CN218956736U - Chip test seat convenient to chip location direction - Google Patents
Chip test seat convenient to chip location direction Download PDFInfo
- Publication number
- CN218956736U CN218956736U CN202223373982.8U CN202223373982U CN218956736U CN 218956736 U CN218956736 U CN 218956736U CN 202223373982 U CN202223373982 U CN 202223373982U CN 218956736 U CN218956736 U CN 218956736U
- Authority
- CN
- China
- Prior art keywords
- chip
- connecting plate
- positioning
- auxiliary guide
- plate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 20
- 238000000034 method Methods 0.000 claims abstract description 17
- 239000000523 sample Substances 0.000 claims abstract description 8
- 208000004350 Strabismus Diseases 0.000 claims description 2
- 230000000149 penetrating effect Effects 0.000 abstract description 2
- 230000000694 effects Effects 0.000 abstract 1
- 238000009434 installation Methods 0.000 description 3
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
Images
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
The utility model relates to a chip test seat convenient for positioning and guiding a chip, which comprises a base, wherein a surface cover is pivoted on the base, a cavity is arranged in the base, the surface cover is used for opening or closing the cavity, a chip connecting plate is arranged in the cavity, a probe connecting plate connected with the chip connecting plate is arranged below the chip connecting plate, the probe connecting plate is used for being connected with a chip tester, an auxiliary guide plate is arranged above the chip connecting plate, the auxiliary guide plate is used for ensuring that pins of the chip are kept vertical to the chip connecting plate in the process of being connected with the chip connecting plate, a penetrating guide opening is formed in the auxiliary guide plate, a bearing part formed by inward deflection is arranged in the guide opening, and the bearing part is used for supporting an outer frame of the chip. The utility model has the following advantages and effects: through setting up supplementary deflector, guarantee the pin perpendicular to chip connecting plate of chip that awaits measuring at the in-process of being connected with the chip connecting plate, prevent that the chip from producing the damage at the in-process of connecting.
Description
Technical Field
The utility model relates to the technical field of chip testing, in particular to a chip testing seat convenient for positioning and guiding a chip.
Background
In the field of semiconductors, in order to control the quality of products, before leaving the factory, the chip tester is required to perform corresponding tests on the opening and short circuit conditions of a single IC component and each circuit network of the chip, and the analog device function and the digital device logic function, so as to facilitate the connection of the chip to be tested to the chip tester, and at present, the chip tester is mainly adopted to realize the quick connection of the chip to be tested and the chip tester.
For example, chinese patent document with publication number CN214409200U discloses a flip-type PCB chip test socket, mainly comprising: the flip is hinged between the base and the flip, a pressing component is arranged on one face of the flip, facing the base, of the flip, a needle assembly is arranged in the base, a floating plate is arranged above the needle assembly, a spring is arranged between the floating plate and the needle assembly, a plurality of through holes are formed in the floating plate, a chip guide block is arranged above the floating plate, and the position of the chip guide block corresponds to the pressing component.
According to the above disclosure, after the flip cover is covered, the pressing component can contact with the chip and press the chip, so that the chip drives the chip guide block to press down, meanwhile, the floating plate also presses down correspondingly, the stamping needle contacts with the tin ball at the bottom of the chip, when the floating plate reaches the balance position, the floating plate stops descending, the chip is connected with the stamping needle, however, the inventor finds that the chip cannot be ensured to be vertically placed into the chip guide block when the chip is placed into the chip guide block, and a deviation angle exists between the chip guide block and the chip guide block due to the influence of external factors in the pressing process of the chip, so that pins at the bottom of the chip cannot be vertically aligned with the stamping needle, and the chip is easily damaged when the chip is connected.
Disclosure of Invention
Aiming at the defects in the prior art, the utility model aims to provide a chip test seat which is convenient for positioning and guiding a chip, and can ensure that pins of the chip to be tested are perpendicular to a chip connecting plate in the process of being connected with the chip connecting plate, so as to prevent the chip from being damaged in the process of being connected.
In order to achieve the above purpose, the present utility model provides the following technical solutions: the utility model provides a chip test seat convenient to chip location direction, includes the base, the pin joint has the face lid on the base, be equipped with the cavity in the base, the face lid is used for opening or closing the cavity, be equipped with the chip connecting plate in the cavity, chip connecting plate below is equipped with the probe connecting plate of being connected with the chip connecting plate, the probe connecting plate is used for being connected with the chip test machine, chip connecting plate top is equipped with supplementary deflector, supplementary deflector is used for guaranteeing the chip at the in-process of being connected with the chip connecting plate, the pin of chip keeps perpendicular with the chip connecting plate, be equipped with the guiding mouth that runs through on the supplementary deflector, be equipped with the adapting unit that inwards squints and form in the guiding mouth, adapting unit is used for supporting the frame of chip.
