CN218766691U - Diffuser plate defect detection device and diffuser plate defect detection system - Google Patents

Abstract

The utility model provides a diffuser plate defect detecting device and diffuser plate defect detecting system, this diffuser plate defect detecting device mainly through set up two sets of light sources and linear array camera on the assembly line, one of them set of light source and linear array camera divide row in the upper and lower both sides of waiting to detect the diffuser plate, be the angle that is perpendicular in opposite directions, shine and scan waiting to detect the diffuser plate; the other set of light source and the linear array camera are positioned on the same side of the diffusion plate to be detected and irradiate and scan the diffusion plate to be detected at an inclined angle, so that images input to the defect detection device are images irradiated and scanned from different angles, the defect detection device is enabled to conveniently detect defect areas with small cross section areas such as but not limited to scratch defects, and the accuracy and the comprehensiveness of defect detection are improved.

Description

Diffuser plate defect detection device and diffuser plate defect detection system

Technical Field

The utility model relates to a display screen makes the field, especially relates to a diffuser plate defect detecting device and diffuser plate defect detecting system.

Background

The display screen diffusion plate is mainly used in the assembly of a display screen, plays a role in light diffusion, and homogenizes light by scattering light flux. The quality of the diffuser plate affects the imaging performance of the display screen. In the production process of the diffusion plate, due to the influence of the production process, the production line environment and other reasons, various defects of the diffusion plate may exist, such as dirt, foreign matters, scratches, damage, uneven light transmission and the like. In the prior art, after the display diffusion plate is processed, only one LED light source and one line scan camera are used, wherein the LED light source irradiates the diffusion plate to be detected from bottom to top, the line scan camera scans the diffusion plate to be detected from top to bottom, and then a signal shot by the line scan camera is analyzed to detect defects on the surface of the diffusion plate. However, since the method only has one LED light source and one line scan camera, and images of the diffuser plate are taken from a vertical angle, when analyzing the images taken by the line scan camera, defect regions with small cross-sectional areas, such as but not limited to scratch defects, are difficult to detect, and the accuracy and comprehensiveness of defect detection are reduced.

SUMMERY OF THE UTILITY MODEL

The utility model provides a diffuser plate defect detecting device and diffuser plate defect detecting system improves defect detection's accuracy and comprehensiveness.

The utility model provides a diffuser plate defect detecting device, this diffuser plate defect detecting device mainly includes: the device comprises a production line, a detection station darkroom and a defect detection device. Wherein, the assembly line is used for transporting the diffuser plate of waiting to detect. The detection station darkroom is carried on the assembly line, and the assembly line passes through the detection station darkroom. A first linear array camera and a first light source are arranged in the detection station darkroom, wherein the first linear array camera and the first light source are respectively arranged at the upper side and the lower side of the production line, and the first linear array camera and the first light source are arranged oppositely; the first light source is used for irradiating the diffusion plate to be detected conveyed to the first position area in the dark room of the detection station, and the first linear array camera is used for shooting an image of the area irradiated by the first light source on the diffusion plate to be detected. A second linear array camera and a second light source are further arranged in the detection station darkroom, wherein the second linear array camera and the second light source are both positioned on the same side of the assembly line, and the irradiation direction of the second light source is obliquely arranged relative to the conveying surface of the assembly line; the second light source is used for irradiating the diffusion plate to be detected conveyed to the second position area in the dark room of the detection station, and the second linear array camera is used for shooting the image of the area irradiated by the second light source on the diffusion plate to be detected. The defect detection device is connected with the first linear-array camera and the second linear-array camera and used for visually detecting images shot by the first linear-array camera and the second linear-array camera so as to determine defects on the diffusion plate to be detected.

In the scheme, two sets of light sources and linear cameras are arranged on the production line, wherein one set of light source and one set of linear camera are respectively arranged at the upper side and the lower side of the diffusion plate to be detected and are in opposite vertical angles to irradiate and scan the diffusion plate to be detected; the other set of light source and the linear array camera are positioned on the same side of the diffusion plate to be detected and irradiate and scan the diffusion plate to be detected at an inclined angle, so that images input to the defect detection device are images irradiated and scanned from different angles, the defect detection device is convenient to detect defect regions with small cross section areas such as but not limited to scratch defects, and the accuracy and the comprehensiveness of defect detection are improved.

In a specific embodiment, the irradiation direction of the first light source is perpendicular to the conveying surface of the production line, and the shooting direction of the first linear array camera is perpendicular to the conveying surface of the production line, so that the first light source and the first linear array camera are in opposite perpendicular angles to irradiate and scan the diffusion plate to be detected.

In a specific embodiment, the second linear array camera and the second light source are arranged in sequence along the conveying direction of the assembly line, so that the irradiation and scanning directions of the second light source and the second linear array camera are in a part in the same direction with the conveying direction of the assembly line, and the defect area with a small cross section area on the surface of the diffusion plate to be detected can be shot conveniently.

In a specific embodiment, an included angle between the irradiation direction of the second light source and the conveying surface of the assembly line is equal to an included angle between the shooting direction of the second linear array camera and the conveying surface of the assembly line, so that a defect region with a small cross-sectional area on the surface of the diffusion plate to be detected can be shot conveniently.

In a specific embodiment, the first line-array camera is positioned above the production line, and the first light source is positioned below the production line; the second linear array camera and the second light source are both located above the assembly line, so that the two linear array cameras and the second light source are both located above the assembly line, and only the first light source is located below the assembly line, so that the arrangement is convenient.

In one particular embodiment, the defect detection device includes: a first defect detecting sub-device, a second defect detecting sub-device, a third defect detecting sub-device and a fourth defect detecting sub-device which are connected with the first linear array camera and the second linear array camera. The first defect detection sub-device is used for visually detecting images shot by the first linear-array camera and the second linear-array camera so as to confirm dirt, foreign matters and hole defects on the diffusion plate to be detected. The second defect detection sub-device is used for visually detecting images shot by the first linear-array camera and the second linear-array camera so as to confirm the scratch defect on the diffusion plate to be detected. The third defect detection sub-device is used for visually detecting images shot by the first linear array camera and the second linear array camera so as to confirm corner damage defects on the diffusion plate to be detected. The fourth defect detection sub-device is used for visually detecting images shot by the first linear-array camera and the second linear-array camera so as to confirm the defect of uneven light transmission on the diffusion plate to be detected. The defect detection method not only is convenient for detecting defect regions with small cross section areas such as but not limited to scratch defects, but also is convenient for detecting different defect types, and improves the accuracy and comprehensiveness of defect detection.

In a specific embodiment, the diffuser plate defect detecting apparatus further includes a control device, connected to the first line-array camera, the first light source, the second line-array camera, and the second light source, respectively, for controlling the first line-array camera, the first light source, the second line-array camera, and the second light source to be turned on or off, respectively.

In a specific embodiment, a first sensor and a second sensor are further arranged in the detection station darkroom, and both the first sensor and the second sensor are connected with the control device; the first sensor and the second sensor are arranged in sequence along the conveying direction of the assembly line, and the first linear array camera and the second linear array camera are arranged in sequence along the conveying direction of the assembly line. The diffusion plate detection device comprises a first sensor, a second sensor and a detection module, wherein the first sensor is used for sensing whether the diffusion plate to be detected is located in a first position area or not; the second sensor is used for sensing whether the diffusion plate to be detected is located in the second position area. The control device is also used for controlling the first linear array camera and the first light source to be turned on under the condition that the first sensor senses that the diffusion plate to be detected is located in the first position area, and controlling the first linear array camera and the first light source to be turned off under the condition that the first sensor does not sense that the diffusion plate to be detected is located in the first position area; the control device is further configured to control the second linear-array camera and the second light source to be turned on if the second sensor senses that the diffusion plate to be detected is located in the second position area, and to control the second linear-array camera and the second light source to be turned off if the second sensor does not sense that the diffusion plate to be detected is located in the second position area. The two sets of light sources and the linear array camera are triggered to work in sequence respectively when the diffusion plate to be detected is conveyed to a proper position by the production line, and the two sets of light sources and the linear array camera are not affected mutually.

In a specific implementation mode, the control device is further in communication connection with the defect detection device and the production line respectively, and is used for controlling the production line to stop conveying under the condition that the defect detection device confirms that the defect exists on the diffusion plate to be detected, so that detection personnel can timely perform subsequent processing on the diffusion plate with the defect.

In one embodiment, the diffuser plate defect detecting apparatus further includes: and when the defect detection device detects a defect on the diffusion plate to be detected, the control device also controls the alarm to send an alarm signal to remind a detector to pay attention.

The second aspect, the utility model also provides a diffuser plate defect detecting system, diffuser plate defect detecting system include above-mentioned arbitrary diffuser plate defect detecting device and wait to detect the diffuser plate. Two sets of light sources and linear cameras are arranged on a production line, wherein one set of light sources and one set of linear cameras are respectively arranged on the upper side and the lower side of the diffusion plate to be detected and form opposite vertical angles to irradiate and scan the diffusion plate to be detected; the other set of light source and the linear array camera are positioned on the same side of the diffusion plate to be detected and irradiate and scan the diffusion plate to be detected at an inclined angle, so that images input to the defect detection device are images irradiated and scanned from different angles, the defect detection device is convenient to detect defect regions with small cross section areas such as but not limited to scratch defects, and the accuracy and the comprehensiveness of defect detection are improved.

Drawings

Fig. 1 is a schematic structural diagram of a diffuser plate defect detection apparatus according to an embodiment of the present invention;

fig. 2 is a flowchart illustrating a working process of a diffuser plate defect detecting apparatus according to an embodiment of the present invention.

Reference numerals:

10-assembly line 11-diffusion plate to be detected 20-detection station darkroom

31-first line-array camera 32-second line-array camera 41-first light source

42-second light source 50-defect detection device 61-first sensor

62-second sensor 70-control device 80-alarm

Detailed Description

In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

For conveniently understanding the utility model provides a diffuser plate defect detecting device, first explain below the utility model provides a diffuser plate defect detecting device's application scene, this diffuser plate defect detecting device are applied to the detection flow after the processing of display screen diffuser plate for whether there is the defect in the display screen diffuser plate surface that detects processing. The display screen may be a display screen of a television, a display screen of a computer, or the like. The defect inspection device for the diffusion plate will be described in detail with reference to the accompanying drawings.

Referring to fig. 1 and fig. 2, an embodiment of the present invention provides a defect detecting device for a diffuser plate, which mainly includes: a flow line 10, a detection station dark room 20 and a defect detection device 50. Wherein the assembly line 10 is used for transporting the diffuser plate 11 to be detected. The inspection station dark room 20 is mounted on the line 10, and the line 10 passes through the inspection station dark room 20. A first linear array camera 31 and a first light source 41 are arranged in the detection station darkroom 20, wherein the first linear array camera 31 and the first light source 41 are respectively arranged at the upper side and the lower side of the assembly line 10, and the first linear array camera 31 is opposite to the first light source 41; the first light source 41 is used for irradiating the diffusion plate 11 to be detected conveyed to the first position area in the dark room 20 of the detection station, and the first linear array camera 31 is used for shooting an image of the area irradiated by the first light source 41 on the diffusion plate 11 to be detected. The darkroom 20 of the detection station is also provided with a second linear array camera 32 and a second light source 42, wherein both the first light source 41 and the second light source 42 can be strip-shaped light sources, and are uniformly irradiated on the surface of the diffusion plate 11 to be detected and matched with the first linear array camera 31, the second linear array camera 32 and the production line to shoot the whole surface of the diffusion plate 11 to be detected; the second line-array camera 32 and the second light source 42 are positioned on the same side of the production line 10, and the irradiation direction of the second light source 42 is arranged obliquely relative to the conveying surface of the production line 10; the second light source 42 is used for irradiating the diffusion plate 11 to be detected conveyed to the second position area in the dark room 20 of the detection station, and the second linear array camera 32 is used for shooting the image of the area irradiated by the second light source 42 on the diffusion plate 11 to be detected. The defect detecting device 50 is connected to the first line-array camera 31 and the second line-array camera 32, and is configured to visually detect images captured by the first line-array camera 31 and the second line-array camera 32, so as to confirm a defect on the diffuser plate 11 to be detected.

