CN218767064U - Detection probe - Google Patents

Detection probe Download PDF

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Publication number
CN218767064U
CN218767064U CN202222872594.8U CN202222872594U CN218767064U CN 218767064 U CN218767064 U CN 218767064U CN 202222872594 U CN202222872594 U CN 202222872594U CN 218767064 U CN218767064 U CN 218767064U
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China
Prior art keywords
contact end
glass plate
probe
panel
circuit
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CN202222872594.8U
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Chinese (zh)
Inventor
吴镇洙
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Hefei Weirui Technology Co ltd
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Hefei Weirui Optoelectronic Technology Co ltd
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Priority to CN202222872594.8U priority Critical patent/CN218767064U/en
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Abstract

The utility model discloses a test probe, including casing and the probe unit of setting on the casing, its characterized in that: the probe unit is composed of a plurality of independent probes, each probe is provided with a power-on circuit, the surface of each probe is provided with a front contact end used for being in contact with the panel circuit and a rear contact end used for being in contact with the driving IC, an elastic body is arranged between the front contact end and the shell, and the front contact end extends out of the shell. The front contact end and the rear contact end are flat surface contact ends, the driving IC is superposed on the rear contact end, the superposed position is clamped between the upper glass plate and the lower glass plate, the lower glass plate is contacted with the shell, and the upper glass plate is provided with a pressure plate for providing pressure and fixing the upper glass plate and the lower glass plate. The utility model discloses a predominant use is the flat display device who detects to have small pixel interval to for the test probe provides elasticity and the window structure of being convenient for observe.