The utility model is further provided with: the auxiliary guide plate is characterized in that an installation groove is formed in the inner side wall of the auxiliary guide plate, a plurality of jacking springs are arranged in the installation groove at intervals, one end of each jacking spring is fixed to the bottom of the installation groove, the other end of each jacking spring is connected with a clamping block, and when a chip is placed on the bearing part, the clamping blocks are jacked on the outer frame of the chip.
The utility model is further provided with: guide grooves are respectively formed in the inner walls of the two sides of the base, guide blocks corresponding to the guide grooves of the two sides are respectively arranged on the outer walls of the two sides of the auxiliary guide plate, and the guide blocks extend into the guide grooves and form limit fit to the horizontal direction of the auxiliary guide plate.
The utility model is further provided with: the guide block is characterized in that connecting grooves are formed in the side wall of the guide block and are arranged at intervals along the vertical direction, pulleys are rotationally connected in the connecting grooves, sliding rails opposite to the pulleys are arranged in the guide grooves, and the pulleys and the sliding rails form sliding fit.
The utility model is further provided with: the outer wall of the clamping block is provided with a convex positioning block, a positioning groove corresponding to the positioning block is arranged in the mounting groove, and the positioning block is positioned in the positioning groove.
Compared with the prior art, the utility model has the beneficial effects that:
through setting up supplementary deflector, when being connected through test seat and chip tester with the chip that awaits measuring, through putting into the guiding mouth with the chip that awaits measuring, support the frame of chip by the adapting portion, this supplementary deflector is parallel with the chip connecting plate, only need ensure at this moment and put into the guiding mouth with the chip after, the chip is parallel with adapting portion just can ensure the pin perpendicular to chip connecting plate of chip bottom, the chip of adapting portion is put into in parallel to the rethread supplementary deflector is spacing afterwards, thereby can prevent the face lid and close the back, the chip produces deflection when pushing down the chip and remove towards the chip connecting plate, so effectively solved current test seat and being under the in-process of pushing down the chip, the chip receives the influence of external factor to produce the technical problem of deflection easily, and then can ensure the pin perpendicular to chip connecting plate of chip that awaits measuring at the in-process of being connected with the chip connecting plate, prevent that the chip from producing the damage at the in-process of connection.
Drawings
FIG. 1 is a schematic view of the internal structure of the present utility model;
FIG. 2 is a schematic top view of the base of the present utility model;
FIG. 3 is a schematic view of a connection structure between an auxiliary guide plate and a base in the present utility model;
FIG. 4 is a schematic view of a partial enlarged structure of the present utility model A;
fig. 5 is a schematic view of a partial enlarged structure of the present utility model at B.
Detailed Description
The following description of the embodiments of the present utility model will be made apparent and fully in view of the accompanying drawings, in which some, but not all embodiments of the utility model are shown. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.
In the description of the present utility model, it should be noted that the directions or positional relationships indicated by the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc. are based on the directions or positional relationships shown in the drawings, are merely for convenience of describing the present utility model and simplifying the description, and do not indicate or imply that the devices or elements referred to must have a specific orientation, be configured and operated in a specific orientation, and thus should not be construed as limiting the present utility model. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.
As shown in fig. 1 to 5, the utility model discloses a chip test seat convenient for positioning and guiding a chip, which comprises a base 1, wherein a surface cover 2 is pivoted on the base 1, a cavity 3 is arranged in the base 1, the surface cover 2 is used for opening or closing the cavity 3, a chip connecting plate 4 is arranged in the cavity 3, a probe connecting plate 5 connected with the chip connecting plate 4 is arranged below the chip connecting plate 4, the probe connecting plate 5 is used for being connected with a chip tester, an auxiliary guide plate 6 is arranged above the chip connecting plate 4, the auxiliary guide plate 6 is used for ensuring that pins of the chip are vertical to the chip connecting plate 4 in the process of being connected with the chip connecting plate 4, a guide opening 61 penetrating the auxiliary guide plate 6 is arranged on the auxiliary guide plate 6, a bearing part 62 formed by inward deflection is arranged in the guide opening 61 and used for supporting an outer frame of the chip, when the chip to be tested is connected with the chip tester through the test seat, the outer frame of the chip is supported by the bearing part 62, the auxiliary guide plate 6 is only required to ensure that the chip is parallel to the chip connecting plate 4, after the chip is placed into the guide opening 61, pins of the chip and the chip can be ensured to be parallel to the chip connecting plate 62 can be prevented from being parallel to the chip connecting plate 4, and then the chip can be prevented from being deflected to the chip connecting plate 4 in the process when the chip is perpendicular to the chip connecting plate 4, and the chip can be prevented from being perpendicular to the chip connecting plate 4 and being connected with the chip through the guide opening.
In this embodiment, the limit structure of the chip placed in the receiving portion 62 by the auxiliary guide plate 6 is that the mounting groove 63 is formed in the inner side wall of the auxiliary guide plate 6, the jacking springs 7 are arranged in the mounting groove 63, the jacking springs 7 are multiple and are arranged at intervals, one end of each jacking spring 7 is fixed at the bottom of the mounting groove 63, the other end of each jacking spring 7 is connected with the clamping block 8, when the chip is placed in the receiving portion 62, the outer frame of the chip can jack the clamping block 8, the spring connected with the clamping block 8 is stressed to deform, the reaction force generated by deformation can act on the clamping block 8, so that the clamping block 8 can tightly jack the outer frame of the chip to form limit fit for the horizontal direction of the chip, and therefore the chip parallel to the receiving portion 62 can be prevented from deflecting in the downward moving process.
In this embodiment, guide grooves 9 are further respectively disposed on inner walls of two sides of the base 1, guide blocks 64 corresponding to the guide grooves 9 of two sides are respectively disposed on outer walls of two sides of the auxiliary guide plate 6, the guide blocks 64 extend into the guide grooves 9 and form a limit fit to the horizontal direction of the auxiliary guide plate 6, and in the process of moving the auxiliary guide plate 6 downwards, the outer walls of the guide blocks 64 can contact with the side walls of the base 1 to form a limit fit to the horizontal direction of the auxiliary guide plate 6, so that the auxiliary guide plate 6 can be prevented from deflecting in the process of moving downwards, and the chip is prevented from deflecting.
In this embodiment, the side wall of the guide block 64 is further provided with a plurality of connecting grooves 641, the connecting grooves 641 are arranged at intervals along the vertical direction, the pulley 10 is rotationally connected in the connecting grooves 641, the sliding rail 11 opposite to the pulley 10 is arranged in the guide groove 9, the pulley 10 and the sliding rail 11 form sliding fit, and friction generated when the outer wall of the guide block 64 and the side wall of the base 1 are mutually contacted in the moving process of the auxiliary guide plate 6 can be reduced by arranging the pulley 10 in the connecting grooves 641, so that the auxiliary guide plate 6 is more convenient and labor-saving to press down.
In this embodiment, the outer wall of the clamping block 8 is further provided with a protruding positioning block 81, the mounting groove 63 is internally provided with a positioning groove 65 corresponding to the positioning block 81, the positioning block 81 is located in the positioning groove 65, when the outer frame of the chip pushes the clamping block 8, the positioning block 81 located in the positioning groove 65 can slide in the positioning groove 65, so that the moving path of the clamping block 8 can be limited and guided, each clamping block 8 is ensured to be horizontally opposite to the outer frame of the chip, and the outer frame of the chip is uniformly stressed when the outer frame of the chip is clamped, so that the chip is prevented from deflecting.
The present embodiment is only for explanation of the present utility model and is not to be construed as limiting the present utility model, and modifications to the present embodiment, which may not creatively contribute to the present utility model as required by those skilled in the art after reading the present specification, are all protected by patent laws within the scope of claims of the present utility model.
Claims (5)
1. The utility model provides a chip test seat convenient to chip location direction, its characterized in that, includes the base, the pin joint has the face lid on the base, be equipped with the cavity in the base, the face lid is used for opening or closing the cavity, be equipped with the chip connecting plate in the cavity, chip connecting plate below is equipped with the probe connecting plate of being connected with the chip connecting plate, the probe connecting plate is used for being connected with the chip test machine, chip connecting plate top is equipped with auxiliary guide plate, auxiliary guide plate is used for guaranteeing the chip at the in-process of being connected with the chip connecting plate, and the pin and the chip connecting plate of chip keep perpendicular, be equipped with the guiding mouth that runs through on the auxiliary guide plate, be equipped with the adapting unit that inwards squints formed in the guiding mouth, adapting unit is used for supporting the frame of chip.
2. The chip testing seat convenient for positioning and guiding chips as defined in claim 1, wherein the inner side wall of the auxiliary guide plate is provided with a mounting groove, a plurality of pushing springs are arranged in the mounting groove at intervals, one end of each pushing spring is fixed at the bottom of the mounting groove, the other end of each pushing spring is connected with a clamping block, and when the chips are placed on the receiving part, the clamping blocks are pushed against the outer frame of the chips.
3. The chip testing seat for facilitating chip positioning and guiding according to claim 1, wherein guide grooves are respectively formed in inner walls of two sides of the base, guide blocks corresponding to the guide grooves of two sides are respectively arranged on outer walls of two sides of the auxiliary guide plate, and the guide blocks extend into the guide grooves and form limit fit in the horizontal direction of the auxiliary guide plate.
4. The chip testing seat convenient for positioning and guiding chips according to claim 3, wherein the side wall of the guide block is provided with a plurality of connecting grooves which are arranged at intervals along the vertical direction, the connecting grooves are rotationally connected with pulleys, sliding rails opposite to the pulleys are arranged in the guide grooves, and the pulleys and the sliding rails form sliding fit.
5. The chip testing seat for facilitating positioning and guiding of chips as defined in claim 2, wherein the outer wall of said clamping block is provided with a convex positioning block, said mounting groove is provided with a positioning groove corresponding to said positioning block, and said positioning block is positioned in said positioning groove.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202223373982.8U CN218956736U (en) | 2022-12-15 | 2022-12-15 | Chip test seat convenient to chip location direction |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202223373982.8U CN218956736U (en) | 2022-12-15 | 2022-12-15 | Chip test seat convenient to chip location direction |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN218956736U true CN218956736U (en) | 2023-05-02 |
Family
ID=86109656
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202223373982.8U Active CN218956736U (en) | 2022-12-15 | 2022-12-15 | Chip test seat convenient to chip location direction |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN218956736U (en) |
-
2022
- 2022-12-15 CN CN202223373982.8U patent/CN218956736U/en active Active
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US7214084B2 (en) | Socket for electrical parts | |
| CN110108909B (en) | ICT test fixture | |
| KR20180031271A (en) | Vertical Probe Card | |
| KR102293762B1 (en) | Socket for inspection of semiconductor devices | |
| KR20060087125A (en) | Socket assembly for testing semiconductor device | |
| KR20180109303A (en) | Test socket | |
| KR101278890B1 (en) | Probe card holding apparatus and prober | |
| KR20180020037A (en) | Apparatus for Inspecting Camera Module | |
| KR102171511B1 (en) | Socket for semiconductor chip test | |
| US6876215B1 (en) | Apparatus for testing semiconductor integrated circuit devices in wafer form | |
| CN218956736U (en) | Chip test seat convenient to chip location direction | |
| US7134892B2 (en) | Socket for electrical parts | |
| CN101101307A (en) | Semiconductor device testing apparatus | |
| CN218956647U (en) | Spiral cover type chip test seat convenient for chip lamination | |
| KR101722403B1 (en) | the pin block with adjustable pitch control | |
| US6049214A (en) | Universal printed circuit board inspection apparatus, and method of using same | |
| CN110658470A (en) | Jig for testing probe | |
| CN216209316U (en) | Automatic test fixture | |
| KR101646544B1 (en) | Test socket with minimized number of components | |
| KR20210132981A (en) | A Test Device Of Semi-Conductor | |
| KR102366593B1 (en) | Self-align type test socket | |
| JP4276163B2 (en) | IC socket | |
| KR20240018035A (en) | Test apparatus for IC | |
| KR100551993B1 (en) | Carrier module for semiconductor test handler | |
| KR20240018201A (en) | Test apparatus for IC |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CP03 | Change of name, title or address |
Address after: 314100 Building 2, No. 168, Qiantang River Road, Huimin Street, Jiashan County, Jiaxing City, Zhejiang Province Patentee after: Beizhen (Jiaxing) Electronic Technology Co.,Ltd. Country or region after: China Address before: 314100 Building 2, No. 168, Qiantang River Road, Huimin Street, Jiashan County, Jiaxing City, Zhejiang Province Patentee before: Beizhen (Zhejiang) Electronic Technology Co.,Ltd. Country or region before: China |
|
| CP03 | Change of name, title or address |