In the above scheme, two sets of light sources and line cameras are arranged on the assembly line 10, wherein one set of light source and line camera is respectively arranged at the upper side and the lower side of the diffusion plate 11 to be detected, and irradiates and scans the diffusion plate 11 to be detected at opposite vertical angles; the other set of light source and the linear array camera are positioned on the same side of the diffusion plate to be detected 11 and irradiate and scan the diffusion plate to be detected 11 in an inclined angle, so that images input to the defect detection device 50 are irradiated and scanned from different angles, the defect detection device 50 is enabled to conveniently detect defect regions with small cross section areas such as but not limited to scratch defects, and the accuracy and the comprehensiveness of defect detection are improved. The above-described respective structures will be described in detail with reference to the accompanying drawings.

In the arrangement of the flow line 10, as shown in fig. 1, the flow line 10 as a transport mechanism for carrying and transporting the diffusion plate 11 to be detected may be configured as a flow line 10 by using a structure such as a roller, so that the diffusion plate 11 to be detected can be transported on the flow line 10 into the inspection station dark room 20 in the transport direction of the flow line 10. The inspection station darkroom 20 is arranged on the production line 10, and the production line 10 passes through the inspection station darkroom 20, so that when the diffusion plate 11 to be detected is conveyed into the inspection station darkroom 20, the diffusion plate 11 to be detected can be irradiated and scanned by the light source and the linear array camera to obtain an image of the surface of the diffusion plate 11 to be detected.

As shown in fig. 1, a first line-array camera 31 and a first light source 41 are disposed in the dark room 20 of the inspection station, wherein the first line-array camera 31 and the first light source 41 are respectively arranged at the upper side and the lower side of the assembly line 10, and the first line-array camera 31 and the first light source 41 are disposed opposite to each other. Specifically, the first line camera 31 may be disposed above the assembly line 10, and the first light source 41 may be disposed below the assembly line 10. When waiting to detect diffuser plate 11 and conveying on assembly line 10, first light source 41 can see through the clearance between the different cylinders on assembly line 10, shines the lower surface of waiting to detect diffuser plate 11 to the diffuser plate 11 light filling that detects is examined. The first line-array camera 31 captures an image of an area on the diffusion plate 11 to be inspected, which is irradiated with the first light source 41, while the first light source 41 irradiates the diffusion plate 11 to be inspected. The diffusion plate 11 to be detected passes through the first linear array camera 31 at a constant speed on the assembly line 10, so that the first linear array camera 31 at a fixed position finishes scanning and shooting the whole diffusion plate 11 to be detected. Of course, the first line camera 31 may be disposed below the flow line 10, and the first light source 41 may be disposed above the flow line 10, in which case the first line camera 31 needs to shoot the image of the area irradiated by the first light source 41 on the diffusion plate 11 to be detected through the gap between different rollers on the flow line 10.

Specifically, when the irradiation and scanning directions of the first light source 41 and the first line camera 31 are determined, as shown in fig. 1, the irradiation direction of the first light source 41 may be perpendicular to the conveying surface of the flow line 10, that is, the irradiation direction of the first light source 41 may be perpendicular to the surface of the diffusion plate 11 to be detected. At this time, the shooting direction of the first line-array camera 31 is perpendicular to the conveying surface of the pipeline 10, that is, the shooting direction of the first line-array camera 31 is perpendicular to the surface of the diffusion plate 11 to be detected. In this way, the first light source 41 and the first linear-array camera 31 are convenient to irradiate and scan the diffusion plate 11 to be detected at opposite vertical angles. It should be understood that the irradiation and scanning directions of the first light source 41 and the first line camera 31 may be in other manners than those illustrated above.

Referring to fig. 1, a second line-array camera 32 and a second light source 42 are also provided within the inspection station dark room 20, wherein the second line-array camera 32 and the second light source 42 are located on the same side of the pipeline 10. In a specific setting, as shown in fig. 1, the second line camera 32 and the second light source 42 may be both located above the production line 10, and by combining the arrangement of the first line camera 31 and the first light source 41 in fig. 1, both the second line camera and the second light source 42 are both located above the production line 10, and only the first light source 41 is located below the production line 10, which is convenient for setting. It should be understood that the second line-array camera 32 and the second light source 42 may be disposed below the water line 10 in addition to the manner described above that is illustrated as being disposed above the water line 10. As shown in fig. 1, the irradiation direction of the second light source 42 is arranged obliquely to the conveying surface of the production line 10, and the second line-array camera 32 photographs an image of the area irradiated by the second light source 42 on the diffusion plate 11 to be detected while the second light source 42 irradiates the diffusion plate 11 to be detected. The second light source 42 and the second line-array camera 32 are used for shooting a side view at an inclined angle, the second light source 42 is irradiated with light inclined at a certain angle to the diffusion plate 11 to be detected, and the second line-array camera 32 shoots at a certain angle in an opposite direction. The diffusion plate 11 to be detected passes through the second linear-array camera 32 at a constant speed on the assembly line 10, so that the second linear-array camera 32 at a fixed position finishes scanning and shooting the whole diffusion plate 11 to be detected.

As shown in fig. 1, the second line-array camera 32 and the second light source 42 may be arranged in series along the conveying direction of the assembly line 10, that is, the second line-array camera 32 is distributed upstream of the assembly line 10 relative to the second light source 42, and the second light source 42 is distributed downstream of the assembly line 10 relative to the second line-array camera 32. The irradiation and scanning directions of the second light source 42 and the second line-array camera 32 are made to be the same direction as the conveying direction of the production line 10, which is favorable for shooting the defect area with a small cross-sectional area on the surface of the diffusion plate 11 to be detected. It should be understood that the second line-array camera 32 and the second light source 42 may be arranged in other ways than those shown above. For example, the second light source 42 and the second line-array camera 32 may also be arranged one after the other in the conveying direction of the pipeline 10.

With continued reference to fig. 1, the angle between the illumination direction of the second light source 42 and the conveying surface of the line 10 may also be made equal to the angle between the shooting direction of the second line-array camera 32 and the conveying surface of the line 10. That is, the included angle between the irradiation direction of the second light source 42 and the upper surface of the diffusion plate 11 to be detected is equal to the included angle between the shooting direction of the second linear-array camera 32 and the surface of the diffusion plate 11 to be detected, so as to shoot the defect region with a smaller cross-sectional area on the surface of the diffusion plate 11 to be detected. It should be understood that other means than those shown above may be employed. For example, an angle between the irradiation direction of the second light source 42 and the conveying surface of the line 10 may not be equal to an angle between the imaging direction of the second line-array camera 32 and the conveying surface of the line 10, but the irradiation region of the second light source 42 may include the imaging region of the second line-array camera 32.

Referring to fig. 1, the first line camera 31 and the second line camera 32 are arranged in series in the conveying direction of the assembly line 10, i.e., the first line camera 31 and the first light source 41 are arranged at an upstream position of the assembly line 10, and the second line camera 32 and the second light source 42 are arranged at a downstream position of the assembly line 10, so that the two sets of line cameras and light sources do not interfere with each other. It should be understood that the above-described arrangement is not limited to the one shown in fig. 1. In addition, other approaches may be used. For example, the second line-array camera 32 and the first line-array camera 31 may be disposed one after another in the conveying direction of the pipeline 10, that is, the second line-array camera 32 and the second light source 42 are disposed at an upstream position of the pipeline 10, and the first line-array camera 31 and the first light source 41 are disposed at a downstream position of the pipeline 10.

In selecting the first and second line cameras 31, 32 described above, an industrial line camera may be employed as the two line cameras. In addition, the first line camera 31 and the second line camera 32 may both be black and white line cameras. The images of each frame taken by the two line cameras are images of one line in the axial direction (the direction perpendicular to the conveying direction and parallel to the conveying surface) of the assembly line 10, and when the diffusion plate 11 to be detected moves at a constant speed in the assembly line 10, the positions of the two line cameras are fixed, so that the diffusion plate 11 to be detected and the two line cameras move relatively, and the two line cameras accumulate the linear images continuously to finally obtain the image of the whole diffusion plate 11 to be detected. For a 65 inch television display screen, the highest resolution can be up to 0.2 mm, calculated by detecting one defect point by a minimum of three pixels.

In addition, referring to fig. 1, the diffuser defect detecting apparatus may further include a control device 70, the control device 70 is respectively connected to the first line-array camera 31, the first light source 41, the second line-array camera 32 and the second light source 42, and the control device 70 is configured to respectively control the first line-array camera 31, the first light source 41, the second line-array camera 32 and the second light source 42 to be turned on or off. Specifically, when the control device 70 is provided, a terminal such as, but not limited to, an upper computer may be used as the control device 70 that issues a control instruction.

As shown in fig. 1, a first sensor 61 and a second sensor 62 may be further disposed in the dark room 20 of the detection station, and both the first sensor 61 and the second sensor 62 are connected to the control device 70; the first sensor 61 and the second sensor 62 are arranged one after the other in the conveying direction of the assembly line 10. That is, the first sensor 61 corresponds to the first line camera 31 and the first light source 41, and the second sensor 62 corresponds to the second line camera 32 and the second light source 42. Referring to fig. 1 and 2, the first sensor 61 is used for sensing whether the diffusion plate 11 to be detected is located in the first position area; the second sensor 62 is used for sensing whether the diffusion plate 11 to be detected is located in the second position area. The control device 70 is further configured to control the first line camera 31 and the first light source 41 to be turned on if the first sensor 61 senses that the diffuser plate 11 to be inspected is located in the first position area, and to control the first line camera 31 and the first light source 41 to be turned off if the first sensor 61 does not sense that the diffuser plate 11 to be inspected is located in the first position area; the control device 70 is also used to control the second line-array camera 32 and the second light source 42 to be turned on if the second sensor 62 senses that the diffusion plate 11 to be detected is located in the second position area, and to control the second line-array camera 32 and the second light source 42 to be turned off if the second sensor 62 does not sense that the diffusion plate 11 to be detected is located in the second position area. When the diffusion plate 11 to be detected is conveyed to a proper position by the assembly line 10, the two sets of light sources and the linear array camera are triggered to work in sequence respectively without mutual influence.

Referring to fig. 1 and 2, after the first and second line-array cameras 31 and 32 acquire images of the entire diffuser plate 11 to be inspected, defect inspection is started. In setting the defect detecting device 50, as shown in fig. 1 and 2, the defect detecting device 50 is used to visually detect the images taken by the first and second line-array cameras 31 and 32 to confirm the defect on the diffusion plate 11 to be detected. A defect detection algorithm is integrated within the defect detection device 50. In providing the defect detecting device 50, the defect detecting device 50 may be composed of a plurality of sub-devices, and different sub-devices detect different defect types, respectively. For example, the defect detection device 50 may include: a first defect detecting sub-device, a second defect detecting sub-device, a third defect detecting sub-device and a fourth defect detecting sub-device, which are connected to the first line-array camera 31 and the second line-array camera 32.

The first defect detecting sub-device is used for visually detecting images captured by the first and second line-array cameras 31 and 32 to confirm dirt, foreign matter and hole defects on the diffusion plate 11 to be detected. The diffusion plate without defects in normal condition is shot by the black and white linear array camera, and the final imaging effect is pure white image effect. When dirt, foreign matters and holes exist on the surface of the diffusion plate, black shadows with different degrees exist. The first defect detection sub-device can judge whether the defects of dirt, foreign matters and holes exist by judging the area and the gray value of the black shadow.

The second defect detecting sub-device is used to visually detect the images taken by the first and second line-array cameras 31 and 32 to confirm the scratch defect on the diffusion plate 11 to be detected. Because the diffusion plate has texture, the second defective sub-device can be filtered once first to filter the texture. And the second linear-array camera 32 and the second light source 42 are combined to realize side-lighting and side-shooting scenes, so that the scratch defect imaging effect is more obvious, and the scratch defect detection is more facilitated.

The third defect detecting sub-device is used for visually detecting the images shot by the first and second line-array cameras 31 and 32 to confirm the corner breakage defect on the diffusion plate 11 to be detected. The imaging effect of the edge area of the normal defect-free diffusion plate material is a straight edge or a right-angle edge, and the third defect detection sub-device can confirm the corner damage defect on the diffusion plate 11 to be detected by detecting the edge straightness of the edge and the corner of the diffusion plate.

The fourth defect detecting sub-device is used for visually detecting the images captured by the first line-array camera 31 and the second line-array camera 32 to confirm the uneven light transmission defect on the diffusion plate 11 to be detected. When the first linear-array camera 31 and the second linear-array camera 32 are both black and white linear-array cameras, the diffusion plate 11 to be detected has uneven thickness or when impurities exist in the diffusion plate 11 to be detected, the diffusion plate material has uneven light transmission defects, so that the fourth defect detection sub-device can confirm the uneven light transmission defects on the diffusion plate 11 to be detected by using the characteristics.

Through the four defect detection sub-devices, not only defect regions with small cross section areas such as but not limited to scratch defects can be detected conveniently, but also different defect types can be detected conveniently, and the accuracy and comprehensiveness of defect detection are improved. It should be noted that each of the defect detecting devices 50 and the defect detecting sub-devices are all integrated components of integrated software and hardware in the prior art to implement corresponding defect detection. It should be understood that the defect detection device 50 is not limited to the above-described configuration, and other configurations may be used. For example, defect detection device 50 may be comprised of some of the four defect detection sub-devices described above.

Referring to fig. 1 and 2, the control device 70 may further be communicatively connected to the defect detecting device 50 and the assembly line 10, and configured to control the assembly line 10 to stop transmitting, specifically, to open by controlling the assembly line stopper, when the defect detecting device 50 determines that there is a defect on the diffuser plate 11 to be detected, so as to stop transmitting the assembly line 10, and facilitate the detector to perform subsequent processing on the diffuser plate with the defect in time.

With continued reference to fig. 1, the diffuser plate defect detecting apparatus may further include an alarm 80 communicatively connected to the control device 70, and when the defect detecting device 50 detects a defect on the diffuser plate 11 to be detected, the control device 70 further controls the alarm 80 to send an alarm signal to remind the detecting person of the defect. When the alarm 80 is provided, the alarm 80 may be a sound and light alarm, or may be another type of alarm.

In the above-described various embodiments, two sets of light sources and line cameras are arranged on the assembly line 10, wherein one set of light sources and one set of line cameras are respectively arranged at the upper side and the lower side of the diffusion plate 11 to be detected, and irradiate and scan the diffusion plate 11 to be detected at opposite vertical angles; the other set of light source and the linear array camera are positioned on the same side of the diffusion plate to be detected 11 and irradiate and scan the diffusion plate to be detected 11 in an inclined angle, so that images input to the defect detection device 50 are irradiated and scanned from different angles, the defect detection device 50 is enabled to conveniently detect defect regions with small cross section areas such as but not limited to scratch defects, and the accuracy and the comprehensiveness of defect detection are improved.

Additionally, the utility model also provides a diffuser plate defect detecting system, refer to fig. 1 and fig. 2, this diffuser plate defect detecting system includes above-mentioned arbitrary diffuser plate defect detecting device and waits to detect diffuser plate 10. Two sets of light sources and linear cameras are arranged on the assembly line 10, wherein one set of light sources and one set of linear cameras are respectively arranged at the upper side and the lower side of the diffusion plate 11 to be detected and form opposite vertical angles to irradiate and scan the diffusion plate 11 to be detected; the other set of light source and the linear array camera are positioned on the same side of the diffusion plate to be detected 11 and irradiate and scan the diffusion plate to be detected 11 in an inclined angle, so that images input to the defect detection device 50 are irradiated and scanned from different angles, the defect detection device 50 is enabled to conveniently detect defect regions with small cross section areas such as but not limited to scratch defects, and the accuracy and the comprehensiveness of defect detection are improved.

The above description is only for the specific embodiments of the present invention, but the protection scope of the present invention is not limited thereto, and any changes or substitutions that can be easily conceived by those skilled in the art within the technical scope of the present invention should be covered by the protection scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.

Claims (10)

1. A diffuser plate defect detection device, characterized by comprising:

the assembly line is used for conveying the diffusion plate to be detected;

the detection station darkroom is carried on the production line, and the production line penetrates through the detection station darkroom;

the first line-array camera and the first light source are arranged in the detection station darkroom, wherein the first line-array camera and the first light source are respectively arranged at the upper side and the lower side of the assembly line, and the first line-array camera is arranged opposite to the first light source; the first light source is used for irradiating the diffusion plate to be detected conveyed to a first position area in the detection station darkroom, and the first linear array camera is used for shooting an image of the area irradiated by the first light source on the diffusion plate to be detected;

the second linear array camera and the second light source are arranged in the detection station darkroom, the second linear array camera and the second light source are both positioned on the same side of the assembly line, and the irradiation direction of the second light source is obliquely arranged relative to the conveying surface of the assembly line; the second light source is used for irradiating the diffusion plate to be detected conveyed to a second position area in the detection station darkroom, and the second linear array camera is used for shooting an image of the area irradiated by the second light source on the diffusion plate to be detected;

and the defect detection device is connected with the first linear array camera and the second linear array camera and is used for visually detecting images shot by the first linear array camera and the second linear array camera so as to determine the defects on the diffusion plate to be detected.

2. The diffuser plate defect inspection apparatus of claim 1, wherein the illumination direction of the first light source is perpendicular to the transport plane of the flow line, and the imaging direction of the first linear-array camera is perpendicular to the transport plane of the flow line.

3. The diffuser plate defect inspection apparatus of claim 1, wherein the second line-array camera is arranged in tandem with the second light source along the direction of travel of the assembly line.

4. The diffuser plate defect inspection apparatus of claim 3, wherein an angle between the direction of illumination of the second light source and the transport surface of the flow line is equal to an angle between the direction of capture of the second line-array camera and the transport surface of the flow line.

5. The diffuser plate defect inspection apparatus of claim 1, wherein the first line camera is positioned above the flow line and the first light source is positioned below the flow line;

the second linear-array camera and the second light source are both located above the assembly line.

6. The diffuser plate defect inspection apparatus of claim 1, wherein the defect detection device comprises: a first defect detecting sub-device, a second defect detecting sub-device, a third defect detecting sub-device and a fourth defect detecting sub-device which are connected with the first linear array camera and the second linear array camera;

the first defect detection sub-device is used for visually detecting images shot by the first linear array camera and the second linear array camera so as to confirm dirt, foreign matters and hole defects on the diffusion plate to be detected;

the second defect detection sub-device is used for visually detecting images shot by the first linear array camera and the second linear array camera so as to confirm the scratch defect on the diffusion plate to be detected;

the third defect detection sub-device is used for visually detecting images shot by the first linear array camera and the second linear array camera so as to confirm the corner damage defect on the diffusion plate to be detected;

the fourth defect detection sub-device is used for visually detecting images shot by the first linear array camera and the second linear array camera so as to confirm the defect of uneven light transmission on the diffusion plate to be detected.

7. The diffuser plate defect inspection apparatus of claim 1, further comprising: and the control device is respectively connected with the first linear array camera, the first light source, the second linear array camera and the second light source and is used for respectively controlling the first linear array camera, the first light source, the second linear array camera and the second light source to be turned on or turned off.

8. The diffuser plate defect detecting apparatus as claimed in claim 7, wherein a first sensor and a second sensor are further disposed in the inspection station dark room, and both the first sensor and the second sensor are connected to the control device; the first sensor and the second sensor are arranged in sequence along the conveying direction of the assembly line; the first linear-array camera and the second linear-array camera are arranged in sequence along the conveying direction of the assembly line;

the first sensor is used for sensing whether the diffusion plate to be detected is located in the first position area; the second sensor is used for sensing whether the diffusion plate to be detected is located in the second position area;

the control device is further used for controlling the first linear array camera and the first light source to be turned on under the condition that the first sensor senses that the diffusion plate to be detected is located in the first position area, and controlling the first linear array camera and the first light source to be turned off under the condition that the first sensor does not sense that the diffusion plate to be detected is located in the first position area;

the control device is further configured to control the second linear array camera and the second light source to be turned on when the second sensor senses that the diffusion plate to be detected is located in the second position area, and to control the second linear array camera and the second light source to be turned off when the second sensor does not sense that the diffusion plate to be detected is located in the second position area.

9. The diffuser plate defect inspection apparatus as set forth in claim 7, wherein said control device is further connected to said defect inspection device and said flow line, respectively, and is adapted to control said flow line to stop the conveyance in case said defect inspection device confirms the presence of a defect on said diffuser plate to be inspected.

10. A diffuser plate defect inspection system comprising the diffuser plate defect inspection apparatus of any one of claims 1 to 9 and a diffuser plate to be inspected.

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