CN218974434U - Chip test seat suitable for multi-type chip test - Google Patents
Chip test seat suitable for multi-type chip test Download PDFInfo
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- CN218974434U CN218974434U CN202320002446.2U CN202320002446U CN218974434U CN 218974434 U CN218974434 U CN 218974434U CN 202320002446 U CN202320002446 U CN 202320002446U CN 218974434 U CN218974434 U CN 218974434U
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- 238000012360 testing method Methods 0.000 title claims abstract description 42
- 239000000523 sample Substances 0.000 claims abstract description 4
- 230000000149 penetrating effect Effects 0.000 claims 1
- 238000000034 method Methods 0.000 abstract description 6
- 230000006978 adaptation Effects 0.000 abstract description 3
- 230000000694 effects Effects 0.000 abstract description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000007906 compression Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000017525 heat dissipation Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
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Abstract
The utility model relates to a chip test seat suitable for testing multiple types of chips, which comprises a base, wherein a surface cover is pivoted on the base, a mounting groove is formed in the base, a chip positioning plate, a chip connecting plate and a probe connecting plate which are connected with each other are sequentially arranged in the mounting groove, the chip positioning plate is detachably connected with the chip connecting plate, a connecting cavity is formed in the surface cover, a pressing block is arranged in the connecting cavity, a protruding sliding block is arranged in the connecting cavity, a sliding groove corresponding to the sliding block is formed in the outer wall of the pressing block, and the pressing block is in a reset state and a pressing state through sliding. The utility model has the following advantages and effects: through can dismantle the connection with chip locating plate and chip connecting plate to can install the chip locating plate of looks adaptation according to the specification of the chip that awaits measuring, and then can be suitable for the test of multiple type chip, and can guarantee at the in-process of roof pressure chip that the chip atress is even, prevent that the chip bottom pin from damaging.
Description
Technical Field
The utility model relates to the technical field of chip testing, in particular to a chip testing seat suitable for testing multiple types of chips.
Background
In the field of semiconductors, in order to control the quality of products, a chip tester is required to test the opening and short circuit conditions of a single IC component and each circuit network of a chip, and the analog device function and the digital device logic function before leaving the factory. At present, the mode that adopts the test seat to be connected chip and chip testing machine has gradually replaced the direct mode that welds the chip that awaits measuring on test circuit board and be connected with chip testing machine, through the mode that adopts the test seat to be connected, the dismouting of the chip that awaits measuring can be convenient for to effectively improve the efficiency to chip batch test.
For example, chinese patent document with bulletin number CN201616521U discloses a positioning structure of a chip testing seat, which is provided with a base and a cover pivoted with the base, wherein the base is provided with a groove, a group of guide connection devices are arranged in the groove, and a pressing unit is arranged on the bottom surface of the cover, wherein the guide connection devices are provided with a positioning part matched with the chip to be tested to fix, and a plurality of through holes corresponding to the positions of pins at the bottom of the chip to be tested are arranged in the positioning part, the through holes are used for sleeving pins for fixing the chip to be tested, the chip to be tested is positioned on the positioning part, and a conductive part for conducting the chip to be tested and the testing circuit board is arranged below the positioning part.
According to the technical scheme, after the cover body is buckled on the base, the propping unit can prop up the chip to be tested, so that pins at the bottom of the chip to be tested can be stably connected with the conductive part of the test circuit board, however, in the buckling process of the cover body, the propping unit is propped against the chip to be tested along with the rotation of the cover body, one side of the propping unit is contacted with the chip to be tested, so that the chip to be tested is easily stressed unevenly due to the component force of partial non-vertical acting on the chip in the compression process, the pins at the bottom of the chip are inclined in the connection process with pins on the conductive part of the test circuit board, and in addition, in the practical use process, the positioning part is matched with the chip to be tested, so that the positioning guiding effect can be ensured in the connection process of the chip and the conductive part of the test circuit board, however, in the technical scheme, the positioning part is of a single specification, and the content disclosed in the specification drawing shows that the positioning part and the base are of an integrated structure, so that the chips with different specifications cannot be positioned.
