CN218546829U - Wafer test probe card capable of improving probe space - Google Patents
Wafer test probe card capable of improving probe space Download PDFInfo
- Publication number
- CN218546829U CN218546829U CN202222040311.3U CN202222040311U CN218546829U CN 218546829 U CN218546829 U CN 218546829U CN 202222040311 U CN202222040311 U CN 202222040311U CN 218546829 U CN218546829 U CN 218546829U
- Authority
- CN
- China
- Prior art keywords
- side wall
- connection
- elastic
- card
- department
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 239000000523 sample Substances 0.000 title claims abstract description 47
- 238000012360 testing method Methods 0.000 title claims abstract description 21
- 230000007246 mechanism Effects 0.000 claims abstract description 34
- 230000000149 penetrating effect Effects 0.000 claims description 16
- 210000001503 joint Anatomy 0.000 claims description 5
- 238000000034 method Methods 0.000 abstract description 17
- 230000008569 process Effects 0.000 abstract description 15
- 238000005299 abrasion Methods 0.000 abstract description 3
- 238000003780 insertion Methods 0.000 description 8
- 230000037431 insertion Effects 0.000 description 8
- 238000005452 bending Methods 0.000 description 2
- 208000004350 Strabismus Diseases 0.000 description 1
- 230000004075 alteration Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
Images
Landscapes
- Measuring Leads Or Probes (AREA)
Abstract
The utility model relates to a probe card technical field just discloses an improve wafer test probe card in probe space, which comprises an outer shell, the both sides end contained angle department through connection of shell has suppress the mechanism, suppress the mechanism including plug-in card, supporting network and supporting shoe, the inside wall department joint in the outside end of supporting network of plug-in card, the lateral wall swing joint in plug-in card's lateral wall department of supporting shoe, the lateral wall department through connection of shell has the movable frame. The inner end of the needle rod close to the push plate can drive the side wall of the push plate to rotate, the needle rod is prevented from being shielded and limited by a connecting port at the upper port and the lower port in the angle adjusting process, the elastic force is also added to the inner side end of the needle rod in the inserting process in the elastic collision process, the abrasion of the side wall of the needle rod in the process of inserting the needle rod into an equipment interface can be reduced when the side wall of the needle rod is inserted into the equipment interface, and an effective moving space is provided in the surrounding moving range of the needle rod when the side wall of the elastic block deviates to a position between the side wall of the movable block and the side wall of the clamping strip.
Description
Technical Field
The utility model relates to a probe card technical field specifically is an improve wafer test probe card in probe space.
Background
According to chip wafer testing, a probe card belongs to a customized device, a probe head inside the probe card is fixed with a probe card in the process of being plugged with a butt connector, in the plugging process, when a connecting point of the probe head and the probe card is pressed tightly by force, a needle head is clamped with a hole of the butt connector, in the process, two sides are required to swing slightly to be plugged, and therefore the surrounding space of the needle head is limited easily and is not easy to operate.
SUMMERY OF THE UTILITY MODEL
Not enough and can't insert tight problem in the swing space can appear for the in-process of solving above-mentioned chip wafer test syringe needle, the purpose that the increase probe swing space can easily be operated more than the realization, the utility model discloses a following technical scheme realizes:
the utility model provides an improve wafer test probe card in probe space, includes the shell, the both sides end contained angle department through connection of shell has suppress mechanism, suppress mechanism including plug-in card, supporting network and supporting shoe, the inside wall department joint of plug-in card is in the outside end of supporting network, the lateral wall swing joint of supporting shoe is in the lateral wall department of plug-in card, the lateral wall department through connection of shell has the movable frame, movable frame department through connection has the pull wire, the one end through connection that the pull wire kept away from the movable frame has shift mechanism, shift mechanism includes elastic sheet, butt plate, the lateral wall top through connection of elastic sheet is in the lateral wall top of butt plate, the one end through connection that the elastic sheet was kept away from to the butt plate has the push pedal, one side through connection that the butt plate was kept away from to the push pedal has the needle bar, the crack department through connection that the lateral wall front end department of shell set up has a pair strip mechanism.
Furthermore, the elastic pressing mechanism further comprises an elastic strip, the side wall of the elastic strip is connected between the side wall gaps of the supporting net in a penetrating mode and is formed in a crossed mode, the side wall of the supporting block inclines towards the side edge of the supporting net to push the side wall of the supporting net, and the gap between the side wall of the supporting net and the side wall of the elastic plate is reduced.
Further, the shift mechanism still includes the movable rod, the side through connection of movable rod is in the lateral wall top of butt plate, the one end sliding connection that the butt plate was kept away from to the movable rod is in the inside wall department of elastic sheet, the one end swing joint that the butt plate was kept away from to the movable rod is in the lateral wall top department of push pedal, and the lateral wall of push pedal can slide downwards along shift mechanism's lateral wall department, drags the lateral wall of elastic sheet downwards, and the lateral wall department of elastic sheet is pulled to rectilinear state gradually from the state of kickup.