Description

Detection probe
Technical Field
The utility model relates to a flat panel display panel detection area, more specifically says, relates to a test probe.
Background
The master (Mather Glass) is a large Glass panel used in the fabrication of LCD or OLED panels. Taking an OLED panel of a smart phone as an example, the original plate is arranged into tens of OLED panels, and after the OLED panel is manufactured, the OLED panel is separated from the original plate to form an OLED display panel for the smart phone. The LCD structure is that the liquid crystal box is placed between two parallel glass substrates, TFT (thin film transistor) is arranged on the lower substrate glass, the color filter is arranged on the upper substrate glass, the rotation direction of liquid crystal molecules is controlled by the signal and voltage change on the TFT, thereby controlling the polarized light emergence of each pixel point to achieve the purpose of display, and after the LCD is manufactured, whether the backlight and the connecting circuit are normal or not needs to be detected.
In the production process of flat display devices such as Liquid Crystal Display (LCD) devices, a flat display panel used by the flat display device needs to be subjected to non-defective product detection, and the flat display panel is assembled into the flat display device after detection results are good. When the flat panel display panel is detected, a panel circuit on the flat panel display panel is detected to be in electrical contact with the probe unit, the probe unit is connected with the driving IC, then a power supply and a control signal in the driving IC are conducted to the panel circuit of the flat panel display panel, and after the flat panel display panel is lightened, good product detection of the flat panel display panel is carried out.
Through retrieval, the Chinese patent authorizes the public number: CN 215953763U, application date: 20210929, patent name: the utility model provides a lighting device, this application relates to display panel test technical field, discloses a lighting device, includes the circuit board. The circuit board can move relative to the display panel to realize the electric connection of the circuit board and the bonding area of the display panel. Be provided with the detection zone on the circuit board, be provided with detection probe on the detection zone, detection probe includes the probe body and sets up the probe arch on the probe body, and the probe arch comprises copper layer and gold-plated layer, and the gold-plated layer can the butt in bonding area. The lighting test device provided by the invention cannot be suitable for a circuit of a panel to be detected with a fine spacing, and cannot provide elasticity for the detection probe in the detection process, so that the panel to be detected and the detection probe are easily damaged, and the detection probe cannot be recycled while the subsequent detection of the panel to be detected is not accurate enough.
SUMMERY OF THE UTILITY MODEL
1. Technical problem to be solved by the utility model
In view of the fact that the circuit of the conventional display panel has been gradually thinned, the conventional lighting detection device cannot cope with the display panel with a fine pitch, and the probe itself provided with the energizing signal circuit on the film has no elasticity, so that if the flatness of the panel to be detected and the probe unit is not sufficient, poor contact is easily caused, and the detection accuracy is lowered. The utility model provides a test probe, it is applicable in the display panel circuit of fine interval to add the elastomer, effectively restoreed the flatness of treating panel and probe unit.
2. Technical scheme
In order to achieve the above purpose, the utility model provides a technical scheme does:
the utility model discloses a test probe, including casing and the probe unit of setting on the casing, the probe unit comprises a plurality of independent probes, all sets up the circular telegram circuit on every probe, and the probe surface sets up the back contact jaw that is used for the preceding contact jaw that contacts with panel circuit and contacts with driver IC, be provided with the elastomer between preceding contact jaw and the casing, preceding contact jaw extends outside the casing.
Furthermore, the front contact end and the rear contact end are both flat surface contact ends with flat surfaces.
Further, the driver IC is laminated on the rear contact terminal with the lamination interposed between the upper glass plate and the lower glass plate.
Further, the lower glass plate is in contact with the housing, and a pressing plate for providing a pressing force is provided on the upper glass plate for fixing the upper glass plate and the lower glass plate.
Furthermore, the pressurizing plate is provided with bolt holes, the pressurizing plate is fixed on the shell through bolts, and the pressure between the pressurizing plate and the upper glass plate can be adjusted through the bolts.
Furthermore, the pressing plate is provided with a perspective window for observing the overlapping state of the driving IC and the rear contact end.
Further, the see-through windows are adjacent elliptical structures.
Furthermore, the front contact end is provided with three adjacent convex structures, and the rear contact end is provided with two adjacent convex structures.
3. Advantageous effects
Adopt the technical scheme provided by the utility model, compare with existing well-known technique, have following beneficial effect:
(1) With the gradual fine spacing of the circuits of the display panel, the conventional blade-type probes are very easy to deform, and the deformed blade-type probes are easy to short-circuit when contacting each other, so that the detection of the display panel with the fine spacing cannot be applied. The utility model provides a current circuit that test probe formed for the metal tackification technology on thin and transparent film, forms small arch in contact display panel circuit and drive circuit department, and this probe unit can infinitely be suitable for display panel's current circuit size.
(2) The probe forming the current circuit on the thin and transparent film by using the metal tackifying process has no elasticity, and if the flatness of the panel to be detected is insufficient, the contact between the probe and the panel to be detected is poor, and the phenomenon of misjudgment is easy to occur. The utility model provides a detection device adds the elastomer at probe unit and casing contact site, both can offset the not enough bad influence of bringing of plane degree, can alleviate again and wait to detect the impact that produces when panel and the contact of probe unit, play the effect of protection display panel and probe unit.
(3) In the existing liquid crystal display screen detection device, the contact part of the probe unit and the drive circuit is difficult to be directly observed, so that the rear contact end of the probe unit is not in electric contact with the drive circuit easily, and the detection result is not accurate enough; and need provide pressure when probe unit and drive circuit contact, the panel that provides pressure needs be flat smooth, for this, the utility model provides a pair of test probe is provided with two smooth glass boards, and two glass boards still have the transparency when providing pressure, accessible naked eye confirms probe unit and drive circuit's contact condition after the equipment is accomplished, with probe unit and drive circuit's contact failure minimizing.
Drawings
FIG. 1 is an exploded view of the overall structure of the present invention;
fig. 2 is a side view of the present invention;
fig. 3 is a schematic view of the probe unit of the present invention.
The reference numerals in the schematic drawings illustrate: 1. a housing; 2. an elastomer; 31. an upper glass plate; 32. a lower glass plate; 4. a probe unit; 41. a probe; 42. a front contact end; 43. a rear contact end; 5. a pressurizing plate; 51. a see-through window; 52. bolt holes; 6. and a driver IC.
Detailed Description
For a further understanding of the present invention, reference will be made to the following detailed description taken in conjunction with the accompanying drawings and examples.
Examples
The present embodiment provides a test probe for testing a circuit suitable for a fine panel, as shown in fig. 1, comprising a housing 1 and a probe unit 4 disposed on the housing 1, wherein the panel circuit includes a plurality of circuits, the probe unit 4 provided in the present embodiment is composed of a plurality of independent probes 41 corresponding to the number of the panel circuits, and each probe 41 is in electrical contact with one of the panel circuits as shown in fig. 3. Each probe 41 is formed on a thin and transparent film by using a metal tackifying process to form a power-on circuit, a front contact end 42 for contacting with a panel circuit and a rear contact end 43 for contacting with the driving IC6 are arranged on the surface of each probe 41, when the flat panel display panel is detected, a power supply and a control signal in the driving IC6 are transmitted to the panel circuit of the flat panel display panel through the probe 41, and after the flat panel display panel is lightened, the good product detection of the flat panel display panel is carried out.
The probe 41 itself that forms the current circuit on the thin and transparent film by using a metal adhesion process does not have elasticity, if the flatness of the panel to be detected is insufficient, the front contact end 42 of the probe 41 is likely to be in poor contact with the circuit of the panel to be detected, a certain pressure needs to be provided to the contact end in order to ensure that the front contact end 42 of the probe 41 is in good contact with the panel to be detected, but the shell 1 is made of a metal aluminum material, so that sufficient elasticity cannot be provided for the probe 41, and the front contact end 42 of the probe 41 is in poor contact with the circuit of the panel to be detected, and at the same time, the probe 41 and the panel circuit are likely to be damaged. As shown in fig. 2, in the detection apparatus provided in this embodiment, the elastic body 2 is added at the contact portion between the front contact end 42 and the housing 1, so that not only can adverse contact effects caused by insufficient flatness be offset, but also impact generated when the panel to be detected contacts the probe unit 4 can be relieved, and the display panel and the probe unit 4 are protected. To confirm that the front contact end 42 is properly mated with the panel to be tested, the front contact end 42 extends outwardly of the housing 1 for viewing. In addition, in order to further reduce the problem of poor contact between the front contact end 42 and the panel to be detected, the front contact end 42 is a flat surface contact end with a flat surface. In order to ensure that the housing 1 has certain strength and lightness, the housing 1 in the embodiment is made of aluminum.
In the present embodiment, the driving IC6 is stacked on the rear contact end 43 and electrically contacts with the rear contact end 43, wherein the rear contact end 43 is a flat contact end with a flat surface. In order to secure the stability of the electric contact and to facilitate the observation of the contact state of the driver IC6 with the rear contact terminals 43, the present embodiment sandwiches the stack between the upper glass plate 31 and the lower glass plate 32, wherein the lower glass plate 32 is in contact with the housing 1, and the upper glass plate 31 is provided with the pressure plate 5 for providing pressure for fixing the upper glass plate 31 and the lower glass plate 32. Wherein, the pressurizing plate 5 is provided with bolt holes 52, the pressurizing plate 5 is fixed on the shell 1 by bolts, and the pressure between the pressurizing plate 5 and the upper glass plate 31 can be adjusted by the bolts.
In order to observe the contact state of the driver IC6 and the rear contact terminal 43 without removing the pressing plate 5, a see-through window 51 for observing the overlapping state of the driver IC6 and the rear contact terminal 43 is provided in the pressing plate 5, and the contact state of the driver IC6 and the rear contact terminal 43 can be observed through the see-through window 51.
As shown in fig. 3, in order to further ensure the effectiveness of the electrical contact, the front contact end 42 of this embodiment is three adjacent protruding structures, and any one of the protruding structures can be electrically connected after being contacted with the circuit of the panel to be detected, as described above, in order to ensure the effectiveness of the electrical contact between the rear contact end 43 and the driver IC6, the rear contact end 43 is two adjacent protruding structures.
The probe unit 4 in this embodiment is fixed to the elastic body 2, the lower glass plate 32, and the housing 1 by a double-sided adhesive tape for easy mounting and dismounting.
The present invention and its embodiments have been described above schematically, and the description is not limited thereto, and what is shown in the drawings is only one of the embodiments of the present invention, and the actual structure is not limited thereto. Therefore, if the person skilled in the art receives the teaching of the present invention, without departing from the inventive spirit of the present invention, the person skilled in the art should also design the similar structural modes and embodiments without creativity to the technical solution, and all shall fall within the protection scope of the present invention.