Disclosure of Invention
Aiming at the defects of the prior art, the utility model aims to provide a chip test seat suitable for testing multiple types of chips, which can position chips with different specifications so as to realize the detection of the multiple types of chips, ensure the uniform stress of the chips and prevent the damage of pins at the bottom of the chips in the process of jacking the chips.
In order to achieve the above purpose, the present utility model provides the following technical solutions: the utility model provides a be suitable for chip test seat of many types chip test, includes the base, the pin joint has the face lid on the base, be equipped with the mounting groove in the base, the face lid is used for opening or closing the mounting groove, be equipped with interconnect's chip locating plate, chip connecting plate and probe connecting plate from last to being equipped with down in proper order along the direction of height in the mounting groove, can dismantle between chip locating plate and the chip connecting plate and be connected, the face is covered and is equipped with the connecting chamber, be equipped with the briquetting in the connecting chamber, be equipped with convex slider in the connecting chamber, the slider is a plurality of and according to circumference evenly distributed, the briquetting outer wall is equipped with the spout corresponding with the slider, can constitute sliding fit between spout and the slider, the briquetting has reset state and roof pressure state through the slip, when the briquetting is located reset state, the briquetting is retracted in the connecting chamber, when the briquetting is located the roof pressure state, the briquetting stretches out from the connecting chamber.
The utility model is further provided with: still include limit structure, limit structure is used for preventing that the briquetting from retracting to the connecting chamber when being in the roof pressure state, limit structure is including setting up in connecting chamber towards chip locating plate one side and inwards convex limit flange, form spacing space between limit flange and the slider tip, be equipped with the application of force pole that extends to the connecting chamber on the briquetting, when the briquetting slides to spacing space, and spout and slider phase when wrong, spacing space constitutes the spacing cooperation to briquetting axial.
The utility model is further provided with: the force application rod is located one end of the back pressing block and is provided with a key groove for facilitating the rotation of the pressing block.
The utility model is further provided with: the chip locating plate is provided with a first threaded hole which penetrates through the chip locating plate, the chip connecting plate is provided with a second threaded hole which corresponds to the first threaded hole, and the chip locating plate and the chip connecting plate are detachably connected through screwing in or screwing out of the first threaded hole and the second threaded hole through locking pieces.
The utility model is further provided with: and a support column for the overhead base is arranged at the bottom of the base.
Compared with the prior art, the utility model has the beneficial effects that:
because the convex sliding block is arranged in the connecting cavity, and the sliding groove corresponding to the sliding block is arranged on the outer wall of the pressing block, the sliding fit can be formed between the sliding groove and the sliding block to slide in the connecting cavity, when the face cover is buckled, the pressing block is in a reset state through sliding, so that the pressing block is retracted in the connecting cavity, one side of the pressing block is contacted with a chip to be tested firstly, uneven stress of the chip is caused, after the face cover is buckled, the pressing block is in a jacking state through sliding, the pressing block extends out of the connecting cavity, the pressure of the pressing block on the chip is ensured to be vertically acted on the chip, the chip stress is even, and in addition, the chip locating plate is detachably connected with the chip connecting plate, so that the chip locating plate matched with the specification of the chip to be tested can be installed according to the test of the chip to be tested, and the chip of multiple types can be applied.
Drawings
FIG. 1 is a schematic diagram of a front view structure of the present utility model;
FIG. 2 is a schematic top view of the present utility model;
FIG. 3 is a schematic diagram showing the internal structure of the inventive block in a reset state;
fig. 4 is a schematic view of the internal structure of the press block in the pressing state according to the present utility model.
Detailed Description
The following description of the embodiments of the present utility model will be made apparent and fully in view of the accompanying drawings, in which some, but not all embodiments of the utility model are shown. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.
In the description of the present utility model, it should be noted that the directions or positional relationships indicated by the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc. are based on the directions or positional relationships shown in the drawings, are merely for convenience of describing the present utility model and simplifying the description, and do not indicate or imply that the devices or elements referred to must have a specific orientation, be configured and operated in a specific orientation, and thus should not be construed as limiting the present utility model. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.
