature simulation mechanism described above; and
the temperature signal acquisition mechanism is connected with the temperature simulation mechanism; the temperature signal acquisition mechanism comprises a plug electrically connected with the connector, a detection branch connected with the plug, an ADC (analog to digital converter) connected with the detection branch and a power supply connected with the detection branch; the detection branches correspond to the simulation assemblies in number, and each detection branch is electrically connected with each simulation assembly.
In one embodiment, the detection branch comprises a communication branch, a power supply branch connected with the communication branch, and a built-in constant value resistor arranged on the power supply branch; and all the communication branches are connected in parallel and then are connected with the ADC.
In one embodiment, each of the power supply branches is connected in parallel and then connected to the power supply.
In one embodiment, a grounding branch is arranged on the plug and is electrically connected with the switching assembly.
Drawings
Fig. 1 is a schematic structural diagram of a temperature measuring device according to an embodiment of the present invention;
fig. 2 is a schematic structural diagram of a temperature simulation mechanism according to a second embodiment of the present invention.
The reference numbers in the figures have the meaning:
100. a temperature testing device;
10. a temperature simulation mechanism;
20. a connector;
30. a simulation component; 31. a low resistance branch; 32. a first constant value resistor; 33. a high resistance branch; 34. a second fixed-value resistor;
40. a switching component; 41. a first transmission branch; 42. a second transmission branch; 43. a switching element; 45. a first switch; 46. a second switch;
50. a temperature signal acquisition mechanism;
60. a plug; 65. a ground branch;
70. detecting a branch circuit; 71. a communicating branch; 72. a power supply branch; 73. a fixed value resistor is arranged inside;
80. an ADC converter;
90. a power source;
10a, a temperature simulation mechanism;
43a, a switching element.
Detailed Description
In order to make the aforementioned objects, features and advantages of the present invention more comprehensible, embodiments accompanied with figures are described in detail below. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention. The present invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein, as those skilled in the art will be able to make similar modifications without departing from the spirit and scope of the present invention.
In the description of the present invention, it is to be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", and the like, indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings, and are only for convenience of description and simplicity of description, and do not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore, should not be construed as limiting the present invention.
Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In the description of the present invention, "a plurality" means at least two, e.g., two, three, etc., unless specifically limited otherwise.
In the present invention, unless otherwise expressly stated or limited, the terms "mounted," "connected," and "fixed" are to be construed broadly and may, for example, be fixedly connected, detachably connected, or integrally formed; can be mechanically or electrically connected; they may be directly connected or indirectly connected through intervening media, or they may be connected internally or in any other suitable relationship, unless expressly stated otherwise. The specific meaning of the above terms in the present invention can be understood according to specific situations by those skilled in the art.
In the present application, unless expressly stated or limited otherwise, the first feature may be directly on or directly under the second feature or indirectly via intermediate members. Also, a first feature "on," "over," and "above" a second feature may be directly or diagonally above the second feature, or may simply indicate that the first feature is at a higher level than the second feature. A first feature "under," "beneath," and "under" a second feature may be directly under or obliquely under the second feature, or may simply mean that the first feature is at a lesser elevation than the second feature.
It will be understood that when an element is referred to as being "secured to" or "disposed on" another element, it can be directly on the other element or intervening elements may also be present. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present. The terms "vertical," "horizontal," "upper," "lower," "left," "right," and the like as used herein are for illustrative purposes only and do not denote a unique embodiment.
Referring to fig. 1, a temperature measuring device 100 according to an embodiment of the present invention includes a temperature simulating mechanism 10 and a temperature signal collecting mechanism 50 connected to the temperature simulating mechanism 10. The temperature simulation mechanism 10 includes a connection head 20, a simulation module 30 connected to the connection head 20, and a switching module 40 connected to the simulation module 30. The simulation modules 30 are provided in a number of at least two; the analog component 30 comprises a low-resistance branch 31, a first constant-value resistor 32 arranged on the low-resistance branch 31, a high-resistance branch 33 and a second constant-value resistor 34 arranged on the high-resistance branch 33; the resistance values of the first constant value resistor 32 and the second constant value resistor 34 are different, the first constant value resistor 32 and the second constant value resistor 34 with different resistance values are switched into a circuit, the change situation of the environmental temperature change to the resistance values is replaced, the operation is simple and convenient, the testing efficiency is improved, the testing of a plurality of groups of resistance value data samples is realized, and the testing accuracy is improved. The switching assembly 40 includes a first transmission branch 41, a second transmission branch 42, a switching element 43 connecting the first transmission branch 41 and the second transmission branch 42; the first transmission branch 41 is connected with the low-resistance branch 31 of each analog component 30 in sequence, the second transmission branch 42 is connected with the high-resistance branch 33 of each analog component 30 in sequence, the first transmission branch 41 and the second transmission branch 42 are connected with the connector 20 after being grounded in parallel, the switching element 43 is used for controlling the respective communication state of the first transmission branch 41 and the second transmission branch 42, namely the switching element 43 is used for controlling the communication state of the first constant-value resistor 32 and the second constant-value resistor 34 connected into the circuit, so that the test method of replacing the environmental temperature change by the constant-value resistors connected with different resistance values is realized, and the operation is simple and convenient.