Claims (8)

1. A detection probe, comprising a housing (1) and a probe unit (4) arranged on the housing (1), characterized in that: the probe unit (4) is composed of a plurality of independent probes (41), each probe (41) is provided with a power-on circuit, the surface of each probe (41) is provided with a front contact end (42) used for being in contact with a panel circuit and a rear contact end (43) used for being in contact with the driving IC (6), an elastic body (2) is arranged between the front contact end (42) and the shell (1), and the front contact end (42) extends out of the shell (1).
2. A test probe according to claim 1, wherein: the front contact end (42) and the rear contact end (43) are both flat surface contact ends with flat surfaces.
3. A test probe according to claim 1, wherein: the driving IC (6) is superposed on the rear contact end (43), and the superposed position is clamped between the upper glass plate (31) and the lower glass plate (32).
4. A test probe according to claim 3 wherein: the lower glass plate (32) is in contact with the shell (1), and a pressurizing plate (5) used for providing pressure is arranged on the upper glass plate (31) and used for fixing the upper glass plate (31) and the lower glass plate (32).
5. A test probe according to claim 4 wherein: the pressurizing plate (5) is provided with bolt holes (52), the pressurizing plate (5) is fixed on the shell (1) through bolts, and the pressure between the pressurizing plate (5) and the upper glass plate (31) can be adjusted through the bolts.
6. A test probe according to claim 4 or 5 wherein: and a perspective window (51) for observing the superposition state of the driving IC (6) and the rear contact end (43) is arranged on the pressurizing plate (5).
7. A test probe according to claim 6 wherein: the perspective windows (51) are of adjacent elliptical structures.
8. A test probe according to claim 1, wherein: the front contact end (42) is three adjacent convex structures, and the rear contact end (43) is two adjacent convex structures.
CN202222872594.8U 2022-10-28 2022-10-28 Detection probe Active CN218767064U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202222872594.8U CN218767064U (en) 2022-10-28 2022-10-28 Detection probe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202222872594.8U CN218767064U (en) 2022-10-28 2022-10-28 Detection probe

Publications (1)

Publication Number Publication Date
CN218767064U true CN218767064U (en) 2023-03-28

Family

ID=85702408

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202222872594.8U Active CN218767064U (en) 2022-10-28 2022-10-28 Detection probe

Country Status (1)

Country Link
CN (1) CN218767064U (en)

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Address after: 230000 No. 1766, Jiudingshan Road, Xinzhan District, Hefei City, Anhui Province

Patentee after: Hefei Weirui Technology Co.,Ltd.

Address before: No. 1766 Jiudingshan Road, Xinzhan District, Hefei City, Anhui Province, 230012

Patentee before: HEFEI WEIRUI OPTOELECTRONIC TECHNOLOGY CO.,LTD.

CP03 Change of name, title or address