Integrated circuit chip tester
Technical Field
The present application relates to the field of integrated circuit testing, and more particularly, to an integrated circuit chip tester.
Background
An integrated circuit chip is an electronic component that includes a silicon substrate, a circuit, a stationary seal ring, a ground ring, and a guard ring. An integrated circuit tester is a special instrument for testing an integrated circuit. The integrated circuit test is one of the key means for ensuring the performance and quality of the integrated circuit.
The tester of integrated circuit chip usually includes the tester shell, and the top of tester shell is inlayed and is equipped with the display screen, and the upper surface of tester shell is equipped with chip slot, a plurality of function button and pilot lamp. The outer surface of one side of chip slot is connected with the dead lever, and the top of tester shell is connected with cleaning device, and power source, shift knob and transmission interface have been seted up to the rear surface of tester shell.
In view of the above-mentioned related technologies, the inventor thinks that the chip needs to be clamped and fixed after being inserted into the chip slot, and in the prior art, the chip is fixed by clamping two sides of the chip pins, but since the pins of the chip are irregular thin metal sheets, the pins are easily bent by clamping the pins from two irregular sides of the pins, and even the pins are broken, and the chip is damaged.
SUMMERY OF THE UTILITY MODEL
The present application provides an integrated circuit chip tester for better clamping and securing the pins of the chip.
The application provides an integrated circuit chip tester adopts following technical scheme:
the utility model provides an integrated circuit chip tester, includes the casing, be provided with the chip plug box that is used for being connected with the chip on the casing, a plurality of inserting grooves have been seted up to the chip plug box, be provided with first clamping mechanism and second clamping mechanism in the chip plug box, first clamping mechanism is including the first pressure strip that is used for supporting a terminal surface of tight chip's pin, second clamping mechanism is including the second pressure strip that is used for supporting another terminal surface of tight pin, first pressure strip and second pressure strip all slide with the chip plug box and be connected.
Through adopting above-mentioned technical scheme, through first clamping mechanism and the cooperation motion of second clamping mechanism for first pressure strip supports the pin tightly from two smooth terminal surfaces of pin respectively with the second pressure strip, makes the chip fix steadily in the chip plug box, and the chip tester can test the chip. The pins are pressed from the end faces, the pins are clamped more firmly, and the possibility of bending of the pins is reduced.
Optionally, the first clamping mechanism includes a first connecting rod fixedly connected to the first pressing plate, the first pressing plate and the first connecting rod are arranged in an inclined manner in the horizontal direction, and the first connecting rod is connected to the chip plugging box in a sliding manner.
Through adopting above-mentioned technical scheme, drive the head rod for first pressure strip moves along the groove length direction of inserting groove, supports tightly the pin of chip.
Optionally, the number of the first clamping mechanisms is two, and the two first clamping mechanisms are symmetrically arranged about a central axis of the chip plug-in box.
Through adopting above-mentioned technical scheme, set up two first clamping mechanism, can compress tightly the pin of chip both sides.
Optionally, the chip plugging box is connected with a pulling plate in a sliding manner in the groove width direction of the plugging groove, the pulling plate is provided with two sliding grooves, the sliding grooves and the central axis of the chip plugging box are arranged in an inclined manner in the horizontal direction, the two sliding grooves are symmetrically arranged about the central axis of the chip plugging box, the sliding grooves and the first connecting rods are arranged in a one-to-one correspondence manner, and the first connecting rods slide in the sliding grooves corresponding to the first connecting rods.
Through adopting above-mentioned technical scheme, the drive arm-tie makes the arm-tie slide along the groove width direction of inserting groove, drives two head rods and two first pressure strips simultaneous movement, supports tightly to the pin of chip both sides.
Optionally, the second clamping mechanism includes a second connecting rod hinged to the second pressing plate, the second connecting rod is hinged to a sliding sleeve, and the sliding sleeve is movably connected to the chip plug-in box.
Through adopting above-mentioned technical scheme, the drive sleeve that slides for the motion of second connecting rod drives the second pressure strip and follows the groove length direction motion of inserting groove, supports tightly with the cooperation of first pressure strip to the pin of chip.
Optionally, the number of the second clamping mechanisms is two, and the two second clamping mechanisms are symmetrically arranged about a central axis of the chip plug-in box.
