CN2192052Y - Contact image sensor testing device - Google Patents

Contact image sensor testing device Download PDF

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Publication number
CN2192052Y
CN2192052Y CN 94203003 CN94203003U CN2192052Y CN 2192052 Y CN2192052 Y CN 2192052Y CN 94203003 CN94203003 CN 94203003 CN 94203003 U CN94203003 U CN 94203003U CN 2192052 Y CN2192052 Y CN 2192052Y
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China
Prior art keywords
circuit
cis
links
signal
control
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Expired - Fee Related
Application number
CN 94203003
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Chinese (zh)
Inventor
郑文明
陈文雄
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Dunnan Science And Tech Co Ltd
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Dunnan Science And Tech Co Ltd
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Publication date
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Priority to CN 94203003 priority Critical patent/CN2192052Y/en
Application granted granted Critical
Publication of CN2192052Y publication Critical patent/CN2192052Y/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Abstract

The utility model provides a testing device for contact image sensors, which is mainly provided with a power supply control circuit, a time-sequence generation circuit, a CIS output signal process circuit and a control interface circuit. The utility model can test contact image sensors (CIS for short) for computers and judges whether the contact image sensors are good or not, and the tests are quick and accurate.

Description

Contact image sensor testing device
The utility model is a kind of contact type sensor proving installation, especially for computing machine with control and provide needed power supply and sequential to the contact-type image sensor, and can read the output signal of this contact-type image sensor, with the quality of the tested thing of analysis and judgement.
So-called contact-type image sensor (CONTACT IMAGE SENSOR--is called for short CIS) is luminous with the LED of a tandem, be radiated on its file paper that contacts, and the light sensing element of mat one tandem goes to receive the light that is reflected by file paper, and the brightness of corresponding reflection ray produces AC output signal in various degree.The detailed construction of relevant CIS, be disclosed in the novel patent application case in Taiwan numbers 79209603, and (Announcement Number: 189614), name is called (8 every millimeter silicon crystal closed contact-type image sensors), and concrete detailed explanation is arranged in this case to have got permission patent.In the past when carrying out the CIS finished product test, all are manual testings, promptly with required power supply and the sequential (CLOCK) of manual manipulation mode input CIS work, remove to detect one by one CIS with oscillograph again and go up the interchange AC signal that each light sensing element is exported, judge that with visual type its output AC signal whether all in preset range, uses and judge whether this CIS is non-defective unit.But this kind test mode has three shortcomings:
One, the figure that presents of oscillograph is owing to the difference of line weight has error, and is accurate inadequately.
Two, by manually observe differentiating with visual type, not only accuracy is difficult to guarantee, and because of people's difference, obtains different results easily, does not have a standard.
Three, every tool CIS includes 1728 light sensing elements at least, and as if the output AC signal that detects each sensing element with manual type one by one, its time-consuming will be very huge, and will be extremely uneconomical.
The creator is because above-mentioned shortcoming is to attempt detecting CIS with computing machine.
The purpose of this utility model provides a kind of contact-type image sensor proving installation, for computing machine CIS is carried testing power supply, sequential, and obtain the AC voltage signal that each light sensing element exports and be converted to the DC signal by CIS, for computing machine analyze, print result, with reach accurately, standard and effect fast.
The formation of the utility model proving installation comprises: a power control circuit, a sequential produces circuit, a CIS(contact-type image sensor) an output signal processing circuitry and a control interface circuit;
Described power control circuit comprises a relay circuit and a transistor switching circuit, and this two circuit links to each other with control panel and described control interface circuit, is subjected to its control and moves; Wherein, the voltage output end of described relay circuit links to each other with tested CIS, and to supply with its operating voltage, the output of described transistor switching circuit links to each other with tested CIS, for the required power supply of LED wherein;
Described timing sequence generating circuit comprises an oscillator and a sequential circuit; This timing sequence generating circuit links to each other with described CIS output signal processing circuitry, provides timing signal and address counting sequence signal to it, links to each other with a tested CIS simultaneously, provides the starting impulse of the light sensing element among basic clock signal and this CIS to it;
Described CIS output signal processing circuitry comprises prime amplifier, mould/number conversion circuit, memory, data register and the computing machine and the address selection circuit that connect successively; The input end of described prime amplifier links to each other with tested CIS, accept its AC signal, described mould/number conversion circuit links to each other with described timing sequence generating circuit, accepts described timing signal, and described memory is selected circuit to link to each other with described address and accepted its address counting sequence signal;
Described control interface circuit links to each other with computing machine and to accept its steering order, selects circuit to link to each other with described relay circuit, transistor switching circuit, timing sequence generating circuit and address simultaneously, it is provided the action control signal.
Description of drawings:
Fig. 1 is a line block diagram of the present utility model.
Fig. 2 is a power control circuit specific embodiment wiring diagram of the present utility model.
Fig. 3 is the utility model timing sequence generating circuit specific embodiment wiring diagram.
Fig. 4 is that the utility model address is selected circuit, memory and data register circuit specific embodiment wiring diagram.
Fig. 5 is that the utility model prime amplifier and mould/number conversion circuit are specifically implemented wiring diagram.
Fig. 6 is the utility model control interface circuit specific embodiment wiring diagram.
The drawing reference numeral explanation:
(1) relay circuit
(2) transistor switching circuit
(3) panel
(4) control interface circuit
(5) CIS
(RDI) relay
(Q1, Q2) transistor
(6) oscillator
(7) sequential circuit
(8) pre-amplification circuit
(9) mould/number conversion circuit
(10) memory
(11) computing machine
(12) data register circuit
(13) address is selected circuit
Existing conjunction with figs. is after special tectonic of the present utility model and effect thereof be specified in, so that can understand more;
Fig. 1 is a line block diagram of the present utility model.The utility model mainly has a power control circuit, and a sequential produces circuit, a CIS output signal processing circuitry and a control interface circuit.Power control circuit wherein mainly comprises a relay circuit (1) and a transistor switching circuit (2); Both all are subjected to panel (3) or control interface circuit (4) to control and move.When relay circuit (1) moves, will be the required operating voltage of test, as+5 volts ,-12 volts of grades are delivered to tested CIS(5) on; Transistor switching circuit (2) is then controlled the required power supply of LED conveying to CIS, also sends the light of required brightness according to the size of the power supply of being imported with a tandem LED who lights CIS.In Fig. 2, illustrated the wiring diagram of a specific embodiment of power control circuit.Its repeat circuit (RDI) is the major component in the relay circuit (1); Transistor Q1 and Q2 then are the major component of transistor switching circuit (2).
Oscillator (6) among Fig. 1 and a sequential circuit (7) are then formed timing sequence generating circuit of the present utility model.This circuit also produces timing (SAMPLING CLOCK) and address counting sequence (ADDRESS Counting CLOCK) to CIS output signal processing circuitry of the present utility model except producing two groups of CIS work schedules to tested CIS.In two groups of above-mentioned CIS work schedules, one group is the basic sequential of CIS, and another group then begins to move and export the pulse signal of AC signal for the light sensing element on the startup CIS.A specific embodiment circuit of timing sequence generating circuit is illustrated in Fig. 3.
CIS output signal processing circuitry of the present utility model, be with a preamplifier circuit (8), acceptance is also amplified the AC signal of being exported by CIS, by a mould/number conversion circuit (9) the AC conversion of signals is become the DC signal again, deposit in the memory (10), computing machine (11) reads data in the memory via a data register circuit (12) again, studies and judges etc. the usefulness of processing as analysis.Wherein, mould/number conversion circuit (9) is accepted the timing of being exported by the timing sequence generating circuit and is worked according to this, and the address of the AC signal of each light sensing element through converting the DC signal to and depositing memory (10) in is to select circuit (13) to determine according to the address counting sequence of timing sequence generating circuit and by the control of control interface circuit (4) by an address among the CIS.
And control interface circuit (4) is accepted the steering order of computing machine (11), and the action of control relay circuit (1), transistor switching circuit (2), sequential circuit (7) and address selection circuit (13) respectively.
Fig. 4 illustrates the wiring diagram that an address is selected circuit (13), memory (10) and data register circuit embodiments such as (12).The embodiment wiring diagram of prime amplifier (8) and mould/number conversion circuit (9) then is plotted in Fig. 5.Fig. 6 then is the wiring diagram of control interface circuit (4) embodiment.
In sum, by the utility model, computing machine can be to CIS input test required working power and sequential, and can read the output signal of each light sensing element of CIS, and then the quality of analysis and judgement CIS quickly and accurately, greatly having improved the quality and the speed of CIS test job, is a kind of novel creation that has practical value.

Claims (1)

1, a kind of contact-type image sensor proving installation is characterized in that this device comprises:
One power control circuit, a sequential produces circuit, a CIS (contact-type image sensor) output signal processing circuitry and a control interface circuit;
Described power control circuit comprises a relay circuit and a transistor switching circuit, and this two circuit links to each other with control panel and described control interface circuit, is subjected to its control and moves; Wherein, the voltage output end of described relay circuit links to each other with tested CIS, and to supply with its operating voltage, the output of described transistor switching circuit links to each other with tested CIS, for the required power supply of LED wherein;
Described timing sequence generating circuit comprises an oscillator and a sequential circuit; This timing sequence generating circuit links to each other with described CIS output signal processing circuitry, provides timing signal and address counting sequence signal to it, links to each other with a tested CIS simultaneously, provides the starting impulse of the light sensing element among basic clock signal and this CIS to it;
Described CIS output signal processing circuitry comprises prime amplifier, mould/number conversion circuit, memory, data register and the computing machine and the choice of location circuit that connect successively; The input end of described prime amplifier links to each other with tested CIS, accept its AC signal, described mould/number conversion circuit links to each other with described timing sequence generating circuit, accepts described timing signal, and described memory links to each other with described choice of location circuit and is subjected to its position counting clock signal;
Described control interface circuit links to each other with computing machine and to accept its steering order, links to each other with described relay circuit, transistor switching circuit, timing sequence generating circuit and choice of location circuit simultaneously, it is provided the action control signal.
CN 94203003 1994-02-01 1994-02-01 Contact image sensor testing device Expired - Fee Related CN2192052Y (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN 94203003 CN2192052Y (en) 1994-02-01 1994-02-01 Contact image sensor testing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN 94203003 CN2192052Y (en) 1994-02-01 1994-02-01 Contact image sensor testing device

Publications (1)

Publication Number Publication Date
CN2192052Y true CN2192052Y (en) 1995-03-15

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Application Number Title Priority Date Filing Date
CN 94203003 Expired - Fee Related CN2192052Y (en) 1994-02-01 1994-02-01 Contact image sensor testing device

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103134437A (en) * 2011-11-29 2013-06-05 英业达股份有限公司 Test fixture and test method
CN104166084A (en) * 2013-05-15 2014-11-26 力智电子股份有限公司 Automatic testing device and automatic testing method thereof

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103134437A (en) * 2011-11-29 2013-06-05 英业达股份有限公司 Test fixture and test method
CN103134437B (en) * 2011-11-29 2016-06-15 英业达股份有限公司 Measurement jig and method of testing
CN104166084A (en) * 2013-05-15 2014-11-26 力智电子股份有限公司 Automatic testing device and automatic testing method thereof

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C19 Lapse of patent right due to non-payment of the annual fee
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