CN219285329U

CN219285329U - Chip high-temperature aging test equipment capable of independently controlling temperature

Info

Publication number: CN219285329U
Application number: CN202223291595.XU
Authority: CN
Inventors: 王文学
Original assignee: Sanji Technology Tianjin Co ltd
Current assignee: Sanji Technology Tianjin Co ltd
Priority date: 2022-12-08
Filing date: 2022-12-08
Publication date: 2023-06-30
Anticipated expiration: 2032-12-08

Abstract

The utility model discloses chip high-temperature aging test equipment capable of independently controlling temperature, which comprises a test box and electric heating rods respectively arranged on the top wall and the bottom wall of the inner cavity of the test box, wherein a quick-release plate is arranged at the opening of the inner cavity of the test box, a fixed seat is fixed at the center of the inner cavity of the test box, a heat through groove penetrating through the top wall and the bottom wall of the inner cavity of the test box is formed in the fixed seat, a servo motor is fixedly arranged on the side wall of the test box, an output shaft of the servo motor is coaxially connected with a screw rod, the screw rod is horizontally arranged on one side of the inner cavity of the test box, a limiting rod is welded on the other side of the inner cavity of the test box, two positioning plates are symmetrically arranged in the inner cavity of the test box, one ends of the two positioning plates are respectively sleeved at two ends of the screw rod in a threaded mode, threads at the two ends of the screw rod are opposite in rotation directions, and the other ends of the two positioning plates are both sleeved on the limiting rod in a sliding mode. The chip high-temperature aging test equipment capable of controlling the temperature independently enables the test result of the chip high-temperature aging to be more accurate.

Description

Chip high-temperature aging test equipment capable of independently controlling temperature

Technical Field

The utility model belongs to the technical field of chip burn-in test, and particularly relates to chip high-temperature burn-in test equipment capable of independently controlling temperature.

Background

An IC chip is a chip formed by placing an integrated circuit formed by a large number of microelectronic devices (transistors, resistors, capacitors, etc.) on a plastic substrate. The IC chip comprises a wafer chip and a packaging chip, and the corresponding IC chip production line consists of a wafer production line and a packaging production line.

In carrying out the present utility model, the inventors have found that at least the following problems exist in this technology: after the IC chip is produced, a high temperature burn-in test is required to test its burn-in condition in a high temperature environment. However, most of the current testing devices only can bake one side of the IC chip at high temperature, while the other side is usually ignored, resulting in a large temperature difference between two sides of the IC chip, and thus the structure of the high temperature burn-in test is not accurate enough.

Therefore, we propose a chip high temperature burn-in test device capable of independently controlling temperature to solve the above problems.

Disclosure of Invention

The utility model mainly aims to provide the chip high-temperature aging test equipment capable of independently controlling the temperature, and the heat generated by the two electric heating rods can be just opposite to the top and the bottom of the chip to release, so that the temperature difference between the top and the bottom of the chip is greatly reduced, the test result of the chip high-temperature aging is more accurate, and the problems in the background technology can be effectively solved.

In order to achieve the above purpose, the present utility model adopts the following technical scheme:

the chip high-temperature aging test equipment capable of independently controlling temperature comprises a test box and electric heating rods respectively arranged on the top wall and the bottom wall of the inner cavity of the test box, wherein a quick-release plate is arranged at the opening of the inner cavity of the test box, a fixing seat is fixed at the center of the inner cavity of the test box, and a heat through groove penetrating through the top wall and the bottom wall of the fixing seat is formed in the fixing seat;

the side wall fixed mounting of testing box has servo motor, servo motor's output shaft coaxial coupling has the screw rod, the screw rod level sets up in one side of testing box inner chamber, the opposite side welding of testing box inner chamber has the gag lever post, still the symmetry is equipped with two locating plates in the testing box inner chamber, two the one end of locating plate is threaded sleeve respectively locates the both ends of screw rod, just the screw thread at screw rod both ends revolves to opposite, two the equal sliding sleeve of the other end of locating plate is located on the gag lever post.

As a preferred implementation scheme, the screw rod and the limiting rod are symmetrical to two sides of the inner cavity of the test box, and two ends of the screw rod are both in rotary connection with the test box; so that the operation of the screw is more stable.

As a preferred embodiment, the four corners of the bottom wall of the fixed seat are welded with the support posts, and the four support posts are welded on the bottom wall of the inner cavity of the test box; the electric heating rod of the bottom wall of the inner cavity of the test box is arranged on the inner sides of the four struts, so that the stability of the structure of the fixing seat is ensured.

As a preferable implementation mode, one side wall of each positioning plate, which is opposite to the other side wall, is fixedly adhered with a soft cushion, and the bottom walls of the two positioning plates are adhered to the top wall of the fixing seat; when the two positioning plates translate in opposite directions, two soft cushions can be utilized to fix the two ends of the chip.