Through adopting above-mentioned technical scheme, set up two second clamping mechanism, can compress tightly the pin of chip both sides.
Optionally, the chip plug box is connected with a second pull rod in a sliding manner in the groove width direction of the plug groove, the second pull rod is fixedly connected with a sliding rod parallel to the groove length direction of the plug groove, and the sliding rod is slidably arranged in the two sliding sleeves in a penetrating manner.
Through adopting above-mentioned technical scheme, drive second pull rod for the slide bar motion, the cover is established two sliding sleeve outside the slide bar and is slided along the slide bar, drives two second connecting rods and two second pressure strips and carries out the butt to the pin of chip both sides.
Optionally, the chip plug-in box is hinged with a limiting rod corresponding to the sliding sleeve, and one end of each limiting rod, which is far away from the chip plug-in box, is hinged with the sliding sleeve.
Through adopting above-mentioned technical scheme, set up the gag lever post, carry on spacingly to the sleeve that slides, reduce the sleeve that slides and break away from the condition of slide bar in the motion process, make the sleeve that slides more smoothly slide on the slide bar.
In summary, the present application includes at least one of the following beneficial technical effects:
1. the first clamping mechanism and the second clamping mechanism are matched to move, and the pins are abutted from the two end faces of the pins respectively, so that the chip is stably fixed in the chip plug box, and the possibility of bending the pins is reduced;
2. the first clamping mechanism and the second clamping mechanism are symmetrically provided with two groups, and pins on two sides of the chip can be clamped and fixed at the same time.
Drawings
FIG. 1 is an exploded view of the structure of an integrated circuit chip tester.
Fig. 2 is an enlarged view of a portion a of fig. 1.
Fig. 3 is a schematic structural view of the first clamping mechanism and the second clamping mechanism.
Fig. 4 is an enlarged view of a portion B of fig. 3.
Fig. 5 is an enlarged view of a structure of a portion C in fig. 3.
Description of reference numerals: 1. a housing; 10. a chip; 2. a chip plug-in box; 20. inserting grooves; 21. a box body; 22. a cavity; 23. a cover plate; 230. an avoidance groove; 3. a first clamping mechanism; 31. a first compression plate; 32. a first connecting rod; 33. pulling a plate; 331. a sliding groove; 34. a limiting plate; 35. a first pull rod; 4. a second clamping mechanism; 40. a limiting groove; 41. a second compression plate; 42. a second connecting rod; 43. a slipping sleeve; 44. a second pull rod; 45. a slide bar; 46. a limiting rod; 47. a first hinge lever; 48. a second hinge rod.
Detailed Description
The present application is described in further detail below with reference to figures 1-5.
The embodiment of the application discloses an integrated circuit chip tester.
Referring to fig. 1, the integrated circuit chip tester includes a housing 1, and the housing 1 is provided with a display screen and a plurality of keys. The housing 1 is further provided with a chip insertion box 2 for connecting with the chip 10.
Referring to fig. 2, a plurality of pins are correspondingly fixed on two sides of the chip 10. The chip plug box 2 comprises a box body 21 fixedly connected with the shell 1, a plurality of plug grooves 20 are formed in the box body 21, the plug grooves 20 are arranged in two rows along the central axis of the chip plug box 2, and the two rows of plug grooves 20 are arranged correspondingly to each other. A cavity 22 is formed in the box body 21, and the cavity 22 is communicated with the plurality of inserting grooves 20. The box body 21 is connected with a cover plate 23 in a clamping manner, and the cover plate 23 is provided with avoidance grooves 230 which are arranged in one-to-one correspondence with the insertion grooves 20. The pins of the chip 10 can be inserted into the insertion grooves 20 through the escape grooves 230.
Referring to fig. 3, two first clamping mechanisms 3 and two second clamping mechanisms 4 are disposed in the cavity 22 of the chip splicing cassette 2. The two first clamping mechanisms 3 are arranged symmetrically with respect to the central axis of the chip plug box 2, and the two second clamping mechanisms 4 are also arranged symmetrically with respect to the central axis of the chip plug box 2.
The first clamping mechanism 3 and the second clamping mechanism 4 move in cooperation with each other to clamp and fix the chip 10 from both sides of the chip 10.