The temperature signal collecting mechanism 50 is a temperature signal collecting module inside the BMS; the temperature signal collecting mechanism 50 includes a plug 60 electrically connected to the connector 20, a detection branch 70 connected to the plug 60, an ADC converter 80 connected to the detection branch 70, and a power supply 90 (VCC) connected to the detection branch 70. Wherein (ADC is the abbreviation of English Analog-to-Digital Converter, also known as Analog-to-Digital Converter, the effect is the Digital code of converting battery voltage value Analog to binary to offer the cell-phone and detect the use as the electric quantity), this detection branch 70 is corresponding with the quantity that sets up of Analog component 30, each detection branch 70 is connected each Analog component 30 respectively electrically, this detection branch 70 is used for supplying BMS to carry out temperature signal collection, guarantees the BMS through designing multiunit detection branch 70 and carries out the demand of gathering to multiunit temperature signal.
In the temperature simulation mechanism 10, the first fixed value resistor 32 is disposed on the low resistance branch 31, the second fixed value resistor 34 is disposed on the high resistance branch 33, the switching element 43 controls the respective communication states of the first transmission branch 41 and the second transmission branch 42, and the fixed value resistors with different resistance values are connected to replace the change of the ambient temperature for testing, so that the data sample test with a plurality of groups of resistance values is realized, the test accuracy is improved, the operation is simple, and the test efficiency is improved. And through setting up multiunit simulation subassembly 30, guarantee once only to the test of multiunit temperature signal acquisition branch road, further improve efficiency of software testing.
Further, each analog component 30 is connected to a different antenna of the connector 20, and the analog component 30 is electrically connected to the detection branch circuit 70 through the connector 20 and the plug 60. The low resistance branch 31 and the high resistance branch 33 of each analog component 30 are connected in parallel and then connected to the same antenna of the connector 20, and the resistance value of the second fixed resistor 34 is greater than that of the first fixed resistor 32, so as to ensure that the resistance value on the high resistance branch 33 connected to the detection branch 70 is greater than that on the low resistance branch 31 connected to the detection branch 70, thereby realizing data sample test of two fixed resistors with different resistance values. In this embodiment, the resistance value of the second fixed resistor 34 is twice the resistance value of the first fixed resistor 32, and when the resistance value changes twice and ensures enough obvious variation, the calculation of the tester is facilitated, and then whether the circuit of the temperature signal acquisition mechanism 50 is up to standard or not is ensured to be judged quickly, and the test efficiency is ensured.
Furthermore, the number of the simulation assemblies 30 is four, the simulation assemblies 30 are sequentially arranged in parallel, the connector 20 is correspondingly provided with six antennae, wherein the four antennae are respectively connected with the four simulation assemblies 30, and the other two antennae are used for grounding, so that the normal state of the test circuit is ensured.
Furthermore, the first transmission branch 41 is sequentially connected to the low resistance branches 31 of the analog components 30, and the first constant value resistor 32 is connected to the circuit through the first transmission branch 41; the second transmission branch 42 is connected to the high resistance branches 33 of the analog components 30 in sequence, the second fixed resistor 34 is connected to the circuit through the second transmission branch 42, and the first transmission branch 41 and the second transmission branch 42 are grounded in parallel and then connected to two grounding antennas of the connector 20. In the present embodiment, the switching element 43 includes a first switch 45 disposed on the first transmission branch 41, a second switch 46 disposed on the second transmission branch 42; the first switch 45 controls the conducting state of the first transmission branch 41, the second switch 46 controls the conducting state of the second transmission branch 42, and when the first switch 45 is connected with the second switch 46 and is disconnected, the first fixed value resistor 32 is connected into the circuit; when the second switch 46 is connected and the first switch 45 is disconnected, the second fixed-value resistor 34 is connected into the circuit.
Further, referring to fig. 1 again, the plug 60 is electrically connected to the connector 20 correspondingly, the number of the antennas provided in the plug 60 is the same as that of the connector 20, and each antenna in the plug 60 is connected to each antenna in the connector 20. In the present embodiment, the plug 60 is correspondingly provided with six antennas, wherein four antennas are respectively connected with four antennas of the connector 20 of the connection simulation module 30, and the other two antennas are used for grounding; the plug 60 is provided with a grounding branch 65, the grounding branch 65 is electrically connected with the switching component 40, and the grounding branch 65 is connected with two antennas of the plug 60 for grounding.
Further, the detection branch 70 includes a communication branch 71, a power supply branch 72 connected to the communication branch 71, and a built-in constant resistor 73 provided in the power supply branch 72. One end of the communication branch 71 is connected with the antenna of the plug 60, the other end of the communication branch 71 is connected with the ADC converter 80, the communication branches 71 are connected in parallel and then connected with the ADC converter 80, and the ADC converter 80 is configured to measure a voltage at a connection position of the communication branch 71 and the power supply branch 72, that is, a divided voltage of the analog component 30 in the access circuit. One end of the power supply branch 72 is connected with the communication branch 71, the other end of the power supply branch 72 is connected with the power supply 90, each power supply branch 72 is connected with the power supply 90 after being connected in parallel, the built-in constant value resistor 73 is correspondingly arranged on the power supply branch 72, the power supply 90 is used for providing voltage required by testing, after current passes through the built-in constant value resistor 73, the current passes through the plug 60 and the connector 20, passes through the simulation assembly 30, and then enters the grounding branch 65 through the switching assembly 40 to form circulation, so that the completion of the testing is ensured.
The utility model discloses a working process does: during testing, the first switch 45 is first turned on, the second switch 46 is turned off, and the first transmission branch 41 is then turned on, i.e. the low resistance branch 31 and the first fixed value resistor 32 are connected into a circuit. Since the first fixed resistor 32 and the built-in fixed resistor 73 are fixed resistors, the resistance value of the first fixed resistor 32 is known as R 1 The resistance value of the built-in constant value resistor 73 is R 0 (ii) a Measure the input voltage of the power supply 90 as U VCC The voltage detected by the ADC converter 80 is U 1 . The resistance value R 'of the first constant value resistor 32 is calculated by a formula' 1 ，
Then calculating the obtained R' 1 With known R 1 Are compared, e.g. R' 1 And R 1 The numerical values are equal, which indicates that the circuit of the temperature signal acquisition mechanism 50 is normal, such as R' 1 And R 1 If the values are not equal, it indicates that the circuit of the temperature signal acquisition mechanism 50 has a problem, and the first test is completed.
And performing a second test, namely disconnecting the first switch 45 and connecting the second switch 46, wherein the second transmission branch 42 is connected at the moment, namely the high-resistance branch 33 and the second fixed-value resistor 34 are connected into the circuit. As in the first test, the resistance of the second constant resistor 34 is known as R 2 The resistance value of the built-in constant value resistor 73 is still R 0 (ii) a Measure the input voltage of the power supply 90 as U VCC The voltage detected by the ADC converter 80 is U 2 . The resistance value R 'of the first constant value resistor 32 is calculated by formula' 2 ，
Then calculating the obtained R' 2 With known R 2 Are compared, e.g. R' 2 And R 2 The numerical values are equal, which indicates that the circuit of the temperature signal acquisition mechanism 50 is normal, such as R' 2 And R 2 If the values are not equal, it indicates that the circuit of the temperature signal acquisition mechanism 50 has a problem, and the second test is completed.
Because the resistance values of the first fixed-value resistor 32 and the second fixed-value resistor 34 are different, the test of two groups of numerical value samples is realized, and the accuracy of the circuit detection of the temperature signal acquisition mechanism 50 is ensured; meanwhile, the simulation components 30 are respectively correspondingly connected with the detection branches 70 in the temperature signal acquisition mechanism 50 one by one, so that all the detection branches 70 in the temperature signal acquisition mechanism 50 can be tested by one-time installation, and the testing efficiency is improved.
Referring to fig. 2, a temperature simulation mechanism 10a according to a second embodiment of the present invention is different from the temperature simulation mechanism 10 according to the first embodiment in that the switch element 43a is a single-pole double-to switch, two contacts of the switch element 43a are respectively disposed on the first transmission branch 41 and the second transmission branch 42, and the connection state between the switch element 43a and the two contacts is switched to switch the first fixed value resistor 32 or the second fixed value resistor 34 to the circuit, so that the switching control can be realized by one switch, thereby reducing the testing cost.
The technical features of the embodiments described above may be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the embodiments described above are not described, but should be considered as being within the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only represent some embodiments of the present invention, and the description thereof is specific and detailed, but not to be construed as limiting the scope of the present invention. It should be noted that, for those skilled in the art, without departing from the spirit of the present invention, several variations and modifications can be made, which are within the scope of the present invention. Therefore, the protection scope of the present invention should be subject to the appended claims.