As a preferred embodiment, temperature sensors are arranged on two sides of the top wall and two sides of the bottom wall of the fixing seat, four temperature sensors are arranged in total, a display screen and a controller are arranged on the side wall of the test box, and the display screen and the four temperature sensors are electrically connected with the controller; the four temperature sensors can detect the temperature above and below the fixing seat at the same time, so that the temperature is controlled more accurately.

As a preferred embodiment, the opening of the inner cavity of the test box is arranged on the side wall of the inner cavity of the test box, two sides of the opening of the inner cavity of the test box are fixedly adhered with base plates, magnets are embedded on one sides of the two base plates, which are opposite to the fixed seat, and the quick release plate is magnetically attracted and fixed with the two magnets; the quick release plate is made of iron, so that the quick release plate can be attracted with two magnets to seal the inner cavity of the test box.

In summary, the technical effects and advantages of the present utility model are:

according to the chip high-temperature aging test equipment capable of controlling temperature independently, the chip is placed on the fixed seat, the servo motor is enabled to operate to drive the screw to operate, the two positioning plates are enabled to slide along the limiting rod, the two positioning plates are driven to position the chip all the time, the chip is always positioned in the center of the fixed seat, heat generated by the two electric heating rods can be just opposite to the top and the bottom of the chip to be released, the temperature difference between the top and the bottom of the chip is greatly reduced, and therefore the chip high-temperature aging test result is more accurate;

this but chip high temperature ageing test equipment of independent control temperature through all setting up two temperature sensor at the top and the bottom of fixing base, carries out real-time detection to the temperature in the test box to show temperature numerical value on the display screen through the controller, make personnel can be according to the power of temperature value real-time control electrical heating stick, thereby more conveniently adjust the temperature, make the temperature of high temperature ageing test more accurate.

Drawings

FIG. 1 is a schematic diagram of the overall structure of the present utility model;

FIG. 2 is a cross-sectional view taken at A-A of FIG. 1 in accordance with the present utility model;

FIG. 3 is a cross-sectional view taken at B-B of FIG. 1 in accordance with the present utility model;

FIG. 4 is a schematic view of the cartridge of the present utility model after separation from the quick release plate.

In the figure: 1. a test cartridge; 2. a quick release plate; 3. a handle; 4. a fixing seat; 5. a heat-conducting groove; 6. a servo motor; 7. a screw; 8. a limit rod; 9. a positioning plate; 10. a soft cushion; 11. a support post; 12. a temperature sensor; 13. an electric heating rod; 14. a display screen; 15. a controller; 16. a backing plate; 17. and (3) a magnet.

Detailed Description

The following description of the embodiments of the present utility model will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present utility model, but not all embodiments.

Referring to fig. 1-4, the chip high temperature aging test equipment capable of controlling temperature independently comprises a test box 1 and electric heating rods 13 respectively arranged on the top wall and the bottom wall of the inner cavity of the test box 1, wherein the two electric heating rods 13 are connected with an external power supply so as to enable the test box to release heat in normal operation, a quick-release plate 2 is arranged at an opening of the inner cavity of the test box 1, a handle 3 is fixedly connected to the quick-release plate 2, a fixing seat 4 is fixed at the center of the inner cavity of the test box 1, a heat through groove 5 penetrating through the top wall and the bottom wall of the test box 1 is arranged on the fixing seat 4, heat released by the electric heating rods 13 at the bottom of the inner cavity of the test box 1 can be transferred to the chip through the heat through groove 5, support posts 11 are welded at four corners of the bottom wall of the fixing seat 4, and the four support posts 11 are welded on the bottom wall of the inner cavity of the test box 1, and the electric heating rods 13 at the bottom wall of the inner cavity of the test box 1 are arranged on the inner sides of the four support posts 11 so as to ensure the stability of the structure of the fixing seat 4;

the side wall of the test box 1 is fixedly provided with a servo motor 6, an output shaft of the servo motor 6 penetrates through the test box 1 and is coaxially connected with a screw rod 7, the screw rod 7 is horizontally arranged on one side of the inner cavity of the test box 1, a limit rod 8 is welded on the other side of the inner cavity of the test box 1, the screw rod 7 and the limit rod 8 are symmetrical to two sides of the inner cavity of the test box 1, two ends of the screw rod 7 are rotationally connected with the test box 1, the operation of the screw rod 7 is more stable, two positioning plates 9 are symmetrically arranged in the inner cavity of the test box 1, one ends of the two positioning plates 9 are respectively sleeved at two ends of the screw rod 7 in a threaded mode, threads at two ends of the screw rod 7 rotate in opposite directions, the other ends of the two positioning plates 9 are slidably sleeved on the limit rod 8, when the servo motor 6 drives the screw rod 7 to operate, the two positioning plates 9 can translate oppositely or reversely along the limit rod 8, soft cushions 10 are fixedly adhered to one side wall of the two positioning plates 9, and the bottom wall of the two positioning plates 9 are rotationally connected with the top wall of the fixing seat 4, and when the two positioning plates 9 translate oppositely, and the two soft cushions 10 can be fixed by the chip;

