CN218995467U

CN218995467U - Probe card fixing frame device for integrated circuit test

Info

Publication number: CN218995467U
Application number: CN202223493040.3U
Authority: CN
Inventors: 殷国海
Original assignee: Jiangsu Xinyuan Semiconductor Co ltd
Current assignee: Jiangsu Xinyuan Semiconductor Co ltd
Priority date: 2022-12-27
Filing date: 2022-12-27
Publication date: 2023-05-09
Anticipated expiration: 2032-12-27

Abstract

The utility model discloses a probe card fixing frame device for integrated circuit testing, which relates to the technical field of probe card testing and comprises a fixing frame and a fixing assembly; fixing frame: a connecting ring is fixed on the side surface, an extrusion assembly and a power assembly are arranged at the upper end of the connecting ring, and a rotating assembly is arranged on the circumferential surface of the connecting ring; and (3) fixing the assembly: contain square pole, extrusion head, fastening frame and spring, four corresponding square holes have been seted up on the side of fixed frame, the inside sliding connection in square hole has square pole, square pole is fixed with the extrusion head on the outside side of fixed frame, square pole is fixed with fastening frame on the inside side of fixed frame, the spring has been cup jointed on the side of square pole, the one end of spring links to each other with the side of extrusion head, the other end of spring links to each other with the side of fixed frame, can fix the probe card that needs to test to can overturn the probe card.

Description

Probe card fixing frame device for integrated circuit test

Technical Field

The utility model relates to the technical field of probe card testing, in particular to a probe card fixing frame device for integrated circuit testing.

Background

The probe card is characterized in that probes are directly contacted with welding pads or bumps on a chip to lead out chip signals, and then the chip signals are matched with peripheral test instruments and software to control the probe card so as to achieve the purpose of automatic measurement.

Disclosure of Invention

The utility model aims to overcome the existing defects, and provides a probe card fixing frame device for integrated circuit testing, which can fix a probe card to be tested and turn the probe card over, thereby effectively solving the problems in the background technology.

In order to achieve the above purpose, the present utility model provides the following technical solutions: the probe card fixing frame device for the integrated circuit test comprises a fixing frame and a fixing assembly;

fixing frame: a connecting ring is fixed on the side surface, an extrusion assembly and a power assembly are arranged at the upper end of the connecting ring, and a rotating assembly is arranged on the circumferential surface of the connecting ring;

and (3) fixing the assembly: contain square pole, extrusion head, fastening frame and spring, four corresponding square holes have been seted up on the side of fixed frame, the inside sliding connection in square hole has square pole, square pole is fixed with the extrusion head on the outside side of fixed frame, square pole is fixed with fastening frame on the inside side of fixed frame, the spring has been cup jointed on the side of square pole, the one end of spring links to each other with the side of extrusion head, the other end of spring links to each other with the side of fixed frame, fixes the probe card through setting up fixed subassembly.

Further, the extrusion assembly comprises an inner gear ring, first gears and a cam, the inner gear ring is rotationally connected to the upper end of the connecting ring, four corresponding first gears are rotationally connected to the upper end of the connecting ring, all the first gears are meshed with the inner gear ring, the cam is fixed to the upper end of the first gears, the cam corresponds to the extrusion head, and the extrusion head is extruded through the extrusion assembly.

Further, the power component comprises a first motor and a second gear, the first motor is installed at the lower end of the connecting ring, the second gear is fixed on the output shaft of the first motor and meshed with the inner gear ring, and the input end of the first motor is electrically connected with the output end of the external control switch group.

Further, the rotating assembly comprises a connecting plate, a rotating shaft, a supporting plate and a second motor, two corresponding connecting plates are fixed at the left end and the right end of the circumferential surface of the connecting ring, the rotating shaft is fixed on the side surface of the connecting plate, one end of the rotating shaft, far away from the connecting plate, is rotationally connected with the side surface of the supporting plate, the second motor is installed on the right side of the supporting plate on the right side, an output shaft of the second motor is fixed on the right end surface of the rotating shaft on the right side, and the input end of the second motor is electrically connected with the output end of an external control switch group and drives the connecting ring to rotate through the rotating assembly.

Further, the downside of two backup pads is fixed with the bottom plate, four corresponding fixed orifices have been seted up to the downside of bottom plate, link to each other two backup pads through setting up the bottom plate.

Further, the inside of fastening frame is fixed with two corresponding rubber plates, evenly distributed's anti-skidding groove has been seted up on the side of rubber plate, can effectively avoid fastening frame to damage the probe card through setting up the rubber plate.