As shown in fig. 1 to 4, the utility model discloses a chip test seat suitable for testing multiple types of chips, which comprises a base 1, wherein a surface cover 2 is pivoted on the base 1, a mounting groove 3 is arranged in the base 1, the surface cover 2 is used for opening or closing the mounting groove 3, a chip positioning plate 4, a chip connecting plate 5 and a probe connecting plate 6 which are connected with each other are sequentially arranged in the mounting groove 3 from top to bottom along the height direction, the chip positioning plate 4 and the chip connecting plate 5 are detachably connected, a connecting cavity 21 is arranged on the surface cover 2, a pressing block 22 is arranged in the connecting cavity 21, a plurality of protruding sliding blocks 7 are arranged in the connecting cavity 21 and uniformly distributed according to the circumference, sliding grooves 221 corresponding to the sliding blocks 7 are arranged on the outer wall of the pressing block 22, sliding fit can be formed between the sliding grooves 221 and the sliding blocks 7, the pressing block 22 has a reset state and a pressing state through sliding, when the pressing block 22 is in the reset state, the briquetting 22 is retracted in the connecting cavity 21, when briquetting 22 is located the roof pressure state, briquetting 22 stretches out from connecting cavity 21, when buckling face lid 2, be in reset state with briquetting 22 through the slip, make briquetting 22 retract in connecting cavity 21, thereby can prevent along with the rotation of face lid 2, one side of briquetting 22 contacts with the chip that awaits measuring earlier, lead to the chip atress uneven, after covering 2 lock with the face, be in the roof pressure state with briquetting 22 through the slip again, make briquetting 22 stretch out from connecting cavity 21, ensure that briquetting 22 can perpendicularly act on the chip to the pressure of chip, make the chip atress even, in addition through can dismantle chip locating plate 4 and chip connecting plate 5 be connected, thereby can install the chip locating plate 4 of looks adaptation according to the specification of the chip that awaits measuring, and then can be suitable for the test of multiple type chip.
In this embodiment, still further set up limit structure, limit structure is used for preventing briquetting 22 to retract to connecting chamber 21 when being in the roof pressure state, limit structure is including setting up in connecting chamber 21 towards chip locating plate 4 one side and inwards convex limit flange 8, form spacing space 9 between limit flange 8 and the slider 7 tip, be equipped with the application of force pole 10 that extends to connecting chamber 21 on the briquetting 22, when briquetting 22 slides to spacing space 9, and spout 221 and slider 7 looks when wrong, spacing space 9 constitutes the spacing cooperation to briquetting 22 axial, after face lid 2 lock is in base 1, promote briquetting 22 through promoting application of force pole 10 earlier and slide for briquetting 22 slides in spacing space 9, slider 7 slides from spout 221 at this moment, then rethread rotates application of force pole 10 and makes briquetting 22 rotate, thereby make spout 221 can stagger with slider 7, and then through slider 7 tip and limit flange 8 butt respectively in briquetting 22 both sides, realize spacing space 9 to briquetting 22 axial spacing, can prevent briquetting 22 when pressing the chip, stability to the roof pressure of briquetting 22 has been guaranteed to the roof pressure.
In this embodiment, the end of the force application rod 10 located opposite to the pressing block 22 is further provided with a key slot 101 for facilitating the rotation of the pressing block 22, and the key slot 101 can be adapted to the head of the screwdriver, so that the pressing block 22 can be rotated by the force application rod 10 by means of a corresponding tool, thereby being more convenient and labor-saving.
In this embodiment, be equipped with the first screw hole that runs through on chip locating plate 4, be equipped with the second screw hole that corresponds with first screw hole on the chip connecting plate 5, realize dismantling the connection through retaining member 11 screw in or unscrew first screw hole and second screw hole between chip locating plate 4 and the chip connecting plate 5 to can install the chip locating plate 4 of looks adaptation according to the specification of the chip that awaits measuring, and then can be suitable for the test of multiple type chip.
In this embodiment, the bottom of the base 1 is further provided with a pillar 12 for the overhead base 1, so that heat dissipation can be facilitated when the connection base is connected to the conductive portion of the test circuit board.
