CN219054022U

CN219054022U - Crystal phase sample grinding clamp

Info

Publication number: CN219054022U
Application number: CN202223117632.5U
Authority: CN
Inventors: 陈洁; 王立毅; 杨陆峰
Original assignee: Institute of High Energy Physics of CAS; Spallation Neutron Source Science Center
Current assignee: Institute of High Energy Physics of CAS; Spallation Neutron Source Science Center
Priority date: 2022-11-23
Filing date: 2022-11-23
Publication date: 2023-05-23
Anticipated expiration: 2032-11-23

Abstract

The utility model relates to the technical field of crystal phase sample grinding, in particular to a crystal phase sample grinding clamp, which comprises a clamp inner core, wherein an external thread is arranged on the outer peripheral surface of the clamp inner core, a first screwing hole is formed in the first end of the clamp inner core, a calibration line is arranged at the first end of the clamp inner core, and a sample is fixedly arranged at one end, deviating from the first screwing hole, of the clamp inner core; the inner wall surface of the clamp sleeve is provided with an internal thread matched with the external thread, the clamp inner core is in threaded connection with the clamp sleeve, and a first scale line is uniformly marked on one end surface of the clamp sleeve; the clamp comprises an alignment base, wherein one end of the clamp outer sleeve, which is away from the first scale mark, is placed on the alignment base; the fixing piece is arranged between the clamp outer sleeve and the clamp inner core. The utility model does not need to repeatedly measure the sample, and ensures the polishing efficiency.

Description

Crystal phase sample grinding clamp

Technical Field

The utility model relates to the technical field of crystal phase sample grinding, in particular to a crystal phase sample grinding clamp.

Background

The preparation of a crystal phase sample is a necessary condition for material research in the fields of metal materials, ceramic materials and the like. After the metal material or the ceramic material is developed, the metal material or the ceramic material is required to be used for preparing a sample, the sample is ground, and then the scanning electron microscope is used for observation. When the sample is ground, the sample is firstly fixed on a clamp, and then the grinding is carried out by a polishing machine. In the prior art, in the process of grinding samples, the samples are required to be measured repeatedly for a plurality of times, so that the polishing requirements of the samples are met. By adopting the mode, the polishing efficiency is reduced, and the time and the labor are wasted.

Therefore, a crystal phase sample grinding jig is required to solve the above problems.

Disclosure of Invention

The utility model aims to provide a crystal phase sample grinding clamp which does not need repeated measurement of a sample and ensures grinding efficiency.

To achieve the purpose, the utility model adopts the following technical scheme:

a crystalline phase sample milling fixture comprising:

the fixture comprises a fixture inner core, wherein an external thread is arranged on the outer peripheral surface of the fixture inner core, a first screwing hole is formed in the first end of the fixture inner core, a calibration line is arranged at the first end of the fixture inner core, and a sample is fixedly arranged at one end, deviating from the first screwing hole, of the fixture inner core;

the inner wall surface of the clamp sleeve is provided with an internal thread matched with the external thread, the clamp inner core is in threaded connection with the clamp sleeve, and a first scale line is uniformly marked on one end surface of the clamp sleeve;

an alignment base on which one end of the clamp outer sleeve facing away from the first scale mark is placed, and rotating the clamp inner core so that the sample is attached to the pair Ji De;

the fixing piece is arranged between the clamp outer sleeve and the clamp inner core and used for limiting the relative position between the clamp outer sleeve and the clamp inner core.

Further, a threaded hole is formed in the clamp outer sleeve, and the fixing piece is in threaded connection with the clamp outer sleeve through the threaded hole and can be in butt joint with the clamp inner core.

Further, a plurality of threaded holes are formed in the clamp outer sleeve at intervals, a plurality of fixing pieces are arranged, and the fixing pieces and the threaded holes are arranged in one-to-one correspondence.

Further, an elastic abutting part is arranged at one end of the fixing piece, which abuts against the inner core of the clamp.

Further, a second screwing hole is formed in one end, away from the elastic abutting portion, of the fixing piece.

Further, the second screwing hole is a regular hexagonal hole.

Further, a water guide groove is formed along the surface of the clamp inner core, which is axially positioned on the clamp inner core.

Further, a plurality of water guide grooves are formed in the inner core of the clamp at intervals along the circumferential direction.