Referring to fig. 4, the first clamping mechanism 3 includes a first pressing plate 31 connected to the box body 21 in a sliding manner, a first connecting rod 32 is fixed to one end of the first pressing plate 31, the first connecting rod 32 and the first pressing plate 31 are inclined in the horizontal direction, an included angle between the first connecting rod 32 and the first pressing plate 31 may be an acute angle or an obtuse angle, and an included angle between the first connecting rod 32 and the first pressing plate 31 in this embodiment is an obtuse angle. One end of the first connecting rod 32 away from the first pressing plate 31 faces the central axis of the chip socket 2. A limit plate 34 for limiting the first connecting rod 32 is fixedly connected to the box body 21.
Referring to fig. 4, a first pull rod 35 is slidably connected in the box 21, and the first pull rod 35 penetrates through a sidewall of the box 21 and extends out of the box 21. One end of the first pull rod 35 located in the box body 21 is fixedly connected with a pull plate 33, the end face of the pull plate 33 is provided with two sliding grooves 331, the sliding grooves 331 are obliquely arranged with the central axis of the box body 21, the two sliding grooves 331 are symmetrically arranged relative to the central axis of the box body 21, and the distance between the two sliding grooves 331 is gradually reduced along the direction far away from the first pull rod 35. The sliding grooves 331 correspond to the first connecting rods 32 one by one, and the first connecting rods 32 slide in the corresponding sliding grooves 331.
Pulling the first pull rod 35, driving the pull plate 33 to move, sliding the first connecting rod 32 in the sliding groove 331, driving the first pressing plate 31 to move toward the direction close to or away from the central axis of the box body 21, and abutting against the outer end faces of the pins at the two sides of the chip 10.
Referring to fig. 5, the second clamping mechanism 4 includes a second pressing plate 41 connected to the box 21 in a sliding manner, one end of the second pressing plate 41 is hinged to a second connecting rod 42 through a first hinge rod 47, and one end of the second connecting rod 42 away from the second pressing plate 41 is hinged to a sliding sleeve 43. The box body 21 is provided with a limit groove 40, and the limit groove 40 is parallel to the groove length direction of the inserting groove 20. The first hinge lever 47 slides in the stopper groove 40. The box body 21 is fixedly connected with a second hinged rod 48, the second hinged rod 48 is positioned in the limiting groove 40, the second hinged rod 48 is rotatably connected with a limiting rod 46, and one end, far away from the second hinged rod 48, of the limiting rod 46 is hinged with the sliding sleeve 43.
Referring to fig. 5, a second pull rod 44 is slidably connected in the box 21, and the second pull rod 44 passes through the sidewall of the box 21 and extends out of the box 21. One end of the second pull rod 44 located in the box body 21 is fixedly connected with a sliding rod 45, and the sliding rod 45 is parallel to the slot length direction of the insertion slot 20. The sliding rod 45 is slidably arranged in the two sliding sleeves 43.
The second pull rod 44 is pulled to slide the two sliding sleeves 43 along the sliding rod 45, the second connecting rod 42 is driven to move, the first hinge rod 47 slides along the limiting groove 40, the second pressing plate 41 moves in a direction close to or far away from the central axis of the box body 21, and inner end faces of pins at two sides of the chip 10 are abutted tightly. The stop rod 46 enables the sliding sleeve 43 to better slide along the sliding rod 45.
The implementation principle of the integrated circuit chip tester in the embodiment of the application is as follows: the pins of the chip 10 are placed corresponding to the insertion grooves 20, the chip 10 is inserted into the chip insertion box 2, and at this time, the first pull rod 35 and the second pull rod 44 are pulled simultaneously to drive the first pressing plate 31 and the second pressing plate 41 to tightly press and fix the pins of the chip 10. The chip tester tests the chip 10, and after the test is completed, the first pull rod 35 and the second pull rod 44 are pulled reversely at the same time, the first pressing plate 31 and the second pressing plate 41 do not support the pins of the chip 10 tightly any more, and the chip 10 can be pulled out of the chip plug box 2.
The above embodiments are preferred embodiments of the present application, and the protection scope of the present application is not limited by the above embodiments, so: all equivalent changes made according to the structure, shape and principle of the present application shall be covered by the protection scope of the present application.