temperature sensor 12 is installed to both sides of fixing base 4 roof and both sides of diapire, namely temperature sensor 12 is equipped with four altogether, display screen 14 and controller 15 are installed to the lateral wall at test box 1, display screen 14 and four temperature sensor 12 all are with controller 15 electric connection, four temperature sensor 12 can detect the temperature of fixing base 4 top and below simultaneously, thereby make the control of temperature more accurate, temperature sensor 12's model optional pt100, the optional OHR-PR10 of model of controller 15, the opening in test box 1 inner chamber is seted up its lateral wall, both sides at test box 1 inner chamber opening part are all fixed with backing plate 16, all inlay magnet 17 in the lateral wall of two backing plates 16 dorsad fixing base 4, quick detach board 2 is fixed with two magnet 17 magnetism, quick detach board 2's material is iron, thereby can attract each other with two magnet 17, seal the test box 1 inner chamber.

Working principle: firstly, the handle 3 is held to take down the quick release plate 2, the inner cavity of the test box 1 is opened, the chip to be tested is placed on the fixed seat 4 through the opening of the inner cavity of the test box 1, then the quick release plate 2 is replaced, the inner cavity of the test box 1 is closed, the servo motor 6 is driven to operate so as to drive the screw 7 to operate, the two positioning plates 9 are enabled to translate along the limiting rod 8 in opposite directions, and finally the two soft cushions 10 are enabled to contact with the two ends of the chip, so that the chip is fixed;

afterwards, the two electric heating rods 13 are electrified simultaneously, heat is released at the top and the bottom of the chip, the top and the bottom of the chip are heated simultaneously, the temperature of the top and the bottom of the chip is detected in real time through the four temperature sensors 12, the four temperature sensors 12 transmit electric signals to the controller 15, the controller 15 transmits electric signals to the display screen 14, and the temperature values detected by the four temperature sensors 12 are displayed on the display screen 14, so that personnel can control the power of the two electric heating rods 13 in real time according to the temperature in the outside, the temperature control is more accurate, and the aging test of the chip in a high-temperature environment is more accurate.

The foregoing is only a preferred embodiment of the present utility model, but the scope of the present utility model is not limited thereto, and any person skilled in the art, who is within the scope of the present utility model, should make equivalent substitutions or modifications according to the technical scheme of the present utility model and the inventive concept thereof, and should be covered by the scope of the present utility model.

Claims

1. The chip high-temperature aging test equipment capable of independently controlling temperature comprises a test box (1) and an electric heating rod (13) which is respectively arranged on the top wall and the bottom wall of the inner cavity of the test box (1), wherein a quick-release plate (2) is arranged at the opening of the inner cavity of the test box (1), and the chip high-temperature aging test equipment is characterized in that a fixing seat (4) is fixed at the center of the inner cavity of the test box (1), and a heat through groove (5) penetrating through the top wall and the bottom wall of the fixing seat (4) is formed in the fixing seat;

the utility model discloses a test box, including test box (1), servo motor (6) are installed to lateral wall fixed mounting of test box (1), the output shaft coaxial coupling of servo motor (6) has screw rod (7), screw rod (7) level sets up in one side of test box (1) inner chamber, the opposite side welding of test box (1) inner chamber has gag lever post (8), still the symmetry is equipped with two locating plates (9) in test box (1) inner chamber, two the both ends of screw rod (7) are located to the one end difference thread bush of locating plate (9), just the screw thread at screw rod (7) both ends revolves to opposite, two the other end of locating plate (9) is all the slip cap and is located on gag lever post (8).

2. The chip high-temperature aging test equipment capable of independently controlling temperature according to claim 1, wherein the screw rod (7) and the limiting rod (8) are symmetrical to two sides of an inner cavity of the test box (1), and two ends of the screw rod (7) are rotatably connected with the test box (1).

3. The temperature-independently controllable chip high-temperature aging test equipment according to claim 1, wherein the four corners of the bottom wall of the fixing seat (4) are welded with supporting columns (11), and four supporting columns (11) are welded on the bottom wall of the inner cavity of the test box (1).

4. The device for testing the chip high-temperature aging capable of independently controlling the temperature according to claim 1, wherein a soft pad (10) is fixedly adhered to one opposite side wall of each of the two positioning plates (9), and the bottom walls of the two positioning plates (9) are adhered to the top wall of the fixing seat (4).

5. The chip high-temperature aging test device capable of independently controlling temperature according to claim 1, wherein temperature sensors (12) are mounted on two sides of the top wall and two sides of the bottom wall of the fixing seat (4), four temperature sensors (12) are arranged in total, a display screen (14) and a controller (15) are mounted on the side wall of the test box (1), and the display screen (14) and the four temperature sensors (12) are electrically connected with the controller (15).

6. The chip high-temperature aging test device capable of independently controlling temperature according to claim 5, wherein the opening of the inner cavity of the test box (1) is arranged on the side wall of the test box, two sides of the opening of the inner cavity of the test box (1) are fixedly adhered with base plates (16), one side, facing away from the fixed seat (4), of each base plate (16) is inlaid with a magnet (17), and the quick-release plate (2) is magnetically attracted and fixed with the two magnets (17).