Further, a second scale line is provided along the surface of the clamp housing axially to the clamp housing.

Further, a plurality of second scale marks are arranged at intervals along the circumferential direction of the clamp sleeve.

The utility model has the beneficial effects that:

the utility model provides a crystal phase sample grinding clamp, which is characterized in that a clamp inner core is in threaded connection with a clamp outer sleeve, a first scale line is uniformly marked on one end face of the clamp outer sleeve, a calibration line is arranged on one end face of the clamp inner core, a sample is fixed on the end face of the clamp inner core, one end of the clamp outer sleeve, which is far away from the first scale line, is placed on an alignment base, then the clamp inner core is rotated to enable the clamp inner core to be attached to a pair Ji De, so that the end face of the sample is flush with the end face of the clamp outer sleeve, the condition that the calibration line is aligned with the scale of the first scale line at the moment is observed, then the clamp inner core is continuously rotated, the scale rotated by the calibration line is the extending length of the sample relative to the clamp outer sleeve, after the extending length of the sample is adjusted, the relative position between the clamp outer sleeve and the clamp inner core is limited by a fixing piece, and the extending length of the sample is ensured to be unchanged in the polishing process of the sample. Through the mode, repeated measurement of the sample is not needed, and polishing efficiency is guaranteed.

Drawings

FIG. 1 is a schematic view of a crystalline phase sample milling fixture of the present utility model;

FIG. 2 is a half cross-sectional view of a crystalline phase sample milling fixture of the present utility model;

FIG. 3 is a schematic view of the core of a jig in a crystal phase sample grinding jig according to the present utility model;

fig. 4 is a schematic view of a fixing member in a crystal phase grinding-sample fixture according to the present utility model.

In the figure:

1. a clamp inner core; 11. a first screw hole; 12. a water guide groove; 13. calibrating a line; 14. an external thread; 2. a clamp jacket; 21. a first scale line; 22. a threaded hole; 23. a second graduation mark; 3. pair Ji De; 4. a sample; 5. a fixing member; 51. a second screw hole; 52. and an elastic abutting part.

Detailed Description

The technical scheme of the utility model is further described below with reference to the attached drawings and the embodiments. It is to be understood that the specific embodiments described herein are merely illustrative of the utility model and are not limiting thereof. It should be further noted that, for convenience of description, only some, but not all of the drawings related to the present utility model are shown.

In the description of the present utility model, it should be noted that, unless explicitly specified and limited otherwise, the terms "mounted," "connected," and "connected" are to be construed broadly, and may be either fixed or removable, for example; can be mechanically or electrically connected; can be directly connected or indirectly connected through an intermediate medium, and can be communication between two elements. The specific meaning of the above terms in the present utility model will be understood in specific cases by those of ordinary skill in the art.

In the present utility model, unless expressly stated or limited otherwise, a first feature "above" or "below" a second feature may include both the first and second features being in direct contact, as well as the first and second features not being in direct contact but being in contact with each other through additional features therebetween. Moreover, a first feature being "above," "over" and "on" a second feature includes the first feature being directly above and obliquely above the second feature, or simply indicating that the first feature is higher in level than the second feature. The first feature being "under", "below" and "beneath" the second feature includes the first feature being directly under and obliquely below the second feature, or simply means that the first feature is less level than the second feature.

In order to avoid repeated measurement of the sample during polishing of the sample and thus ensure polishing efficiency, as shown in fig. 1-4, the utility model provides a crystal phase sample polishing clamp. The crystal phase sample grinding clamp comprises a clamp inner core 1, a clamp outer sleeve 2, an alignment base 3 and a fixing piece 5.

The outer peripheral surface of the clamp inner core 1 is provided with an external thread 14, a first screwing hole 11 is formed in the first end of the clamp inner core 1, a calibration line 13 is arranged at the first end of the clamp inner core 1, and a sample 4 is fixedly arranged at one end, deviating from the first screwing hole 11, of the clamp inner core 1; the inner wall surface of the clamp outer sleeve 2 is provided with an internal thread matched with the external thread 14, the clamp inner core 1 is in threaded connection with the clamp outer sleeve 2, and a first scale line 21 is uniformly marked on one end surface of the clamp outer sleeve 2; one end of the clamp outer sleeve 2, which is away from the first scale line 21, is placed on the alignment base 3, and the clamp inner core 1 is rotated so that the sample 4 is attached to the alignment base 3; a fixing member 5 is provided between the clamp casing 2 and the clamp core 1 for defining the relative position between the clamp casing 2 and the clamp core 1.

In the process of clamping, firstly, a sample 4 is fixed on a clamp inner core 1, then the clamp inner core 1 is mounted on a clamp outer sleeve 2, the clamp inner core 1 is rotated, the clamp inner core 1 is attached to an alignment base 3, the end face of the sample 4 is enabled to be flush with the end face of the clamp outer sleeve 2, the condition that a calibration line 13 is aligned with a scale of a first scale line 21 at the moment is observed, then the clamp inner core 1 is continuously rotated, the scale rotated by the calibration line 13 is the extending length of the sample 4 relative to the clamp outer sleeve 2, after the extending length of the sample 4 is adjusted, the relative position between the clamp outer sleeve 2 and the clamp inner core 1 is limited by a fixing piece 5, and the extending length of the sample 4 is unchanged in the process of polishing the sample 4. In the polishing process, when the end face of the sample 4 is flush with the end face of the clamp sleeve 2, the polishing is considered to be completed. By the mode, repeated measurement of the sample 4 is not needed, and polishing efficiency is guaranteed.

Further, each scale of the first scale line 21 corresponds to 10 micrometers, and in other embodiments, the first scale line 21 may be arranged according to actual needs, which is not limited in this way.

Further, the clamp outer sleeve 2 is provided with a threaded hole 22, and the fixing piece 5 is in threaded connection with the clamp outer sleeve 2 through the threaded hole 22 and can be abutted with the clamp inner core 1. Specifically, in the present embodiment, the fixing member 5 is a jackscrew, and the jackscrew is abutted against the jig core 1, thereby defining the relative position between the jig core 1 and the jig outer jacket 2. The fixing piece 5 is convenient to install and detach by adopting a threaded connection mode.

Further, a plurality of threaded holes 22 are formed in the clamp outer sleeve 2 at intervals, a plurality of fixing pieces 5 are arranged, and the plurality of fixing pieces 5 are arranged in one-to-one correspondence with the threaded holes 22. Through setting up a plurality of screw holes 22 and a plurality of mounting 5, can guarantee spacing effect, at the in-process of polishing sample 4, guarantee that the length that sample 4 stretches out relative anchor clamps overcoat 2 is unchangeable.

Further, an elastic abutment 52 is provided at an end of the fixing member 5 abutting against the jig core 1. By providing the elastic abutment 52, on the one hand, no damage is caused to the external thread 14 of the core, and on the other hand, the relative position between the clamp outer sleeve 2 and the clamp inner core 1 can be defined, so that no relative rotation occurs between the clamp outer sleeve 2 and the clamp inner core 1. In the present embodiment, the elastic abutment 52 may be made of rubber.

Further, a second screwing hole 51 is opened at one end of the fixing member 5 facing away from the elastic abutment 52. By providing the second screw hole 51, the fixing member 5 is easily installed or removed. Further, the second screw hole 51 is a regular hexagonal hole. When the fixing member 5 is attached or detached, the disassembly is performed by using an allen wrench. In other embodiments, the second screw hole 51 may be in a straight or cross shape, without being excessively limited thereto.

Since the polishing agent is required to be used in the polishing process of the sample 4, the polishing agent can be embedded into the threaded surface, and after polishing is completed, the polishing agent can enable threads between the clamp inner core 1 and the clamp outer sleeve 2 to be glued, so that the clamp cannot rotate. To solve this problem, further, a water guide groove 12 is provided along the surface of the jig core 1 in the axial direction of the jig core 1. After finishing the polishing, water is introduced into the water guide groove 12, and under the soaking of the water, the polishing agent is quickly dissolved, so that the clamp inner core 1 and the clamp outer sleeve 2 are conveniently separated.

Further, a plurality of water guide grooves 12 are provided at intervals along the circumferential direction of the jig core 1. By providing a plurality of water guiding grooves 12, the speed of water entering the screw surface can be increased, and thus the dissolution speed of the polishing agent can be increased.

Further, a second graduation mark 23 is provided along the surface of the clamp housing 2, which is axially located with respect to the clamp housing 2. In the process of polishing the sample 4 by using an automatic polishing machine or a vibration polishing machine, abrasion is possibly caused to the clamp sleeve 2, the abrasion is conveniently observed by arranging the second scale mark 23, and the quantity to be processed is conveniently determined when the worn part is subsequently corrected.