Claims (10)
1. A temperature simulation mechanism, comprising:
a connector;
the simulation assemblies are connected with the connectors, and the number of the simulation assemblies is at least two; the analog component comprises a low-resistance branch circuit, a first constant-value resistor arranged on the low-resistance branch circuit, a high-resistance branch circuit and a second constant-value resistor arranged on the high-resistance branch circuit; the first constant resistor and the second constant resistor have different resistance values; and
the switching component is connected with the analog component; the switching assembly comprises a first transmission branch, a second transmission branch and a switching element for connecting the first transmission branch and the second transmission branch; the first transmission branch circuit is connected with each of the low-resistance branch circuits of the simulation assembly in sequence, the second transmission branch circuit is connected with each of the high-resistance branch circuits of the simulation assembly in sequence, the first transmission branch circuit is connected with the second transmission branch circuit in parallel and grounded and then connected with the connector, and the switch element is used for controlling the respective communication states of the first transmission branch circuit and the second transmission branch circuit.
2. The temperature modeling mechanism of claim 1, wherein said switching element comprises a first switch disposed on a first transmission branch, a second switch disposed on a second transmission branch.
3. The temperature simulation mechanism of claim 1, wherein the switching element is a single-pole two-way switch, and two contacts of the switching element are respectively disposed on the first transmission branch and the second transmission branch.
4. The temperature simulation mechanism according to claim 1, wherein a resistance value of the second fixed-value resistor is larger than a resistance value of the first fixed-value resistor.
5. The temperature simulation mechanism according to claim 4, wherein the resistance value of the second constant value resistor is twice as large as the resistance value of the first constant value resistor.
6. The temperature simulation mechanism according to claim 1, wherein the number of the simulation modules is four, and the simulation modules are arranged in parallel and in series.
7. A temperature testing apparatus, comprising:
a temperature simulation mechanism as claimed in any one of claims 1 to 6; and
the temperature signal acquisition mechanism is connected with the temperature simulation mechanism; the temperature signal acquisition mechanism comprises a plug electrically connected with the connector, a detection branch connected with the plug, an ADC (analog to digital converter) connected with the detection branch and a power supply connected with the detection branch; the detection branches correspond to the simulation assemblies in number, and each detection branch is electrically connected with each simulation assembly.
8. The temperature test device according to claim 7, wherein the detection branch comprises a communication branch, a power supply branch connected with the communication branch, and a built-in constant value resistor arranged on the power supply branch; and all the communication branches are connected in parallel and then are connected with the ADC.
9. The temperature testing apparatus of claim 8, wherein each of the power supply branches is connected in parallel to the power supply.
10. The temperature testing apparatus of claim 7, wherein a ground branch is disposed on the plug, the ground branch being electrically connected to the switching assembly.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202222808646.5U CN218727871U (en) | 2022-10-24 | 2022-10-24 | Temperature simulation mechanism and temperature test equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202222808646.5U CN218727871U (en) | 2022-10-24 | 2022-10-24 | Temperature simulation mechanism and temperature test equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN218727871U true CN218727871U (en) | 2023-03-24 |
Family
ID=85590039
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202222808646.5U Active CN218727871U (en) | 2022-10-24 | 2022-10-24 | Temperature simulation mechanism and temperature test equipment |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN218727871U (en) |
-
2022
- 2022-10-24 CN CN202222808646.5U patent/CN218727871U/en active Active
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN102156265B (en) | Device and method for testing health state of battery | |
| CN110389289B (en) | Insulation fault detection method and control device | |
| CN213181942U (en) | Be applicable to BMS simulation front end and gather chip functional test frock | |
| CN111239633B (en) | Battery pack pressure difference reason analysis method and device and computer equipment | |
| CN115097338A (en) | SOC calibration method, SOH estimation method, device and storage medium | |
| CN218727871U (en) | Temperature simulation mechanism and temperature test equipment | |
| CN112086697B (en) | Battery pack management system and control method thereof | |
| CN213122241U (en) | Automatic test system for testing USB3.0 interface | |
| CN218037290U (en) | Power battery BMS test system calibrating device | |
| JP2018049726A (en) | Battery temperature monitoring system | |
| CN216954910U (en) | Detection system | |
| CN216286351U (en) | Temperature test system | |
| CN103018569B (en) | A kind of wire rod impedance instrument and method of testing | |
| CN102544408B (en) | Battery box and mobile phone charging and discharging testing system | |
| CN215678565U (en) | Multi-path small resistance test circuit and system | |
| CN115421026A (en) | Aging test method, circuit and system for batch PD chips | |
| CN211293113U (en) | Test tool of battery management system | |
| CN215340072U (en) | Built-in battery grounding resistance test module applied to distribution network equipment | |
| CN114002517A (en) | Device diagnosis method, platform, system and readable storage medium | |
| CN216956293U (en) | Power battery detection device | |
| CN220552969U (en) | Universal meter simulation system of testing machine | |
| CN218866058U (en) | Power battery module detection equipment | |
| CN114002585A (en) | BMS analog front-end acquisition chip performance testing device and method | |
| CN216560753U (en) | Testing device | |
| CN217404439U (en) | Multifunctional cable sheath direct current testing device |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant |