CN218568780U - Novel device for sampling and inspecting substrate - Google Patents
Novel device for sampling and inspecting substrate Download PDFInfo
- Publication number
- CN218568780U CN218568780U CN202222455953.XU CN202222455953U CN218568780U CN 218568780 U CN218568780 U CN 218568780U CN 202222455953 U CN202222455953 U CN 202222455953U CN 218568780 U CN218568780 U CN 218568780U
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- baffle
- rack
- gear
- selective examination
- card strip
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Abstract
The utility model discloses a novel device for substrate selective examination, which comprises a selective examination device base, a selective examination device upper end and a baffle plate, wherein the selective examination device base is provided with a U-shaped groove and a supporting wall, the supporting wall is arranged at two sides of the U-shaped groove, racks are arranged at two sides in the U-shaped groove, a gear is meshed on the racks, the upper end surface of the gear supports a substrate and is matched with the supporting wall to support the substrate; the gear shaft is arranged, two ends of the gear shaft are clamped on the supporting wall, the gear is arranged on the gear shaft, the gear shaft is rotated to drive the gear to rotate, and the gear rotates and is meshed with the driving rack to move; the baffle articulates in the outside of rack, and supports the wall both ends and be equipped with the baffle spout and supply the baffle to slide in and accomodate or the roll-off, blocks through card strip detachably behind the baffle roll-off and fixes on the selective examination ware upper end, sets up horizontal slot on the selective examination ware upper end, and the slot is used for the cartridge base plate. The utility model discloses a novel device for base plate selective examination about the direction spacing to the base plate of being convenient for shifts between feed end magazine and discharge end magazine.
Description
Technical Field
The utility model relates to a chip package technical field, concretely relates to a novel device for base plate selective examination.
Background
In the chip packaging industry, a ball bonding station can frequently perform sampling inspection on a substrate operating on a ball bonding machine, a sampling inspection device is required during sampling inspection, and the existing sampling inspection device is of a structure with one closed end and one open end.
The existing extraction and detection device is not provided with a limit structure for the up-and-down direction of a substrate, and the substrate has the risk of shaking up and down and falling out; the existing sampling and inspecting device only has a baffle at the tail end, and the substrate slides out from the front end during sampling and inspecting; the direction requirement has been placed to the base plate in the magazine, and there are two kinds of schemes when current pump inspection ware shifts the base plate between feeding cartridge clip and ejection of compact cartridge clip: the first is to withdraw the feed end magazine first and then transfer the substrate with the drawer, which is inefficient; the second is to take the substrate out of the drawer by hand and change its direction and then put it into the magazine, which is an illegal operation.
SUMMERY OF THE UTILITY MODEL
In order to solve the problems in the prior art, a limiting structure convenient for the up-and-down direction of a substrate is provided; and a novel device for substrate sampling inspection, which is convenient for the substrate to be transferred between the feed end magazine and the discharge end magazine.
In order to achieve the above object, the utility model discloses a novel device for base plate selective examination adopts following technical scheme:
a novel device for base plate selective examination which characterized in that: the device comprises an extraction and inspection device base, an upper end of the extraction and inspection device and a baffle plate, wherein the extraction and inspection device base is provided with a U-shaped groove and a supporting wall, the supporting wall is arranged on two sides of the U-shaped groove, racks are arranged on two sides in the U-shaped groove, a gear is meshed with the racks and assembled, and a base plate is supported by the upper end surface of the gear and matched with the supporting wall to support the base plate;
the gear shaft is arranged, two ends of the gear shaft are clamped on the supporting wall, the gear is arranged on the gear shaft, the gear shaft is rotated to drive the gear to rotate, and the gear rotates and is meshed with the driving rack to move;
the baffle articulates in the outside of rack, and supports the wall both ends and be equipped with the baffle spout and supply the baffle to slide in and accomodate or the roll-off, blocks through card strip detachably behind the baffle roll-off and fixes on the selective examination ware upper end, sets up horizontal slot on the selective examination ware upper end, and the slot is used for the cartridge base plate.
While adopting the technical scheme, the invention can also adopt or combine the following technical scheme:
as a preferred technical scheme of the invention: the up end of drawer inspection ware upper end sets up card strip fixed slot, and the articulated card strip of baffle up end, fixed mounting baffle when card strip card goes into card strip fixed slot, and wherein, the card strip chooses for use elasticity card strip.
As a preferred technical scheme of the invention: set up the baffle stopper on the baffle, when baffle and rack were located same horizontal plane, the baffle stopper withstood the rack and avoided the baffle to rotate.
As a preferred technical scheme of the invention: the support wall is provided with two rack sliding grooves on the inner wall facing the U-shaped groove, two ends of a rack bottom shaft are slidably mounted on the rack sliding grooves, and the rack bottom shaft supports and mounts racks to prevent the racks from being in direct contact with the base of the sampling device, wherein the two rack bottom shafts are arranged in parallel.
As a preferred technical scheme of the invention: the support wall is provided with a rack bottom shaft mounting hole in the vertical direction, and the rack bottom shaft mounting hole is communicated with the rack sliding groove to provide a rack bottom shaft mounting channel.
As a preferred technical scheme of the invention: and a handle is arranged on the outer side of the gear shaft.
Compared with the prior art, the utility model has at least one of the following advantages that the degree of freedom of the substrate in the device is 0 by the cooperation of the slots and the rotatable baffles on the two sides, and the risk of falling is avoided; in the utility model, by utilizing the movability of the baffle plates at the two sides, the base plate transfer between the feed end material box and the discharge end material box only needs to draw out the base plate from the other side of the sampling inspection device of the device, and the machine table does not need to withdraw from the cartridge clip, thereby improving the efficiency; in the utility model, the slot at the upper end of the substrate sampling and inspecting device is suspended for inserting the substrate, so that the friction on the back surface of the substrate is reduced, and the product quality is improved to a certain extent; the utility model adopts a motion control mode of meshing the gear and the rack, and the motion distance of the baffle is controllable; just the utility model provides a both sides baffle is the active structure, has two kinds of states at least: first two baffles close on one side and open on one side, and this state is applicable to and takes out the base plate from the magazine or transfer the base plate to the magazine from the selective examination ware, and another two baffles are closed simultaneously, and under this state, the base plate can not the landing, and the security is high, and fungible magazine long distance shifts the base plate.
Drawings
FIG. 1 is a schematic structural view of the present embodiment 1;
FIG. 2 is a schematic structural view of the base of the spot checker in accordance with the present embodiment 1;
in the drawings: a drawer base 1; a U-shaped groove 101; a support wall 102; a gear shaft 2; a handle 201; a rack 3; a baffle 5; a card bar 501; a baffle stopper 502; a gear 6; a rack bottom shaft 7; a baffle chute 11; a rack chute 12; a rack bottom shaft mounting hole 13; a drawer upper end 20; a clip strip fixing groove 203; a card slot 204.
Detailed Description
The present invention will be described in further detail with reference to the accompanying drawings and specific embodiments.
Example 1
As shown in fig. 1-2, the utility model discloses a novel device for substrate selective examination, including a selective examination device base 1, a selective examination device upper end 20 and a baffle 5, the selective examination device base 1 is provided with a U-shaped groove 101 and a supporting wall 102, the supporting wall 102 is arranged at two sides of the U-shaped groove 101, two sides of the U-shaped groove 101 are provided with racks 3, the racks 3 are engaged with a gear 6, the upper end surface of the gear 6 supports the substrate, and the substrate is supported by matching with the supporting wall 102;
the gear shaft 2 is arranged, two ends of the gear shaft 2 are clamped on the supporting wall 102, the gear 6 is arranged on the gear shaft 2, the gear shaft 2 is rotated to drive the gear 6 to rotate, and the gear 6 is rotated to be meshed with the driving rack 3 to move;
the baffle 5 articulates in the outside of rack 3, and support wall 102 both ends are equipped with baffle spout 11 and supply baffle 5 to slide in and accomodate or the roll-off, and the baffle 5 roll-off back is through calorie strip 501 detachably card solid on support wall 102.
The upper end 20 of the sampling device is fixedly arranged on the sampling device base 1, a clamping groove 204 is formed in the upper end 20 of the sampling device and used for inserting the substrate, and the height of the lower end of the clamping groove 204 is reserved, so that the suspended insertion of the substrate is realized.
The up end of drawing and examining ware upper end 20 sets up card strip fixed slot 203, and the articulated card strip 501 that blocks of 5 up ends of baffle, fixed mounting baffle 5 when card strip 501 card goes into card strip fixed slot 203, and wherein, card strip 501 chooses for use the elasticity card strip.
Set up baffle stopper 502 on the baffle, when baffle 5 and rack 3 are located same horizontal plane, baffle stopper 502 withstands rack 3 and avoids baffle 5 to rotate.
The inner wall of the supporting wall 102 facing the U-shaped groove 101 is provided with a rack sliding groove 12, two ends of a rack bottom shaft 7 are slidably mounted on the rack sliding groove 12, and the rack bottom shaft 7 supports and mounts the rack 3 so that the rack 3 does not directly contact with the base 1 of the sampling device.
The support wall 102 is provided with a rack bottom shaft mounting hole 13 in the vertical direction, and the rack bottom shaft mounting hole 13 is connected with the rack chute 12 in a penetrating manner to provide a mounting passage for the rack bottom shaft 7.
A handle 201 is arranged outside the gear shaft 2.
The utility model discloses in, gear 6 and 3 meshing of rack, the handle 201 of gear shaft 2 is rotated, and gear 6 rotates and drives rack 3 and gos forward or retreat, and 3 front ends of rack are linked with the form of hinge with baffle 5, and this makes baffle 5 have around the rotatory ability in hinge center, and baffle 5 can advance or retreat under the drive of rack simultaneously.
The baffle plate limiting block 502 is used for preventing the baffle plate 5 from continuously rotating due to the fact that the inner side of the baffle plate 5 is blocked by the rack 3 when the baffle plate 5 rotates to the same horizontal plane with the rack 3, and the baffle plate 5 can be retracted more conveniently.
The support wall 102 of the base 1 of the drawer is provided with a screw mounting position, and the screw mounting position is detachably assembled with the upper end 20 of the drawer through screws.
The rack bottom shaft 7 can lift the rack 3 in the air to avoid direct contact with the bottom surface of the base 1 of the drawer, and meanwhile, when the rack 3 is subjected to force from the gear 6, the force can be transmitted to the rack bottom shaft 7 and rotates to drive the rack 3 to move forwards or backwards, the length of the rack sliding groove 12 can limit the stroke of the rack 3, and the baffle sliding groove 11 is a track for the baffle 5 to move on the base 1 of the drawer.
The slot 204 is a moving track of the substrate in the drawer, the substrate is suspended when moving, friction between the substrate and the drawer can be reduced, and meanwhile, the substrate is not tightly attached to the drawer, so that the drawer is convenient to carry out the drawer.
The utility model discloses a novel device for substrate selective examination, which is characterized in that a transverse slot 204 is arranged on the upper end 20 of the selective examination device for inserting a substrate, and the vertical direction of the substrate can be limited after the slot 204 is inserted with the substrate; during the selective examination, will earlier the utility model discloses a novel device one end baffle 5 is closed for base plate selective examination, and fixed mounting is on selective examination ware upper end 20, and the base plate takes out from the discharge end magazine, puts into the baffle 5 of this device opposite side of closed behind the selective examination ware completely, opens the baffle that this device is close to the base plate front end after the selective examination is accomplished, takes out the base plate and puts into the feeding magazine.
In the utility model, after the substrate is completely placed in the device, the handle 201 is rotated to discharge the baffle 5 from the base 1 of the sampling inspection device; closing the baffle 5, and clamping the elastic clamping strip 501 on the baffle 5 into the clamping strip fixing groove 203; after the selective examination is finished, the card strip 501 is pulled out of the card strip fixing groove 203, the baffle 5 is put down, the handle 201 is rotated to take the card strip into the selective examination device base 1, and then the substrate is sent into a material box. The utility model discloses in, gear shaft 2 provides the drive power of 3 seesaws of rack, and rack 3 turns into the stroke of horizontal direction with the rotation of gear 6, realizes the baffle 5 income/emits the suction examination ware base 1 of this device, and elasticity card strip 501 is fixed baffle 5 soon, avoids its rotation.
The above is the preferred embodiment of the utility model, not limit according to this the utility model discloses a protection scope, the event: all equivalent changes made according to the structure, shape and principle of the utility model are covered within the protection scope of the utility model.
Claims (6)
1. A novel device for base plate selective examination which characterized in that: the device comprises an extraction and inspection device base, an upper end of the extraction and inspection device and a baffle plate, wherein the extraction and inspection device base is provided with a U-shaped groove and a supporting wall, the supporting wall is arranged on two sides of the U-shaped groove, racks are arranged on two sides in the U-shaped groove, a gear is meshed with the racks and assembled, and a base plate is supported by the upper end surface of the gear and matched with the supporting wall to support the base plate;
the gear shaft is arranged, two ends of the gear shaft are clamped on the supporting wall, the gear is arranged on the gear shaft, the gear shaft is rotated to drive the gear to rotate, and the gear rotates to be meshed with the driving rack to move;
the baffle articulates in the outside of rack, and supports the wall both ends and be equipped with the baffle spout and supply the baffle to slide in and accomodate or the roll-off, and through card strip detachably card solid on the selective examination ware upper end behind the baffle roll-off, set up horizontal slot on the selective examination ware upper end, the slot is used for the cartridge base plate.
2. The novel apparatus of claim 1, wherein: the up end of suction detector upper end sets up card strip fixed slot, and the articulated card strip of baffle up end, fixed mounting baffle when card strip card goes into card strip fixed slot, and wherein, the card strip chooses for use elasticity card strip.
3. The novel apparatus of claim 1, wherein: set up the baffle stopper on the baffle, when baffle and rack were located same horizontal plane, the baffle stopper withstood the rack and avoided the baffle to rotate.
4. The novel apparatus of claim 1, wherein: the support wall is equipped with the rack spout towards the inner wall of U-shaped recess, and rack bottom shaft both ends slidable mounting is on the rack spout, and rack bottom shaft supports the installation rack and realizes that the rack does not contact with the base direct contact of sampling inspection ware, and wherein, rack bottom shaft parallel arrangement is two.
5. The novel apparatus of claim 4, wherein: the support wall is provided with a rack bottom shaft mounting hole in the vertical direction, and the rack bottom shaft mounting hole is communicated with the rack sliding groove to provide a rack bottom shaft mounting channel.
6. The novel apparatus of claim 1, wherein: and a handle is arranged on the outer side of the gear shaft.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202222455953.XU CN218568780U (en) | 2022-09-16 | 2022-09-16 | Novel device for sampling and inspecting substrate |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202222455953.XU CN218568780U (en) | 2022-09-16 | 2022-09-16 | Novel device for sampling and inspecting substrate |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN218568780U true CN218568780U (en) | 2023-03-03 |
Family
ID=85312789
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202222455953.XU Active CN218568780U (en) | 2022-09-16 | 2022-09-16 | Novel device for sampling and inspecting substrate |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN218568780U (en) |
-
2022
- 2022-09-16 CN CN202222455953.XU patent/CN218568780U/en active Active
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