The present embodiment is only for explanation of the present utility model and is not to be construed as limiting the present utility model, and modifications to the present embodiment, which may not creatively contribute to the present utility model as required by those skilled in the art after reading the present specification, are all protected by patent laws within the scope of claims of the present utility model.
Claims (5)
1. The utility model provides a be suitable for chip test seat of many types chip test, its characterized in that, includes the base, the pin joint has the face lid on the base, be equipped with the mounting groove in the base, the face lid is used for opening or closing the mounting groove, be equipped with interconnect's chip locating plate, chip connecting plate and probe connecting plate from last to being equipped with down in proper order along the direction of height in the mounting groove, can dismantle between chip locating plate and the chip connecting plate and be connected, be equipped with the connection chamber on the face lid, be equipped with the briquetting in the connection chamber, be equipped with convex slider in the connection chamber, the slider is a plurality of and according to circumference evenly distributed, the briquetting outer wall is equipped with the spout corresponding with the slider, can constitute sliding fit between spout and the slider, the briquetting has reset state and roof pressure state through the slip, when the briquetting is located reset state, the briquetting is retracted in the connection chamber, when the briquetting is located roof pressure state, the briquetting stretches out from the connection chamber.
2. The chip test seat suitable for the multi-type chip test according to claim 1, further comprising a limiting structure, wherein the limiting structure is used for preventing the pressing block from retracting to the connecting cavity when being in a pressing state, the limiting structure comprises a limiting flange which is arranged on one side of the connecting cavity, which faces the chip locating plate, and protrudes inwards, a limiting space is formed between the limiting flange and the end part of the sliding block, a force application rod extending to the connecting cavity is arranged on the pressing block, and when the pressing block slides to the limiting space, and the sliding groove and the sliding block are staggered, the limiting space forms limiting fit for the axial direction of the pressing block.
3. The die test socket for multiple die testing as defined in claim 2, wherein said biasing rod is provided with a keyway at an end facing away from said press block for facilitating rotation of said press block.
4. The chip test socket for testing multiple types of chips according to claim 1, wherein the chip positioning plate is provided with a first threaded hole penetrating through the chip positioning plate, the chip connecting plate is provided with a second threaded hole corresponding to the first threaded hole, and the chip positioning plate and the chip connecting plate are detachably connected by screwing in or screwing out the first threaded hole and the second threaded hole through locking pieces.
5. A die test pad for multiple die testing according to claim 1, wherein the base bottom is provided with a support for an overhead base.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202320002446.2U CN218974434U (en) | 2023-01-03 | 2023-01-03 | Chip test seat suitable for multi-type chip test |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202320002446.2U CN218974434U (en) | 2023-01-03 | 2023-01-03 | Chip test seat suitable for multi-type chip test |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN218974434U true CN218974434U (en) | 2023-05-05 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202320002446.2U Active CN218974434U (en) | 2023-01-03 | 2023-01-03 | Chip test seat suitable for multi-type chip test |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN218974434U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117092491A (en) * | 2023-10-18 | 2023-11-21 | 苏州微飞半导体有限公司 | Chip test seat applied to large-order pins and manufacturing method |
-
2023
- 2023-01-03 CN CN202320002446.2U patent/CN218974434U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117092491A (en) * | 2023-10-18 | 2023-11-21 | 苏州微飞半导体有限公司 | Chip test seat applied to large-order pins and manufacturing method |
| CN117092491B (en) * | 2023-10-18 | 2024-04-05 | 苏州微飞半导体有限公司 | Chip test seat applied to large-order pins and manufacturing method |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CP03 | Change of name, title or address |
Address after: 314100 Building 2, No. 168, Qiantang River Road, Huimin Street, Jiashan County, Jiaxing City, Zhejiang Province Patentee after: Beizhen (Jiaxing) Electronic Technology Co.,Ltd. Country or region after: China Address before: 314100 Building 2, No. 168, Qiantang River Road, Huimin Street, Jiashan County, Jiaxing City, Zhejiang Province Patentee before: Beizhen (Zhejiang) Electronic Technology Co.,Ltd. Country or region before: China |
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| CP03 | Change of name, title or address |