Further, a plurality of second graduation marks 23 are provided at intervals along the circumferential direction of the clamp housing 2. By providing a plurality of second graduation marks 23, it is convenient to quickly observe whether the clamp housing 2 is worn and the situation of the wear.

Further, the test piece 4 may be fixed to the jig core 1 by means of adhesive bonding. In conventional crystalline phase preparation, the sample is placed in an insert, and the insert sample is produced by cold-setting (usually by solidifying an organic substance such as epoxy resin or dental tray powder) or by hot-setting (usually by hot-press molding of a resin). Although the method can make corresponding samples, the method has the advantages of complex operation, environmental protection and difficult taking out of subsequent samples. The sample 4 is fixed by adopting a cementing mode, so that polishing is convenient, and meanwhile, after polishing is finished, the sample can be quickly taken down.

It is to be understood that the above examples of the present utility model are provided for clarity of illustration only and are not limiting of the embodiments of the present utility model. Other variations or modifications of the above teachings will be apparent to those of ordinary skill in the art. It is not necessary here nor is it exhaustive of all embodiments. Any modification, equivalent replacement, improvement, etc. which come within the spirit and principles of the utility model are desired to be protected by the following claims.

Claims

1. Crystal phase grinds appearance anchor clamps, its characterized in that includes:

the fixture comprises a fixture inner core (1), wherein an external thread (14) is arranged on the outer peripheral surface of the fixture inner core (1), a first screwing hole (11) is formed in the first end of the fixture inner core (1), a calibration line (13) is arranged at the first end of the fixture inner core (1), and a sample (4) is fixedly arranged at one end, deviating from the first screwing hole (11), of the fixture inner core (1);

the fixture comprises a fixture outer sleeve (2), wherein an inner wall surface of the fixture outer sleeve (2) is provided with an inner thread matched with the outer thread (14), the fixture inner core (1) is in threaded connection with the fixture outer sleeve (2), and a first scale line (21) is uniformly marked on one end surface of the fixture outer sleeve (2);

-a pair Ji De (3), one end of the clamp sleeve (2) facing away from the first scale line (21) being placed over the pair Ji De (3), rotating the clamp core (1) such that the sample (4) is in abutment with the pair Ji De (3);

the fixing piece (5) is arranged between the clamp outer sleeve (2) and the clamp inner core (1) and used for limiting the relative position between the clamp outer sleeve (2) and the clamp inner core (1).

2. The crystal phase sample grinding clamp according to claim 1, wherein the clamp outer sleeve (2) is provided with a threaded hole (22), and the fixing piece (5) is in threaded connection with the clamp outer sleeve (2) through the threaded hole (22) and can be in butt joint with the clamp inner core (1).

3. The crystal phase sample grinding clamp according to claim 2, wherein a plurality of threaded holes (22) are formed in the clamp outer sleeve (2) at intervals, a plurality of fixing pieces (5) are arranged, and the fixing pieces (5) are arranged in one-to-one correspondence with the threaded holes (22).

4. The crystal phase grinding clamp according to claim 2, wherein an elastic abutting portion (52) is provided at an end of the fixing member (5) abutting against the clamp core (1).

5. The crystal phase grinding clamp according to claim 4, wherein a second screwing hole (51) is formed at one end of the fixing piece (5) away from the elastic abutting portion (52).

6. The crystal phase grinding jig according to claim 5, wherein the second screwing holes (51) are regular hexagonal holes.

7. The crystal phase grinding-sample fixture according to claim 1, characterized in that a water guiding groove (12) is provided along the axial direction of the fixture inner core (1) on the surface of the fixture inner core (1).

8. The crystal phase grinding clamp according to claim 7, wherein a plurality of water guide grooves (12) are formed at intervals along the circumferential direction of the clamp core (1).

9. The crystal phase grinding-like fixture according to claim 1, characterized in that a second graduation mark (23) is provided along the axial direction of the fixture housing (2) on the surface of the fixture housing (2).

10. The crystal phase grinding-sample holder according to claim 9, characterized in that a plurality of the second graduation marks (23) are provided at intervals along the circumferential direction of the holder casing (2).