Furthermore, the inner sides of the two side walls of the shell are connected with elastic blocks in a penetrating mode, the inner side walls of the elastic blocks are connected to the side ends of the push plate in a sliding mode, and the inner end, close to the push plate, of the needle rod can drive the side walls of the push plate to rotate.
Further, to strip mechanism including movable block and card strip, the lateral wall through connection of card strip is in the bottom layer inside wall department of shell, movable block through connection is in the top layer inside wall department of shell, and the lateral wall of elasticity piece can squint to between the lateral wall of movable block and card strip.
Furthermore, the bottom side wall of the movable block is movably connected to the top side wall of the clamping strip, the side end of the push plate pushes the side wall of the elastic block when moving, and the side wall of the elastic block can be deviated to a position between the movable block and the side wall of the clamping strip.
Furthermore, one end of the needle rod, which is far away from the push plate, is movably connected between the movable block and the side wall of the clamping strip.
Furthermore, the side end through connection of elasticity strip is in the inside wall department of plug-in card, the lateral wall department swing joint of elasticity strip is in the lateral wall department of supporting network, and after the space reduced between the lateral wall of supporting network and the lateral wall of elastic plate, elastic plate's lateral wall department can collide each other with elasticity between the lateral wall department of supporting network.
The utility model provides an improve wafer test probe card in probe space. The method has the following beneficial effects:
1. according to the wafer test probe card for improving the probe space, the side wall of the elastic sheet is gradually pulled to a linear state from an upward bending state, the inner included angle between the side wall of the elastic sheet and the side wall of the butt joint plate is reduced, the inner end of the needle rod close to the push plate can drive the side wall of the push plate to rotate, and the needle rod is prevented from being shielded and limited by the connecting port at the upper port and the lower port in the angle adjusting process.
2. According to the wafer test probe card capable of improving the probe space, after the gap between the side wall of the supporting net and the side wall of the elastic strip is reduced, the side wall of the elastic strip and the side wall of the supporting net can collide mutually to have elasticity, in the elastic collision process, the elasticity is increased for the inner side end of the needle rod in the insertion process, and the abrasion of the needle rod in the forced insertion process can be reduced when the side wall of the needle rod is inserted into an equipment interface.
3. According to the wafer test probe card capable of improving the probe space, when the side wall of the needle rod rotates and drives the push plate to rotate, the side end of the push plate moves to push the side wall of the elastic block, the side wall of the elastic block can deviate to a position between the side wall of the movable block and the side wall of the clamping strip, and effective movable space is provided in the surrounding movable range of the needle rod.
Drawings
FIG. 1 is a schematic view of the overall structure of the present invention;
FIG. 2 is a schematic view of the internal structure of the shifting mechanism of the present invention;
fig. 3 is the right side schematic view of the internal related structure connection of the suppressing mechanism of the present invention.
In the figure: 1. a housing; 2. a spring pressing mechanism; 211. inserting a card; 212. a support net; 213. a support block; 214. an elastic strip; 3. a movable frame; 4. a pull wire; 5. a displacement mechanism; 511. an elastic sheet; 512. a movable rod; 513. butt-joint plates; 6. pushing a plate; 7. a needle bar; 8. a strip aligning mechanism; 811. a movable block; 812. clamping the strip; 9. an elastic block.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
The embodiment of the wafer test probe card for improving the probe space comprises the following steps:
referring to fig. 1-3, a wafer test probe card for increasing a probe space includes a housing 1, a latch mechanism 2 is connected through a corner between two side ends of the housing 1, the latch mechanism 2 includes an insertion card 211, a support net 212 and a support block 213, an inner sidewall of the insertion card 211 is connected to an outer sidewall of the support net 212, a sidewall of the support block 213 is movably connected to a sidewall of the insertion card 211, the latch mechanism 2 further includes a spring bar 214, a sidewall of the spring bar 214 is connected to a sidewall gap of the support net 212 in a crossing manner, the sidewall of the support block 213 inclines to the side of the support net 212 to push the sidewall of the support net 212, the gap between the sidewall of the support net 212 and the sidewall of the spring bar 214 is reduced, a side end of the spring bar 214 is connected to an inner sidewall of the insertion card 211 in a penetrating manner, a sidewall of the spring bar 214 is movably connected to a sidewall of the support net 212, and a gap between the sidewall of the support net 212 is reduced, and the sidewall of the spring bar 214 can collide with each other;