Compared with the prior art, the utility model has the beneficial effects that: the probe card fixing frame device for the integrated circuit test has the following advantages:

through setting up fixed subassembly and making can place four fastening frame with the probe card in the in-process of using, start power component after placing and make the ring gear rotate, the ring gear rotates and drives four extrusion subassembly and rotate and extrude four extrusion heads and make four fastening frame removal and fix the probe card that will test, use testing arrangement to test one side of probe card after the fixing, start the second motor after the test and make the go-between rotate, the go-between rotates and drives the probe card that needs to test and rotate, can reuse testing arrangement to test the undetected one side of probe card after the one side that the probe card did not test rotates the top, both can accomplish the test of probe card both sides under the condition of not dismantling under such circumstances, the efficiency of test has been improved greatly.

Drawings

FIG. 1 is a schematic view of the front side structure of the present utility model;

FIG. 2 is a schematic view of a fastening assembly according to the present utility model;

FIG. 3 is a schematic view of the extrusion assembly of the present utility model

In the figure: the device comprises a fixed frame 1, a connecting ring 2, a fixed component 3, a square rod 31, a 32 extrusion head, a 33 fastening frame, a 34 spring, a 4 extrusion component, a 41 inner gear ring, a 42 first gear, a 43 cam, a 5 power component, a 51 first motor, a 52 second gear, a 6 rotation component, a 61 connecting plate, a 62 rotating shaft, a 63 supporting plate, a 64 second motor, a 7 bottom plate, an 8 fixing hole and a 9 rubber plate.

Detailed Description

The following description of the embodiments of the present utility model will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present utility model, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.

Please refer to fig. 1-3, the present embodiment provides the following technical solutions: the probe card fixing frame device for the integrated circuit test comprises a fixing frame 1 and a fixing assembly 3;

fixing frame 1: the side surface is fixed with a connecting ring 2, the upper end of the connecting ring 2 is provided with an extrusion component 4 and a power component 5, the circumferential surface of the connecting ring 2 is provided with a rotating component 6, the extrusion component 4 comprises an inner gear ring 41, a first gear 42 and a cam 43, the upper end of the connecting ring 2 is rotationally connected with the inner gear ring 41, the upper end of the connecting ring 2 is rotationally connected with four corresponding first gears 42, all the first gears 42 are meshed with the inner gear ring 41, the upper end of the first gear 42 is fixedly provided with the cam 43, the cam 43 corresponds to the extrusion head 32, the power component 5 comprises a first motor 51 and a second gear 52, the lower end of the connecting ring 2 is provided with the first motor 51, the output shaft of the first motor 51 is fixedly provided with the second gear 52, the second gear 52 is meshed with the inner gear ring 41, the input end of the first motor 51 is electrically connected with the output end of the external control switch group, the rotating assembly 6 comprises a connecting plate 61, a rotating shaft 62, a supporting plate 63 and a second motor 64, two corresponding connecting plates 61 are fixed at the left end and the right end of the circumferential surface of the connecting ring 2, the rotating shaft 62 is fixed on the side surface of the connecting plate 61, one end of the rotating shaft 62 far away from the connecting plate 61 is rotationally connected with the side surface of the supporting plate 63, the second motor 64 is installed on the right side of the supporting plate 63 on the right side, the output shaft of the second motor 64 is fixed on the right end surface of the rotating shaft 62 on the right side, the input end of the second motor 64 is electrically connected with the output end of the external control switch group, the rotating assembly 6 is arranged to drive the connecting ring 2 to rotate, and the extrusion head 32 is extruded by arranging the extrusion assembly 4;

fixing assembly 3: the probe card comprises a square rod 31, an extrusion head 32, a fastening frame 33 and a spring 34, wherein four corresponding square holes are formed in the side face of a fixed frame 1, the square rod 31 is slidably connected with the square rod 31, the extrusion head 32 is fixed on the side face of the outer part of the fixed frame 1, the fastening frame 33 is fixed on the side face of the inner part of the fixed frame 1, the spring 34 is sleeved on the side face of the square rod 31, one end of the spring 34 is connected with the side face of the extrusion head 32, the other end of the spring 34 is connected with the side face of the fixed frame 1, and the probe card is fixed by the fixing assembly 3.

Wherein: the bottom plate 7 is fixed on the lower side of the two support plates 63, four corresponding fixing holes 8 are formed on the lower side of the bottom plate 7, and the two support plates 63 are connected through the bottom plate 7.

Wherein: two corresponding rubber plates 9 are fixed in the fastening frame 33, evenly distributed anti-slip grooves are formed in the side faces of the rubber plates 9, and the fastening frame 33 can be effectively prevented from damaging the probe card by the aid of the rubber plates 9.

The utility model provides a probe card fixing frame device for integrated circuit test, which has the following working principle: firstly, the probe card is placed between four fastening frames 33, after the placement, the power assembly 5 is started to enable the inner gear ring 41 to rotate, the inner gear ring 41 rotates to drive the four first gears 42 to rotate, the four first gears 42 rotate to drive the four cams 43 to rotate, the extrusion heads 32 are extruded when the protruding parts of the cams 43 are contacted with the extrusion heads 32 in the process of the rotation of the four cams 43, so that the probe card to be tested is fixed by moving the four fastening frames 33, one side of the probe card is tested by using the testing device after the fixing, the second motor 64 is started after the testing to enable the connecting ring 2 to rotate, the connecting ring 2 rotates to drive the probe card to be tested to rotate, and when one side of the probe card not tested is rotated to the upper side, the testing device can be reused to test one side of the probe card not tested, under the condition that the testing of both sides of the probe card can be completed, and the testing efficiency is greatly improved.

It should be noted that the external control switch group disclosed in the above embodiment is provided with buttons corresponding to the first motor 51 and the second motor 64 one by one, and the first motor 51 and the second motor 64 may be 1LE0003 three-phase asynchronous motors.

The foregoing description is only illustrative of the present utility model and is not intended to limit the scope of the utility model, and all equivalent structures or equivalent processes or direct or indirect application in other related technical fields are included in the scope of the present utility model.

Claims

1. The utility model provides a probe card mount device for integrated circuit test which characterized in that: comprises a fixed frame (1) and a fixed component (3);

fixing frame (1): a connecting ring (2) is fixed on the side surface, an extrusion assembly (4) and a power assembly (5) are arranged at the upper end of the connecting ring (2), and a rotating assembly (6) is arranged on the circumferential surface of the connecting ring (2);

fixing component (3): contain square pole (31), extrusion head (32), fastening frame (33) and spring (34), four corresponding square holes have been seted up on the side of fixed frame (1), the inside sliding connection in square hole has square pole (31), be fixed with extrusion head (32) on the outside side of fixed frame (1) square pole (31), be fixed with fastening frame (33) on the inside side of fixed frame (1) square pole (31), cup joint spring (34) on the side of square pole (31), the one end of spring (34) links to each other with the side of extrusion head (32), the other end of spring (34) links to each other with the side of fixed frame (1).

2. The probe card holder apparatus for integrated circuit testing according to claim 1, wherein: the extrusion assembly (4) comprises an inner gear ring (41), first gears (42) and a cam (43), wherein the inner gear ring (41) is rotationally connected to the upper end of the connecting ring (2), four corresponding first gears (42) are rotationally connected to the upper end of the connecting ring (2), all the first gears (42) are meshed with the inner gear ring (41), the cam (43) is fixed to the upper end of the first gears (42), and the cam (43) corresponds to the extrusion head (32).

3. The probe card holder apparatus for integrated circuit testing according to claim 2, wherein: the power assembly (5) comprises a first motor (51) and a second gear (52), the first motor (51) is installed at the lower end of the connecting ring (2), the second gear (52) is fixed on an output shaft of the first motor (51), the second gear (52) is meshed with the inner gear ring (41), and the input end of the first motor (51) is electrically connected with the output end of the external control switch group.

4. The probe card holder apparatus for integrated circuit testing according to claim 1, wherein: the rotating assembly (6) comprises a connecting plate (61), a rotating shaft (62), a supporting plate (63) and a second motor (64), two corresponding connecting plates (61) are fixed at the left end and the right end of the circumferential surface of the connecting ring (2), the rotating shaft (62) is fixed on the side face of the connecting plate (61), one end of the rotating shaft (62) away from the connecting plate (61) is rotationally connected with the side face of the supporting plate (63), the right side of the supporting plate (63) on the right side is provided with the second motor (64), an output shaft of the second motor (64) is fixed on the right end face of the rotating shaft (62) on the right side, and an input end of the second motor (64) is electrically connected with an output end of an external control switch group.

5. The probe card holder apparatus for integrated circuit testing as claimed in claim 4, wherein: the lower sides of the two supporting plates (63) are fixed with a bottom plate (7), and four corresponding fixing holes (8) are formed in the lower side of the bottom plate (7).

6. The probe card holder apparatus for integrated circuit testing according to claim 1, wherein: two corresponding rubber plates (9) are fixed in the fastening frame (33), and evenly distributed anti-skid grooves are formed in the side surfaces of the rubber plates (9).