the side wall of the shell 1 is connected with a movable frame 3 in a penetrating manner, the movable frame 3 is connected with a traction wire 4 in a penetrating manner, one end, far away from the movable frame 3, of the traction wire 4 is connected with a shifting mechanism 5 in a penetrating manner, the shifting mechanism 5 comprises an elastic sheet 511 and a butt plate 513, the top end of the side wall of the elastic sheet 511 is connected with the top end of the side wall of the butt plate 513 in a penetrating manner, one end, far away from the elastic sheet 511, of the butt plate 513 is connected with a push plate 6 in a penetrating manner, the shifting mechanism 5 further comprises a movable rod 512, the side end of the movable rod 512 is connected with the top end of the side wall of the butt plate 513 in a penetrating manner, one end, far away from the butt plate 513, of the movable rod 512 is movably connected with the top end of the side wall of the push plate 6, the side wall of the push plate 6 can slide downwards along the side wall of the shifting mechanism 5 to pull the side wall of the elastic sheet 511 downwards, and the side wall of the elastic sheet 511 is gradually pulled to a straight line state from an upwards bent state;
one side of the push plate 6 far away from the butt plate 513 is connected with a needle rod 7 in a penetrating manner, a crack position arranged at the front end of the side wall of the shell 1 is connected with a strip aligning mechanism 8 in a penetrating manner, the strip aligning mechanism 8 comprises a movable block 811 and a clamping strip 812, the side wall of the clamping strip 812 is connected with the inner side wall of the bottom layer of the shell 1 in a penetrating manner, the movable block 811 is connected with the inner side wall of the top layer of the shell 1 in a penetrating manner, the side wall of the elastic block 9 can be deviated between the movable block 811 and the side wall of the clamping strip 812, the bottom side wall of the movable block 811 is movably connected with the top side wall of the clamping strip 812, the side wall of the push plate 6 pushes the side wall of the elastic block 9 during moving, the side wall of the elastic block 9 can be deviated between the movable block 811 and the side wall of the clamping strip 812, one end of the needle rod 7 far away from the push plate 6 is movably connected between the side walls of the movable block 811 and the clamping strip 812, the inner side wall of the shell 1 is connected with the elastic block 9 in a sliding manner, and the inner end of the inner side wall of the elastic block 9 close to the needle rod 6 can drive the side wall of the push plate 6 to rotate.
The working principle is as follows: when the needle bar is used, as shown in fig. 1 and fig. 2, when the sidewall of the needle bar 7 rotates clockwise and upward, the inner side end of the needle bar 7 close to the push plate 6 rotates upward along the sidewall of the push plate 6, the sidewall of the needle bar 7 pushes the sidewall of the push plate 6 from top to bottom, the sidewall of the push plate 6 slides downward along the sidewall of the shifting mechanism 5, the sidewall of the elastic piece 511 is pulled downward, the sidewall of the elastic piece 511 is gradually pulled from an upward bending state to a linear state, an inner included angle between the sidewall of the elastic piece 511 and the sidewall of the butt plate 513 is reduced, the inner end of the needle bar 7 close to the push plate 6 can drive the sidewall of the push plate 6 to rotate, the needle bar 7 is prevented from being shielded and limited by the upper and lower connecting ports in the process of adjusting the angle of the needle bar 7, and the sidewall of the push plate 6 can rotate along with the angle change of the needle bar 7;
as shown in fig. 1 and 3, when the angle of the needle bar 7 is changed, the side wall of the push plate 6 is driven to drag the side wall of the supporting block 213 to move, the side wall of the supporting block 213 rotates by an angle, the side wall of the supporting block 213 inclines to the side edge of the supporting net 212 to push the side wall of the supporting net 212, after the gap between the side wall of the supporting net 212 and the side wall of the elastic strip 214 is reduced, the side wall of the elastic strip 214 and the side wall of the supporting net 212 can collide with each other to have elasticity, in the elastic collision process, the elastic force is added to the inner side end of the needle bar 7 in the insertion process, and the abrasion of the side wall of the needle bar 7 in the insertion process of the needle bar 7 in the equipment interface can be reduced;
when the side wall of the needle bar 7 rotates, the push plate 6 is driven to rotate, the side end of the push plate 6 pushes the side wall of the elastic block 9 when moving, the side wall of the elastic block 9 can be deviated between the side walls of the movable block 811 and the clamping strip 812, and an effective moving space is provided in the surrounding moving range of the needle bar 7.
Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.
Claims (8)
1. A wafer test probe card for improving probe space comprises a shell (1), and is characterized in that: both sides end contained angle department through connection of shell (1) has suppress mechanism (2), suppress mechanism (2) including plug-in card (211), supporting network (212) and supporting shoe (213), the inside wall department joint of plug-in card (211) is in the outside end of supporting network (212), the lateral wall swing joint of supporting shoe (213) is in the lateral wall department of plug-in card (211), the lateral wall department through connection of shell (1) has movable frame (3), there is pull wire (4) through connection in movable frame (3) department, the one end through connection that movable frame (3) were kept away from in pull wire (4) has shift mechanism (5), shift mechanism (5) are including elastic sheet (511), butt joint plate (513), the lateral wall top through connection of elastic sheet (511) is on the lateral wall top of butt joint plate (513), the one end through connection that butt joint plate (511) kept away from elastic sheet (513) has through connection (6), one side through connection that push plate (6) kept away from push pedal (6) has needle bar (513), the preceding lateral wall department through connection that shell (1) set up butt joint mechanism (8).
2. The wafer test probe card capable of increasing the probe space according to claim 1, wherein: the elastic pressing mechanism (2) further comprises an elastic strip (214), and the side wall of the elastic strip (214) penetrates through and is connected with the side wall gap of the supporting net (212) in a crossed mode.
3. The wafer test probe card capable of increasing the probe space according to claim 1, wherein: the shifting mechanism (5) further comprises a movable rod (512), the side end of the movable rod (512) is connected to the top end of the side wall of the butt plate (513) in a penetrating mode, one end, far away from the butt plate (513), of the movable rod (512) is connected to the inner side wall of the elastic sheet (511) in a sliding mode, and one end, far away from the butt plate (513), of the movable rod (512) is connected to the top end of the side wall of the push plate (6) in a movable mode.
4. The wafer test probe card capable of increasing the probe space according to claim 1, wherein: the inner sides of the two side walls of the shell (1) are connected with elastic blocks (9) in a penetrating mode, and the inner side walls of the elastic blocks (9) are connected to the side ends of the push plate (6) in a sliding mode.
5. The wafer test probe card capable of increasing the probe space according to claim 1, wherein: to strip mechanism (8) including movable block (811) and card strip (812), the lateral wall through connection in the bottom layer inside wall department of shell (1) of card strip (812), movable block (811) through connection in the top layer inside wall department of shell (1).
6. The wafer test probe card capable of increasing the probe space according to claim 5, wherein: the bottom side wall of the movable block (811) is movably connected with the top side wall of the clamping strip (812).
7. The wafer test probe card capable of increasing the probe space according to claim 1, wherein: one end of the needle rod (7) far away from the push plate (6) is movably connected between the side walls of the movable block (811) and the clamping strip (812).
8. The wafer test probe card capable of increasing the probe space according to claim 2, wherein: the side end of the elastic strip (214) is connected with the inner side wall of the plug-in card (211) in a penetrating mode, and the side wall of the elastic strip (214) is movably connected with the side wall of the supporting net (212).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202222040311.3U CN218546829U (en) | 2022-08-04 | 2022-08-04 | Wafer test probe card capable of improving probe space |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202222040311.3U CN218546829U (en) | 2022-08-04 | 2022-08-04 | Wafer test probe card capable of improving probe space |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN218546829U true CN218546829U (en) | 2023-02-28 |
Family
ID=85269780
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202222040311.3U Active CN218546829U (en) | 2022-08-04 | 2022-08-04 | Wafer test probe card capable of improving probe space |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN218546829U (en) |
-
2022
- 2022-08-04 CN CN202222040311.3U patent/CN218546829U/en active Active
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN201773975U (en) | Electronic card connector | |
| JP2005059396A (en) | Binding method, binding device and binder cartridge | |
| CN218546829U (en) | Wafer test probe card capable of improving probe space | |
| CN208820148U (en) | A kind of automatic plug-pull device | |
| CN207756751U (en) | A kind of photovoltaic panel frame riveting device | |
| CN220155939U (en) | Automatic pin inserting mechanism of pin inserting machine | |
| CN209794391U (en) | automatic PIN burying device of manipulator | |
| CN209849608U (en) | Multi-station semi-automatic bending machine | |
| CN206864848U (en) | A kind of soft arranging wire and FPC automatic plug mechanism | |
| CN213212606U (en) | Data transmission device based on security performance improvement | |
| CN201113130Y (en) | Electrical connector | |
| CN216226626U (en) | U-shaped pin bending mechanism for pin inserting machine | |
| CN218657640U (en) | Automatic card plugging and unplugging device | |
| CN203326283U (en) | Misplug prevention type SIM card connector | |
| CN220042537U (en) | Connector production bending device | |
| CN214143695U (en) | Piling device for building construction | |
| CN214161134U (en) | Bending die for bending electronic parts | |
| CN219350918U (en) | USB automatic pulling-out device | |
| CN206405357U (en) | Round wires conveying mechanism | |
| CN214252506U (en) | Integrated circuit chip tester | |
| CN215497315U (en) | Device for quick plugging and self-locking of connector | |
| CN219402068U (en) | Wire bending jig | |
| CN217215315U (en) | Optical communication signal connecting device | |
| CN110391520A (en) | Electronic card coupler | |
| CN216251207U (en) | USB joint with welding-free performance |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant |